DE3484602D1 - Messung von komponenten in einem gas. - Google Patents
Messung von komponenten in einem gas.Info
- Publication number
- DE3484602D1 DE3484602D1 DE8888202520T DE3484602T DE3484602D1 DE 3484602 D1 DE3484602 D1 DE 3484602D1 DE 8888202520 T DE8888202520 T DE 8888202520T DE 3484602 T DE3484602 T DE 3484602T DE 3484602 D1 DE3484602 D1 DE 3484602D1
- Authority
- DE
- Germany
- Prior art keywords
- gas
- measuring components
- measuring
- components
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/0009—Calibration of the apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/24—Vacuum systems, e.g. maintaining desired pressures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/72—Mass spectrometers
- G01N30/7206—Mass spectrometers interfaced to gas chromatograph
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T137/00—Fluid handling
- Y10T137/8593—Systems
- Y10T137/85978—With pump
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US06/472,257 US4579144A (en) | 1983-03-04 | 1983-03-04 | Electron impact ion source for trace analysis |
Publications (1)
Publication Number | Publication Date |
---|---|
DE3484602D1 true DE3484602D1 (de) | 1991-06-20 |
Family
ID=23874762
Family Applications (3)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8484301357T Expired - Fee Related DE3482349D1 (de) | 1983-03-04 | 1984-03-01 | System zur zufuehrung von gas regelbaren drucks. |
DE8888202519T Expired - Fee Related DE3485376D1 (de) | 1983-03-04 | 1984-03-01 | Elektroneneinschlag-ionenquelle zur analysierung von komponenten. |
DE8888202520T Expired - Fee Related DE3484602D1 (de) | 1983-03-04 | 1984-03-01 | Messung von komponenten in einem gas. |
Family Applications Before (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE8484301357T Expired - Fee Related DE3482349D1 (de) | 1983-03-04 | 1984-03-01 | System zur zufuehrung von gas regelbaren drucks. |
DE8888202519T Expired - Fee Related DE3485376D1 (de) | 1983-03-04 | 1984-03-01 | Elektroneneinschlag-ionenquelle zur analysierung von komponenten. |
Country Status (3)
Country | Link |
---|---|
US (1) | US4579144A (de) |
EP (3) | EP0311224B1 (de) |
DE (3) | DE3482349D1 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3631862A1 (de) * | 1986-09-19 | 1988-03-31 | Strahlen Umweltforsch Gmbh | Einrichtung zur analytischen bestimmung von organischen stoffen |
GB8816499D0 (en) * | 1988-07-12 | 1988-08-17 | C J S Sciences Ltd | Valve |
US4960991A (en) * | 1989-10-17 | 1990-10-02 | Hewlett-Packard Company | Multimode ionization source |
FR2661501B1 (fr) * | 1990-04-27 | 1994-02-18 | Rhone Poulenc Films | Appareil d'analyse du gaz contenu dans une enceinte par spectrometrie de masse, procede d'analyse mettant en óoeuvre ledit appareil et applications dudit procede. |
DE4113695A1 (de) * | 1991-04-26 | 1992-10-29 | Bayer Ag | Kontinuierlich betriebener gasanalysator |
US5237175A (en) * | 1992-02-26 | 1993-08-17 | Varian Associates, Inc. | Reagent gas control for an ion trap mass spectrometer used in the chemical ionization mode |
US5302827A (en) * | 1993-05-11 | 1994-04-12 | Mks Instruments, Inc. | Quadrupole mass spectrometer |
GB9409953D0 (en) * | 1994-05-17 | 1994-07-06 | Fisons Plc | Mass spectrometer and electron impact ion source therefor |
DE19949978A1 (de) * | 1999-10-08 | 2001-05-10 | Univ Dresden Tech | Elektronenstoßionenquelle |
US7838842B2 (en) * | 1999-12-13 | 2010-11-23 | Semequip, Inc. | Dual mode ion source for ion implantation |
JP2019204708A (ja) * | 2018-05-24 | 2019-11-28 | 株式会社島津製作所 | 質量分析用検出装置及び質量分析装置 |
CN116321655B (zh) * | 2023-03-15 | 2024-01-30 | 瑞莱谱(杭州)医疗科技有限公司 | 一种封闭式离子源及其调试方法 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2653620A (en) * | 1949-01-04 | 1953-09-29 | Phillips Petroleum Co | Process and means for regulating the gas pressure in containers |
BE620641A (de) * | 1960-10-03 | 1900-01-01 | ||
US3638401A (en) * | 1969-03-24 | 1972-02-01 | Varian Associates | Vacuum connector for connecting replaceable evacuated devices to an evacuated system |
GB1237028A (en) * | 1969-04-28 | 1971-06-30 | Mullard Ltd | Ion source |
US3648047A (en) * | 1970-07-13 | 1972-03-07 | Perkin Elmer Corp | Sensitivity control for mass spectrometer |
US3942546A (en) * | 1972-10-27 | 1976-03-09 | Continental Oil Company | Corrosion monitoring and composition-analytical apparatus |
DE2361955A1 (de) * | 1973-12-13 | 1975-06-19 | Uranit Gmbh | Quadrupol-massenspektrometer |
US4023398A (en) * | 1975-03-03 | 1977-05-17 | John Barry French | Apparatus for analyzing trace components |
GB1571799A (en) * | 1975-12-15 | 1980-07-16 | Secr Defence | Detection of polar vapours |
DE2620391A1 (de) * | 1976-05-08 | 1977-11-10 | Berghaus Ionit Anstalt | Regeln des gasdrucks bei stromstarken glimmentladungen |
US4156814A (en) * | 1977-06-24 | 1979-05-29 | University Of Virginia | Apparatus for producing ions of thermally labile or nonvolatile solids |
DK234378A (da) * | 1978-05-26 | 1979-11-27 | Risoe Forsoegsanlaeg | Totrins separator til adskillelse af gas og eller dampformige stoffer med forskellige molekylevaegte |
US4241750A (en) * | 1978-11-27 | 1980-12-30 | Kabushiki Kaisha Cosmo Keiki | Pressure setting device |
US4213326A (en) * | 1979-02-14 | 1980-07-22 | The Upjohn Company | Sample supply device |
US4261698A (en) * | 1980-01-23 | 1981-04-14 | International Business Machines Corporation | Trace oxygen detector |
US4383171A (en) * | 1980-11-17 | 1983-05-10 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Particle analyzing method and apparatus |
-
1983
- 1983-03-04 US US06/472,257 patent/US4579144A/en not_active Expired - Lifetime
-
1984
- 1984-03-01 EP EP19880202519 patent/EP0311224B1/de not_active Expired - Lifetime
- 1984-03-01 DE DE8484301357T patent/DE3482349D1/de not_active Expired - Fee Related
- 1984-03-01 DE DE8888202519T patent/DE3485376D1/de not_active Expired - Fee Related
- 1984-03-01 DE DE8888202520T patent/DE3484602D1/de not_active Expired - Fee Related
- 1984-03-01 EP EP19840301357 patent/EP0122006B1/de not_active Expired - Lifetime
- 1984-03-01 EP EP19880202520 patent/EP0310210B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0122006B1 (de) | 1990-05-23 |
EP0310210A1 (de) | 1989-04-05 |
EP0311224A1 (de) | 1989-04-12 |
EP0310210B1 (de) | 1991-05-15 |
EP0122006A3 (en) | 1987-01-21 |
DE3482349D1 (de) | 1990-06-28 |
US4579144A (en) | 1986-04-01 |
DE3485376D1 (de) | 1992-01-30 |
EP0122006A2 (de) | 1984-10-17 |
EP0311224B1 (de) | 1991-12-18 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Free format text: DRES. WESER UND MARTIN, 81245 MUENCHEN |
|
8328 | Change in the person/name/address of the agent |
Free format text: WESER & KOLLEGEN, 81245 MUENCHEN |
|
8339 | Ceased/non-payment of the annual fee |