DE2967450D1 - Read-only memory with field effect transistors having variable conductance value channels - Google Patents

Read-only memory with field effect transistors having variable conductance value channels

Info

Publication number
DE2967450D1
DE2967450D1 DE7979901649T DE2967450T DE2967450D1 DE 2967450 D1 DE2967450 D1 DE 2967450D1 DE 7979901649 T DE7979901649 T DE 7979901649T DE 2967450 T DE2967450 T DE 2967450T DE 2967450 D1 DE2967450 D1 DE 2967450D1
Authority
DE
Germany
Prior art keywords
read
memory
field effect
effect transistors
conductance value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE7979901649T
Other languages
English (en)
Inventor
Donald Gregory Craycraft
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NCR Voyix Corp
Original Assignee
NCR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NCR Corp filed Critical NCR Corp
Application granted granted Critical
Publication of DE2967450D1 publication Critical patent/DE2967450D1/de
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B20/00—Read-only memory [ROM] devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5692—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency read-only digital stores using storage elements with more than two stable states
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/08—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements
    • G11C17/10—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM
    • G11C17/12—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards using semiconductor devices, e.g. bipolar elements in which contents are determined during manufacturing by a predetermined arrangement of coupling elements, e.g. mask-programmable ROM using field-effect devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
DE7979901649T 1978-11-20 1979-11-16 Read-only memory with field effect transistors having variable conductance value channels Expired DE2967450D1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US05/962,572 US4192014A (en) 1978-11-20 1978-11-20 ROM memory cell with 2n FET channel widths
PCT/US1979/000989 WO1980001119A1 (en) 1978-11-20 1979-11-16 Rom memory cell with 2n fet channel widths

Publications (1)

Publication Number Publication Date
DE2967450D1 true DE2967450D1 (en) 1985-06-20

Family

ID=25506083

Family Applications (1)

Application Number Title Priority Date Filing Date
DE7979901649T Expired DE2967450D1 (en) 1978-11-20 1979-11-16 Read-only memory with field effect transistors having variable conductance value channels

Country Status (5)

Country Link
US (1) US4192014A (de)
EP (1) EP0020648B1 (de)
JP (1) JPS55500925A (de)
DE (1) DE2967450D1 (de)
WO (1) WO1980001119A1 (de)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE32401E (en) * 1978-06-13 1987-04-14 International Business Machines Corporation Quaternary FET read only memory
US4287570A (en) * 1979-06-01 1981-09-01 Intel Corporation Multiple bit read-only memory cell and its sense amplifier
JPS56156993A (en) * 1980-05-08 1981-12-03 Fujitsu Ltd Read only memory
US4327424A (en) * 1980-07-17 1982-04-27 International Business Machines Corporation Read-only storage using enhancement-mode, depletion-mode or omitted gate field-effect transistors
JPS5856199B2 (ja) * 1980-09-25 1983-12-13 株式会社東芝 半導体記憶装置
US4410904A (en) * 1980-10-20 1983-10-18 American Microsystems, Inc. Notched cell ROM
WO1982002276A1 (en) * 1980-12-24 1982-07-08 Jiang Ching Lin Multi-bit read only memory cell sensing circuit
CA1167963A (en) * 1980-12-24 1984-05-22 Mostek Corporation Multi-bit read only memory cell sensing circuit
US4404655A (en) * 1981-01-28 1983-09-13 General Instrument Corporation Data sense apparatus for use in multi-threshold read only memory
US4415992A (en) * 1981-02-25 1983-11-15 Motorola, Inc. Memory system having memory cells capable of storing more than two states
EP0072846A1 (de) * 1981-02-25 1983-03-02 Motorola, Inc. Speicherzelle mit mehr als zwei spannungsebenen
US4412143A (en) * 1981-03-26 1983-10-25 Ncr Corporation MOS Sense amplifier
JPS583192A (ja) * 1981-06-30 1983-01-08 Fujitsu Ltd 読み出し専用メモリ
US4388702A (en) * 1981-08-21 1983-06-14 Mostek Corporation Multi-bit read only memory circuit
US4462088A (en) * 1981-11-03 1984-07-24 International Business Machines Corporation Array design using a four state cell for double density
US4495602A (en) * 1981-12-28 1985-01-22 Mostek Corporation Multi-bit read only memory circuit
US4546453A (en) * 1982-06-22 1985-10-08 Motorola, Inc. Four-state ROM cell with increased differential between states
US4488065A (en) * 1982-08-16 1984-12-11 Ncr Corporation Sensing and logic for multiple bit per cell ROM
JPS59126315A (ja) * 1982-12-24 1984-07-20 Fujitsu Ltd 比較回路
JPS59148360A (ja) * 1983-02-14 1984-08-25 Fujitsu Ltd 半導体記憶装置及びその製造方法
EP0136119B1 (de) * 1983-09-16 1988-06-29 Fujitsu Limited Festwertspeicherschaltung mit Multi-Bitzellen
JPS60125998A (ja) * 1983-12-12 1985-07-05 Fujitsu Ltd 半導体記憶装置
US5239500A (en) * 1989-09-29 1993-08-24 Centre Suisse D'electronique Et De Microtechnique S.A. Process of storing analog quantities and device for the implementation thereof
US5218569A (en) 1991-02-08 1993-06-08 Banks Gerald J Electrically alterable non-volatile memory with n-bits per memory cell
US6002614A (en) * 1991-02-08 1999-12-14 Btg International Inc. Memory apparatus including programmable non-volatile multi-bit memory cell, and apparatus and method for demarcating memory states of the cell
JP3397427B2 (ja) * 1994-02-02 2003-04-14 株式会社東芝 半導体記憶装置
US6353554B1 (en) 1995-02-27 2002-03-05 Btg International Inc. Memory apparatus including programmable non-volatile multi-bit memory cell, and apparatus and method for demarcating memory states of the cell
US6857099B1 (en) * 1996-09-18 2005-02-15 Nippon Steel Corporation Multilevel semiconductor memory, write/read method thereto/therefrom and storage medium storing write/read program
JP2005243127A (ja) * 2004-02-25 2005-09-08 Sanyo Electric Co Ltd 紫外線消去型半導体メモリ装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3656117A (en) * 1971-02-05 1972-04-11 Ibm Ternary read-only memory
US4054864A (en) * 1973-05-04 1977-10-18 Commissariat A L'energie Atomique Method and device for the storage of analog signals
JPS5235536A (en) * 1975-09-13 1977-03-18 Toshiba Corp Memory using charge cobination element
JPS52106689A (en) * 1976-03-05 1977-09-07 Hitachi Ltd Preparation for semiconductor integrated circuit unit
JPS5846798B2 (ja) * 1976-12-27 1983-10-18 富士通株式会社 半導体記憶装置
US4202044A (en) * 1978-06-13 1980-05-06 International Business Machines Corporation Quaternary FET read only memory

Also Published As

Publication number Publication date
EP0020648A4 (de) 1982-03-03
EP0020648A1 (de) 1981-01-07
EP0020648B1 (de) 1985-05-15
JPS55500925A (de) 1980-11-06
US4192014A (en) 1980-03-04
WO1980001119A1 (en) 1980-05-29

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee