DE112011103563T8 - Verfahren und System zum Identifizieren von seltenen Fehlerraten - Google Patents

Verfahren und System zum Identifizieren von seltenen Fehlerraten Download PDF

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Publication number
DE112011103563T8
DE112011103563T8 DE112011103563T DE112011103563T DE112011103563T8 DE 112011103563 T8 DE112011103563 T8 DE 112011103563T8 DE 112011103563 T DE112011103563 T DE 112011103563T DE 112011103563 T DE112011103563 T DE 112011103563T DE 112011103563 T8 DE112011103563 T8 DE 112011103563T8
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error rates
identifying rare
rare error
identifying
rates
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DE112011103563T5 (de
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Trent Lorne McConaghy
Joel Cooper
Jeffrey Dyck
Kyle Fisher
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Mentor Graphics Canada ULC
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Solido Design Automation Inc
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/39—Circuit design at the physical level
    • G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/20—Design optimisation, verification or simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/32—Circuit design at the digital level
    • G06F30/33—Design verification, e.g. functional simulation or model checking
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/32—Circuit design at the digital level
    • G06F30/33—Design verification, e.g. functional simulation or model checking
    • G06F30/3308—Design verification, e.g. functional simulation or model checking using simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/36—Circuit design at the analogue level
    • G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2111/00—Details relating to CAD techniques
    • G06F2111/08—Probabilistic or stochastic CAD

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • Data Mining & Analysis (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Mathematical Physics (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Algebra (AREA)
  • Pure & Applied Mathematics (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
DE112011103563T 2010-10-27 2011-10-27 Verfahren und System zum Identifizieren von seltenen Fehlerraten Active DE112011103563T8 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US40723010P 2010-10-27 2010-10-27
US61/407,230 2010-10-27
PCT/CA2011/050673 WO2012055045A2 (en) 2010-10-27 2011-10-27 Method and system for identifying rare-event failure rates

Publications (2)

Publication Number Publication Date
DE112011103563T5 DE112011103563T5 (de) 2013-08-22
DE112011103563T8 true DE112011103563T8 (de) 2013-11-21

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DE112011103563T Active DE112011103563T8 (de) 2010-10-27 2011-10-27 Verfahren und System zum Identifizieren von seltenen Fehlerraten

Country Status (6)

Country Link
US (1) US9483602B2 (de)
JP (1) JP5860054B2 (de)
KR (1) KR101904518B1 (de)
DE (1) DE112011103563T8 (de)
TW (1) TWI559156B (de)
WO (1) WO2012055045A2 (de)

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US10776548B1 (en) * 2017-03-28 2020-09-15 Cadence Design Systems, Inc. Parallel Monte Carlo sampling for predicting tail performance of integrated circuits
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JP6874238B2 (ja) * 2017-06-30 2021-05-19 日本電気株式会社 光学系設計支援システム、光学系設計支援方法および光学系設計支援プログラム
US10658841B2 (en) 2017-07-14 2020-05-19 Engie Storage Services Na Llc Clustered power generator architecture
KR102578644B1 (ko) 2017-08-30 2023-09-13 삼성전자주식회사 반도체 집적회로의 수율 예측 장치, 및 이를 이용한 반도체 장치 제조 방법
US11507846B2 (en) * 2018-03-26 2022-11-22 Nvidia Corporation Representing a neural network utilizing paths within the network to improve a performance of the neural network
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CN111584063B (zh) * 2019-02-15 2023-11-10 宏碁股份有限公司 不同分组集合下的评估统计效能的方法
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US10852351B1 (en) 2019-05-30 2020-12-01 International Business Machines Corporation Iterative approach to determine failure threshold associated with desired circuit yield in integrated circuits
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JP2023517512A (ja) * 2020-03-05 2023-04-26 コーニンクレッカ フィリップス エヌ ヴェ ３次元超音波画像データのコンテキストマルチプラナー再構成、ならびに関連する装置、システム、及び方法
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Also Published As

Publication number Publication date
US20130226544A1 (en) 2013-08-29
US9483602B2 (en) 2016-11-01
TWI559156B (zh) 2016-11-21
JP5860054B2 (ja) 2016-02-16
TW201237647A (en) 2012-09-16
DE112011103563T5 (de) 2013-08-22
WO2012055045A2 (en) 2012-05-03
KR101904518B1 (ko) 2018-10-04
WO2012055045A3 (en) 2012-06-21
JP2013542526A (ja) 2013-11-21
KR20140024252A (ko) 2014-02-28

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