A kind of photovoltaic module or array I-V characteristic measuring device and method
Technical field
The present invention relates to a kind of photovoltaic module or array performance testing apparatus and method of testing, particularly relate to a kind of photovoltaic module or array I-V characteristic measuring device and method, belong to solar photovoltaic assembly technical field.
Background technology
Along with the quick growth of World Economics, the demand of the energy is constantly increased.Solar energy is as the reproducible clean energy resource of a kind of low-carbon (LC), just worldwide flourish.Photovoltaic system receives the sunlight energy by installation photovoltaic component and converts solar energy into direct current, then by photovoltaic DC-to-AC converter, direct current is converted to alternating current.The energy output of photovoltaic module directly has influence on the income of photovoltaic plant owner, and in industry, the corporate facility of specialty is all in the Study of Lifting of carrying out assembly height energy output.
The I-V characteristic of solar cell is the important indicator of the performance evaluating solar cell, carries out monitoring have great importance to the I-V characteristic of solar cell.At present, the performance of photovoltaic module is tested photovoltaic module by indoor sunlight simulator mostly, by current-voltage (I-V) characteristic curve of test light photovoltaic assembly, carry out the power generation performance of evaluation component.But the I-V characteristic of testing solar battery can not reflect the performance of solar cell at actual service conditions under indoor stable state.In prior art, the method for outdoor test photovoltaic module and array I-V performance curve has two kinds, and a kind of is adopt portable I-V tester to measure, and usually once records a curve, can not carry out sequential scan tests; Another kind is can sequential scan tests, but under assembly is not operated in real operating load, and in the most of the time of not scans I-V curve, assembly belongs to open-circuit condition, can not reflect the performance of solar cell out of doors under actual service conditions.
Summary of the invention
The present invention is directed in prior art, photovoltaic module I-V characteristic test can not reflect that the real work state of assembly, method of testing are complicated, the accurate not technical problem of measurement result, provides
A kind of photovoltaic module or array I-V characteristic measuring device and method, improve the accuracy of photovoltaic module I-V feature measurement.
For this reason, the present invention adopts following technical scheme:
A kind of photovoltaic module or array I-V characteristic measuring device, comprise to-be-measured cell, current-voltage sampler and industrial computer, it is characterized in that: described to-be-measured cell comprises the testing component with cathode output end and cathode output end, linked switch and the first load, measurement mechanism also comprises the second load and controls the on-off controller of linked switch, second load is program control load, first load, on the positive pole that second load and current-voltage sampler are connected in parallel on testing component respectively and cathode output end, described linked switch comprises K switch m and K switch m+1, K switch m controls the first load, K switch m+1 controls current-voltage sampler and the second load, industrial computer and current-voltage sampler, program control load, on-off controller connects.
Further, described to-be-measured cell is several, linked switch comprises some groups corresponding with to-be-measured cell quantity accordingly, K switch m in each group of linked switch controls the first load, K switch m+1 controls current-voltage sampler and the second load, also comprises connection or disconnection that a censor key controls each testing component and current-voltage sampler and the second load.
Further, described testing component is the photovoltaic array of monolithic photovoltaic module or the series connection of polylith photovoltaic module and/or formation in parallel.
Further, described first load is electronic load and/or network load.
Another aspect of the present invention, provides a kind of photovoltaic module or array I-V characteristic measurement method, is applied in above-mentioned photovoltaic module or array I-V characteristic measuring device, comprises the steps:
S0: before test starts, regulation and control industrial computer, sets each sweep time of I-V sweep test and the interval time of twice sweep;
S1: when non-I-V sweep test state, the K switch m in linked switch are closed, and K switch m+1 disconnects, and testing component is in running order under optimum load value;
S2: according to the I-V sweep test interval time of setting, industrial computer sends appointment, the K switch m that on-off controller controls in linked switch disconnects, K switch m+1 closes, within the sweep time of setting, second load changes under the instruction of industrial computer, and I, V value that current-voltage sampler record testing component exports in the second load variations process is also charged in industrial computer, completes an I-V sweep test;
S3: after single sweep operation completes, industrial computer sends instruction, and the K switch m that on-off controller controls in linked switch closes, and K switch m+1 disconnects, and testing component comes back to operating state;
S4: according to the I-V sweep test interval time of setting, start I-V sweep test next time, repeats above-mentioned steps S2 and S3, carries out loop test to testing component I-V characteristic.
Further, described to-be-measured cell is several, linked switch comprises some groups corresponding with testing component quantity accordingly, K switch m in each group of linked switch controls the first load, K switch m+1 controls current-voltage sampler and the second load, also comprises connection or disconnection that a censor key controls each testing component and current-voltage sampler and the second load; When non-I-V sweep test state, the K switch m of each testing component is all in closure state, and each testing component is all in running order; When test starts, the K switch m that on-off controller controls in each group of linked switch successively disconnects, K switch m+1 closes, control corresponding testing component by censor key to be connected with current-voltage sampler and the second load, enter the test operation of step S2 and S3, each testing component is tested one by one, until each testing component completes an I-V sweep test; According to the I-V sweep test interval time of setting, start next round I-V sweep test, loop test is carried out to each testing component I-V characteristic.
Further, described testing component is the photovoltaic array of monolithic photovoltaic module or the series connection of polylith photovoltaic module and/or formation in parallel.
Further, described first load is electronic load and/or network load.
Photovoltaic module of the present invention or array I-V characteristic measuring device, by arranging the first load, the second load, linked switch, when non-measured state, testing component is communicated with the first load, and assembly is in running order; When measuring state, assembly is communicated with the second load, and the second load is program control load, can be changed under the control of industrial computer by 0 to infinity, and the electric current of test testing component in load variations process and magnitude of voltage, obtain I-V characteristic curve; Therefore, assembly has more real working temperature and state when testing, and test result is more accurate; Set test interval by industrial computer, loop test can be carried out to testing component; Testing component is also not limited to monolithic element, also can measure the series connection of polylith assembly and/or the assembly array formed in parallel, applied widely; First load comprises electronic load, has the network load etc. such as the inverter of MPPT function, makes testing component more close to real work state.Photovoltaic assembly of the present invention or array I-V characteristic measurement method, step is simple, and measurement result is accurate, applied widely.
Accompanying drawing explanation
Fig. 1 is the structural representation of the embodiment of the present invention 1;
Fig. 2 is the structural representation of the embodiment of the present invention 2;
In figure, 1 is to-be-measured cell, and 11 is testing component, and 12 is linked switch, and 13 is the first load, and 2 is current-voltage sampler, and 3 is industrial computer, and 4 is the second load, and 5 is on-off controller, and 6 is censor key.
Embodiment
In order to make those skilled in the art person better understand the present invention program, carry out clear, complete description below in conjunction with accompanying drawing to technical scheme of the present invention, part same as the prior art in the present invention is with reference to prior art.
Embodiment 1:
As shown in Figure 1, the photovoltaic module of the present embodiment or array I-V characteristic measuring device, comprise to-be-measured cell 1, current-voltage sampler 2 and industrial computer 3, described to-be-measured cell 1 comprises the testing component 11 with cathode output end and cathode output end, linked switch 12 and the first load 13, measurement mechanism also comprises the second load 4 and controls the on-off controller 5 of linked switch, second load 4 is program control load, can be changed by 0 to infinity under the control of industrial computer, first load 13, on the positive pole that second load 4 and current-voltage sampler 2 are connected in parallel on testing component respectively and cathode output end, described linked switch 12 comprises K switch m and K switch m+1, in the present embodiment, called after K1 and K2, K switch 1 controls the first load, K switch 2 controls current-voltage sampler 2 and the second load 4, industrial computer 3 and current-voltage sampler 2, program control load 4 and on-off controller 5 connect.
Testing component 11 can monolithic photovoltaic module or the series connection of polylith photovoltaic module and/or the in parallel photovoltaic array formed; First load 13 is electronic load or network load.
Embodiment 2:
As shown in Figure 2, the difference of the present embodiment and embodiment 1 is, described to-be-measured cell 1 is several, the first to-be-measured cell, the second to-be-measured cell is described as at this ... n-th to-be-measured cell, the linked switch of each to-be-measured cell, the first linked switch, the second linked switch is described as at this ... n-th linked switch, K switch m in each group of linked switch controls the first load, K switch m+1 controls current-voltage sampler and the second load, also comprises a censor key 6 and controls each testing component and current-voltage sampler 2 and the second load 4.
Embodiment 3:
The present embodiment provides a kind of photovoltaic module or array I-V characteristic measurement method, is applied to photovoltaic module or array I-V characteristic measuring device that embodiment 1 provides, comprises the steps:
S0: before test starts, regulation and control industrial computer, sets each sweep time of I-V sweep test and the interval time of twice sweep;
S1: when non-I-V sweep test state, the K switch in linked switch
1closed, K switch
2disconnect, testing component is in running order under optimum load value;
S2: according to the I-V sweep test interval time of setting, industrial computer sends instruction, the K switch m that on-off controller controls in linked switch disconnects, K switch m+1 closes, within the sweep time of setting, second load changes under the instruction of industrial computer, and I, V value that current-voltage sampler record testing component exports in the second load variations process is also charged in industrial computer, completes an I-V sweep test;
S3: after single sweep operation completes, industrial computer sends instruction, and the K switch m that on-off controller controls in linked switch closes, and K switch m+1 disconnects, and testing component comes back to operating state;
S4: according to the I-V sweep test interval time of setting, start I-V sweep test next time, repeats above-mentioned steps S2 and S3, carries out loop test to testing component I-V characteristic.
Embodiment 4:
The present embodiment provides a kind of photovoltaic module or array I-V characteristic measurement method, be applied to photovoltaic module or array I-V characteristic measuring device that embodiment 2 provides, several testing components are circulated measurement one by one, for convenience, each testing component is called after first testing component, the second testing component, the n-th testing component respectively, each linked switch is called after first linked switch, the second linked switch respectively ... n-th linked switch, K switch m and K switch m+1 is labeled as K1 and K2, K3 and K4 successively ... Km and Km+1;
Concrete steps are as follows:
Before test starts, regulation and control industrial computer, sets each sweep time of I-V sweep test and the interval time of twice sweep;
When non-I-V sweep test state, the K switch in each linked switch
mclosed, K switch
m+1disconnect, each testing component is in running order under optimum load value;
Test starts, industrial computer sends appointment, on-off controller control switch K1 disconnects, K2 closes, now the K switch m of other testing component is still in closure state, Km+1 switch is in off-state, the first testing component and current-voltage sampler 2 and the second load 4 is connected by censor key 6, within the sweep time of setting, second load changes under the instruction of industrial computer, current-voltage sampler record testing component is at the I of the second load variations the output of process, V value, obtain the I-V characteristic curve of the first testing component and charge in industrial computer, complete an I-V sweep test of the first testing component, subsequently, K1 closes, and K2 disconnects, and the first testing component gets back to operating state, until the I-V sweep test interval time of setting, industrial computer sends instruction, and K3 disconnects, K4 closes, censor key connects the second testing component and current-voltage sampler 2 and the second load 4, and the principle with test the first testing component is identical, completes an I-V sweep test of the second testing component, K3 closes subsequently, and K4 disconnects, and the second testing component gets back to operating state, in like manner, the 3rd testing component, the 4th testing component is carried out successively ... the test of the n-th testing component, so circulates, and realizes real-time circulation continuous print I-V sweep test to multiple testing component.
Obviously, described embodiment is only section Example of the present invention, instead of whole embodiments.Based on the embodiment in the present invention, those of ordinary skill in the art, not making the every other embodiment obtained under creative work prerequisite, should belong to the scope of protection of the invention.