DE112022002154T5 - Bildgebungsvorrichtung - Google Patents

Bildgebungsvorrichtung Download PDF

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Publication number
DE112022002154T5
DE112022002154T5 DE112022002154.3T DE112022002154T DE112022002154T5 DE 112022002154 T5 DE112022002154 T5 DE 112022002154T5 DE 112022002154 T DE112022002154 T DE 112022002154T DE 112022002154 T5 DE112022002154 T5 DE 112022002154T5
Authority
DE
Germany
Prior art keywords
pixel separation
separation portion
pixel
imaging device
semiconductor substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
DE112022002154.3T
Other languages
German (de)
English (en)
Inventor
Michiko Sakamoto
Hiroshi Tanaka
Shogo OTANI
Takashi Kojima
Tadashi Iijima
Shota Kitamura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Semiconductor Solutions Corp
Original Assignee
Sony Semiconductor Solutions Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Semiconductor Solutions Corp filed Critical Sony Semiconductor Solutions Corp
Publication of DE112022002154T5 publication Critical patent/DE112022002154T5/de
Pending legal-status Critical Current

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/802Geometry or disposition of elements in pixels, e.g. address-lines or gate electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011Manufacture or treatment of image sensors covered by group H10F39/12
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/18Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H10F39/182Colour image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/805Coatings
    • H10F39/8053Colour filters
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/806Optical elements or arrangements associated with the image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/806Optical elements or arrangements associated with the image sensors
    • H10F39/8063Microlenses
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/806Optical elements or arrangements associated with the image sensors
    • H10F39/8067Reflectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80Constructional details of image sensors
    • H10F39/807Pixel isolation structures

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
DE112022002154.3T 2021-04-15 2022-03-28 Bildgebungsvorrichtung Pending DE112022002154T5 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021-069276 2021-04-15
JP2021069276 2021-04-15
PCT/JP2022/014960 WO2022220084A1 (ja) 2021-04-15 2022-03-28 撮像装置

Publications (1)

Publication Number Publication Date
DE112022002154T5 true DE112022002154T5 (de) 2024-10-10

Family

ID=83640674

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112022002154.3T Pending DE112022002154T5 (de) 2021-04-15 2022-03-28 Bildgebungsvorrichtung

Country Status (5)

Country Link
US (1) US20240204014A1 (https=)
JP (1) JPWO2022220084A1 (https=)
CN (1) CN116897433A (https=)
DE (1) DE112022002154T5 (https=)
WO (1) WO2022220084A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7487151B2 (ja) * 2021-06-29 2024-05-20 ゼタテクノロジーズ株式会社 固体撮像装置、固体撮像装置の製造方法、および電子機器
US20230395628A1 (en) * 2022-06-03 2023-12-07 Omnivision Technologies, Inc. Half quad photodiode (qpd) to improve qpd channel imbalance
WO2024154590A1 (ja) * 2023-01-18 2024-07-25 ソニーセミコンダクタソリューションズ株式会社 光検出装置
WO2026071148A1 (ja) * 2024-09-30 2026-04-02 ソニーセミコンダクタソリューションズ株式会社 光検出装置、撮像装置、および電子機器

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021069276A (ja) 2019-10-28 2021-04-30 モッツエンボッカー マービン 太陽電池式オフィス・工場照明

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6168331B2 (ja) * 2012-05-23 2017-07-26 ソニー株式会社 撮像素子、および撮像装置
JP6505430B2 (ja) * 2014-12-12 2019-04-24 キヤノン電子株式会社 光学フィルタ及び撮像装置
WO2018078976A1 (ja) * 2016-10-28 2018-05-03 ソニー株式会社 固体撮像素子、固体撮像素子の製造方法、及び電子機器
WO2019111373A1 (ja) * 2017-12-07 2019-06-13 オリンパス株式会社 固体撮像装置および固体撮像装置の製造方法
TWI858001B (zh) * 2019-02-25 2024-10-11 日商索尼半導體解決方案公司 固態攝像裝置及電子機器
JP2021027276A (ja) * 2019-08-08 2021-02-22 キヤノン株式会社 光電変換装置および機器
JP2021040088A (ja) * 2019-09-05 2021-03-11 ソニーセミコンダクタソリューションズ株式会社 固体撮像装置及び電子機器
JP2020188267A (ja) * 2020-07-14 2020-11-19 キヤノン株式会社 撮像装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021069276A (ja) 2019-10-28 2021-04-30 モッツエンボッカー マービン 太陽電池式オフィス・工場照明

Also Published As

Publication number Publication date
JPWO2022220084A1 (https=) 2022-10-20
US20240204014A1 (en) 2024-06-20
CN116897433A (zh) 2023-10-17
WO2022220084A1 (ja) 2022-10-20

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R079 Amendment of ipc main class

Free format text: PREVIOUS MAIN CLASS: H01L0027146000

Ipc: H10F0039180000