DE2966903D1 - Digital tester - Google Patents

Digital tester

Info

Publication number
DE2966903D1
DE2966903D1 DE8080900111T DE2966903T DE2966903D1 DE 2966903 D1 DE2966903 D1 DE 2966903D1 DE 8080900111 T DE8080900111 T DE 8080900111T DE 2966903 T DE2966903 T DE 2966903T DE 2966903 D1 DE2966903 D1 DE 2966903D1
Authority
DE
Germany
Prior art keywords
pseudorandom
test
data
analyzed
stream
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE8080900111T
Other languages
English (en)
Inventor
David S Bass
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sperry Corp
Original Assignee
Sperry Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sperry Corp filed Critical Sperry Corp
Application granted granted Critical
Publication of DE2966903D1 publication Critical patent/DE2966903D1/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/31813—Test pattern generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
DE8080900111T 1978-11-30 1979-11-26 Digital tester Expired DE2966903D1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US05/965,122 US4222514A (en) 1978-11-30 1978-11-30 Digital tester
PCT/US1979/001061 WO1980001207A1 (en) 1978-11-30 1979-11-26 Digital tester

Publications (1)

Publication Number Publication Date
DE2966903D1 true DE2966903D1 (en) 1984-05-17

Family

ID=25509484

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8080900111T Expired DE2966903D1 (en) 1978-11-30 1979-11-26 Digital tester

Country Status (8)

Country Link
US (1) US4222514A (de)
EP (1) EP0020714B1 (de)
BE (1) BE880263A (de)
DE (1) DE2966903D1 (de)
GB (2) GB2047413B (de)
IT (1) IT1120643B (de)
NO (1) NO152070C (de)
WO (1) WO1980001207A1 (de)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4383312A (en) * 1980-11-28 1983-05-10 The United States Of America As Represented By The Secretary Of The Navy Multiplex system tester
FR2501867A1 (fr) * 1981-03-11 1982-09-17 Commissariat Energie Atomique Systeme de test de la defaillance ou du bon fonctionnement d'un circuit a composants logiques
DE3400035A1 (de) * 1983-01-07 1984-07-12 General Electric Co., Schenectady, N.Y. Simulator fuer statistisches rauschen
FR2563392B1 (fr) * 1984-04-19 1986-06-06 Loire Electronique Generateur pseudo-aleatoire
US4715034A (en) * 1985-03-04 1987-12-22 John Fluke Mfg. Co., Inc. Method of and system for fast functional testing of random access memories
US4771429A (en) * 1986-09-18 1988-09-13 Abbott Laboratories Circuit combining functions of cyclic redundancy check code and pseudo-random number generators
US4855681A (en) * 1987-06-08 1989-08-08 International Business Machines Corporation Timing generator for generating a multiplicty of timing signals having selectable pulse positions
US4870346A (en) * 1987-09-14 1989-09-26 Texas Instruments Incorporated Distributed pseudo random sequence control with universal polynomial function generator for LSI/VLSI test systems
US5260950A (en) * 1991-09-17 1993-11-09 Ncr Corporation Boundary-scan input circuit for a reset pin
US5357523A (en) * 1991-12-18 1994-10-18 International Business Machines Corporation Memory testing system with algorithmic test data generation
US6185707B1 (en) * 1998-11-13 2001-02-06 Knights Technology, Inc. IC test software system for mapping logical functional test data of logic integrated circuits to physical representation
GB2362718B (en) * 2000-05-24 2002-04-17 3Com Corp Method and apparatus for inducing locally elevated temperatures in an application specific integrated circuit
GB2377142A (en) * 2001-06-29 2002-12-31 Motorola Inc Encoder for generating an error checkword
KR20080019078A (ko) * 2006-08-22 2008-03-03 삼성전자주식회사 순환 중복 검사를 이용한 테스트 방법 및 이를 이용하는디지털 장치
CN114076883B (zh) * 2021-11-10 2023-09-05 北京中电华大电子设计有限责任公司 老化电路、芯片老化测试方法及芯片

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3651315A (en) * 1970-05-14 1972-03-21 Collins Radio Co Digital products inspection system
US3832535A (en) * 1972-10-25 1974-08-27 Instrumentation Engineering Digital word generating and receiving apparatus
US3924181A (en) * 1973-10-16 1975-12-02 Hughes Aircraft Co Test circuitry employing a cyclic code generator
US3976864A (en) * 1974-09-03 1976-08-24 Hewlett-Packard Company Apparatus and method for testing digital circuits
NO141294C (no) * 1974-10-31 1980-02-06 Licentia Gmbh Fremgangsmaate ved frembringelse av slumpartede binaertegnfoelger
US4045662A (en) * 1976-03-29 1977-08-30 The Bendix Corporation Self testing monitoring apparatus for multiplexed digital input signals
US4070565A (en) * 1976-08-18 1978-01-24 Zehntel, Inc. Programmable tester method and apparatus
US4142239A (en) * 1977-06-29 1979-02-27 The United States Of America As Represented By The Secretary Of The Army Apparatus for generating digital streams having variable probabilities of error
US4125763A (en) * 1977-07-15 1978-11-14 Fluke Trendar Corporation Automatic tester for microprocessor board

Also Published As

Publication number Publication date
EP0020714B1 (de) 1984-04-11
NO152070C (no) 1985-07-24
EP0020714A4 (de) 1981-08-31
US4222514A (en) 1980-09-16
IT1120643B (it) 1986-03-26
NO152070B (no) 1985-04-15
IT7950932A0 (it) 1979-11-28
GB2100485B (en) 1983-06-08
GB2047413A (en) 1980-11-26
GB2100485A (en) 1982-12-22
WO1980001207A1 (en) 1980-06-12
EP0020714A1 (de) 1981-01-07
NO793899L (no) 1980-06-02
GB2047413B (en) 1983-03-09
BE880263A (fr) 1980-03-17

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Legal Events

Date Code Title Description
8339 Ceased/non-payment of the annual fee