DE102004055817B3 - Manufacture procedure for heavy-duty semiconductor modules involves mass of solder to produce solder connection and particles of copper are sprayed into place on solder - Google Patents
Manufacture procedure for heavy-duty semiconductor modules involves mass of solder to produce solder connection and particles of copper are sprayed into place on solder Download PDFInfo
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- DE102004055817B3 DE102004055817B3 DE102004055817A DE102004055817A DE102004055817B3 DE 102004055817 B3 DE102004055817 B3 DE 102004055817B3 DE 102004055817 A DE102004055817 A DE 102004055817A DE 102004055817 A DE102004055817 A DE 102004055817A DE 102004055817 B3 DE102004055817 B3 DE 102004055817B3
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4871—Bases, plates or heatsinks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/2612—Auxiliary members for layer connectors, e.g. spacers
- H01L2224/26152—Auxiliary members for layer connectors, e.g. spacers being formed on an item to be connected not being a semiconductor or solid-state body
- H01L2224/26175—Flow barriers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/291—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/8338—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/83385—Shape, e.g. interlocking features
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09654—Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
- H05K2201/09745—Recess in conductor, e.g. in pad or in metallic substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10742—Details of leads
- H05K2201/10886—Other details
- H05K2201/10909—Materials of terminal, e.g. of leads or electrodes of components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10954—Other details of electrical connections
- H05K2201/10969—Metallic case or integral heatsink of component electrically connected to a pad on PCB
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/20—Details of printed circuits not provided for in H05K2201/01 - H05K2201/10
- H05K2201/2081—Compound repelling a metal, e.g. solder
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/13—Moulding and encapsulation; Deposition techniques; Protective layers
- H05K2203/1333—Deposition techniques, e.g. coating
- H05K2203/1344—Spraying small metal particles or droplets of molten metal
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Abstract
Description
Die Erfindung betrifft ein Verfahren zum Herstellen eines Leistungshalbleitermoduls und ein solches Halbleitermodul. Bei der Herstellung von Leistungshalbleitermodulen ergibt sich das Problem, dass durch Temperaturwechsel Lötstellen verspröden und reißen.The The invention relates to a method for producing a power semiconductor module and such a semiconductor module. In the manufacture of power semiconductor modules The problem arises that due to temperature changes solder joints go brittle and tear.
Bisher wird dem Problem durch eine Erhöhung der Lötschichtdicke versucht entgegenzuwirken, je höher Lötschichtdicke ist, um so größer ist der Bereich, in dem das im wesentlichen elastische Lot Ausdehnungsunterschiede, die durch unterschiedliche Temperaturausdehnungskoeffizienten begründet sind, ausgleichen kann.So far The problem is caused by an increase the solder layer thickness tries to counteract, the higher Solder layer thickness is, the bigger it is the area in which the substantially elastic solder has expansion differences, which are due to different coefficients of thermal expansion, can compensate.
Die US 2003/0175559 A1 baut eine laminierte Wärmesenke unter Verwendung von kaltgasgespritzten Schichten auf, wozu Metalle und Keramiken in Partikelform aufgespritzt werden.The US 2003/0175559 A1 builds a laminated heat sink using on cold-gas sprayed layers, including metals and ceramics in Particle mold are sprayed.
Die
nachveröffentlichte
Die
Die
Die
Auch die WO 2004/091809 A2 verwendet Kaltgasaufspritzen um Metalle wie Lote abzuscheiden, um einen lötfähigen elektrischen Anschluss oder ein „solderable pad" zu einer mit Plastik beschichteten elektrischen Schaltung herzustellen, ohne das Plastik vorher abisolieren zu müssen, in dem durch das Plastik „durch geschossen wird" bzw. dies „weggespritzt" wird.Also WO 2004/091809 A2 uses Kaltgasaufspritzen to metals such as Deposit solder to a solderable electrical Connection or a "solderable pad "to one with To produce plastic coated electrical circuit without Before having to strip the plastic in advance through the plastic " is shot "or this is" splashed away "is.
Die
Die JP 2002-158238 A lehrt das Aufbringen einer konvexen Schicht, um den nachfolgend aufgebrachten Leitkleber an den Rändern dicker als in der Mitte des Chips herzustellen.The JP 2002-158238 A teaches the application of a convex layer to the subsequently applied conductive adhesive at the edges thicker than to produce in the middle of the chip.
Der Erfindung liegt daher die Aufgabe zugrunde, die hochbelasteten Stellen eines Lötschichtverbindungsaufbaus, die Ecken und Kanten einer Lötverbindung sicherer zu gestalten, ohne dass es zu einem „Verschwimmen" oder gar zu einem „Verkippen" kommt.Of the Invention is therefore the object of the highly loaded bodies a solder layer connection structure, the corners and edges of a solder joint to make it safer without "blurring" or even "tilting".
Erfindungsgemäß wird dies durch die Merkmale des Hauptanspruches und des neben geordneten Anspruchs 5 gelöst. Insbesondere ein Aufspritzen von Partikeln wenigstens eines elektrisch und thermisch leitendem Materials in einem Strom heißen Gases auf die Teilbereich eines Trägers, der den belasteten Stellen der Lötverbindung benachbart ist, führt zu einer erhöhten Lötschichtdicke in diesem Bereich. According to the invention this is by the features of the main claim and the next parent Claim 5 solved. In particular, an injection of particles of at least one electrically and thermally conductive material in a stream of hot gas on the subsection of a carrier, the loaded areas of the solder joint adjacent leads to an increased Solder layer thickness in this area.
Durch die Verringerung der Lötschichtdicke in anderen Bereichen wird es möglich, den ansonsten verschwimmenden Verbindungspartner in seiner Position zu halten. Dabei können mehrere Schichten verschiedener Materialien mit unterschiedlichen Wärmeausdehnungskoeffizienten aufeinandergeschichtet werden, um so bereits in diesem Schichtstapel wesentliche Temperaturausdehnungskoeffizientenunterschiede auszugleichen.By the reduction of the solder layer thickness in other areas will make it possible the otherwise blurred connection partner in his position to keep. It can several layers of different materials with different thermal expansion coefficients be stacked so as to already be in this layer stack compensate for significant differences in temperature coefficient of expansion.
Insbesondere in der Mitte des Lötpartners macht es Sinn, derartige, große Flächenanteile des Verbindungspartners abdeckende Strukturen zur Verringerung der Lötschichtdicke aufzubringen. An den Ecken und Kanten ist ein derartiger Aufbau dann wesentlich flacher zu wählen oder ganz fortzulassen, so dass dort erhöhte Lötschichtdicken die geometrisch bei der Ausdehnung am stärksten belasteten Stellen am besten halten können.Especially in the middle of the soldering partner it makes sense, such, great area shares structures covering the liaison partner to reduce Solder layer thickness applied. At the corners and edges is such a structure then much flatter to choose or omit altogether, so that there increased solder layer thicknesses the geometrically strongest in expansion best able to withstand stressed areas.
Es ist auch denkbar, am Rande zur Vermeidung des Verfließens des Lotes Kanten aufzubauen, die das Lot an diesen Stellen, an denen es höhere Dicke hat, halten sollen. Statt eines mittleren Plateaus, das als zentraler Abstandhalter dient, können auch mehrere kleinere Plateaus, beispielsweise in den Ecken der Lötverbindung, vorgesehen werden, die es erlauben – bei aufgrund der geometrisch kleinen Abmessungen geringen thermischen Ausdehnungen – diese Plateaus mit minimaler oder gar keiner Lötung zu versehen.It is also conceivable, on the edge to avoid the flow of the Lots of edges to build up the solder in those places where it higher Thickness has to hold. Instead of a middle plateau, the as central spacer serves, can also several smaller plateaus, for example in the corners of the soldered connection, be provided, which allow it - due to the geometric small dimensions of low thermal expansion - this Plateaus with minimal or no soldering to provide.
Schon drei dieser Plateaus können als „Tragsäulen" den Verbindungspartner bei einer Lötung tragen und so die Dicke der Lötschicht einstellen. Falls die Fixierung noch fester sein soll, z.B. ein Aufschwimmen vermieden werden soll, können – vom Gros der Lötmassenaufbringung separiert kleine Bereiche hochschmelzenden Lots aufgebracht werden, die zunächst separat aufgeschmolzen werden ohne das Gros der Lötmasse zu verflüssigen, und die nach einem Erstarren den zweiten Verbindungspartner fest in einer vordefinerten Position halten, da sie nicht mit der restlichen Lötmasse aufschmelzen, wenn die großflächige Lötung vorgenommen wird.Nice three of these plateaus can as "support columns" the connection partner at a soldering wear and so the thickness of the solder layer to adjust. If the fixation is to be even stronger, e.g. one Floating should be avoided - from the bulk of the soldering application separated small areas of refractory solder can be applied, the first be melted separately without the bulk of the solder liquefy, and after a solidify the second connection partner firmly hold in a predefined position, as they do not match the rest solder melt when the large area soldering done becomes.
Weiter können Verformungen, beispielsweise der Bodenplatte antizipiert werden und entsprechend durch höhere Lötschichtdicken und entsprechend vor Auftrag weiterer abstand haltender Schichten ausgeglichen werden. Auf diese Weise lassen sich neben zukünftigen Substratverformungen auch bereits bestehende Substratverformungen, beispielsweise durch gebogene Substrate oder nicht glatte Strukturen an der Oberseite ausgleichen.Further can Deformations, such as the bottom plate are anticipated and accordingly higher Solder layer thicknesses and accordingly before the order of further spacing layers be compensated. In this way can be next to future Substrate deformations also existing substrate deformations, for example, by curved substrates or non-smooth structures balance at the top.
Weitere Merkmale und Vorteile der Erfindung ergeben sich aus nachfolgender Beschreibung eines bevorzugten Ausführungsbeispiels. Dabei zeigt:Further Features and advantages of the invention will become apparent from the following Description of a preferred embodiment. Showing:
Durch
den Aufbau eines Plateaus (siehe
Durch Aufspritzen einer wandartigen Struktur außerhalb des vorgesehenen Lötgebietes, lässt sich ein Verfließen des Lotes vermeiden. Diese wandartigen Strukturen sollten einen höheren Schmelzpunkt als das Gros der Lötmasse haben. Sie können aus Metallen wie Kupfer oder sogar aus keramischen Werkstoffen gebildet sein.By Spraying a wall-like structure outside the intended soldering area, let yourself a flow avoid the solder. These wall-like structures should have one higher melting point as the bulk of the solder to have. You can made of metals such as copper or even ceramic materials be.
Bisher wurden zu diesem Zweck Lötstoplacke aufgebracht, die jedoch bei den hohen Lötschichtdicken, die nun vorgesehen werden, nicht ausreichen. Durch Kaltgasaufspritzen zum Auftrag von Material, lassen sich jedoch Wände oder „Deiche" aufbauen, die aufgrund der beeinflußbaren Oberflächenspannung geschmolzenen Lotes wesentlich besser auch dickere Schichten Lots am Ort halten können, sogar wenn das Lot in einer Dicke vorgesehen wird, die die Höhe der wandartigen Struktur überschreitet.So far were soldered for this purpose applied, however, at the high solder layer thicknesses that are now provided will not be enough. By Kaltgasaufspritzen to the order of Material, however, can be walls or build "dikes" due to the influenceable surface tension molten solder much better even thicker layers of solder can hold in place, even if the solder is provided in a thickness exceeding the height of the wall-like structure.
Die Erfindung ist zwar für den Bau von Leistungshalbleitern besonderes interessant, aber auch andere Halbleitermodule, bei denen besondere thermische Wechsel zu befürchten sind, oder die für lange Standzeiten auszulegen sind (Satelliten) können den erfindungsgemäßen Aufbau nutzen, d.h. eine variierende Schichtdicke der Lötung, die an belasteten Orten durch einen verdickten Auftrag von aufgespritzter Partikeln wenigstens eines elektrisch und thermisch leitenden Materials gebildet ist, das die Lötverbindung bei einem Aufschmelzen und anschließendem Erstarren ausbildet, aufweisen.The Although the invention is for the construction of power semiconductors particularly interesting, but also others Semiconductor modules in which special thermal changes are to be feared, or the for long periods are to be interpreted (satellites), the structure of the invention use, i. a varying layer thickness of the soldering, in loaded places by a thickened application of sprayed particles at least an electrically and thermally conductive material is formed, that the solder joint during a melting and subsequent solidification, exhibit.
An
definierten Ecken und Kantenbereichen kann zum Beispiels eine dünnere Schicht
eines ersten, leitenden Materials unter der Lötung aufgebracht sein als an
den Stellen geringer Lötungsdicke.
Dies kann sogar soweit gehen, daß Grabenstrukturen in Randbereichen
der Lötverbindungsgeometrie
vorgesehen werden (
Claims (8)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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DE102004055817A DE102004055817B3 (en) | 2004-11-18 | 2004-11-18 | Manufacture procedure for heavy-duty semiconductor modules involves mass of solder to produce solder connection and particles of copper are sprayed into place on solder |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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DE102004055817A DE102004055817B3 (en) | 2004-11-18 | 2004-11-18 | Manufacture procedure for heavy-duty semiconductor modules involves mass of solder to produce solder connection and particles of copper are sprayed into place on solder |
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DE102004055817B3 true DE102004055817B3 (en) | 2006-01-12 |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1833088A1 (en) * | 2006-03-07 | 2007-09-12 | Danfoss Silicon Power GmbH | Method of forming a crack-free connection between a heat sink and a substrate plate |
DE112006000717B4 (en) * | 2005-04-20 | 2011-06-01 | International Rectifier Corp., El Segundo | Chip-scale packaging and manufacturing process |
DE102014115202A1 (en) * | 2014-10-20 | 2016-04-21 | Infineon Technologies Ag | PROCESS FOR REMOVING AT LEAST ONE SUBSTRATE WITH A CARRIER PLATE |
EP2573809A4 (en) * | 2010-05-18 | 2017-05-24 | Toyota Jidosha Kabushiki Kaisha | Semiconductor device and method for manufacturing the same |
Citations (9)
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US4091809A (en) * | 1976-10-18 | 1978-05-30 | Philips Roxane, Inc. | Partially transparent eyeshield |
WO1991005368A1 (en) * | 1989-10-05 | 1991-04-18 | Digital Equipment Corporation | Die attach structure and method |
DE10045783A1 (en) * | 2000-05-08 | 2001-11-22 | Ami Doduco Gmbh | Use of cold gas spraying or flame spraying of metals and alloys and mixtures or composite materials of metals and alloys to produce layer(s) on electrical contacts, carriers for contacts, electrical conductors and on strips or profiles |
JP2002158238A (en) * | 2000-11-16 | 2002-05-31 | Mitsubishi Electric Corp | Method for connecting electronic component, electronic device and method for manufacturing the same |
DE10122221A1 (en) * | 2001-05-08 | 2002-11-21 | Danfoss Silicon Power Gmbh | Power electronics module with base plate and substrate soldered to it has base plate recess with at least dimensions of substrate and with wall regions inclined from out to in |
US20030175559A1 (en) * | 2002-03-15 | 2003-09-18 | Morelli Donald T. | Kinetically sprayed aluminum metal matrix composites for thermal management |
DE20311131U1 (en) * | 2003-07-18 | 2003-09-18 | Woehr Richard Gmbh | Noiseless modular housing system for e.g. computer has multi-layer cooling system with metal base plate having higher coefficient of thermal conduction than aluminum and on one side layer of aluminum with or without cooling fins |
EP1387609A2 (en) * | 2002-07-30 | 2004-02-04 | Behr-Hella Thermocontrol GmbH | Electronic arrangement, particularly for electronic controller of electomechanical device, e.g. fan into vehicle |
DE10320740A1 (en) * | 2003-05-09 | 2004-12-02 | Newspray Gmbh | Soldering parts involves applying solder to at least one part, thereby or thereafter carrying out soldering process; solder is applied to part(s) by cold gas spraying which cleans/activates surface |
-
2004
- 2004-11-18 DE DE102004055817A patent/DE102004055817B3/en active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4091809A (en) * | 1976-10-18 | 1978-05-30 | Philips Roxane, Inc. | Partially transparent eyeshield |
WO1991005368A1 (en) * | 1989-10-05 | 1991-04-18 | Digital Equipment Corporation | Die attach structure and method |
DE10045783A1 (en) * | 2000-05-08 | 2001-11-22 | Ami Doduco Gmbh | Use of cold gas spraying or flame spraying of metals and alloys and mixtures or composite materials of metals and alloys to produce layer(s) on electrical contacts, carriers for contacts, electrical conductors and on strips or profiles |
JP2002158238A (en) * | 2000-11-16 | 2002-05-31 | Mitsubishi Electric Corp | Method for connecting electronic component, electronic device and method for manufacturing the same |
DE10122221A1 (en) * | 2001-05-08 | 2002-11-21 | Danfoss Silicon Power Gmbh | Power electronics module with base plate and substrate soldered to it has base plate recess with at least dimensions of substrate and with wall regions inclined from out to in |
US20030175559A1 (en) * | 2002-03-15 | 2003-09-18 | Morelli Donald T. | Kinetically sprayed aluminum metal matrix composites for thermal management |
EP1387609A2 (en) * | 2002-07-30 | 2004-02-04 | Behr-Hella Thermocontrol GmbH | Electronic arrangement, particularly for electronic controller of electomechanical device, e.g. fan into vehicle |
DE10320740A1 (en) * | 2003-05-09 | 2004-12-02 | Newspray Gmbh | Soldering parts involves applying solder to at least one part, thereby or thereafter carrying out soldering process; solder is applied to part(s) by cold gas spraying which cleans/activates surface |
DE20311131U1 (en) * | 2003-07-18 | 2003-09-18 | Woehr Richard Gmbh | Noiseless modular housing system for e.g. computer has multi-layer cooling system with metal base plate having higher coefficient of thermal conduction than aluminum and on one side layer of aluminum with or without cooling fins |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE112006000717B4 (en) * | 2005-04-20 | 2011-06-01 | International Rectifier Corp., El Segundo | Chip-scale packaging and manufacturing process |
US8097938B2 (en) | 2005-04-20 | 2012-01-17 | International Rectifier Corporation | Conductive chip-scale package |
EP1833088A1 (en) * | 2006-03-07 | 2007-09-12 | Danfoss Silicon Power GmbH | Method of forming a crack-free connection between a heat sink and a substrate plate |
EP2573809A4 (en) * | 2010-05-18 | 2017-05-24 | Toyota Jidosha Kabushiki Kaisha | Semiconductor device and method for manufacturing the same |
DE102014115202A1 (en) * | 2014-10-20 | 2016-04-21 | Infineon Technologies Ag | PROCESS FOR REMOVING AT LEAST ONE SUBSTRATE WITH A CARRIER PLATE |
DE102014115202B4 (en) * | 2014-10-20 | 2017-08-31 | Infineon Technologies Ag | PROCESS FOR REMOVING AT LEAST ONE SUBSTRATE WITH A CARRIER PLATE |
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