DE3381543D1 - Verfahren zur erkennung von kuegelchen-mustern. - Google Patents

Verfahren zur erkennung von kuegelchen-mustern.

Info

Publication number
DE3381543D1
DE3381543D1 DE8383109392T DE3381543T DE3381543D1 DE 3381543 D1 DE3381543 D1 DE 3381543D1 DE 8383109392 T DE8383109392 T DE 8383109392T DE 3381543 T DE3381543 T DE 3381543T DE 3381543 D1 DE3381543 D1 DE 3381543D1
Authority
DE
Germany
Prior art keywords
detecting ball
ball patterns
patterns
detecting
ball
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8383109392T
Other languages
English (en)
Inventor
Takayuki Ozaki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Application granted granted Critical
Publication of DE3381543D1 publication Critical patent/DE3381543D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67271—Sorting devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005—Apparatus not specifically provided for elsewhere
    • H01L21/67242—Apparatus for monitoring, sorting or marking
    • H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/544—Marks applied to semiconductor devices or parts, e.g. registration marks, alignment structures, wafer maps
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001—Technical content checked by a classifier
    • H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Die Bonding (AREA)
DE8383109392T 1982-09-22 1983-09-21 Verfahren zur erkennung von kuegelchen-mustern. Expired - Lifetime DE3381543D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57163827A JPH0722166B2 (ja) 1982-09-22 1982-09-22 ダイボンダ等におけるペレツト認識方法

Publications (1)

Publication Number Publication Date
DE3381543D1 true DE3381543D1 (de) 1990-06-13

Family

ID=15781489

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8383109392T Expired - Lifetime DE3381543D1 (de) 1982-09-22 1983-09-21 Verfahren zur erkennung von kuegelchen-mustern.

Country Status (4)

Country Link
US (1) US4543659A (de)
EP (1) EP0108893B1 (de)
JP (1) JPH0722166B2 (de)
DE (1) DE3381543D1 (de)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60200379A (ja) * 1984-03-26 1985-10-09 Hitachi Ltd 画像処理用セグメンテ−シヨン装置
JPH0810709B2 (ja) * 1985-06-20 1996-01-31 ロ−ム株式会社 ペレツトピツクアツプ方法および装置
CH670211A5 (de) * 1986-06-25 1989-05-31 Lasarray Holding Ag
JPS6387832U (de) * 1986-11-26 1988-06-08
DE3728818A1 (de) * 1987-08-28 1989-03-16 Muet Gmbh Anordnung zum ermitteln und beseitigen von fertigungsfehlern einer elektrischen baugruppe
JPH01284743A (ja) * 1988-05-10 1989-11-16 Toshiba Corp 半導体装置の樹脂モールドの外観検査方法とその検査装置
US4975863A (en) * 1988-06-16 1990-12-04 Louisiana State University And Agricultural And Mechanical College System and process for grain examination
JPH0821601B2 (ja) * 1988-12-26 1996-03-04 株式会社東芝 半導体ペレットのダイボンディング方法
US4945766A (en) * 1989-09-08 1990-08-07 General Motors Corporation Method and apparatus for ultrasonic inspection
JPH06105741B2 (ja) * 1989-11-24 1994-12-21 株式会社東芝 インナーリードボンディング検査方法
US5086477A (en) * 1990-08-07 1992-02-04 Northwest Technology Corp. Automated system for extracting design and layout information from an integrated circuit
US5279669A (en) * 1991-12-13 1994-01-18 International Business Machines Corporation Plasma reactor for processing substrates comprising means for inducing electron cyclotron resonance (ECR) and ion cyclotron resonance (ICR) conditions
JP2804178B2 (ja) * 1994-04-18 1998-09-24 マイクロン、テクノロジー、インコーポレーテッド 電子ダイを部品パッケージ内に自動的に位置決めするための方法及び装置
JP3298795B2 (ja) * 1996-07-16 2002-07-08 株式会社新川 リードフレームの搬送データ設定方法
JP2000068296A (ja) * 1998-08-19 2000-03-03 Nichiden Mach Ltd ダイボンダ
US6730998B1 (en) 2000-02-10 2004-05-04 Micron Technology, Inc. Stereolithographic method for fabricating heat sinks, stereolithographically fabricated heat sinks, and semiconductor devices including same
US6426552B1 (en) * 2000-05-19 2002-07-30 Micron Technology, Inc. Methods employing hybrid adhesive materials to secure components of semiconductor device assemblies and packages to one another and assemblies and packages including components secured to one another with such hybrid adhesive materials
US6432752B1 (en) * 2000-08-17 2002-08-13 Micron Technology, Inc. Stereolithographic methods for fabricating hermetic semiconductor device packages and semiconductor devices including stereolithographically fabricated hermetic packages
SG97164A1 (en) 2000-09-21 2003-07-18 Micron Technology Inc Individual selective rework of defective bga solder balls
US20040164461A1 (en) * 2002-11-11 2004-08-26 Ahmad Syed Sajid Programmed material consolidation systems including multiple fabrication sites and associated methods
US7216009B2 (en) * 2004-06-14 2007-05-08 Micron Technology, Inc. Machine vision systems for use with programmable material consolidation system and associated methods and structures
US8000826B2 (en) * 2006-01-24 2011-08-16 Synopsys, Inc. Predicting IC manufacturing yield by considering both systematic and random intra-die process variations
JP4777923B2 (ja) * 2007-03-05 2011-09-21 カヤバ工業株式会社 緩衝器のバルブ構造
JP5789436B2 (ja) * 2011-07-13 2015-10-07 ファスフォードテクノロジ株式会社 ダイボンダ
JP5797492B2 (ja) * 2011-08-18 2015-10-21 キヤノンマシナリー株式会社 ボンディング方法およびボンディング装置
CN104900558A (zh) * 2015-05-21 2015-09-09 佛山市蓝箭电子股份有限公司 一种芯片图像识别装置和方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3617744A (en) * 1969-07-01 1971-11-02 Bell Telephone Labor Inc Method and apparatus for circuit module testing by comparison of a fluorescent image with a standard pattern
US3909602A (en) * 1973-09-27 1975-09-30 California Inst Of Techn Automatic visual inspection system for microelectronics
JPS52140278A (en) * 1976-05-19 1977-11-22 Hitachi Ltd Position detector
JPS54158874A (en) * 1978-06-06 1979-12-15 Matsushita Electronics Corp Dies bonding unit
JPS5768042A (en) * 1980-10-15 1982-04-26 Hitachi Ltd Pellet pickup method
JPS5944778B2 (ja) * 1980-11-29 1984-11-01 日本電気ホームエレクトロニクス株式会社 半導体ペレツト外観検査方法
US4496056A (en) * 1982-03-25 1985-01-29 General Electric Company Automated inspection system

Also Published As

Publication number Publication date
EP0108893A2 (de) 1984-05-23
JPS5954236A (ja) 1984-03-29
US4543659A (en) 1985-09-24
EP0108893A3 (en) 1987-06-03
JPH0722166B2 (ja) 1995-03-08
EP0108893B1 (de) 1990-05-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee