CN86101321A - Short pulse test equipment of solar cells technical scheme - Google Patents
Short pulse test equipment of solar cells technical scheme Download PDFInfo
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- CN86101321A CN86101321A CN86101321.2A CN86101321A CN86101321A CN 86101321 A CN86101321 A CN 86101321A CN 86101321 A CN86101321 A CN 86101321A CN 86101321 A CN86101321 A CN 86101321A
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- solar cell
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Abstract
At present with the test equipment of solar cells of long arc pulse xenon lamp as testing light source, complex structure, bulky and cost an arm and a leg.This programme will be photographed and be migrated as testing light source with multitime flash lamp or similar short-pulse light (light pulse duration millisecond is following), measure the dark characteristic and the series impedance of solar cell earlier, determine the volt-ampere characteristic of solar cell under illumination in view of the above, and then obtain various unit for electrical property parameters.This programme is simple in structure, and power consumption is low, and volume is little, is easy to carry, and cost is low, and test area can be greater than some square metres, and indoor or field condition all can use.
Description
The present invention relates to a kind of solar cell (single solar cell and various dissimilar compoboard) electric performance test device, can measure the volt-ampere characteristic of solar cell, and and then obtain various unit for electrical property parameters.
Complete or the support equipment that modern test equipment of solar cells is made up of several sections such as solar simulator, electronic load and computer data processing systems.Wherein solar simulator stable state arranged with two kinds of pulsed.The irradiance of stable state solar simulator is invariable, and energy and fairly simple computer data processing system match.But major defect is the test that is difficult to be applied to the large-area solar cell compoboard, and the average power consumption of measuring every square metre of compoboard is difficult to be lower than tens kilowatts, so equipment is huge, costs an arm and a leg.Another shortcoming is that continuous light causes solar cell temperature sharply to raise.
The pulsed solar simulator has overcome above-mentioned two shortcomings to a certain extent, adopt tens kilowatts of instantaneous powers and average power only be its stroboscopic formula flashlight (long arc pulse xenon lamp) of 1/10th as testing light source, the duration of each light pulse is a millisecond order of magnitude.A data point on the volt-ampere characteristic is measured in each flash of light.Load changes by giving fixed sequence in the test process, and the every change of load is once glistened once.Memory gets off the data recording of being measured successively, becomes a volt-ampere characteristic after gathering.It is to gather tens groups of data in the long pulse flash of light of a Millisecond that a kind of device is arranged in early days in addition, is unified into a curve again.Require data acquisition system (DAS) very accurate like this, and be unified into a volt-ampere characteristic with tens groups of data and also still dislike coarse.
The advantage that above-mentioned two kinds of pulsed proving installations are compared with the steady state test device is apparent in view.At first being that power consumption reduces greatly, secondly is that the temperature of measured piece is subjected to the influence of illumination very little in test process.But problem does not also solve fully.At first be that the power consumption of measuring every square metre of compoboard also needs several kilowatts, device still belongs to huge and expensive.Selected long arc pulse xenon lamp price is more expensive, adds the complicated light pulse of a cover again and forms circuit, data accumulation and disposal system etc., and price can not be fallen.And the spectral characteristic of long arc pulse xenon lamp is good inadequately and departing from of solar spectrum still dislikes big, so reduced measuring accuracy.
As far back as 1970, existing document is pointed out basic principle (M.S.Imamura theoretically, P.Brandtzaeg and J.L.Miller, " Solar cell dark I-V characteristics and their applications ", Energy 70 Proceedings(The Fifth Intersociety Energy Conversion Engineering Conference), Vol.1, P.10/38-45), be exactly according to the dark characteristic of solar cell and the voltage drop on the resistance in series, the volt-ampere characteristic under can its illumination of prediction.This programme makes above-mentioned principle obtain further developing with perfect, has solved various concrete technical matterss, becomes the technical scheme that can directly be used for designing test equipment of solar cells.
Derived expression: R in above same document
S=V
D-V
L/ I
SC, V in the formula
LCan be the open-circuit voltage V under the solar cell illumination
OC, formula V at this moment
DShould be fooled dark current of dark characteristic and short-circuit current I mutually
SCSolar cell upper end magnitude of voltage when equating, this V
DValue can be found out on dark characteristic.From the resistance in series R that obtains
SValue and dark characteristic just can be determined the volt-ampere characteristic under this solar cell illumination.
The objective of the invention is to solve the various shortcoming of existing pulsed proving installation, make huge proving installation become portable, can not only be used for indoorly, also can carry out the field condition test.The present invention will discard expensive long arc pulse xenon lamp and complicated accessory circuit, makes the cost of proving installation reduce significantly and be convenient to and popularizes.Adopt photography multitime flash lamp or similar short-pulse light as testing light source, the spectral characteristic of this class short-pulse light approaches daylight very much, does not need to add any optical filter.
The principle of this programme is such: the difference of the volt-ampere characteristic of solar cell under illumination and dark characteristic is by series resistors inside R fully
SOn voltage drop cause, as long as measure resistance in series RS and dark characteristic, just can obtain the volt-ampere characteristic under the illumination.And dark characteristic can be measured with any classic method easily, so the crucial resistance in series RS that measures how.
This programme is migrated as testing light source with photography multitime flash lamp or similar short-pulse light.Because they are cheap, trigger circuit is simple, and the small and exquisite and spectral characteristic of volume approaches daylight very much.But the spike part duration of the light pulse that this class short-pulse light sends is tens microseconds or shorter only, do not have flat part, therefore directly measure whole volt-ampere characteristics of solar cell than difficult realization with the single light pulse.This programme only utilizes the peak value of the light pulse of being sent to measure the short-circuit current I of solar cell
SCWith open-circuit voltage V
OC, utilize formula: R
S=V
D-V
L/ I
SCCome indirect determination resistance in series R
S, because this formula also promptly: R
S=V
D-V
OC/ I
SC, V in the formula
DCan on dark characteristic, find out.
The all available monoboard microcomputer of whole test process and data is finished in this programme.
Below in conjunction with accompanying drawing each concrete steps of this programme are described:
Fig. 1 is a block diagram of measuring the dark characteristic of solar cell.Adopt an autoscan power supply (1) as testing power supply, join through the sample resistance (3) of a little resistance and tested solar cell (2).Take out voltage Vd and electric current I d from solar cell (2), be stored in the microcomputer (6) through A/D conversion (4) and (5) respectively.
Fig. 2 is a block diagram of measuring solar batteries and short-circuit current.The peak value of the light pulse of sending with short-pulse light (7) is measured.The electronic load (8) that changes when autoscan scans short circuit when (or on the contrary) by open circuit rapidly, open-circuit voltage V
OCWith short-circuit current I
SCTake out by two sampling holders (9) and (10) respectively, again respectively through A/D conversion (11) and (12) input microcomputer (6).If electronic load (8) sweep velocity is enough fast, only need short-pulse light (7) once to glisten; If sweep velocity is slow, open-circuit voltage V is measured in the available flash of light of secondary in succession respectively
OCWith short-circuit current I
SC
According to above two steps, just can determine series resistors inside R
SBecause in Fig. 1, recorded the dark characteristic of whole piece of solar cell (2), in Fig. 2, recorded the open-circuit voltage V of solar cell (2)
OCWith short-circuit current I
SC, and imported microcomputer (6), therefore can setting program, make microcomputer (6) on dark characteristic, find out automatically when dark current value and equal short-circuit current I
SCThe time correspondent voltage V
D, according to formula: R
S=V
D-V
OC/ I
SCCarry out computing, obtain R
S, store stand-by.
Fig. 3 express how the dark characteristic of solar cell (13) is changed the volt-ampere characteristic (15) under the illumination.Earlier dark characteristic is inverted, and, makes its intercept on current axis equal I its translation that makes progress
SC, (Vd Id) replaces to (Vd, I to be about to the last every bit of dark characteristic (13)
SC-Id), this can be provided with simple calculation procedure and finish, and so just can obtain curve (14).
For same current value, the voltage difference that volt-ampere characteristic under the illumination (15) goes up on voltage and the curve (14) is I
SCR
S, therefore calculation procedure can be set, this curve (14) is gone up every bit (Vd, I
SC-Id) replace to (Vd-I
SCR
S, I
SC-Id), promptly obtain volt-ampere characteristic under the illumination (15).
Be understood that, also can by following method change equally the volt-ampere characteristic (15) under the illumination: setting program, dark characteristic (13) is gone up every bit, and (Vd Id) replaces to (Vd-I
SCR
S, Id), draw the inversion curve of the solar cell volt-ampere characteristic (15) under the illumination of asking, and then again with every bit (Vd-I on this inverted curve
SCR
S, Id) replace to (Vd-I
SCR
S, I
SC-Id), the also convertible volt-ampere characteristic (15) that gets under the illumination.
Fig. 4 is near the block diagram of the current value in volt-ampere characteristic working point under actual measurement solar battery (2) illumination.In order to guarantee measuring accuracy, with solar cell (2) through a little value sample resistance (3) and an adjustable stabilized voltage supply (16) mutually and connect, adjustable stabilized voltage supply (16) is transferred near required voltage value (for example the silicon single crystal solar cell is elected 410 millivolts usually as) solar cell (2) working point.Solar cell (2) promptly obtains this current signal after being subjected to short-pulse light (7) irradiation from sample resistance (3), send into microcomputer (6).Microcomputer (6) is surveyed this point to such an extent that current signal is upward compared corresponding to the current value of same point with the volt-ampere characteristic (15) that above step conversion gets under the illumination by set program, whether error in judgement is in set quota, as exceed, send the instruction of resurveying once immediately, therefore guaranteed measuring accuracy and the reliability that has increased proving installation.
The advantage of this programme is: adopt photography multitime flash lamp or similar short-pulse light to replace expensive long arc pulse xenon lamp, do not need complicated light pulse to form circuit, data accumulation and disposal system etc., simplified device, reduced cost, and the spectral characteristic of this class short-pulse light approaches daylight very much, adopts the long arc pulse xenon lamp can improve measuring accuracy relatively.In whole test process, only need single or two to three flash of light short pulses, per duration of pulse is tens microseconds only, so the whole testing device power consumption can drop to below 100 watts, and the temperature of tested solar cell is also unaffected fully.Existing relatively pulsed test equipment of solar cells, cost can be reduced to it below 1/10th, and relative volume can be little, and weight is also light, on-the-spot test is done in portability to field, but shoot the sun battery component area is increased to tens square metres or bigger from several square metres of present maximum.
When implementing this programme, short-pulse light (7) adopts photography to use the multitime flash lamp most convenient, and valency is the most honest and the cleanest.Monoboard microcomputers such as the optional Z80 of microcomputer (6) are equipped with A/D and D/A converter spare and little machine etc. of beating again.Electronic load (8) should adopt micro-processor controlled autoscan electronic load, and to adopt linear current scanning for well.Measuring the autoscan power supply (1) of dark characteristic can finish with this autoscan electronic load (8) unification electronic circuit.
Claims (5)
1, a kind of test equipment of solar cells technical scheme, measure the dark characteristic [13] and the resistance in series RS value of solar cell [2] earlier, determine the volt-ampere characteristic [15] of solar cell under illumination [2] in view of the above, and then obtain various unit for electrical property parameters, feature of the present invention is to adopt photography multitime flash lamp or similar short-pulse light [7] as testing light source, the open-circuit voltage VOC and the short-circuit current ISC that only utilize the peak value of the light pulse of sending to measure solar cell [2] come indirect determination resistance in series RS value, and whole test process and data processing can be finished with monoboard microcomputer [6].
2, by the described test equipment of solar cells technical scheme of claim 1, it is characterized in that with an autoscan power supply (1) as the power supply of measuring dark characteristic (13), record solar cell (2) dark characteristic of volt-ampere characteristic (13) when not being subjected to illumination, and with each data-storing in microcomputer (6).
3,, it is characterized in that adopting the peak value of the light pulse that photography multitime flash lamp or similar short-pulse light (7) send to measure the open-circuit voltage V of solar cell (2) by claim 1 or 2 described test equipment of solar cells technical schemes
OCWith short-circuit current I
SC, the electronic load (8) that changes when autoscan scans short circuit by open circuit rapidly or when opposite, open-circuit voltage V
OCWith short-circuit current I
SCTaken out by two sampling holders (9) and (10) respectively, respectively through A/D converter (11) and (12) input microcomputer (6), the dark characteristic (13) that makes microcomputer (6) find out solar cell (2) goes up current value and equals short-circuit current I again
SCThe time terminal voltage value V
D, according to formula R
S=V
D-V
OC/ I
SCCarry out computing, obtain resistance in series R
SValue, and store stand-by.
4, by the described test equipment of solar cells technical scheme of claim 3, it is characterized in that being provided with microcomputer (6) calculation procedure, dark characteristic (13) is gone up every bit, and (Vd, Id) value replaces to (Vd, I
SC-Id) be worth, draw the inversion curve (14) of dark characteristic (13), and then again this inverted dark characteristic (14) is gone up every bit (Vd, I
SC-Id) value replaces to (Vd-I
SCR
S, I
SC-Id) value, promptly change the volt-ampere characteristic (15) of solar cell under the illumination (2) of asking, but also setting program (Vd, Id) value replaces to (Vd-I with every bit on the dark characteristic (13)
SCR
S, Id) be worth, draw the inversion curve of the volt-ampere characteristic (15) of solar cell under the illumination (2) of asking, and then again this is inverted every bit (Vd-I on curve
SCR
S, Id) value replaces to (Vd-I
SCR
S, I
SC-Id) value, the volt-ampere characteristic (15) under also convertible the illumination of asking.
5, by the described test equipment of solar cells technical scheme of claim 4, it is characterized in that in order to guarantee measuring accuracy, with solar cell (2) mutually and connect through a little resistance sample resistance (3) and an adjustable stabilized voltage supply (16), adjustable stabilized voltage supply (16) is transferred near required voltage value solar cell (2) working point, after solar cell (2) is subjected to short-pulse light (7) irradiation, from sample resistance (3), promptly obtain this current signal, send into microcomputer (6), microcomputer (6) by set order with this point survey current signal with change under the illumination volt-ampere characteristic (15) of solar cell (2) go up and compare corresponding to the current value of same point, as exceed, then send the instruction of resurveying once immediately.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 86101321 CN1010257B (en) | 1986-03-01 | 1986-03-01 | Technical embodiment for a test equipment of solar cells using short pulse |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 86101321 CN1010257B (en) | 1986-03-01 | 1986-03-01 | Technical embodiment for a test equipment of solar cells using short pulse |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN86101321A true CN86101321A (en) | 1987-10-21 |
| CN1010257B CN1010257B (en) | 1990-10-31 |
Family
ID=4801357
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 86101321 Expired CN1010257B (en) | 1986-03-01 | 1986-03-01 | Technical embodiment for a test equipment of solar cells using short pulse |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1010257B (en) |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009129575A1 (en) * | 2008-04-23 | 2009-10-29 | Bt Imaging Pty Ltd | Device characterisation utilising spatially resolved luminescence imaging |
| CN101799489A (en) * | 2010-02-26 | 2010-08-11 | 常州亿晶光电科技有限公司 | Equipment for testing attenuation of solar cell |
| CN101576602B (en) * | 2009-06-19 | 2010-12-29 | 南开大学 | Device used for detecting effect of up-conversion material in improving short circuit current density of solar cell |
| CN101551437B (en) * | 2009-04-23 | 2011-04-20 | 华中科技大学 | Device for testing solar cell parameter |
| CN102449494A (en) * | 2009-05-18 | 2012-05-09 | 弗劳恩霍弗实用研究促进协会 | Method for spatially determining the series resistance of a semiconductor structure |
| CN102621472A (en) * | 2012-04-10 | 2012-08-01 | 成都聚合科技有限公司 | Test system device for high-power concentrator photovoltaic cell slices |
| CN102680874A (en) * | 2012-03-07 | 2012-09-19 | 中国电子科技集团公司第四十一研究所 | Pulse solar simulator flash synchronous test method |
| CN103353576A (en) * | 2013-06-18 | 2013-10-16 | 中国电子科技集团公司第四十一研究所 | Photovoltaic module power generation measurement method based on volt-ampere characteristic curve |
| CN103399246A (en) * | 2013-08-29 | 2013-11-20 | 雷海平 | Automatic detection and classification control system for electric properties of battery piece |
| CN105352597A (en) * | 2015-10-22 | 2016-02-24 | 河海大学常州校区 | Method for selecting optimal external series resistor of solar cell for irradiation sensor |
| CN106411258A (en) * | 2016-08-30 | 2017-02-15 | 陕西众森电能科技有限公司 | Method for testing electrical property of solar cell and components under short pulse width |
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| CN1314973C (en) * | 2003-10-23 | 2007-05-09 | 上海交通大学 | Single flash testing instrument of film solar battery assembly |
-
1986
- 1986-03-01 CN CN 86101321 patent/CN1010257B/en not_active Expired
Cited By (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2009129575A1 (en) * | 2008-04-23 | 2009-10-29 | Bt Imaging Pty Ltd | Device characterisation utilising spatially resolved luminescence imaging |
| CN101551437B (en) * | 2009-04-23 | 2011-04-20 | 华中科技大学 | Device for testing solar cell parameter |
| CN102449494A (en) * | 2009-05-18 | 2012-05-09 | 弗劳恩霍弗实用研究促进协会 | Method for spatially determining the series resistance of a semiconductor structure |
| CN102449494B (en) * | 2009-05-18 | 2014-07-23 | 弗劳恩霍弗实用研究促进协会 | Method for spatially determining the series resistance of a semiconductor structure |
| CN101576602B (en) * | 2009-06-19 | 2010-12-29 | 南开大学 | Device used for detecting effect of up-conversion material in improving short circuit current density of solar cell |
| CN101799489A (en) * | 2010-02-26 | 2010-08-11 | 常州亿晶光电科技有限公司 | Equipment for testing attenuation of solar cell |
| CN101799489B (en) * | 2010-02-26 | 2014-09-10 | 常州亿晶光电科技有限公司 | Equipment for testing attenuation of solar cell |
| CN102680874A (en) * | 2012-03-07 | 2012-09-19 | 中国电子科技集团公司第四十一研究所 | Pulse solar simulator flash synchronous test method |
| CN102621472A (en) * | 2012-04-10 | 2012-08-01 | 成都聚合科技有限公司 | Test system device for high-power concentrator photovoltaic cell slices |
| CN103353576B (en) * | 2013-06-18 | 2015-11-25 | 中国电子科技集团公司第四十一研究所 | Based on the photovoltaic module energy output method of measurement of volt-ampere characteristic |
| CN103353576A (en) * | 2013-06-18 | 2013-10-16 | 中国电子科技集团公司第四十一研究所 | Photovoltaic module power generation measurement method based on volt-ampere characteristic curve |
| CN103399246A (en) * | 2013-08-29 | 2013-11-20 | 雷海平 | Automatic detection and classification control system for electric properties of battery piece |
| CN103399246B (en) * | 2013-08-29 | 2015-12-23 | 烟台市牟平海联联合有限责任公司 | A kind of electrical performance of cell detects and control system of classifying automatically |
| CN105352597A (en) * | 2015-10-22 | 2016-02-24 | 河海大学常州校区 | Method for selecting optimal external series resistor of solar cell for irradiation sensor |
| CN105352597B (en) * | 2015-10-22 | 2018-06-05 | 河海大学常州校区 | A kind of selection method of the optimal external series resistance of irradiation sensor solar cell |
| CN106411258A (en) * | 2016-08-30 | 2017-02-15 | 陕西众森电能科技有限公司 | Method for testing electrical property of solar cell and components under short pulse width |
| CN106411258B (en) * | 2016-08-30 | 2019-05-28 | 陕西众森电能科技有限公司 | A kind of solar cell and component short pulse width electric performance test method |
Also Published As
| Publication number | Publication date |
|---|---|
| CN1010257B (en) | 1990-10-31 |
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