DE2156661A1 - Ablenkeinrichtung für einen aus geladenen Teilchen bestehenden Strahl - Google Patents
Ablenkeinrichtung für einen aus geladenen Teilchen bestehenden StrahlInfo
- Publication number
- DE2156661A1 DE2156661A1 DE19712156661 DE2156661A DE2156661A1 DE 2156661 A1 DE2156661 A1 DE 2156661A1 DE 19712156661 DE19712156661 DE 19712156661 DE 2156661 A DE2156661 A DE 2156661A DE 2156661 A1 DE2156661 A1 DE 2156661A1
- Authority
- DE
- Germany
- Prior art keywords
- control
- plates
- electrodes
- openings
- charged particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000002245 particle Substances 0.000 title claims description 21
- IHQKEDIOMGYHEB-UHFFFAOYSA-M sodium dimethylarsinate Chemical class [Na+].C[As](C)([O-])=O IHQKEDIOMGYHEB-UHFFFAOYSA-M 0.000 claims description 12
- 230000007423 decrease Effects 0.000 claims description 2
- 230000001133 acceleration Effects 0.000 claims 1
- 238000005192 partition Methods 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 description 16
- 238000000576 coating method Methods 0.000 description 6
- 230000000903 blocking effect Effects 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 3
- 150000002500 ions Chemical class 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005686 electrostatic field Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- YZCKVEUIGOORGS-NJFSPNSNSA-N Tritium Chemical compound [3H] YZCKVEUIGOORGS-NJFSPNSNSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000006880 cross-coupling reaction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 230000004043 responsiveness Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 229910052722 tritium Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J31/00—Cathode ray tubes; Electron beam tubes
- H01J31/08—Cathode ray tubes; Electron beam tubes having a screen on or from which an image or pattern is formed, picked up, converted, or stored
- H01J31/10—Image or pattern display tubes, i.e. having electrical input and optical output; Flying-spot tubes for scanning purposes
- H01J31/12—Image or pattern display tubes, i.e. having electrical input and optical output; Flying-spot tubes for scanning purposes with luminescent screen
- H01J31/123—Flat display tubes
- H01J31/125—Flat display tubes provided with control means permitting the electron beam to reach selected parts of the screen, e.g. digital selection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/467—Control electrodes for flat display tubes, e.g. of the type covered by group H01J31/123
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/04—Electron multipliers
- H01J43/06—Electrode arrangements
- H01J43/18—Electrode arrangements using essentially more than one dynode
- H01J43/24—Dynodes having potential gradient along their surfaces
- H01J43/243—Dynodes consisting of a piling-up of channel-type dynode plates
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
- H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
- H04N3/12—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by switched stationary formation of lamps, photocells or light relays
- H04N3/122—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by switched stationary formation of lamps, photocells or light relays using cathode rays, e.g. multivision
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Particle Accelerators (AREA)
- Electron Beam Exposure (AREA)
- Cathode-Ray Tubes And Fluorescent Screens For Display (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US8987970A | 1970-11-16 | 1970-11-16 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE2156661A1 true DE2156661A1 (de) | 1972-06-15 |
Family
ID=22220041
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19712156661 Pending DE2156661A1 (de) | 1970-11-16 | 1971-11-15 | Ablenkeinrichtung für einen aus geladenen Teilchen bestehenden Strahl |
Country Status (6)
| Country | Link |
|---|---|
| JP (1) | JPS53670B1 (enrdf_load_stackoverflow) |
| CA (1) | CA989980A (enrdf_load_stackoverflow) |
| DE (1) | DE2156661A1 (enrdf_load_stackoverflow) |
| FR (1) | FR2114777A5 (enrdf_load_stackoverflow) |
| GB (1) | GB1312906A (enrdf_load_stackoverflow) |
| NL (1) | NL7115742A (enrdf_load_stackoverflow) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3979635A (en) * | 1975-02-05 | 1976-09-07 | Texas Instruments Incorporated | Charged particle beam scanning device |
| JPS60159092U (ja) * | 1984-03-30 | 1985-10-23 | タキロン株式会社 | 排水ます |
| GB2322471A (en) * | 1997-02-24 | 1998-08-26 | Ibm | Self stabilising cathode |
-
1971
- 1971-11-04 CA CA126,823A patent/CA989980A/en not_active Expired
- 1971-11-15 DE DE19712156661 patent/DE2156661A1/de active Pending
- 1971-11-15 JP JP9183771A patent/JPS53670B1/ja active Pending
- 1971-11-16 NL NL7115742A patent/NL7115742A/xx unknown
- 1971-11-16 GB GB5322271A patent/GB1312906A/en not_active Expired
- 1971-11-16 FR FR7141042A patent/FR2114777A5/fr not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| GB1312906A (en) | 1973-04-11 |
| NL7115742A (enrdf_load_stackoverflow) | 1972-05-18 |
| JPS53670B1 (enrdf_load_stackoverflow) | 1978-01-11 |
| FR2114777A5 (enrdf_load_stackoverflow) | 1972-06-30 |
| CA989980A (en) | 1976-05-25 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OHA | Expiration of time for request for examination |