DE3485367D1 - Verfahren und geraet zur erzeugung einer sequenz von mehrbitworten. - Google Patents

Verfahren und geraet zur erzeugung einer sequenz von mehrbitworten.

Info

Publication number
DE3485367D1
DE3485367D1 DE8484307028T DE3485367T DE3485367D1 DE 3485367 D1 DE3485367 D1 DE 3485367D1 DE 8484307028 T DE8484307028 T DE 8484307028T DE 3485367 T DE3485367 T DE 3485367T DE 3485367 D1 DE3485367 D1 DE 3485367D1
Authority
DE
Germany
Prior art keywords
sequence
generating
multiple words
words
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8484307028T
Other languages
English (en)
Inventor
Michael Peter Crane
David John Marsh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Schlumberger Technologies Ltd
Original Assignee
Schlumberger Technologies Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Schlumberger Technologies Ltd filed Critical Schlumberger Technologies Ltd
Application granted granted Critical
Publication of DE3485367D1 publication Critical patent/DE3485367D1/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
DE8484307028T 1983-10-28 1984-10-15 Verfahren und geraet zur erzeugung einer sequenz von mehrbitworten. Expired - Fee Related DE3485367D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08328880A GB2149159B (en) 1983-10-28 1983-10-28 Method and apparatus for generating sequence of multibit words

Publications (1)

Publication Number Publication Date
DE3485367D1 true DE3485367D1 (de) 1992-01-30

Family

ID=10550895

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8484307028T Expired - Fee Related DE3485367D1 (de) 1983-10-28 1984-10-15 Verfahren und geraet zur erzeugung einer sequenz von mehrbitworten.

Country Status (5)

Country Link
US (1) US4638481A (de)
EP (1) EP0141562B1 (de)
JP (1) JPS60174964A (de)
DE (1) DE3485367D1 (de)
GB (1) GB2149159B (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3515802A1 (de) * 1985-05-02 1986-11-06 Siemens AG, 1000 Berlin und 8000 München Anordnung zur schnellen erzeugung von grossen pruefdatenwortmengen in einer pruefeinrichtung
US4744084A (en) * 1986-02-27 1988-05-10 Mentor Graphics Corporation Hardware modeling system and method for simulating portions of electrical circuits
US5004978A (en) * 1990-03-29 1991-04-02 Hewlett-Packard Company Method for regenerating in-circuit test sequences for circuit board components
US5410664A (en) * 1993-03-31 1995-04-25 Intel Corporation RAM addressing apparatus with lower power consumption and less noise generation
US5907597A (en) * 1994-08-05 1999-05-25 Smart Tone Authentication, Inc. Method and system for the secure communication of data
US5583933A (en) * 1994-08-05 1996-12-10 Mark; Andrew R. Method and apparatus for the secure communication of data
FR2772944A1 (fr) * 1997-12-19 1999-06-25 Sgs Thomson Microelectronics Procede de gestion d'un circuit electronique et unite de gestion pour sa mise en oeuvre
KR101255265B1 (ko) * 2012-08-13 2013-04-15 주식회사 유니테스트 솔리드 스테이트 드라이브 테스터에서 에러 발생장치

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4045736A (en) * 1971-09-27 1977-08-30 Ibm Corporation Method for composing electrical test patterns for testing ac parameters in integrated circuits
US3873818A (en) * 1973-10-29 1975-03-25 Ibm Electronic tester for testing devices having a high circuit density
US4293950A (en) * 1978-04-03 1981-10-06 Nippon Telegraph And Telephone Public Corporation Test pattern generating apparatus
DE3016738C2 (de) * 1980-04-30 1988-06-16 Siemens AG, 1000 Berlin und 8000 München Verfahren zur Übertragung eines Bitmusterfeldes in einen Speicher und Schaltungsanordnung zur Ausübung des Verfahrens
GB2099618B (en) * 1981-06-02 1985-07-03 Tektronix Inc Algorithmic word generator
US4433414A (en) * 1981-09-30 1984-02-21 Fairchild Camera And Instrument Corporation Digital tester local memory data storage system
US4556938A (en) * 1982-02-22 1985-12-03 International Business Machines Corp. Microcode control mechanism utilizing programmable microcode repeat counter
US4488219A (en) * 1982-03-18 1984-12-11 International Business Machines Corporation Extended control word decoding
FR2523789B1 (fr) * 1982-03-19 1985-01-04 Thomson Csf Dispositif de generation de signaux de test d'equipements electroniques
US4493079A (en) * 1982-08-18 1985-01-08 Fairchild Camera & Instrument Corp. Method and system for selectively loading test data into test data storage means of automatic digital test equipment
JPS5994086A (ja) * 1982-11-19 1984-05-30 Advantest Corp 論理回路試験装置

Also Published As

Publication number Publication date
GB8328880D0 (en) 1983-11-30
EP0141562A3 (en) 1987-02-25
US4638481A (en) 1987-01-20
GB2149159B (en) 1987-07-08
JPS60174964A (ja) 1985-09-09
GB2149159A (en) 1985-06-05
EP0141562B1 (de) 1991-12-18
EP0141562A2 (de) 1985-05-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee