DE3485385D1 - Mit pruefzellen ausgestattetes programmierbares rom-geraet. - Google Patents
Mit pruefzellen ausgestattetes programmierbares rom-geraet.Info
- Publication number
- DE3485385D1 DE3485385D1 DE8484113053T DE3485385T DE3485385D1 DE 3485385 D1 DE3485385 D1 DE 3485385D1 DE 8484113053 T DE8484113053 T DE 8484113053T DE 3485385 T DE3485385 T DE 3485385T DE 3485385 D1 DE3485385 D1 DE 3485385D1
- Authority
- DE
- Germany
- Prior art keywords
- programmable rom
- device equipped
- test cells
- rom device
- cells
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/08—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/24—Accessing extra cells, e.g. dummy cells or redundant cells
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58203975A JPS6095799A (ja) | 1983-10-31 | 1983-10-31 | プログラマブル・リ−ド・オンリ−・メモリ |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3485385D1 true DE3485385D1 (de) | 1992-02-06 |
Family
ID=16482720
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8484113053T Expired - Fee Related DE3485385D1 (de) | 1983-10-31 | 1984-10-30 | Mit pruefzellen ausgestattetes programmierbares rom-geraet. |
Country Status (4)
Country | Link |
---|---|
US (1) | US4719599A (de) |
EP (1) | EP0140368B1 (de) |
JP (1) | JPS6095799A (de) |
DE (1) | DE3485385D1 (de) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
NL8600099A (nl) * | 1986-01-20 | 1987-08-17 | Philips Nv | Niet-vluchtig, programmeerbaar halfgeleidergeheugen. |
FR2605112B1 (fr) * | 1986-10-10 | 1989-04-07 | Thomson Csf | Dispositif et procede de generation de vecteurs de test et procede de test pour circuit integre |
JPS63175300A (ja) * | 1987-01-16 | 1988-07-19 | Hitachi Ltd | 半導体集積回路装置 |
JPH0632213B2 (ja) * | 1987-02-26 | 1994-04-27 | 日本電気株式会社 | 半導体メモリ |
US4967394A (en) * | 1987-09-09 | 1990-10-30 | Kabushiki Kaisha Toshiba | Semiconductor memory device having a test cell array |
CA1326303C (en) * | 1988-08-31 | 1994-01-18 | Hideki Shutou | Extended logical scale structure of a programmable logic array |
US5072137A (en) * | 1990-08-17 | 1991-12-10 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with a clocked access code for test mode entry |
US5072138A (en) * | 1990-08-17 | 1991-12-10 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with sequential clocked access codes for test mode entry |
KR920006993A (ko) * | 1990-09-28 | 1992-04-28 | 정몽헌 | Epld의 입출력 마크로셀 시험회로 |
US5465341A (en) * | 1992-10-23 | 1995-11-07 | Vlsi Technology, Inc. | Verifiable security circuitry for preventing unauthorized access to programmed read only memory |
US5661047A (en) * | 1994-10-05 | 1997-08-26 | United Microelectronics Corporation | Method for forming bipolar ROM device |
US7376008B2 (en) * | 2003-08-07 | 2008-05-20 | Contour Seminconductor, Inc. | SCR matrix storage device |
US7646622B2 (en) * | 2006-03-23 | 2010-01-12 | Toshiba America Research, Inc. | Memory based computation systems and methods of using the same |
US20080074898A1 (en) | 2006-06-02 | 2008-03-27 | Bookham Technology Plc | Light source assemblies |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CH612953A5 (en) * | 1975-06-13 | 1979-08-31 | Ciba Geigy Ag | Process for the preparation of steroid carbolactones |
JPS5914838B2 (ja) * | 1978-11-25 | 1984-04-06 | 富士通株式会社 | フィ−ルドプログラマブル素子 |
JPS55142475A (en) * | 1979-04-23 | 1980-11-07 | Fujitsu Ltd | Decoder circuit |
JPS57105898A (en) * | 1980-12-23 | 1982-07-01 | Fujitsu Ltd | Field programmable element |
JPS57143798A (en) * | 1981-03-02 | 1982-09-06 | Fujitsu Ltd | Programmable element |
-
1983
- 1983-10-31 JP JP58203975A patent/JPS6095799A/ja active Granted
-
1984
- 1984-10-30 EP EP84113053A patent/EP0140368B1/de not_active Expired - Lifetime
- 1984-10-30 US US06/666,515 patent/US4719599A/en not_active Expired - Lifetime
- 1984-10-30 DE DE8484113053T patent/DE3485385D1/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0140368A3 (en) | 1988-06-22 |
EP0140368A2 (de) | 1985-05-08 |
JPH0156479B2 (de) | 1989-11-30 |
JPS6095799A (ja) | 1985-05-29 |
EP0140368B1 (de) | 1991-12-27 |
US4719599A (en) | 1988-01-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |