DE102012003255B8 - Vorrichtung zur berührungslosen Temperaturmessung und Temperaturmessverfahren - Google Patents

Vorrichtung zur berührungslosen Temperaturmessung und Temperaturmessverfahren Download PDF

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Publication number
DE102012003255B8
DE102012003255B8 DE201210003255 DE102012003255A DE102012003255B8 DE 102012003255 B8 DE102012003255 B8 DE 102012003255B8 DE 201210003255 DE201210003255 DE 201210003255 DE 102012003255 A DE102012003255 A DE 102012003255A DE 102012003255 B8 DE102012003255 B8 DE 102012003255B8
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Germany
Prior art keywords
temperature measurement
measurement method
contact
contact temperature
temperature
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DE201210003255
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DE102012003255B4 (de
DE102012003255A1 (de
Inventor
Dr.-Ing. Rentmeister Sara
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Testo SE and Co KGaA
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Testo SE and Co KGaA
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Priority to DE201210003255 priority Critical patent/DE102012003255B8/de
Priority to PCT/EP2013/000484 priority patent/WO2013124056A1/de
Priority to CN201390000392.0U priority patent/CN204346588U/zh
Priority to US14/380,117 priority patent/US9857232B2/en
Publication of DE102012003255A1 publication Critical patent/DE102012003255A1/de
Application granted granted Critical
Publication of DE102012003255B4 publication Critical patent/DE102012003255B4/de
Publication of DE102012003255B8 publication Critical patent/DE102012003255B8/de
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/03Arrangements for indicating or recording specially adapted for radiation pyrometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/0275Control or determination of height or distance or angle information for sensors or receivers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J2005/0077Imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/80Calibration

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)
DE201210003255 2012-02-21 2012-02-21 Vorrichtung zur berührungslosen Temperaturmessung und Temperaturmessverfahren Active DE102012003255B8 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE201210003255 DE102012003255B8 (de) 2012-02-21 2012-02-21 Vorrichtung zur berührungslosen Temperaturmessung und Temperaturmessverfahren
PCT/EP2013/000484 WO2013124056A1 (de) 2012-02-21 2013-02-20 Vorrichtung zur berührungslosen temperaturmessung und temperaturmessverfahren
CN201390000392.0U CN204346588U (zh) 2012-02-21 2013-02-20 用于非接触的温度测量的装置和温度测量方法
US14/380,117 US9857232B2 (en) 2012-02-21 2013-02-20 Device for non-contact temperature measurement and temperature measurement method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE201210003255 DE102012003255B8 (de) 2012-02-21 2012-02-21 Vorrichtung zur berührungslosen Temperaturmessung und Temperaturmessverfahren

Publications (3)

Publication Number Publication Date
DE102012003255A1 DE102012003255A1 (de) 2013-08-22
DE102012003255B4 DE102012003255B4 (de) 2013-10-10
DE102012003255B8 true DE102012003255B8 (de) 2014-01-16

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
DE201210003255 Active DE102012003255B8 (de) 2012-02-21 2012-02-21 Vorrichtung zur berührungslosen Temperaturmessung und Temperaturmessverfahren

Country Status (4)

Country Link
US (1) US9857232B2 (de)
CN (1) CN204346588U (de)
DE (1) DE102012003255B8 (de)
WO (1) WO2013124056A1 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2634747A1 (de) * 2012-02-29 2013-09-04 Flir Systems AB Verfahren und System zur Projektion einer sichtbaren Darstellung von Infrarotstrahlung
DE102015102557B4 (de) * 2015-02-23 2023-02-02 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Sichtsystem
CN107543616B (zh) * 2016-06-24 2019-08-20 丘国强 利用三维热成像的机器状况监测系统
DE102016218291A1 (de) 2016-09-23 2018-03-29 Robert Bosch Gmbh Verfahren zur kontaktfreien Ermittlung einer zweidimensionalen Temperaturin-formation sowie Infrarot-Messsystem
CN108111801B (zh) * 2016-11-23 2020-02-21 武汉通畅汽车电子照明有限公司 Adas视觉处理系统的耐温试验系统及方法
DE102017107336A1 (de) * 2017-04-05 2018-10-11 Testo SE & Co. KGaA Messgerät und korrespondierendes Messverfahren
JP6931548B2 (ja) * 2017-04-14 2021-09-08 株式会社Uacj 情報処理装置、温度測定システム、情報処理装置の制御方法、および制御プログラム
TWI704502B (zh) * 2018-06-08 2020-09-11 晟風科技股份有限公司 具有對距離做溫度補償功能之熱像儀及其溫度補償方法
CN111707377B (zh) * 2020-06-29 2021-05-18 安徽必海微软件科技有限公司 一种体温检测云平台系统

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69817622T2 (de) * 1998-01-30 2004-06-17 Tecnimed S.R.L., Vedano Olona Infrarot thermometer
DE19950849B4 (de) * 1999-10-21 2004-09-16 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung sowie Verfahren zur Detektion, Entfernungs-, Größen- und Temperaturmessung von einer Wärmequelle
WO2005012860A1 (de) * 2003-08-01 2005-02-10 Siemens Aktiengesellschaft Elektrisches gerät mit strahlungssensor
US7611278B2 (en) * 2003-12-02 2009-11-03 White Box, Inc. Infrared thermometers

Family Cites Families (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2508637A1 (fr) * 1981-06-25 1982-12-31 Paris X Nanterre Universite Perfectionnements apportes aux procedes de mesures a distance de l'emissivite et/ou de la temperature vraie d'un corps a surface relativment lisse
FR2641871B1 (fr) * 1989-01-18 1991-07-26 Telecommunications Sa Systeme de determination de la position d'au moins une cible par triangulation
US5011295A (en) * 1989-10-17 1991-04-30 Houston Advanced Research Center Method and apparatus to simultaneously measure emissivities and thermodynamic temperatures of remote objects
US5003166A (en) 1989-11-07 1991-03-26 Massachusetts Institute Of Technology Multidimensional range mapping with pattern projection and cross correlation
US5436443A (en) * 1994-07-06 1995-07-25 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Polaradiometric pyrometer in which the parallel and perpendicular components of radiation reflected from an unpolarized light source are equalized with the thermal radiation emitted from a measured object to determine its true temperature
US6115128A (en) 1997-09-17 2000-09-05 The Regents Of The Univerity Of California Multi-dimensional position sensor using range detectors
JP2000097703A (ja) 1998-09-21 2000-04-07 Topcon Corp 3次元測定方法と、これを利用した測量機
JP3381233B2 (ja) * 1999-12-08 2003-02-24 ソニー株式会社 オートフォーカス装置及びフォーカス調整方法
AU2002246520A1 (en) * 2000-11-15 2002-07-30 Rutgers, The State University Of New Jersey Apparatus and method for measuring spatially varying bidirectional reflectance distribution function
DE10133761A1 (de) 2001-07-11 2003-01-30 Vitronic Dr Ing Stein Bildvera Verfahren und Vorrichtung zur virtuellen Lagebestimmung eines Fahrzeugaufbaus
US6950546B2 (en) * 2002-12-03 2005-09-27 Og Technologies, Inc. Apparatus and method for detecting surface defects on a workpiece such as a rolled/drawn metal bar
US7307736B2 (en) 2004-03-31 2007-12-11 Mitutoyo Corporation Scale for use with a translation and orientation sensing system
DE102004027341A1 (de) 2004-05-27 2005-12-22 Deutsches Zentrum für Luft- und Raumfahrt e.V. Verfahren und Vorrichtung für ein optoelektronisches Positions- und Lagemesssystem
US7820936B2 (en) * 2004-07-02 2010-10-26 Boston Scientific Scimed, Inc. Method and apparatus for controlling and adjusting the intensity profile of a laser beam employed in a laser welder for welding polymeric and metallic components
US8306662B2 (en) * 2005-04-23 2012-11-06 Lg Electronics Inc. Position detection device for mobile robot and robot cleaner including the same
JP2009500851A (ja) * 2005-07-05 2009-01-08 マットソン テクノロジー インコーポレイテッド 半導体ウェハの光学的特性を求めるための方法およびシステム
US7632012B2 (en) * 2005-09-01 2009-12-15 Siemens Energy, Inc. Method of measuring in situ differential emissivity and temperature
TWI330808B (en) * 2007-01-23 2010-09-21 Pixart Imaging Inc Quasi-analog knob controlling method and apparatus using the same
US7744274B1 (en) * 2007-06-20 2010-06-29 Ultratech, Inc. Methods and apparatus for temperature measurement and control on a remote substrate surface
KR100891842B1 (ko) * 2007-08-28 2009-04-07 주식회사 포스코 원형 선재 광학결함 검출장치 및 방법
US20100292950A1 (en) * 2007-12-20 2010-11-18 Toyo University Radiation thermometry and radiation thermometry system
US8498836B2 (en) * 2008-11-26 2013-07-30 Fluke Corporation System and method for detecting thermographic anomalies
JP5545577B2 (ja) * 2009-08-28 2014-07-09 独立行政法人産業技術総合研究所 電極部材、電子エネルギー分析器、光電子エネルギー分析器、及び温度測定装置
WO2011075124A1 (en) 2009-12-16 2011-06-23 Hewlett-Packard Development Company, L.P. Estimating 3d structure from a 2d image
US8954132B2 (en) * 2010-02-12 2015-02-10 Jean P. HUBSCHMAN Methods and systems for guiding an emission to a target
US8837811B2 (en) 2010-06-17 2014-09-16 Microsoft Corporation Multi-stage linear structure from motion
DE102011079484A1 (de) * 2011-07-20 2013-01-24 Siemens Aktiengesellschaft Verfahren und System zur Emissivitätsbestimmung
ES2747175T3 (es) * 2013-08-07 2020-03-10 Bio Echo Net Inc Termómetro de infrarrojos
DE102015217471A1 (de) * 2015-09-14 2017-03-16 Robert Bosch Gmbh Lebensmittelverpackungsanordnung

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69817622T2 (de) * 1998-01-30 2004-06-17 Tecnimed S.R.L., Vedano Olona Infrarot thermometer
DE19950849B4 (de) * 1999-10-21 2004-09-16 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung sowie Verfahren zur Detektion, Entfernungs-, Größen- und Temperaturmessung von einer Wärmequelle
WO2005012860A1 (de) * 2003-08-01 2005-02-10 Siemens Aktiengesellschaft Elektrisches gerät mit strahlungssensor
US7611278B2 (en) * 2003-12-02 2009-11-03 White Box, Inc. Infrared thermometers

Also Published As

Publication number Publication date
US20150110152A1 (en) 2015-04-23
WO2013124056A1 (de) 2013-08-29
DE102012003255B4 (de) 2013-10-10
DE102012003255A1 (de) 2013-08-22
US9857232B2 (en) 2018-01-02
CN204346588U (zh) 2015-05-20

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