DE112007003242B4 - Interferometer mit Beibehaltung einer optischen Beziehung zwischen Elementen - Google Patents

Interferometer mit Beibehaltung einer optischen Beziehung zwischen Elementen Download PDF

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Publication number
DE112007003242B4
DE112007003242B4 DE112007003242.1T DE112007003242T DE112007003242B4 DE 112007003242 B4 DE112007003242 B4 DE 112007003242B4 DE 112007003242 T DE112007003242 T DE 112007003242T DE 112007003242 B4 DE112007003242 B4 DE 112007003242B4
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Germany
Prior art keywords
mirror
leaf spring
movable assembly
movable
fixed
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DE112007003242.1T
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German (de)
English (en)
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DE112007003242T5 (de
Inventor
Gregg Ressler
Donald W. Sting
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Agilent Technologies Inc
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Agilent Technologies Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0202—Mechanical elements; Supports for optical elements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0286—Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes
    • G01J3/4535—Devices with moving mirror

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
DE112007003242.1T 2007-01-12 2007-12-07 Interferometer mit Beibehaltung einer optischen Beziehung zwischen Elementen Active DE112007003242B4 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US11/622,815 US7630081B2 (en) 2007-01-12 2007-01-12 Interferometer maintaining optical relationship between elements
US11/622,815 2007-01-12
PCT/US2007/086713 WO2008088620A1 (en) 2007-01-12 2007-12-07 Interferometer maintaining optical relationship between elements

Publications (2)

Publication Number Publication Date
DE112007003242T5 DE112007003242T5 (de) 2009-11-26
DE112007003242B4 true DE112007003242B4 (de) 2016-07-07

Family

ID=39295494

Family Applications (1)

Application Number Title Priority Date Filing Date
DE112007003242.1T Active DE112007003242B4 (de) 2007-01-12 2007-12-07 Interferometer mit Beibehaltung einer optischen Beziehung zwischen Elementen

Country Status (7)

Country Link
US (1) US7630081B2 (cg-RX-API-DMAC7.html)
JP (1) JP5111520B2 (cg-RX-API-DMAC7.html)
CN (1) CN101583857B (cg-RX-API-DMAC7.html)
CA (1) CA2674571C (cg-RX-API-DMAC7.html)
DE (1) DE112007003242B4 (cg-RX-API-DMAC7.html)
GB (1) GB2458412B (cg-RX-API-DMAC7.html)
WO (1) WO2008088620A1 (cg-RX-API-DMAC7.html)

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US8092030B2 (en) 2006-04-12 2012-01-10 Plx, Inc. Mount for an optical structure and method of mounting an optical structure using such mount
US7995208B2 (en) * 2008-08-06 2011-08-09 Ftrx Llc Monolithic interferometer with optics of different material
US9001334B2 (en) * 2010-11-11 2015-04-07 Thermo Electron Scientific Instruments Llc Interferometer velocity control of beamsplitter and moving mirrors
US9798051B2 (en) 2011-02-28 2017-10-24 Plx, Inc. Mount for an optical structure having a grooved protruding member and method of mounting an optical structure using such mount
US20130138226A1 (en) 2011-11-23 2013-05-30 Ftrx Llc Quasi-translator, fourier modulator, fourier spectrometer, motion control system and methods for controlling same, and signal processor circuit
US9013814B2 (en) 2012-07-27 2015-04-21 Plx, Inc. Interferometer and optical assembly having beamsplitter securing apparatus and method of mounting same
US8933406B2 (en) 2012-12-21 2015-01-13 Agilent Technologies, Inc. Interferometer having multiple scan carriages
US9377600B2 (en) 2013-02-21 2016-06-28 Plx, Inc. Mounts for an optical structure having a grooved protruding member with a damping ring disposed in or on the groove and methods of mounting an optical structure using such mounts
WO2014179213A2 (en) * 2013-05-01 2014-11-06 R Jackson Mechanism for movement of a mirror in an interferometer, an interferometer incorporating the same and a fourier transform spectrometer incorporating the same
US10677722B2 (en) 2016-04-05 2020-06-09 University Of Notre Dame Du Lac Photothermal imaging device and system
EP3867629A1 (en) 2016-09-27 2021-08-25 Purdue Research Foundation Depth-resolved mid-infrared photothermal imaging of living cells and organisms with sub-mciron spatial resolution
US12644833B2 (en) 2016-09-27 2026-06-02 Purdue Research Foundation Depth-resolved mid-infrared photothermal imaging of living cells and organisms with sub-micron spatial resolution
EP4790429A2 (en) 2016-11-29 2026-08-12 Photothermal Spectroscopy Corp. Method and apparatus for chemical imaging atomic force microscope infrared spectroscopy
KR101860347B1 (ko) * 2016-11-29 2018-05-23 국방과학연구소 마이켈슨 간섭계의 하우징 시스템
JP6461446B1 (ja) 2017-07-06 2019-01-30 浜松ホトニクス株式会社 ミラーユニット及び光モジュール
US10942116B2 (en) 2017-10-09 2021-03-09 Photothermal Spectroscopy Corp. Method and apparatus for enhanced photo-thermal imaging and spectroscopy
KR102082769B1 (ko) * 2017-10-31 2020-02-28 국방과학연구소 이동반사경 고정구조를 갖는 마이켈슨 간섭계
US11486761B2 (en) 2018-06-01 2022-11-01 Photothermal Spectroscopy Corp. Photothermal infrared spectroscopy utilizing spatial light manipulation
DE102019103814B3 (de) * 2019-02-14 2020-07-02 Hochschule Trier - Trier University of Applied Sciences Vorrichtung zum optischen Messen einer Oberfläche
JP7422413B2 (ja) * 2019-02-28 2024-01-26 国立大学法人 香川大学 分光測定装置
US11480518B2 (en) 2019-12-03 2022-10-25 Photothermal Spectroscopy Corp. Asymmetric interferometric optical photothermal infrared spectroscopy
WO2021155363A1 (en) 2020-01-31 2021-08-05 Photothermal Spectroscopy Corp. Method and apparatus for high performance wide field photothermal infrared spectroscopy and imaging
US12369778B2 (en) 2020-06-26 2025-07-29 Photothermal Spectroscopy Corp. Method and apparatus for fiber optic photothermal imaging and spectroscopy
US11519861B2 (en) 2020-07-20 2022-12-06 Photothermal Spectroscopy Corp Fluorescence enhanced photothermal infrared spectroscopy and confocal fluorescence imaging
CN112394529B (zh) * 2020-11-27 2022-12-30 南京大学 一种单元件分束合束干涉仪
JP7666138B2 (ja) * 2021-05-31 2025-04-22 株式会社島津製作所 赤外光源装置およびフーリエ変換赤外分光光度計
US12277731B2 (en) * 2022-07-21 2025-04-15 Canon U.S.A., Inc. Methods and systems for system self-diagnosis

Citations (1)

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Publication number Priority date Publication date Assignee Title
US5486917A (en) * 1991-10-09 1996-01-23 On-Line Technologies Inc Flexture plate motion-transfer mechanism, beam-splitter assembly, and interferometer incorporating the same

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US4710001A (en) 1986-11-21 1987-12-01 Hewlett-Packard Company Support for a moving mirror in an interferometer
US4801366A (en) * 1987-03-18 1989-01-31 Godfrey Jamie E Apparatuses and methods for analyzing macro-ions at electrophoretic steady state
US4773757A (en) * 1987-08-19 1988-09-27 Laser Precision Corporation High resolution spectrometer interferometer having an integrated alignment unit
JPH0641145Y2 (ja) * 1988-02-29 1994-10-26 株式会社島津製作所 平行運動装置
US5133598A (en) * 1990-03-02 1992-07-28 Nicolet Instrument Corporation Command servo for moving mirror of Michelson interferometer
US5173744A (en) 1991-03-21 1992-12-22 Dybwad Jens R Refractively scanned interferometer
US5309217A (en) 1991-04-27 1994-05-03 Bruker Analytische Messtechnik Fourier spectrometer
JPH07209085A (ja) 1994-01-19 1995-08-11 Yokogawa Electric Corp フーリエ分光器
KR100358476B1 (ko) * 1995-02-09 2003-04-11 포스 일렉트릭 에이/에스 스펙트로미터표준화방법
US5883712A (en) * 1997-05-21 1999-03-16 Nicolet Instrument Corporation Interferometer of an infrared spectrometer with dynamic moving mirror alignment
WO1999002939A1 (en) * 1997-07-14 1999-01-21 Spectral Dimensions, Inc. Methods and devices for very rapid scan interferometry
US6322037B1 (en) 1999-10-26 2001-11-27 Yokogawa Electric Corporation Moving mirror support device for photo-interferometer
US20020149777A1 (en) * 2001-04-12 2002-10-17 Schreiber Kenneth C. Support for a movable mirror in an interferometer
US6943892B2 (en) * 2003-01-29 2005-09-13 Sarnoff Corporation Instrument having a multi-mode optical element and method
US7312859B2 (en) * 2004-01-30 2007-12-25 Promet International, Inc. Optical fiber inspection device

Patent Citations (1)

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Publication number Priority date Publication date Assignee Title
US5486917A (en) * 1991-10-09 1996-01-23 On-Line Technologies Inc Flexture plate motion-transfer mechanism, beam-splitter assembly, and interferometer incorporating the same

Also Published As

Publication number Publication date
JP2010515918A (ja) 2010-05-13
CN101583857A (zh) 2009-11-18
DE112007003242T5 (de) 2009-11-26
US7630081B2 (en) 2009-12-08
HK1136345A1 (en) 2010-06-25
CA2674571A1 (en) 2008-07-24
WO2008088620A1 (en) 2008-07-24
GB0912325D0 (en) 2009-08-26
US20080170231A1 (en) 2008-07-17
GB2458412A (en) 2009-09-23
CA2674571C (en) 2015-04-21
JP5111520B2 (ja) 2013-01-09
CN101583857B (zh) 2012-02-01
GB2458412B (en) 2011-05-18

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Owner name: A2 TECHNOLOGIES, LLC, DANBURY, CONN., US

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