DE3274389D1 - Method and device for the selection of highly reliable integrated circuits - Google Patents

Method and device for the selection of highly reliable integrated circuits

Info

Publication number
DE3274389D1
DE3274389D1 DE8282400795T DE3274389T DE3274389D1 DE 3274389 D1 DE3274389 D1 DE 3274389D1 DE 8282400795 T DE8282400795 T DE 8282400795T DE 3274389 T DE3274389 T DE 3274389T DE 3274389 D1 DE3274389 D1 DE 3274389D1
Authority
DE
Germany
Prior art keywords
selection
integrated circuits
highly reliable
reliable integrated
highly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8282400795T
Other languages
German (de)
English (en)
Inventor
Stephane Charruau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Application granted granted Critical
Publication of DE3274389D1 publication Critical patent/DE3274389D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
DE8282400795T 1981-05-15 1982-04-30 Method and device for the selection of highly reliable integrated circuits Expired DE3274389D1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8109757A FR2506045A1 (fr) 1981-05-15 1981-05-15 Procede et dispositif de selection de circuits integres a haute fiabilite

Publications (1)

Publication Number Publication Date
DE3274389D1 true DE3274389D1 (en) 1987-01-08

Family

ID=9258527

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8282400795T Expired DE3274389D1 (en) 1981-05-15 1982-04-30 Method and device for the selection of highly reliable integrated circuits

Country Status (5)

Country Link
US (1) US4495622A (enExample)
EP (1) EP0065445B1 (enExample)
JP (1) JPS57203976A (enExample)
DE (1) DE3274389D1 (enExample)
FR (1) FR2506045A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5493572A (en) * 1981-04-17 1996-02-20 Hitachi, Ltd. Semiconductor integrated circuit with voltage limiter having different output ranges for normal operation and performing of aging tests
JPS59111514A (ja) * 1982-12-17 1984-06-27 Hitachi Ltd 半導体集積回路
USRE35313E (en) * 1981-04-17 1996-08-13 Hitachi, Ltd. Semiconductor integrated circuit with voltage limiter having different output ranges from normal operation and performing of aging tests
US5566185A (en) * 1982-04-14 1996-10-15 Hitachi, Ltd. Semiconductor integrated circuit
US4617642A (en) * 1982-05-06 1986-10-14 Data General Corporation Select switch responsive to a break code
US4639919A (en) * 1983-12-19 1987-01-27 International Business Machines Corporation Distributed pattern generator
FR2570232A1 (fr) * 1984-09-11 1986-03-14 Thomson Csf Dispositif de traduction de sequence de test en sequence de rodage pour circuit logique et/ou numerique, procede de rodage de circuit logique et/ou numerique et dispositif de rodage de circuit logique et/ou numerique
US4706208A (en) * 1985-09-03 1987-11-10 American Telephone And Telegraph Company, At&T Bell Laboratories Technique for the operational life test of microprocessors
US5115437A (en) * 1990-03-02 1992-05-19 General Electric Company Internal test circuitry for integrated circuits using token passing to select testing ports
US5761214A (en) * 1992-10-16 1998-06-02 International Business Machines Corporation Method for testing integrated circuit devices
GB2276010B (en) * 1993-03-03 1997-01-22 Gec Ferranti Defence Syst Electrical circuit
US5925145A (en) * 1997-04-28 1999-07-20 Credence Systems Corporation Integrated circuit tester with cached vector memories
DE102013205420B4 (de) 2013-03-27 2016-12-15 Siemens Healthcare Gmbh Hochfrequenzleistungsverstärker

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3742254A (en) * 1971-01-27 1973-06-26 Texas Instruments Inc Automatic mos grounding circuit
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
FR2330014A1 (fr) * 1973-05-11 1977-05-27 Ibm France Procede de test de bloc de circuits logiques integres et blocs en faisant application
GB1502184A (en) * 1974-07-05 1978-02-22 Sperry Rand Corp Automatic flight control systems
US3969618A (en) * 1974-11-29 1976-07-13 Xerox Corporation On line PROM handling system
US4102491A (en) * 1975-12-23 1978-07-25 Instrumentation Engineering, Inc. Variable function digital word generating, receiving and monitoring device
JPS53124984A (en) * 1977-04-07 1978-10-31 Mitsubishi Electric Corp Burn-in system
US4195769A (en) * 1978-06-12 1980-04-01 Honeywell Inc. Method and apparatus for fault-testing of electrical system monitor communication circuits
US4363124A (en) * 1980-06-26 1982-12-07 International Business Machines Corp. Recirculating loop memory array tester
US4402055A (en) * 1981-01-27 1983-08-30 Westinghouse Electric Corp. Automatic test system utilizing interchangeable test devices
US4397021A (en) * 1981-06-15 1983-08-02 Westinghouse Electric Corp. Multi-processor automatic test system

Also Published As

Publication number Publication date
EP0065445B1 (fr) 1986-11-20
JPS57203976A (en) 1982-12-14
EP0065445A1 (fr) 1982-11-24
FR2506045B1 (enExample) 1984-09-28
FR2506045A1 (fr) 1982-11-19
US4495622A (en) 1985-01-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee