DE10027042A1 - Method and device for measuring high frequencies in electrical components has a centering/clamping device moving downwards using a ram to pick up a component on a vacuum holder from a centering opening and to center it - Google Patents

Abstract

A centering and clamping device (28) moves downwards using a ram (29) to pick up a component held on a vacuum holder (9) from a centering opening and to Center it on centering surfaces. Clamping surfaces face the underside of groups of connectors on a common surface vertical to a surface (VE) above that surface, in which the axes of disk-like contact elements (16) lie. The synchronized operation of associated rams (34) lowers upper clamping elements.

Description

The invention relates to a method according to the preamble of claim 1 or 3 and a device according to the preamble of claim 19.

In the manufacture of small electrical components, such as so-called "Service mounted devices" (SMDs), it is z. B. in so-called "back-end Machines "among other things also required the components or their electrical Measure or check values. Especially for components that are designed for the Use at high frequencies (GHz range) is a corresponding one High frequency measurement required.

One has already been developed for this high-frequency measurement in back-end machines Measuring device proposed that a on a surface side of a board Measuring circuit has exposed measuring contacts and has contact elements that for the measurement an electrical connection between the respective connection of the produce component to be measured and a measuring contact, on a extremely short path to enable high-frequency measurement. To one Large number of connections provided close to one another on the component for the To be able to contact measurement at the same time are the lamellar ones Contact elements electrically isolated from each other as a stack on two elastic Bands lined up so that each contact element for measurement with a first Contact area against a connection of the component to be measured and with a second spatially offset contact area against the associated measuring contact resilient. However, it is a reliable one, especially at higher powers Contacting and measurement with such a measuring device is not possible.

The object of the invention is to demonstrate a method and a measuring device which enables reliable measurement at high power.  

To solve this problem is a method according to claim 1 or 3 and a measuring device designed according to claim 19.

The invention allows a particularly simple constructive training reliable measurement, especially high-frequency measurement at high power (measured components per unit of time). The invention is based on the Figures explained using exemplary embodiments. Show it:

FIG. 1 is a simplified representation in top view of a component to be measured after the punching out of a lead frame;

FIG. 2 shows a simplified representation and a top view of a back-end machine for processing the components according to FIG. 1;

Fig. 3 according to an enlarged partial view of a measuring device of the invention;

Fig. 4 shows the measuring device of Figure 1 in plan view.

Figs. 5 and 6 in partial view and in side view of the measuring device of Figure 1 in two different working positions.

Fig. 7 is a valve disposed in a receiving or measuring position of the measuring device in an enlarged view and in top view, together with the lateral measuring contacts;

Fig. 8 shows a simplified representation in side view of a measuring device having the measuring station of an apparatus for working or processing of electrical components, such as a back-end machine, for the electrical components.

In the figures are 1 electrical components in the form of SMDs with extremely small dimensions. The components 1 are intended for applications in the GHz range and have, for example, a 3dB cut-off frequency in the range of 10 GHz. The components have, inter alia, a housing 2 in which the respective semiconductor chip is accommodated and from which the electrical connections 3 , that is to say a total of six connections 3 , are provided on two opposite longitudinal sides on both sides of a central plane M.

Fig. 2 shows as an example a so-called back-end machine 4, which serves, among other things, the individual devices 1 which are arranged in a lead frame 5 in a plurality of parallel rows, from this lead frame in a die-cutting station 6 , which is fed to the lead frame 5 , then to be conveyed by means of a first conveyor 7 to a second conveyor 8 , on which the components are each individually and in a predetermined orientation, ie with their connections 3 perpendicular to the horizontal conveying direction A of the conveyor 8 arranged at the lower end are held by vacuum holders 9 which follow one another in the transport direction A of the transporter 8 and are moved in a clocked manner. The components 1 , which are, for example, transistors, integrated circuits, etc., are moved with the transporter 8 to, among other things, a measuring station 10 , at which a high-frequency measurement or test of the high-frequency properties of each component 1 is carried out, in particular. Depending on the measurement result, among other things, the components 1 are then either discarded or classified at their stations 11 according to their properties or sorted in trays or classified at their belt stations 12 according to their properties or belted. Such a back-end machine, but not with a high-frequency measuring station, is described, for example, in the PCT application, AZ: PCT / DE 98/00268 (WO 98/34452).

In order to achieve high performance for the back-end machine 4 , it is also necessary for the high-frequency measurement of the individual components 1 to be carried out very quickly with the required high precision. A measuring device which, among other things, fulfills these requirements is shown in more detail in FIGS . 3-7 and is generally designated 13 there. Fig. 8 shows the measuring station 10 by the measuring device. 13

The measuring device 13 comprises a circuit board 14 which, in the embodiment shown, is oriented with its surface sides in the horizontal direction and is arranged below the movement path of the components 1 held on the vacuum holders 9 .

The circuit board 14 made of electrically insulating material has, among other things, the measuring electronics (not shown) and measuring contacts 15 on both sides of a vertical plane labeled VE in FIGS . 3.5-7. In the embodiment shown, these are each formed by a rectangular metal surface on the top of the circuit board 14 . The board 14 is for example a ceramic plate, the z. B. using the DCB process known to those skilled in the art (direct copper bonding method - US Pat. No. 37 44 120) and subsequent structuring and surface finishing (nickel plating) with the measuring contacts 15 . In the embodiment shown, the rectangular measuring contacts 15 lie with their longitudinal extent perpendicular to the plane VE enclosing the conveying direction A.

The number and arrangement of the measuring contacts 15 corresponds to the number and arrangement of the connections 3 of the components, in such a way that each connection 3 whenever a component 1 has reached the measuring device 13 or the measuring position there during the clocked movement of the transporter 8 this component is arranged directly above a measuring contact 3 . The central plane M of the respective component 1 lies in the plane VE. The connections 3 projecting from the component 1 on both sides are perpendicular to the plane VE with their longitudinal extent.

In order to establish a connection between the respective connection 3 and the associated measuring contact 15 in the shortest possible electrical way, movable contact elements 16 are provided on the measuring device 13 , which in the embodiment shown are small rollers made of metal, ie of a metal suitable for measuring contacts. Because of the skin effect at high frequencies, the contact elements 16 z. B. made of copper with surface finishing (z. B. of nickel).

The contact elements 16 are each freely rotatable about a horizontal axis parallel to the transport direction A and about a predetermined stroke, which is indicated in the figures with the double arrow B, in an axial direction perpendicular to the plane VA between a non-activated initial position which does not touch the connections 3 Movable at a greater distance from the plane VE and a measuring position such that the contact elements 16 in the measuring position each bear with a precisely defined force against the blunt end of a connection 3 and with a likewise precisely defined force against the associated measuring contact 15 and thus the electrical Establish connection between the respective connection 3 and the associated measuring contact 15 of the measuring board 14, specifically via two spatially separated contact areas.

During the infeed movement from the starting position into the measuring position and during the movement after measuring from the measuring position back into the starting position, the contact elements 16 each roll on their associated measuring contact 15 , so that each contact element 16 thereby has different surface areas with each new measurement. or contact areas against the terminal 3 and against the measuring contact 15 and so long standing times for the measuring device 13 and in particular its contact elements 16 are reached before an exchange of this measuring device 13 or its contact elements 16 is necessary, for example because of contamination of the contact elements 16 by Tin which, when the components 1 are punched out, reaches the ends of the connections 3 from the tin-plated lead frame.

The described way of establishing the electrical connection between the connections 3 and the measuring contacts 15 via the contact elements 16 has the advantage, among other things, that the connection is made in a very short way, which is essential for the high-frequency measurement that the contact to the Connections 3 are made on the end faces of the free ends of these connections, which (ends) were generated shortly beforehand by punching the components 1 out of the lead frame 5 . The free ends of the connections 3 thus form high-quality contact surfaces, in particular also not contaminated by oxides, etc., which enable a faultless measurement in a short time. Furthermore, the contact elements 16 can be pressed with a precisely defined force both against the respective connection 3 and against the associated measuring contact 15 , in order to achieve perfect contacting and measurement.

In the embodiment shown, the roller-like or disk-like contact elements 16 are each provided at one end 17 ′ of a lamellar carrier 17 , which is made of a plastic material suitable for high-frequency applications and is arranged with its surface sides perpendicular to the plane VE. Between the two ends 17 'and 17 ", the carriers 17 are convexly curved on their upper long side and concave on their lower long side.

To hold the respective contact element 16 , the carrier 17 is provided at the end 17 ′ on a surface side 17 ″ ″ with a recess 18 , the depth of which is equal to or slightly greater than the thickness of the respective disk-like contact element 16 . In each recess 18 a pin 19 is provided, which is perpendicular to the surface sides of the carrier 17 with its axis and on which the respective measuring element 16 is freely rotatable. As the figures also show, the carriers 17 are each curved in an arcuate manner between their two ends 17 'and 17 "and are otherwise arranged above the plate 14 in such a way that the concave lower longitudinal side of each extending between the ends 17 ' and 17 " Carrier 17 faces the top of the board 14 .

The carriers 17 are each provided with incisions 21 , which partially start from the convex upper long side of these carriers and partially from the lower concave long side. By means of the incisions 21 , the supports 17 can be elastically deformed, for example by pressing on the upper convex long side, in the manner of a bow spring, namely from the relaxed state with a smaller radius of curvature between the two ends 17 'and 17 "into a loaded state with a larger radius of curvature and thus also with one greater distance between these two ends 17 'and 17 ".

The supports 17 are arranged on both sides of the level VE directly adjacent to one another in stacks 22 , namely in the conveying direction A successively in such a way that each surface side 17 '''with a contact element 16 arranged in the recess 18 there adjoins a surface side 17 "" of a subsequent support 17 lies, so that the contact element 16 is secured in each carrier 17 by the adjacent carrier 17 against falling out. In order to secure all contact elements 16 in this way, each stack 22 has an additional carrier 17 without contact element 16 .

The carriers 17 of each stack 22 are fastened at the end 17 ″ remote from the plane VE to a common bearing 23 of a carrier 24 , in such a way that the carriers 17 can be exchanged quickly. The board 14 is also on the carrier 24 attached.

The supports 17 of each stack 22 are received between the legs 25 'of a pressure plate 25 which is U-shaped in cross section and which, with a yoke section 25 ''connecting the legs 25 ', bears against the concave upper longitudinal side of the supports 17 of the relevant stack 22. Each pressure plate 25 is connected via a side tab 26 to a plunger 27 , which can be moved up and down in a controlled manner, as is indicated in FIG. 3 by the double arrow C, so that with each downward stroke of the plunger 27 via the pressure plates 25 a deformation of the carrier 17 takes place in such a way that the contact elements 16 move from the starting position into the measuring position and rest there with the defined force against the respective connection 3 and the contact surface 15. When the plunger 27 is lifted upwards, the contact elements 16 move back again in their starting position (double arrow B).

At the measuring device 13 or at the measuring position there, a lower centering and clamping unit 28 is also provided, sprung at the upper end of a vertical plunger 29 , which is driven by the drive of the measuring device 10 having the measuring device in the vertical direction by a predetermined stroke - and can be moved (double arrow D).

The centering and clamping unit 28 forms a V-shaped receptacle 30 which is open towards the top and has two lateral inclined centering surfaces 30 'which are offset from one another in the conveying direction A and against which the end faces of the components 1 and / or the connections 3 which do not have the connections 3 are centered whose case 2 abut. Furthermore, the centering and clamping unit forms two lower clamping elements 31 , which are offset by 90 ° about the vertical axis with respect to the centering surfaces 30 'and form clamping surfaces 31 ' at their free ends as well as inclined centering surfaces 31 "thereafter, for centering the Components 1 or their housings 2 on the long sides having the connections 3. The centering surfaces 31 ″ are designed, for example, in a web-like manner in such a way that they only interact with the long sides of the housings 2 having the connections 3 outside these connections 3 .

The centering and clamping unit 28 or its centering element 30 with the centering surfaces 30 'and its clamping elements 31 are, for example, a single functional element. Basically, however, there is also the possibility of forming the centering and clamping unit 28 in several parts, in particular also in such a way that a relative movement between the centering element 30 and the clamping elements 31 in the vertical direction is possible.

Two upper clamping elements 32 are also provided on the measuring device 13 , namely on both sides of the plane VE in such a way that each upper clamping element 32 with a clamping surface 32 'is opposite a clamping surface 31 '.

The elements of the centering and clamping unit 28 and the upper clamping elements 32 each consist of an electrically insulating, wear-resistant material suitable for high-frequency applications and are made, for example, of ceramic, at least in their areas that correspond to the respective component to be measured 1 are adjacent. The upper clamping elements 32 are each fastened to a holder 33 , which in turn is held at the upper end of a vertical plunger 34, which can be moved up and down by a drive by a predetermined stroke (double arrow E).

The method of operation of the measuring device 13 can thus be described as follows:

• - Whenever a component 1 held on a vacuum holder 9 has reached the measuring position of the measuring device 13 , the following functions are carried out during the subsequent standstill phase of the clocked conveyor 8 :
• - First, the centering and clamping unit 28 is moved upwards via the plunger 29 , so that the component 1 is received by the centering opening 30 , centered there in the axis of the transport direction A on the centering surfaces 30 ', specifically with the vacuum holder 9 held Component 1 . The clamping surfaces 31 ′ bear against the underside of all connections 3 . The connections 3 lie in a common plane perpendicular to the plane VE above that plane in which the axes of the disk-like contact elements 16 are located.
• - The upper clamping elements 32 are then lowered by the synchronous actuation of the associated plunger 34 , with which the connections 3 are first clamped between the clamping surfaces 31 'and 32 ' and when the clamping elements 32 move further downward and the resilient yielding of the centering and clamping unit 28 the respective component 1 is released from the vacuum holder 9 , specifically with the positioning now secured between the clamping elements 32 and the centering and clamping unit 28 . The component 1 is lowered to such an extent that the plane of the connections 3 lies in the plane in which the axes of all the contact elements 16 are located.
• - If this state is reached, by synchronously operating the plunger 27 and lowering the pressure plates 25, the carrier 17 is deformed such that the disc-shaped contact elements 16 against the clamping between the lower clamping elements 31 and the upper clamping elements 32 with a short length projecting ends of the connections 3 come into contact with a predetermined force and at the same time are also pressed against the associated measuring contact 15 with a predetermined force.

, Is the one hand, pressed with each contact element 16 against the terminal 3 and on the other hand against the measuring contact 15, the forces of the pressure plate 25 are determined by the elasticity or spring constant of the carrier 17 as well as by the curvature at a given stroke. These parameters can be selected to achieve the required contact forces.

After the measurement process has been carried out, the functional elements described are moved in the reverse order, ie the pressure plates 25 are first moved upwards by the measuring elements 16 to release the connections 3 . Subsequently, the clamping elements 32 are moved upward, so that when the centering and clamping unit 28 is resiliently adjusted and the component 1 continues to be held securely, the latter is again gripped by the vacuum holder 9 with its housing 2 . After the clamping elements 32 have finally been moved upwards and the centering and clamping unit 28 has been lowered, the measured component 1 is then moved further in the new movement step of the conveyor 8 and a new component 1 arrives in the measuring position of the measuring device 13 .

The fact that the respective component 1 is spaced from the vacuum holder 9 during the measurement also ensures, inter alia, that the measurement result is not falsified by the vacuum holder 9 , in particular not even if this vacuum holder consists of a material which is not suitable for high-frequency applications and / or foreign substances, etc., which impair the high-frequency measurement, may have been deposited in the vacuum holder 9 .

As has already been stated, the measuring device 13 is part of the measuring station 10 and is provided there on the upper side of a housing 35 of this measuring station. A central slide 36 is slidably provided in the housing 35 , specifically in an axial direction perpendicular to the plane VE. The slider 36 has various control cams 37 , into which engaging drivers or guide pieces provided on the tappets 27 , 29 and 34 engage. Appropriate training of the control grooves 37 inevitably ensures that the movements of the functional elements of the measuring device 13 or the measuring station 10 are carried out in the required chronological order. The slide 36 is controlled by the central drive of the back-end machine 4 . The measuring station 10 can be replaced as a complete unit.

As described above, in the embodiment shown, the components are measured before the connections 3 are bent into the S shape that is customary for SMD components.

The invention has been described above using an exemplary embodiment. It it goes without saying that numerous changes and modifications are possible without that this leaves the inventive idea on which the invention is based.

It was assumed above that the individual carriers 17 are actuated by a pressure plate 25 acting on the upper side of these carriers between the ends 17 'and 17 "for the purpose of moving the contact elements 16 in and out. In principle there is also the possibility of setting and moving the contacts To effect contact elements 16 in that, for example, the ends 17 ″ of the supports 17 lying with their top against a fixed stop, ie for example against a non-movable pressure plate, are moved back and forth in the direction of the plane VE, as shown in FIG . 3 is indicated with the local double arrow B 'of FIG, through corresponding controlled movements of the bearing 23. Of course, it is also possible to combine both types of drive.

Instead of the disk-shaped contact elements 16 , other contact elements are also conceivable, for example contact elements sliding on the measuring contacts 15 .

Reference list

1

Component

2

Component housing

3rd

Connection

4

Back-end machine

5

Lead frame

6

Punching station

7

,

8th

carrier

9

Vacuum holder

10th

Measuring station

11

Sorting station

12th

Belt station

13

Measuring device

14

PCB of the measuring circuit

15

Measuring contact

16

movable contact element

17th

Contact element carrier

17th

',

17th

" The End

17th

'' ',

17th

"" Surface side

18th

Recess

19th

Cones

21

incision

22

stack

23

camp

24th

carrier

25th

printing plate

25th

'Thigh

25th

"Yoke piece

26

Extension (tab)

27

Pestle

28

Weight and clamping unit

29

Pestle

30th

Centering element

30th

'' Centering surface

31

Clamping element

31

'' Clamping surface

31

"Centering surface

32

Clamping element

32

'' Clamping surface

33

holder

34

Pestle

35

casing

36

Spool

37

Control groove

Claims (37)

1. A method for measuring, in particular high-frequency, measurement of electrical components, for example SMDs, which have electrical connections ( 3 ) which protrude from a component housing ( 2 ) and which, when the components ( 1 ) are punched free, from a lead frame on the respective component ( 1 ) remaining material sections of the lead frame are formed, the connections ( 3 ) of each component being connected to measuring contacts ( 15 ) of a measuring circuit ( 14 ) during measurement via movable contact elements ( 16 ), characterized in that during measurement the electrical connection between the Contact elements ( 16 ) and the respective connection ( 3 ) on the cut or front side of the connections ( 3 ) generated during punching. 2. The method according to claim 1, characterized by the use of contact elements (16) sliding or moving between a starting position and a measuring position in each case at least one measuring contact (15) of the measuring circuit (14) roll and during the measurement with a first surface area against the at least one measuring contact ( 15 ) and with a second measuring range deviating from the first against the relevant connection of the component ( 1 ). 3. A method for measuring, in particular high-frequency, measurements of electrical components, for example SMDs, which have electrical connections ( 3 ) protruding from a component housing ( 2 ), the connections ( 3 ) of each component being measured via movable contact elements ( 16 ) with measuring contacts ( 15 ) a measuring circuit ( 14 ), characterized by the use of contact elements ( 16 ) which slide or roll when moving between a starting position and a measuring position on at least one measuring contact ( 15 ) of the measuring circuit ( 14 ). 4. The method according to claim 3, characterized in that the connections ( 3 ) of when the components ( 1 ) are punched out of a lead frame on the respective component ( 1 ) remaining material sections of the lead frame are formed, and that when measuring the electrical connection between the contact elements ( 16 ) and the respective connection ( 3 ) on the cut or end face of the connections ( 3 ) generated during the punching. 5. The method according to any one of the preceding claims, characterized in that the contact elements ( 16 ) during the measurement with a first surface or contact area against the at least one measuring contact ( 15 ) and with a second, from the first spaced area or contact area against the relevant connection ( 3 ) of the component ( 1 ) is present. 6. The method according to any one of the preceding claims, characterized in that the measurement in a production line takes place immediately after the components ( 1 ) have been punched free from a lead frame. 7. The method according to any one of the preceding claims, characterized in that the connections ( 3 ) are secured against lateral deflection or bending during the measurement. 8. The method according to claim 7, characterized in that the connections ( 3 ) are clamped between the clamping elements ( 31 , 32 ) during the measurement. 9. The method according to claim 8, characterized by the use of clamping elements ( 31 , 32 ) which at least on their clamping surfaces ( 31 ', 32 ') consist of an electrically insulating material, preferably of a material which has low dielectric losses even at high frequencies has, for example made of ceramic. 10. The method according to any one of the preceding claims, characterized in that the components ( 1 ) for measuring on holders, preferably on vacuum holders ( 9 ) are fed to a measuring position ( 13 ). 11. The method according to claim 10, characterized in that the components on the Measuring position before measuring while maintaining a predetermined one Orientation removed from the holder and after measuring again under Retaining a given orientation returned to the holder become. 12. The method according to any one of the preceding claims, characterized in that the components ( 1 ) are aligned before measuring. 13. The method according to any one of the preceding claims, characterized in that the respective contact element ( 16 ) bears during the measurement with a first, predetermined force against the measuring contact and with a second, predetermined force against the respective connection ( 3 ). 14. The method according to claim 13, characterized in that the first force acts in the direction perpendicular to the measuring contact ( 15 ) and the second force in the longitudinal direction of the connection ( 3 ). 15. The method according to any one of the preceding claims, characterized in that the two contact areas, on the one hand between the connection ( 3 ) of the respective component ( 1 ) and the contact element ( 16 ) and on the other hand between the contact element ( 16 ) and the measuring contact ( 15th ) are formed, offset by an angular range on the outer surface of the contact element ( 15 ) are provided. 16. The method according to any one of the preceding claims, characterized by the use of contact elements ( 16 ), which are each provided on a carrier consisting of an electrically insulating material ( 17 ). 17. The method according to any one of the preceding claims, characterized in that the movement of the contact elements ( 16 ) is carried out by moving the carrier ( 17 ). 18. The method according to any one of the preceding claims, characterized in that the movement of the contact elements ( 16 ) takes place by elastic deformation of the support ( 17 ) designed as a spring, preferably as a bow spring. 19. Device for measuring, in particular high-frequency, measurements of electrical components ( 1 ), for example SMDs, with a plurality of electrical connections ( 3 ) projecting from a component housing ( 2 ), with a measurement circuit ( 14 ) with a plurality of measurement contacts ( 15 ) and with contact elements ( 16 ), which can be moved from an initial position to a measuring position for establishing electrical connections between the connections ( 3 ) of the component to be measured ( 1 ) and the measuring contacts ( 15 ), in which the contact elements ( 16 ) each have a first contact area against a connection ( 3 ) of the component ( 1 ) and with a second contact area against a measuring contact ( 15 ), characterized in that the contact elements ( 16 ) are each provided on their own carrier ( 17 ) which at least partially consists of an electrically insulating material , and movable with this carrier ( 17 ) between the starting position and the measuring position are. 20. Measuring device according to claim 19, characterized in that the carrier ( 17 ) are designed like a bow spring. 21. Measuring device according to claim 19 or 20, characterized in that for measuring components ( 1 ) with at least two on at least one side of the housing ( 2 ) projecting connections ( 3 ) at least two lamellar carriers ( 17 ) each with at least one contact element ( 16 ) are provided in a stack ( 22 ) adjacent to one another. 22. Measuring device according to one of the preceding claims, characterized in that the carriers ( 17 ) are designed lamella-like and are arranged with their larger surface sides ( 17 ''', 17 "") perpendicular to an axial direction in which the connections ( 3 ) along the at least one housing side of the component to be measured ( 1 ) follow one another. 23. Measuring device according to one of the preceding claims, characterized in that the carrier (17) of the measuring device (13) are preferably held removably on a the contact elements (16) distal end to a bearing (23). 24. Measuring device according to one of the preceding claims, characterized in that means ( 25 ) are provided in order to elastically deform the arc spring-like carrier ( 17 ) in the sense of increasing the radius of curvature, in order to thereby bring the contact elements ( 16 ) from the starting position into the measuring position to move. 25. Measuring device according to claim 24, characterized in that the means are formed by a pressure element ( 25 ) acting on a convex side of the carrier ( 17 ). 26. Measuring device according to one of the preceding claims, characterized in that the carrier ( 17 ) cooperate at an end remote from the contact elements ( 16 ) with an actuator which moves the carrier ( 17 ) in its longitudinal direction, specifically for the movement of the contact elements ( 16 ) between the starting position and the measuring position. 27. Measuring device according to one of the preceding claims, characterized in that means ( 30 , 31 , 32 ) are provided at a measuring position formed by the measuring device for centering and / or clamping the component to be measured ( 1 ) and / or the connections ( 3 ) are. 28. Measuring device according to one of the preceding claims, characterized in that the contact elements ( 16 ) are each provided on a first surface side ( 17 ''') of the respective carrier ( 17 ), and that the carrier ( 17 ) to the stack ( 22nd ) are arranged such that each contact element ( 16 ) on a first surface side ( 17 ''') of a carrier ( 17 ) is adjacent to the second surface side ( 17 "") of an adjacent carrier ( 17 ) which does not have such a contact element ( 16 ) . 29. Measuring device according to one of the preceding claims, characterized in that the contact elements on the respective carrier ( 17 ) are preferably provided interchangeably, at least on their outer surface, are electrically conductive bodies. 30. Measuring device according to one of the preceding claims, characterized in that the contact elements ( 16 ) are disc-like or roll-like and are freely rotatably mounted on the respective carrier ( 17 ) such that the contact elements when moving between the starting position and the measuring position Roll off the associated measuring contact ( 15 ). 31. Measuring device according to one of the preceding claims, characterized in that the measuring position of the measuring device ( 13 ) is selected such that each connection ( 3 ) with respect to at least one associated measuring contact ( 15 ) in an axis perpendicular or approximately perpendicular to the surface of the measuring contact is spaced. 32. Measuring device according to one of the preceding claims, characterized in that the curved spring-like carrier ( 17 ) with the concave side of their curvature facing a plane in which the measuring contacts ( 15 ) are located. 33. Measuring device according to one of the preceding claims, characterized in that means ( 28 , 32 ) are provided to the respective component ( 1 ) transported by means of a holder, for example by means of a vacuum holder ( 9 ) in the measuring device before the measurement while maintaining a Remove the given orientation from the holder and move it to the measuring position and return it to the holder after the measurement. 34. Measuring device according to one of the preceding claims, characterized in that the carriers ( 17 ) each have a molded-on pin ( 19 ) for the rotatable mounting of a disk-like or roller-like contact element ( 16 ). 35. Measuring device according to one of the preceding claims, characterized in that the movement of the contact elements ( 16 ) and the movement of the centering and clamping means ( 28 , 32 ) by a common drive ( 36 ), preferably via control cams ( 37 ). 36. Measuring device according to claim 35, characterized in that the common drive is formed by at least one control slide ( 36 ) in a housing ( 35 ) having the measuring device ( 13 ). 37. Measuring device according to one of the preceding claims, characterized in that it is part of a measuring station ( 10 ) in a production line or machine processing the electrical components ( 1 ), for example part of a back-end line machine.