DE2454814A1 - Photodensitometer - Google Patents
PhotodensitometerInfo
- Publication number
- DE2454814A1 DE2454814A1 DE19742454814 DE2454814A DE2454814A1 DE 2454814 A1 DE2454814 A1 DE 2454814A1 DE 19742454814 DE19742454814 DE 19742454814 DE 2454814 A DE2454814 A DE 2454814A DE 2454814 A1 DE2454814 A1 DE 2454814A1
- Authority
- DE
- Germany
- Prior art keywords
- signal
- flip
- present
- photodensitometer
- image signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000000034 method Methods 0.000 claims description 19
- 230000001960 triggered effect Effects 0.000 claims 3
- 230000006870 function Effects 0.000 claims 1
- 230000003287 optical effect Effects 0.000 description 7
- 238000005259 measurement Methods 0.000 description 6
- 239000003990 capacitor Substances 0.000 description 3
- 230000000630 rising effect Effects 0.000 description 3
- 238000005070 sampling Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000011330 nucleic acid test Methods 0.000 description 2
- 101001055222 Homo sapiens Interleukin-8 Proteins 0.000 description 1
- 102100026236 Interleukin-8 Human genes 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000001093 holography Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP48130729A JPS5081577A (OSRAM) | 1973-11-22 | 1973-11-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2454814A1 true DE2454814A1 (de) | 1975-06-12 |
Family
ID=15041223
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19742454814 Withdrawn DE2454814A1 (de) | 1973-11-22 | 1974-11-19 | Photodensitometer |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US3967903A (OSRAM) |
| JP (1) | JPS5081577A (OSRAM) |
| DE (1) | DE2454814A1 (OSRAM) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4141038A (en) * | 1977-02-14 | 1979-02-20 | Zygo Corporation | Apparatus and method for quantifying irregularities in interference patterns |
| US4169980A (en) * | 1977-04-19 | 1979-10-02 | Zygo Corporation | Method and apparatus for interference fringe center sensing |
| US4159522A (en) * | 1977-05-12 | 1979-06-26 | Zanoni Carl A | Apparatus and method for measuring interference patterns and interferograms |
| DE3020022A1 (de) | 1980-05-24 | 1981-12-03 | Ibm Deutschland Gmbh, 7000 Stuttgart | Verfahren und einrichtung zur pruefung optischer abbildungssysteme |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3549870A (en) * | 1967-04-07 | 1970-12-22 | Atomic Energy Commission | System for computing and continuously displaying increments of movement of an object in useable units of measure |
| US3527537A (en) * | 1968-02-09 | 1970-09-08 | Itek Corp | Automatic correlating interferometer |
| US3644046A (en) * | 1969-04-02 | 1972-02-22 | Owens Illinois Inc | Method and apparatus for measuring interferometer fringe patterns |
| US3578980A (en) * | 1969-06-18 | 1971-05-18 | Comstock & Wescott | Spectral analysis using masks having different combinations of transmitting and non-transmitting portions |
| JPS4936269B1 (OSRAM) * | 1969-09-10 | 1974-09-28 | ||
| US3661464A (en) * | 1970-03-16 | 1972-05-09 | Jorway Corp | Optical interferometer |
| US3771875A (en) * | 1971-11-15 | 1973-11-13 | Perkin Elmer Corp | Interferometer having d.c. level compensation |
-
1973
- 1973-11-22 JP JP48130729A patent/JPS5081577A/ja active Pending
-
1974
- 1974-11-18 US US05/524,808 patent/US3967903A/en not_active Expired - Lifetime
- 1974-11-19 DE DE19742454814 patent/DE2454814A1/de not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5081577A (OSRAM) | 1975-07-02 |
| US3967903A (en) | 1976-07-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OF | Willingness to grant licences before publication of examined application | ||
| 8141 | Disposal/no request for examination |