DE29520929U1 - Winkelmeß-Einrichtung zu einem Meßmikroskop - Google Patents
Winkelmeß-Einrichtung zu einem MeßmikroskopInfo
- Publication number
- DE29520929U1 DE29520929U1 DE29520929U DE29520929U DE29520929U1 DE 29520929 U1 DE29520929 U1 DE 29520929U1 DE 29520929 U DE29520929 U DE 29520929U DE 29520929 U DE29520929 U DE 29520929U DE 29520929 U1 DE29520929 U1 DE 29520929U1
- Authority
- DE
- Germany
- Prior art keywords
- measuring
- microscope
- angle
- measuring device
- angle measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/04—Measuring microscopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/24—Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE29520929U DE29520929U1 (de) | 1994-10-05 | 1995-01-09 | Winkelmeß-Einrichtung zu einem Meßmikroskop |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4435254 | 1994-10-05 | ||
DE19500355A DE19500355A1 (de) | 1994-10-05 | 1995-01-09 | Winkelmeß-Einrichtung zu einem Meßmikroskop |
DE29520929U DE29520929U1 (de) | 1994-10-05 | 1995-01-09 | Winkelmeß-Einrichtung zu einem Meßmikroskop |
Publications (1)
Publication Number | Publication Date |
---|---|
DE29520929U1 true DE29520929U1 (de) | 1996-05-15 |
Family
ID=25940693
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE29520929U Expired - Lifetime DE29520929U1 (de) | 1994-10-05 | 1995-01-09 | Winkelmeß-Einrichtung zu einem Meßmikroskop |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPH08210807A (de) |
DE (1) | DE29520929U1 (de) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102426008B (zh) * | 2011-11-17 | 2013-05-01 | 四川红光汽车机电有限公司 | Ccd测角装置 |
CN109099868B (zh) * | 2018-06-29 | 2020-08-18 | 安徽益佳通电池有限公司 | 一种动力电池模组钢带长度测量装置 |
-
1995
- 1995-01-09 DE DE29520929U patent/DE29520929U1/de not_active Expired - Lifetime
- 1995-10-05 JP JP28454295A patent/JPH08210807A/ja active Pending
Also Published As
Publication number | Publication date |
---|---|
JPH08210807A (ja) | 1996-08-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
R207 | Utility model specification |
Effective date: 19960627 |
|
R150 | Term of protection extended to 6 years |
Effective date: 19980203 |
|
R151 | Term of protection extended to 8 years |
Effective date: 20010207 |
|
R158 | Lapse of ip right after 8 years |
Effective date: 20030801 |