DD283691A5 - Festkoerpermatrix-detektor fuer ein spektrometer - Google Patents
Festkoerpermatrix-detektor fuer ein spektrometer Download PDFInfo
- Publication number
- DD283691A5 DD283691A5 DD88321968A DD32196888A DD283691A5 DD 283691 A5 DD283691 A5 DD 283691A5 DD 88321968 A DD88321968 A DD 88321968A DD 32196888 A DD32196888 A DD 32196888A DD 283691 A5 DD283691 A5 DD 283691A5
- Authority
- DD
- German Democratic Republic
- Prior art keywords
- pixels
- sub
- detector
- chip
- array
- Prior art date
Links
- 230000003595 spectral effect Effects 0.000 claims abstract description 36
- 230000005855 radiation Effects 0.000 claims abstract description 29
- 239000011159 matrix material Substances 0.000 claims abstract description 19
- 238000003491 array Methods 0.000 claims abstract description 13
- 239000006185 dispersion Substances 0.000 claims abstract description 8
- 239000007787 solid Substances 0.000 claims description 9
- 230000004044 response Effects 0.000 claims description 2
- 230000003287 optical effect Effects 0.000 abstract description 11
- 239000004020 conductor Substances 0.000 description 13
- 238000005259 measurement Methods 0.000 description 8
- 238000010521 absorption reaction Methods 0.000 description 7
- 238000001228 spectrum Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 6
- 230000035945 sensitivity Effects 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 238000001514 detection method Methods 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- 239000010703 silicon Substances 0.000 description 5
- 238000012546 transfer Methods 0.000 description 5
- 206010034972 Photosensitivity reaction Diseases 0.000 description 3
- 238000012937 correction Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 230000036211 photosensitivity Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 229910002804 graphite Inorganic materials 0.000 description 2
- 239000010439 graphite Substances 0.000 description 2
- 238000009616 inductively coupled plasma Methods 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 238000009825 accumulation Methods 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000001479 atomic absorption spectroscopy Methods 0.000 description 1
- 238000001636 atomic emission spectroscopy Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 238000001444 catalytic combustion detection Methods 0.000 description 1
- 230000005465 channeling Effects 0.000 description 1
- 238000003776 cleavage reaction Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 230000007017 scission Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000012883 sequential measurement Methods 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 238000002211 ultraviolet spectrum Methods 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
- G01J3/1809—Echelle gratings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Spectrometry And Color Measurement (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US07/123,025 US4820048A (en) | 1987-11-19 | 1987-11-19 | Detector for a spectrometer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DD283691A5 true DD283691A5 (de) | 1990-10-17 |
Family
ID=22406304
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DD88321968A DD283691A5 (de) | 1987-11-19 | 1988-11-18 | Festkoerpermatrix-detektor fuer ein spektrometer |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4820048A (ja) |
| EP (1) | EP0316802B2 (ja) |
| JP (1) | JP2760818B2 (ja) |
| AU (1) | AU625233B2 (ja) |
| CA (1) | CA1321898C (ja) |
| DD (1) | DD283691A5 (ja) |
| DE (1) | DE3888925T3 (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19512793A1 (de) * | 1994-04-06 | 1995-10-12 | Thermo Jarrell Ash Corp | Analysesystem und -verfahren |
Families Citing this family (46)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DD270133A1 (de) * | 1988-03-11 | 1989-07-19 | Akad Wissenschaften Ddr | Anordnung zur untersuchung hochaufgeloester teilspektren eines echelle-spektrums |
| DE3811923C2 (de) * | 1988-04-09 | 1995-02-02 | Bodenseewerk Perkin Elmer Co | Atomemissionsspektrometer mit Untergrundkompensation |
| DE3811922C2 (de) * | 1988-04-09 | 1994-09-15 | Bodenseewerk Perkin Elmer Co | Atomemissions-Spektrometer |
| DE3878687T2 (de) * | 1988-08-17 | 1993-06-09 | Hewlett Packard Gmbh | Spektrometer mit fotodiodenanordnung. |
| US5022755A (en) * | 1989-05-09 | 1991-06-11 | Varian Associates, Inc. | Photodiode configurations for simultaneous background correction and specific wavelength detection |
| US4997281A (en) * | 1989-08-24 | 1991-03-05 | Stark Edward W | Grating spectrometer |
| US5088823A (en) * | 1989-09-29 | 1992-02-18 | Thermo Jarrell Ash Corporation | Spectroanalytical systems |
| US5018856A (en) * | 1989-10-30 | 1991-05-28 | The United States Of America As Represented By The Secretary Of Agriculture | Continuum source atomic absorption spectrometry |
| DD292078A5 (de) * | 1990-02-15 | 1991-07-18 | ���k���������������@����@�����@���@�������������k�� | Fchelle-polychromator |
| US5128549A (en) * | 1990-03-30 | 1992-07-07 | Beckman Instruments, Inc. | Stray radiation compensation |
| DE4118760A1 (de) * | 1991-06-06 | 1992-12-10 | Zentralinstitut Fuer Optik Und | Echelle-doppelmonochromator |
| DE4143284A1 (de) * | 1991-12-30 | 1992-10-01 | Klaus Eberhard Engel | Integrierter halbleitersensor fuer spektrometer |
| US5303028A (en) * | 1992-08-24 | 1994-04-12 | Eastman Kodak Company | Spectrometer apparatus for calibrating color imaging apparatus |
| US5394237A (en) * | 1992-11-10 | 1995-02-28 | Geophysical & Enviromental Research Corp. | Portable multiband imaging spectrometer |
| JPH06205767A (ja) * | 1992-11-25 | 1994-07-26 | Xerox Corp | 放射線画像形成システム |
| US5412468A (en) * | 1993-03-09 | 1995-05-02 | The Perkin-Elmer Corporation | Grouping of spectral bands for data acquisition in a spectrophotometer |
| US5424827A (en) * | 1993-04-30 | 1995-06-13 | Litton Systems, Inc. | Optical system and method for eliminating overlap of diffraction spectra |
| US5420681A (en) * | 1993-08-03 | 1995-05-30 | Ball Corporation | Modular multiple spectral imager and spectral imager |
| US5428558A (en) * | 1993-12-17 | 1995-06-27 | The Perkin-Elmer Corporation | Correction of spectra for stray radiation |
| US5483337A (en) * | 1994-10-19 | 1996-01-09 | Barnard; Thomas W. | Spectrometer with selectable radiation from induction plasma light source |
| US5755861A (en) * | 1995-05-19 | 1998-05-26 | Brother Kogyo Kabushiki Kaisha | Ink composition, process for its preparation, and ink-jet recording process |
| US5565983A (en) * | 1995-05-26 | 1996-10-15 | The Perkin-Elmer Corporation | Optical spectrometer for detecting spectra in separate ranges |
| US5596407A (en) * | 1995-06-07 | 1997-01-21 | Varian Associates, Inc | Optical detector for echelle spectrometer |
| US5905571A (en) * | 1995-08-30 | 1999-05-18 | Sandia Corporation | Optical apparatus for forming correlation spectrometers and optical processors |
| US5642190A (en) * | 1995-09-01 | 1997-06-24 | Thermo Jarrell Ash Corp. | Dual-axis plasma imaging system for use in spectroscopic analysis |
| US6118474A (en) * | 1996-05-10 | 2000-09-12 | The Trustees Of Columbia University In The City Of New York | Omnidirectional imaging apparatus |
| US6029115A (en) * | 1996-10-03 | 2000-02-22 | Perkin Elmer Llc | Analyzing spectrometric data |
| US6558945B1 (en) * | 1999-03-08 | 2003-05-06 | Aclara Biosciences, Inc. | Method and device for rapid color detection |
| US8264680B2 (en) | 1999-05-28 | 2012-09-11 | Yokogawa Electric Corporation | Biochip reader and electrophoresis system |
| DE60021556T2 (de) | 2000-06-05 | 2006-05-24 | Galileo Avionica- S.P.A., Campi Bisenzio | Spektrometer mit doppeltem ausseraxialen Schmidt-Teleskop |
| EP1260802B1 (en) | 2001-05-25 | 2008-10-29 | Galileo Avionica S.p.A. | Wide-band spectrometer with objective comprising an aspherical corrector mirror |
| US6801309B1 (en) * | 2001-10-16 | 2004-10-05 | Therma-Wave, Inc. | Detector array with scattered light correction |
| US6778270B2 (en) * | 2002-09-13 | 2004-08-17 | Finisar Corporation | Holographic demultiplexor |
| US7123361B1 (en) | 2003-03-05 | 2006-10-17 | Verionix Incorporated | Microplasma emission spectrometer |
| US7309842B1 (en) | 2004-03-19 | 2007-12-18 | Verionix Incorporated | Shielded monolithic microplasma source for prevention of continuous thin film formation |
| US20050263682A1 (en) * | 2004-05-28 | 2005-12-01 | Eikenberry Stephen S | Dual prism/filter for narrowband photometry |
| EP2118931A2 (en) * | 2007-02-23 | 2009-11-18 | Thermo Niton Analyzers LLC | Fast and precise time-resolved spectroscopy with linear sensor array |
| US7990522B2 (en) * | 2007-11-14 | 2011-08-02 | Mitutoyo Corporation | Dynamic compensation of chromatic point sensor intensity profile data selection |
| US7873488B2 (en) * | 2008-12-08 | 2011-01-18 | Mitutoyo Corporation | On-site calibration method and object for chromatic point sensors |
| US7876456B2 (en) * | 2009-05-11 | 2011-01-25 | Mitutoyo Corporation | Intensity compensation for interchangeable chromatic point sensor components |
| US8773659B2 (en) * | 2012-01-13 | 2014-07-08 | Roper Scientific Inc. | Anastigmatic imaging spectrograph |
| US20150284851A1 (en) * | 2014-04-07 | 2015-10-08 | Battelle Memorial Institute | Systems and Methods to Control Sources of Atomic Species in a Deposition Process |
| CN107101723B (zh) * | 2017-06-13 | 2018-05-01 | 钢研纳克检测技术股份有限公司 | 高分辨率中阶梯光栅光谱仪二维偏差谱图分析与校正方法 |
| US10809124B2 (en) | 2018-05-07 | 2020-10-20 | Perkinelmer Health Sciences, Inc. | Spectrometers and instruments including them |
| US11092485B2 (en) | 2018-08-10 | 2021-08-17 | Perkinelmer Health Sciences, Inc. | Compact spectrometers and instruments including them |
| CN112673296A (zh) * | 2018-08-10 | 2021-04-16 | 珀金埃尔默健康科学有限公司 | 紧凑型光谱仪和包括所述光谱仪的仪器 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE359648B (ja) * | 1972-03-17 | 1973-09-03 | N Danielsson | |
| US4049353A (en) * | 1976-08-11 | 1977-09-20 | Spectrametrics, Incorporated | Spectrometric system and cassette |
| US4060327A (en) * | 1976-09-13 | 1977-11-29 | International Business Machines Corporation | Wide band grating spectrometer |
| US4146332A (en) * | 1977-04-19 | 1979-03-27 | The United States Of America As Represented By The Secretary Of The Navy | Spectrometer with electronic readout |
| US4205229A (en) * | 1978-10-31 | 1980-05-27 | Nasa | Cooled echelle grating spectrometer |
| DE2938844A1 (de) * | 1979-09-26 | 1981-04-23 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Verfahren zur auswertung optischer spektren |
| DE2952071A1 (de) * | 1979-12-22 | 1981-09-24 | Ibm Deutschland Gmbh, 7000 Stuttgart | Anordnung zur spektralen zerlegung von licht |
| US4391523A (en) * | 1980-11-13 | 1983-07-05 | Leeman Labs Inc. | Scannable detector system for echelle grating spectrometers |
| FR2519427A1 (fr) * | 1982-01-04 | 1983-07-08 | Instruments Sa | Dispositif de spectrometrie |
| DE3516183A1 (de) * | 1984-07-02 | 1986-01-09 | Jenoptik Jena Gmbh, Ddr 6900 Jena | Optisches system fuer spektralgeraete |
| JPH07107498B2 (ja) * | 1985-04-09 | 1995-11-15 | 株式会社日立製作所 | 多波長同時測光光度計 |
-
1987
- 1987-11-19 US US07/123,025 patent/US4820048A/en not_active Expired - Lifetime
-
1988
- 1988-10-26 CA CA000581269A patent/CA1321898C/en not_active Expired - Fee Related
- 1988-11-11 DE DE3888925T patent/DE3888925T3/de not_active Expired - Fee Related
- 1988-11-11 EP EP88118828A patent/EP0316802B2/en not_active Expired - Lifetime
- 1988-11-18 AU AU25688/88A patent/AU625233B2/en not_active Ceased
- 1988-11-18 DD DD88321968A patent/DD283691A5/de not_active IP Right Cessation
- 1988-11-18 JP JP63290338A patent/JP2760818B2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19512793A1 (de) * | 1994-04-06 | 1995-10-12 | Thermo Jarrell Ash Corp | Analysesystem und -verfahren |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH022906A (ja) | 1990-01-08 |
| EP0316802B2 (en) | 1997-08-20 |
| AU2568888A (en) | 1989-05-25 |
| DE3888925T3 (de) | 1997-12-04 |
| DE3888925D1 (de) | 1994-05-11 |
| AU625233B2 (en) | 1992-07-02 |
| JP2760818B2 (ja) | 1998-06-04 |
| DE3888925T2 (de) | 1994-07-21 |
| US4820048A (en) | 1989-04-11 |
| CA1321898C (en) | 1993-09-07 |
| EP0316802A3 (en) | 1990-09-05 |
| EP0316802B1 (en) | 1994-04-06 |
| EP0316802A2 (en) | 1989-05-24 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ENJ | Ceased due to non-payment of renewal fee | ||
| WEVS | Restitution into prior status | ||
| ENJ | Ceased due to non-payment of renewal fee |