JPS57203976A - System selecting high-reliability integrated circuit - Google Patents

System selecting high-reliability integrated circuit

Info

Publication number
JPS57203976A
JPS57203976A JP57080315A JP8031582A JPS57203976A JP S57203976 A JPS57203976 A JP S57203976A JP 57080315 A JP57080315 A JP 57080315A JP 8031582 A JP8031582 A JP 8031582A JP S57203976 A JPS57203976 A JP S57203976A
Authority
JP
Japan
Prior art keywords
integrated circuit
selecting high
system selecting
reliability integrated
reliability
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP57080315A
Other languages
English (en)
Japanese (ja)
Inventor
Shiyaroo Sutefuan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Publication of JPS57203976A publication Critical patent/JPS57203976A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP57080315A 1981-05-15 1982-05-14 System selecting high-reliability integrated circuit Pending JPS57203976A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8109757A FR2506045A1 (fr) 1981-05-15 1981-05-15 Procede et dispositif de selection de circuits integres a haute fiabilite

Publications (1)

Publication Number Publication Date
JPS57203976A true JPS57203976A (en) 1982-12-14

Family

ID=9258527

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57080315A Pending JPS57203976A (en) 1981-05-15 1982-05-14 System selecting high-reliability integrated circuit

Country Status (5)

Country Link
US (1) US4495622A (enExample)
EP (1) EP0065445B1 (enExample)
JP (1) JPS57203976A (enExample)
DE (1) DE3274389D1 (enExample)
FR (1) FR2506045A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59111514A (ja) * 1982-12-17 1984-06-27 Hitachi Ltd 半導体集積回路
USRE35313E (en) * 1981-04-17 1996-08-13 Hitachi, Ltd. Semiconductor integrated circuit with voltage limiter having different output ranges from normal operation and performing of aging tests
US5493572A (en) * 1981-04-17 1996-02-20 Hitachi, Ltd. Semiconductor integrated circuit with voltage limiter having different output ranges for normal operation and performing of aging tests
US5566185A (en) * 1982-04-14 1996-10-15 Hitachi, Ltd. Semiconductor integrated circuit
US4617642A (en) * 1982-05-06 1986-10-14 Data General Corporation Select switch responsive to a break code
US4639919A (en) * 1983-12-19 1987-01-27 International Business Machines Corporation Distributed pattern generator
FR2570232A1 (fr) * 1984-09-11 1986-03-14 Thomson Csf Dispositif de traduction de sequence de test en sequence de rodage pour circuit logique et/ou numerique, procede de rodage de circuit logique et/ou numerique et dispositif de rodage de circuit logique et/ou numerique
US4706208A (en) * 1985-09-03 1987-11-10 American Telephone And Telegraph Company, At&T Bell Laboratories Technique for the operational life test of microprocessors
US5115437A (en) * 1990-03-02 1992-05-19 General Electric Company Internal test circuitry for integrated circuits using token passing to select testing ports
US5761214A (en) * 1992-10-16 1998-06-02 International Business Machines Corporation Method for testing integrated circuit devices
GB2276010B (en) * 1993-03-03 1997-01-22 Gec Ferranti Defence Syst Electrical circuit
US5925145A (en) * 1997-04-28 1999-07-20 Credence Systems Corporation Integrated circuit tester with cached vector memories
DE102013205420B4 (de) * 2013-03-27 2016-12-15 Siemens Healthcare Gmbh Hochfrequenzleistungsverstärker

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53124984A (en) * 1977-04-07 1978-10-31 Mitsubishi Electric Corp Burn-in system

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3742254A (en) * 1971-01-27 1973-06-26 Texas Instruments Inc Automatic mos grounding circuit
US3789205A (en) * 1972-09-28 1974-01-29 Ibm Method of testing mosfet planar boards
FR2330014A1 (fr) * 1973-05-11 1977-05-27 Ibm France Procede de test de bloc de circuits logiques integres et blocs en faisant application
GB1502184A (en) * 1974-07-05 1978-02-22 Sperry Rand Corp Automatic flight control systems
US3969618A (en) * 1974-11-29 1976-07-13 Xerox Corporation On line PROM handling system
US4102491A (en) * 1975-12-23 1978-07-25 Instrumentation Engineering, Inc. Variable function digital word generating, receiving and monitoring device
US4195769A (en) * 1978-06-12 1980-04-01 Honeywell Inc. Method and apparatus for fault-testing of electrical system monitor communication circuits
US4363124A (en) * 1980-06-26 1982-12-07 International Business Machines Corp. Recirculating loop memory array tester
US4402055A (en) * 1981-01-27 1983-08-30 Westinghouse Electric Corp. Automatic test system utilizing interchangeable test devices
US4397021A (en) * 1981-06-15 1983-08-02 Westinghouse Electric Corp. Multi-processor automatic test system

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53124984A (en) * 1977-04-07 1978-10-31 Mitsubishi Electric Corp Burn-in system

Also Published As

Publication number Publication date
FR2506045B1 (enExample) 1984-09-28
EP0065445A1 (fr) 1982-11-24
FR2506045A1 (fr) 1982-11-19
DE3274389D1 (en) 1987-01-08
EP0065445B1 (fr) 1986-11-20
US4495622A (en) 1985-01-22

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