DE3277790D1 - Process for producing a semiconductor device using a diffusion step - Google Patents
Process for producing a semiconductor device using a diffusion stepInfo
- Publication number
- DE3277790D1 DE3277790D1 DE8282300792T DE3277790T DE3277790D1 DE 3277790 D1 DE3277790 D1 DE 3277790D1 DE 8282300792 T DE8282300792 T DE 8282300792T DE 3277790 T DE3277790 T DE 3277790T DE 3277790 D1 DE3277790 D1 DE 3277790D1
- Authority
- DE
- Germany
- Prior art keywords
- producing
- semiconductor device
- diffusion step
- diffusion
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H10W15/00—
-
- H10P32/15—
-
- H10P34/42—
-
- H10W15/01—
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/092—Laser beam processing-diodes or transistor
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/093—Laser beam treatment in general
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56022005A JPS57136342A (en) | 1981-02-17 | 1981-02-17 | Manufacture of semiconductor device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE3277790D1 true DE3277790D1 (en) | 1988-01-14 |
Family
ID=12070884
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE8282300792T Expired DE3277790D1 (en) | 1981-02-17 | 1982-02-17 | Process for producing a semiconductor device using a diffusion step |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4403400A (enExample) |
| EP (1) | EP0058566B1 (enExample) |
| JP (1) | JPS57136342A (enExample) |
| DE (1) | DE3277790D1 (enExample) |
Families Citing this family (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58194799A (ja) * | 1982-05-07 | 1983-11-12 | Hitachi Ltd | 単結晶シリコンの製造方法 |
| JPS59188935A (ja) * | 1983-04-12 | 1984-10-26 | Nec Corp | 誘電体分離型半導体装置及びその製造方法 |
| NL188923C (nl) * | 1983-07-05 | 1992-11-02 | Philips Nv | Werkwijze ter vervaardiging van een halfgeleiderinrichting. |
| US4610730A (en) * | 1984-12-20 | 1986-09-09 | Trw Inc. | Fabrication process for bipolar devices |
| US5250388A (en) * | 1988-05-31 | 1993-10-05 | Westinghouse Electric Corp. | Production of highly conductive polymers for electronic circuits |
| US5306939A (en) * | 1990-04-05 | 1994-04-26 | Seh America | Epitaxial silicon wafers for CMOS integrated circuits |
| US5702973A (en) * | 1990-04-05 | 1997-12-30 | Seh America, Inc. | Method for forming epitaxial semiconductor wafer for CMOS integrated circuits |
| DE4315959C2 (de) * | 1993-05-12 | 1997-09-11 | Max Planck Gesellschaft | Verfahren zur Herstellung einer strukturierten Schicht eines Halbleitermaterials sowie einer Dotierungsstruktur in einem Halbleitermaterial unter Einwirkung von Laserstrahlung |
| DE4331937A1 (de) * | 1993-09-16 | 1994-03-17 | Ulrich Prof Dr Mohr | Verfahren zur Eindiffusion von Dotanten in Halbleiterfestkörper |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1373822A (fr) * | 1963-08-21 | 1964-10-02 | Europ Des Semiconducteurs Soc | Procédé de réalisation de diffusion localisée d'une impureté dans un semiconducteur |
| US4170501A (en) * | 1978-02-15 | 1979-10-09 | Rca Corporation | Method of making a semiconductor integrated circuit device utilizing simultaneous outdiffusion and autodoping during epitaxial deposition |
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1981
- 1981-02-17 JP JP56022005A patent/JPS57136342A/ja active Granted
-
1982
- 1982-02-10 US US06/347,586 patent/US4403400A/en not_active Expired - Fee Related
- 1982-02-17 DE DE8282300792T patent/DE3277790D1/de not_active Expired
- 1982-02-17 EP EP82300792A patent/EP0058566B1/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| EP0058566A2 (en) | 1982-08-25 |
| JPS57136342A (en) | 1982-08-23 |
| JPS632134B2 (enExample) | 1988-01-18 |
| US4403400A (en) | 1983-09-13 |
| EP0058566A3 (en) | 1986-01-29 |
| EP0058566B1 (en) | 1987-12-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8339 | Ceased/non-payment of the annual fee |