DE102013019348A1 - Hochauflösende Scanning-Mikroskopie - Google Patents
Hochauflösende Scanning-Mikroskopie Download PDFInfo
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- DE102013019348A1 DE102013019348A1 DE201310019348 DE102013019348A DE102013019348A1 DE 102013019348 A1 DE102013019348 A1 DE 102013019348A1 DE 201310019348 DE201310019348 DE 201310019348 DE 102013019348 A DE102013019348 A DE 102013019348A DE 102013019348 A1 DE102013019348 A1 DE 102013019348A1
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Images
Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/008—Details of detection or image processing, including general computer control
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/02—Objectives
- G02B21/025—Objectives with variable magnification
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/04—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres
- G02B6/06—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings formed by bundles of fibres the relative position of the fibres being the same at both ends, e.g. for transporting images
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0825—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a flexible sheet or membrane, e.g. for varying the focus
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- General Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Multimedia (AREA)
- Microscoopes, Condenser (AREA)
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE201310019348 DE102013019348A1 (de) | 2013-08-15 | 2013-11-15 | Hochauflösende Scanning-Mikroskopie |
JP2016533862A JP6444406B2 (ja) | 2013-08-15 | 2014-07-18 | 高解像度スキャニング顕微鏡法 |
EP14744023.4A EP3033646B1 (de) | 2013-08-15 | 2014-07-18 | Hochauflösende scanning-mikroskopie |
CN201810735160.9A CN108873285B (zh) | 2013-08-15 | 2014-07-18 | 高分辨率扫描显微术 |
CN201480055894.2A CN105612454A (zh) | 2013-08-15 | 2014-07-18 | 高分辨率扫描显微术 |
PCT/EP2014/065502 WO2015022147A1 (de) | 2013-08-15 | 2014-07-18 | Hochauflösende scanning-mikroskopie |
US14/457,856 US10281701B2 (en) | 2013-08-15 | 2014-08-12 | High-resolution scanning microscopy |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102013013793 | 2013-08-15 | ||
DE102013013793.4 | 2013-08-15 | ||
DE201310019348 DE102013019348A1 (de) | 2013-08-15 | 2013-11-15 | Hochauflösende Scanning-Mikroskopie |
Publications (1)
Publication Number | Publication Date |
---|---|
DE102013019348A1 true DE102013019348A1 (de) | 2015-02-19 |
Family
ID=52430067
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE201310019348 Ceased DE102013019348A1 (de) | 2013-08-15 | 2013-11-15 | Hochauflösende Scanning-Mikroskopie |
Country Status (6)
Country | Link |
---|---|
US (1) | US10281701B2 (enrdf_load_stackoverflow) |
EP (1) | EP3033646B1 (enrdf_load_stackoverflow) |
JP (1) | JP6444406B2 (enrdf_load_stackoverflow) |
CN (2) | CN108873285B (enrdf_load_stackoverflow) |
DE (1) | DE102013019348A1 (enrdf_load_stackoverflow) |
WO (1) | WO2015022147A1 (enrdf_load_stackoverflow) |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102014111167A1 (de) * | 2014-08-06 | 2016-02-11 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche |
DE102015100695A1 (de) * | 2015-01-19 | 2016-07-21 | Carl Zeiss Ag | Optische Anordnung für ein Laser-Scanner-System |
WO2017013033A1 (de) | 2015-07-20 | 2017-01-26 | Carl Zeiss Microscopy Gmbh | Hochauflösende, spektral selektive scanning-mikroskopie einer probe |
DE102015116435A1 (de) | 2015-09-29 | 2017-03-30 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Spektralbereiche |
DE102016119262A1 (de) * | 2016-10-10 | 2018-04-12 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren zum räumlich hochauflösenden Bestimmen des Orts eines vereinzelten, mit Anregungslicht zur Emission von Lumineszenzlicht anregbaren Moleküls in einer Probe |
DE102017203414A1 (de) | 2017-03-02 | 2018-09-06 | Carl Zeiss Microscopy Gmbh | Detektorbaugruppe und Mikroskop mit einer solchen Detektorbaugruppe |
DE102017116982A1 (de) * | 2017-07-27 | 2019-01-31 | Osram Gmbh | Leuchteinrichtung zum abgeben von licht |
CN111226136A (zh) * | 2017-10-30 | 2020-06-02 | 深圳帧观德芯科技有限公司 | 辐射检测器中的暗噪声补偿 |
CN113056696A (zh) * | 2018-10-31 | 2021-06-29 | 卡尔蔡司显微镜有限责任公司 | 显微镜和显微镜检查的方法 |
DE102023100926A1 (de) * | 2023-01-17 | 2024-07-18 | Carl Zeiss Microscopy Gmbh | Mikroskop |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102013012609B4 (de) * | 2013-07-26 | 2024-06-27 | Carl Zeiss Microscopy Gmbh | Optoelektronischer Detektor, insbesondere für hochauflösende Lichtrastermikroskope und Lichtrastermikroskop |
DE102013015932A1 (de) * | 2013-09-19 | 2015-03-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
DE102013015933A1 (de) * | 2013-09-19 | 2015-03-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
JP6635125B2 (ja) * | 2015-11-27 | 2020-01-22 | 株式会社ニコン | 顕微鏡、観察方法、及び画像処理プログラム |
JP6784603B2 (ja) * | 2017-01-05 | 2020-11-11 | 東レエンジニアリング株式会社 | 分光測定方法および分光測定装置 |
DE102017101829A1 (de) * | 2017-01-31 | 2018-08-02 | Carl Zeiss Microscopy Gmbh | Anordnung zur Auflösungssteigerung eines Laser-Scanning-Mikroskops |
DE102017113683A1 (de) | 2017-06-21 | 2018-12-27 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche |
DE102017128773A1 (de) | 2017-12-04 | 2019-06-06 | Leica Microsystems Cms Gmbh | Detektoranordnung für die Mikroskopie |
US11131631B2 (en) * | 2017-12-28 | 2021-09-28 | University Of Notre Dame Du Lac | Super-resolution fluorescence microscopy by stepwise optical saturation |
EP3518017B1 (de) * | 2018-01-24 | 2020-06-17 | Technische Universität Dresden | Verfahren und faseroptisches system zur beleuchtung und detektion eines objekts mit licht |
US10545099B1 (en) * | 2018-11-07 | 2020-01-28 | Kla-Tencor Corporation | Ultra-high sensitivity hybrid inspection with full wafer coverage capability |
DE102018128590A1 (de) * | 2018-11-14 | 2020-05-14 | Carl Zeiss Microscopy Gmbh | Fluktuationsbasierte Fluoreszenzmikroskopie |
DE102019100184A1 (de) * | 2019-01-07 | 2020-07-09 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
DE102020120114A1 (de) * | 2020-07-30 | 2022-02-03 | Abberior Instruments Gmbh | Detektionseinrichtung für ein Laserscanning-Mikroskop |
US20220299768A1 (en) * | 2020-09-22 | 2022-09-22 | Google Llc | Wavelength-specific incoupling gratings for display optimization |
WO2023114213A1 (en) * | 2021-12-13 | 2023-06-22 | The Board Of Trustees Of The Leland Stanford Junior University | Apparatus and method for multiplexed one-photon and nonlinear microscopy and method for biological tissue alignment |
Citations (6)
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DE19951482A1 (de) | 1999-10-26 | 2001-05-10 | Zeiss Carl Jena Gmbh | Anordnung zur Beleuchtung mit mehreren Wellenlängen in einem Mikroskop |
EP1157297B1 (de) | 1999-03-02 | 2002-11-06 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und vorrichtung zur objektabbildung |
WO2006127692A2 (en) | 2005-05-23 | 2006-11-30 | Hess Harald F | Optical microscopy with phototransformable optical labels |
DE102006021317B3 (de) | 2006-05-06 | 2007-10-11 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und Fluoreszenzlichtmikroskop zum räumlich hochauflösenden Abbilden einer Struktur einer Probe |
EP2317362A1 (de) | 2009-10-28 | 2011-05-04 | Carl Zeiss MicroImaging GmbH | Mikroskopisches Verfahren und Mikroskop mit gesteigerter Auflösung |
DE102012204128A1 (de) | 2012-03-15 | 2013-09-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
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JPS62218823A (ja) * | 1986-03-20 | 1987-09-26 | Fujitsu Ltd | 赤外線撮像装置 |
US7616986B2 (en) * | 2001-05-07 | 2009-11-10 | University Of Washington | Optical fiber scanner for performing multimodal optical imaging |
ATE399990T1 (de) * | 2001-10-09 | 2008-07-15 | Univ Ruprecht Karls Heidelberg | Fernfeld lichtmikroskopische methode und vorrichtung zur bestimmung von mindestens einem objekt kleiner als die benutzte wellenlänge |
JP2003283906A (ja) * | 2002-03-20 | 2003-10-03 | Nippon Telegr & Teleph Corp <Ntt> | 高解像度撮像装置 |
US6953927B2 (en) * | 2002-08-09 | 2005-10-11 | California Institute Of Technology | Method and system for scanning apertureless fluorescence microscope |
DE102004034970A1 (de) * | 2004-07-16 | 2006-02-02 | Carl Zeiss Jena Gmbh | Lichtrastermikroskop und Verwendung |
WO2006127967A2 (en) * | 2005-05-25 | 2006-11-30 | Massachusetts Institute Of Technology | Multifocal scanning microscopy systems and methods |
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US7298476B2 (en) * | 2005-10-14 | 2007-11-20 | Laser Microtech, L.L.C. | Method and system for far-field microscopy to exceeding diffraction-limit resolution |
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CN101210969A (zh) * | 2006-12-31 | 2008-07-02 | 中国科学院西安光学精密机械研究所 | 凝视型高分辨率三维成像探测器 |
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-
2013
- 2013-11-15 DE DE201310019348 patent/DE102013019348A1/de not_active Ceased
-
2014
- 2014-07-18 WO PCT/EP2014/065502 patent/WO2015022147A1/de active Application Filing
- 2014-07-18 JP JP2016533862A patent/JP6444406B2/ja active Active
- 2014-07-18 CN CN201810735160.9A patent/CN108873285B/zh active Active
- 2014-07-18 CN CN201480055894.2A patent/CN105612454A/zh active Pending
- 2014-07-18 EP EP14744023.4A patent/EP3033646B1/de active Active
- 2014-08-12 US US14/457,856 patent/US10281701B2/en active Active
Patent Citations (6)
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EP1157297B1 (de) | 1999-03-02 | 2002-11-06 | Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und vorrichtung zur objektabbildung |
DE19951482A1 (de) | 1999-10-26 | 2001-05-10 | Zeiss Carl Jena Gmbh | Anordnung zur Beleuchtung mit mehreren Wellenlängen in einem Mikroskop |
WO2006127692A2 (en) | 2005-05-23 | 2006-11-30 | Hess Harald F | Optical microscopy with phototransformable optical labels |
DE102006021317B3 (de) | 2006-05-06 | 2007-10-11 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Verfahren und Fluoreszenzlichtmikroskop zum räumlich hochauflösenden Abbilden einer Struktur einer Probe |
EP2317362A1 (de) | 2009-10-28 | 2011-05-04 | Carl Zeiss MicroImaging GmbH | Mikroskopisches Verfahren und Mikroskop mit gesteigerter Auflösung |
DE102012204128A1 (de) | 2012-03-15 | 2013-09-19 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie |
Non-Patent Citations (3)
Title |
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C. Müller und J. Enderlein, Physical Review Letters, 104, 198101 (2010) |
Colin Sheppard et al., In Optik 80, No. 2, 53 (1982) |
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Cited By (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11204489B2 (en) | 2014-08-06 | 2021-12-21 | Carl Zeiss Microscopy Gmbh | High-resolution scanning microscopy with discrimination between at least two wavelength ranges |
DE102014111167A1 (de) * | 2014-08-06 | 2016-02-11 | Carl Zeiss Microscopy Gmbh | Hochauflösende Scanning-Mikroskopie mit der Unterscheidung mindestens zweier Wellenlängenbereiche |
DE102015100695A1 (de) * | 2015-01-19 | 2016-07-21 | Carl Zeiss Ag | Optische Anordnung für ein Laser-Scanner-System |
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CN105612454A (zh) | 2016-05-25 |
EP3033646A1 (de) | 2016-06-22 |
JP2016532154A (ja) | 2016-10-13 |
CN108873285B (zh) | 2020-11-24 |
CN108873285A (zh) | 2018-11-23 |
EP3033646B1 (de) | 2024-09-25 |
WO2015022147A1 (de) | 2015-02-19 |
US20150085099A1 (en) | 2015-03-26 |
US10281701B2 (en) | 2019-05-07 |
JP6444406B2 (ja) | 2018-12-26 |
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