DE2402127C3 - Vorrichtung zur Messung des Glanzschleiers von Oberflächen - Google Patents

Vorrichtung zur Messung des Glanzschleiers von Oberflächen

Info

Publication number
DE2402127C3
DE2402127C3 DE2402127A DE2402127A DE2402127C3 DE 2402127 C3 DE2402127 C3 DE 2402127C3 DE 2402127 A DE2402127 A DE 2402127A DE 2402127 A DE2402127 A DE 2402127A DE 2402127 C3 DE2402127 C3 DE 2402127C3
Authority
DE
Germany
Prior art keywords
receiver
light
converging lens
measuring
optical system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2402127A
Other languages
German (de)
English (en)
Other versions
DE2402127B2 (de
DE2402127A1 (de
Inventor
Herwig Dr. Graz Horn (Oesterreich)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omya AG
Original Assignee
Pluess Staufer AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pluess Staufer AG filed Critical Pluess Staufer AG
Priority to DE2402127A priority Critical patent/DE2402127C3/de
Priority to CH588974A priority patent/CH566001A5/xx
Priority to AT440974A priority patent/AT354773B/de
Priority to US05/495,576 priority patent/US4072426A/en
Priority to FR7428612A priority patent/FR2258626B1/fr
Priority to JP12400574A priority patent/JPS546387B2/ja
Publication of DE2402127A1 publication Critical patent/DE2402127A1/de
Publication of DE2402127B2 publication Critical patent/DE2402127B2/de
Application granted granted Critical
Publication of DE2402127C3 publication Critical patent/DE2402127C3/de
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
DE2402127A 1974-01-17 1974-01-17 Vorrichtung zur Messung des Glanzschleiers von Oberflächen Expired DE2402127C3 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
DE2402127A DE2402127C3 (de) 1974-01-17 1974-01-17 Vorrichtung zur Messung des Glanzschleiers von Oberflächen
CH588974A CH566001A5 (US06331856-20011218-P00008.png) 1974-01-17 1974-04-30
AT440974A AT354773B (de) 1974-01-17 1974-05-28 Vorrichtung zur messung des optischen glanz- schleiers von anstrichs- und beschichtungs- oberflaechen
US05/495,576 US4072426A (en) 1974-01-17 1974-08-08 Method and apparatus for determining the reflective properties of surfaces, especially coated surfaces
FR7428612A FR2258626B1 (US06331856-20011218-P00008.png) 1974-01-17 1974-08-20
JP12400574A JPS546387B2 (US06331856-20011218-P00008.png) 1974-01-17 1974-10-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE2402127A DE2402127C3 (de) 1974-01-17 1974-01-17 Vorrichtung zur Messung des Glanzschleiers von Oberflächen

Publications (3)

Publication Number Publication Date
DE2402127A1 DE2402127A1 (de) 1975-07-24
DE2402127B2 DE2402127B2 (de) 1977-07-21
DE2402127C3 true DE2402127C3 (de) 1978-04-06

Family

ID=5905000

Family Applications (1)

Application Number Title Priority Date Filing Date
DE2402127A Expired DE2402127C3 (de) 1974-01-17 1974-01-17 Vorrichtung zur Messung des Glanzschleiers von Oberflächen

Country Status (6)

Country Link
US (1) US4072426A (US06331856-20011218-P00008.png)
JP (1) JPS546387B2 (US06331856-20011218-P00008.png)
AT (1) AT354773B (US06331856-20011218-P00008.png)
CH (1) CH566001A5 (US06331856-20011218-P00008.png)
DE (1) DE2402127C3 (US06331856-20011218-P00008.png)
FR (1) FR2258626B1 (US06331856-20011218-P00008.png)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2924241A1 (de) * 1979-06-15 1981-01-08 Basf Ag Goniophotometer zur messung des glanzes und/oder des glanzschleiers von oberflaechen
US4284356A (en) * 1979-09-26 1981-08-18 Ppg Industries, Inc. Method of and apparatus for comparing surface reflectivity
US4390277A (en) * 1980-07-31 1983-06-28 Mcdonnell Douglas Corporation Flat sheet scatterometer
US4498140A (en) * 1982-06-02 1985-02-05 Chesley F. Carlson Automated self calibrating exposure computer
EP0126613B1 (en) * 1983-05-17 1989-09-20 Sumitomo Heavy Industries, Ltd Method of an apparatus for measuring dampening water for printing machine
CA1216169A (en) * 1983-05-23 1987-01-06 Joseph A. Freilino Method of determining surface roughness using a visible and infrared laser source
JPS6117047A (ja) * 1984-02-29 1986-01-25 Suga Shikenki Kk 視感光沢度測定方法
US4715717A (en) * 1985-12-05 1987-12-29 The Dow Chemical Company Method for monitoring surface texture and quality for moving transparent film bodies
JPS62156277A (ja) * 1985-12-27 1987-07-11 Sumitomo Special Metals Co Ltd エツチング量評価方法
FI78355C (fi) * 1986-05-27 1989-07-10 Puumalaisen Tutkimuslaitos Oy Metod foer maetning av glans och apparatur foer tillaempning av metoden.
US4888983A (en) * 1988-04-20 1989-12-26 Basf Aktiengesellschaft Profilometry
EP0371643A3 (en) * 1988-11-23 1991-05-29 W.R. Grace & Co.-Conn. Improved method and apparatus for inspecting workpieces
US4945253A (en) * 1988-12-09 1990-07-31 Measurex Corporation Means of enhancing the sensitivity of a gloss sensor
US5066865A (en) * 1989-09-01 1991-11-19 Measurex Corporation Single sided reflectance sensor for measuring select physical properties of a material using one or more wavelengths of radiation
DE3929172A1 (de) * 1989-09-02 1991-03-07 Bayer Ag Vorrichtung zur bestimmung der groessenverteilung von pigmentkoernern in einer lackoberflaeche
US5196906A (en) * 1990-06-29 1993-03-23 Tma Technologies, Inc. Modular scatterometer with interchangeable scanning heads
US5387977A (en) * 1991-09-04 1995-02-07 X-Rite, Incorporated Multiangular color measuring apparatus
JPH06272866A (ja) * 1993-03-16 1994-09-27 Fuji Mc:Kk 複合型加熱装置
US6088104A (en) * 1994-12-02 2000-07-11 Veridian Erim International, Inc. Surface characterization apparatus
CN102012413B (zh) 2000-09-25 2012-11-21 松下电器产业株式会社 色层分析定量测量装置
DE10201075A1 (de) * 2002-01-14 2003-07-24 Basf Ag Verfahren und Vorrichtung zur Untersuchung des Weissanlaufens
US20050012939A1 (en) * 2003-07-15 2005-01-20 Snyder Donald M. Method and apparatus for quantifying the degree of fusion of a layer
CA2628090C (en) * 2005-11-07 2014-10-21 Cardinal Cg Company Method and apparatus for identifying photocatalytic coatings
ES2375386B1 (es) * 2010-07-21 2012-09-27 Abengoa Solar New Technologies, S.A. Reflectómetro portátil y método de caracterización de espejos de centrales termosolares.
FR2968402B1 (fr) * 2010-12-07 2013-02-15 Ecole Polytech Systeme et procede d'imagerie multitechniques pour l'analyse chimique, biologique ou biochimique d'un echantillon.
US20130003875A1 (en) * 2011-06-30 2013-01-03 Broadcom Corporation Powerline communication device with multiple plc interface(s)

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA466114A (en) * 1950-06-27 Boor Ladislav Glossmeter
GB156920A (en) * 1919-10-17 1921-01-17 Pilkington Brothers Ltd Improvements in pneumatic load-engaging means
US2378433A (en) * 1939-08-26 1945-06-19 Riszdorfer Laszlo Photoelectric exposure meter
US3229564A (en) * 1961-05-12 1966-01-18 Bausch & Lomb Reflectometer
US3310680A (en) * 1964-03-06 1967-03-21 Hasegawa Toshitsune Photosensitive concentration measuring apparatus for colloidal solutions
DE1548263C3 (de) * 1966-11-10 1975-05-22 Ernst Leitz Gmbh, 6330 Wetzlar Verfahren zur Bestimmung der Größe geometrischer Veränderungen oder Abweichungen einer reflektierenden Oberfläche von einer Solloberfläche mittels optischer Mittel
US3804521A (en) * 1972-02-22 1974-04-16 Itek Corp Optical device for measuring surface roughness
US3835315A (en) * 1972-12-06 1974-09-10 Us Commerce System for determining parameters of a particle by radiant energy scattering techniques
US3850526A (en) * 1973-03-16 1974-11-26 Atomic Energy Commission Optical method and system for measuring surface finish

Also Published As

Publication number Publication date
AT354773B (de) 1979-01-25
FR2258626B1 (US06331856-20011218-P00008.png) 1978-08-11
DE2402127B2 (de) 1977-07-21
ATA440974A (de) 1979-06-15
US4072426A (en) 1978-02-07
JPS546387B2 (US06331856-20011218-P00008.png) 1979-03-28
FR2258626A1 (US06331856-20011218-P00008.png) 1975-08-18
DE2402127A1 (de) 1975-07-24
CH566001A5 (US06331856-20011218-P00008.png) 1975-08-29
JPS50115083A (US06331856-20011218-P00008.png) 1975-09-09

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Legal Events

Date Code Title Description
C3 Grant after two publication steps (3rd publication)
8339 Ceased/non-payment of the annual fee