CN106411258B - A kind of solar cell and component short pulse width electric performance test method - Google Patents
A kind of solar cell and component short pulse width electric performance test method Download PDFInfo
- Publication number
- CN106411258B CN106411258B CN201610761450.1A CN201610761450A CN106411258B CN 106411258 B CN106411258 B CN 106411258B CN 201610761450 A CN201610761450 A CN 201610761450A CN 106411258 B CN106411258 B CN 106411258B
- Authority
- CN
- China
- Prior art keywords
- solar cell
- sampling interval
- pulse width
- sampling
- sampled point
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 title claims abstract description 27
- 238000011056 performance test Methods 0.000 title claims abstract description 16
- 238000012360 testing method Methods 0.000 claims abstract description 96
- 238000005070 sampling Methods 0.000 claims abstract description 75
- 238000012956 testing procedure Methods 0.000 claims abstract description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 6
- 239000013078 crystal Substances 0.000 claims description 6
- 229910052710 silicon Inorganic materials 0.000 claims description 6
- 239000010703 silicon Substances 0.000 claims description 6
- 238000010998 test method Methods 0.000 abstract description 5
- 238000005259 measurement Methods 0.000 abstract description 2
- 238000005516 engineering process Methods 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 4
- 101001073212 Arabidopsis thaliana Peroxidase 33 Proteins 0.000 description 1
- 101001123325 Homo sapiens Peroxisome proliferator-activated receptor gamma coactivator 1-beta Proteins 0.000 description 1
- 102100028961 Peroxisome proliferator-activated receptor gamma coactivator 1-beta Human genes 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000004146 energy storage Methods 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The present invention relates to a kind of solar cell and component electric performance test method, in particular to a kind of test methods using testing solar battery under short pulse width and component electrical property.A kind of solar cell of the present invention and component short pulse width electric performance test method, including following testing procedure: (1) determine that total testing time T, the total testing time T are the pulse width of the corresponding solar simulator test of solar cell to be tested；(2) according to acquisition system and total testing time T, determine that sampling number n, n are the natural number greater than 1.The method of the invention, by dividing the percentage of sampling interval delay time t and the percentage of the total sampling interval of test voltage, cooperates electronic load actuation techniques, under relatively short pulse width to obtain accurate unit for electrical property parameters；This method eliminates capacity effect bring measurement error, it can be achieved that accurate test.
Description
Technical field
The present invention relates to a kind of solar cell and component electric performance test methods, in particular to a kind of to utilize short pulse width
The test method of lower testing solar battery and component electrical property.
Background technique
Currently, conventional crystal silicon solar battery electrical property mainstream measuring technology mostly uses the pulse width based on 10ms or so
It realizes the test and acquisition of electrical property, since conventional crystal silicon battery capacity effect is relatively small, utilizes the pulse of 10ms or so
Actuation techniques are loaded based on linear electron in width, accurate test can be realized under the conditions of current 10ms or so pulse width.
In recent years, with the progress of technique and technology, more efficient battery research and development and industrialization are had become for Vehicles Collected from Market
Hot topic, and traditional solution needs longer pulse width to eliminate bulky capacitor effect to testing process bring and influence,
Industry mainstream technology thinks different technologies, need to rely on different pulse widths.Current mainstream technology can not be in 10ms
Accurate test is realized under magnitude normal mode.However, extending pulse width for energy storage electricity for pulse solar simulator
Road, control circuit and light-source system propose more harsh requirement, how to be realized based on short pulse width with bulky capacitor
The accurate test of effect solar cell, becomes problem urgently to be resolved.
Summary of the invention
The present invention proposes a kind of method that solar module and electrical property are measured under short pulse width.
A kind of solar cell and component short pulse width electric performance test method of the present invention, including following test step
It is rapid:
1, a kind of solar cell and component short pulse width electric performance test method, it is characterised in that including following test step
It is rapid:
(1) determine that total testing time T, the total testing time T are that the corresponding solar simulator of solar cell to be tested is surveyed
The pulse width of examination；
(2) according to the performance of acquisition system and total testing time T, determine that sampling number n, n are the natural number greater than 1；
(3) determine that total sampling interval voltage corresponds to the survey of acquisition system output according to solar cell electrical property acquisition mode
Range is tried, the output valve that the voltage of each sampled point corresponds to acquisition system is denoted as DA, and wherein the maximum value DAmax of DA is the sun
The theoretical maximum voltage of battery electrical property corresponds to the output valve of acquisition system；
(4) n sampled point in (2) is divided into three sampling intervals, the first sampling interval sampled point serial number 1 arrives
N1, the second sampling interval sampled point serial number n1+1 to n2；Third sampling interval sampled point serial number n2+1 to n；
(5) sampling interval divided according to step (4) determines that the testing time of each sampling interval accounts for total testing time
The percentage of T；Determine that each sampling interval DA value range accounts for the percentage of DAmax:
(6) electronic load is adjusted within the testing time of each sampled point setting and DA value, obtains the test of the sampled point
Current value and test voltage value；
(7) all test current values of n sampled point and test voltage value are collected, obtains Isc and Voc value, and will be every
The corresponding test current value in a collection point and test voltage value product, wherein the maximum value of product numerical value is the solar cell
Peak power output value Pmax.
Preferably, the acquisition system is 12-bit data acquisition system.
Preferably, the acquisition mode is Isc-Voc acquisition mode.
Preferably, the acquisition mode is Voc-Isc acquisition mode.
Further, the solar cell is crystal silicon solar battery.
Further, the sampling number is 95, and total testing time T is 10ms, total sampling test section DA range
Value is between 0-2.5, wherein the first sampling interval sampled point serial number number is 1 to 40；Second sampling interval sampled point serial number number is
41 to 75；Third sampling interval sampled point serial number number is 76 to 95.
Further, the solar cell is crystal silicon solar battery.
Further, the sampling number is 95, and total testing time T is 10ms, total sampling test section DA range
Value is between 2.5-0, wherein the first sampling interval sampled point serial number number is 1 to 40；Second sampling interval sampled point serial number number is
41 to 75；Third sampling interval sampled point serial number number is 76 to 95.
The method of the invention, under relatively short pulse width, by sampled point delay time and test voltage
More time delays are optimized to maximum power point section, while cooperating electronic load actuation techniques, make solar cell by control
Electrical property obtain sufficient release in this test condition, utilize test method of the present invention, it is ensured that in the section
The electric current and voltage of corresponding acquisition are relatively accurate, can accurately obtain solar cell unit for electrical property parameters, while eliminating capacitor
Effect bring measurement error compares the N-type solar module of the bulky capacitor effect of prior art test method, maximum work
The deviation of rate is about 0.6%, and utilizing the deviation of its maximum power of the scheme of this patent is 0.1%；Simultaneously in 10ms magnitude
The program for, the capacity effect of N-type solar cell can be eliminated；Simultaneously utilize the method for the invention, no matter Electronic Negative
Operating mode is carried by Isc to Voc or by Voc to Isc, all can ensure that data acquisition starting point, maximum power section and last rank
The accuracy of section realizes accurate test.
Specific embodiment
Embodiment 1
A kind of solar cell and component short pulse width electric performance test method of the present invention, including following test step
It is rapid:
(1) determine that total testing time T, the total testing time T are that the corresponding solar simulator of solar cell to be tested is surveyed
The pulse width of examination；
(2) according to the performance of acquisition system and total testing time T, determine that sampling number n, n are the natural number greater than 1；No
It is different with the quantity of sampled point in acquisition system.
(3) determine that total sampling interval voltage corresponds to the survey of acquisition system output according to solar cell electrical property acquisition mode
Range is tried, the output valve that the voltage of each sampled point corresponds to acquisition system is denoted as DA, and wherein the maximum value DAmax of DA is the sun
The theoretical maximum voltage of battery electrical property corresponds to the output valve of acquisition system.Solar cell electrical property acquisition mode is generally divided into
Two kinds, one kind is Isc-Voc, which determines that total sampling interval corresponds to the DA voltage value variation pattern that acquisition system exports and is
0-DAmax；Another kind is Voc-Isc, which determines that total sampling interval corresponds to the DA voltage value variation of acquisition system output
Mode is DAmax-0.
(4) n sampled point in (1) is divided into three sampling intervals, the first sampling interval sampled point serial number 1 arrives
N1, the second sampling interval sampled point serial number n1+1 to n2；Third sampling interval sampled point serial number n2+1 to n；
(5) sampling interval divided according to step (4) determines that the testing time of each sampling interval accounts for total testing time
The percentage of T；Determine that each sampling interval DA value accounts for the percentage of DAmax:
。
(6) electronic load is adjusted within the testing time of each sampled point setting and DA value, obtains the test of the sampled point
Current value and test voltage value；
(7) all test current values of n sampled point and test voltage value are collected, obtains Isc and Voc value, and will be every
The corresponding test current value in a collection point and test voltage value product, wherein the maximum value of product numerical value is the solar cell
Peak power output value Pmax.
Embodiment 2
The present embodiment selects N-type solar module, and using 12 acquisition systems, Isc-Voc acquisition mode, pulse is wide
Degree is 10ms, and DAmax value 2.5, testing procedure is as follows:
(1) determine that total testing time T is 10ms；
(2) due to using 12 acquisition systems, and total testing time T is 10ms, therefore sets 95 sampled points；
(3) DAmax is 2.5, therefore the value range of DA is between 0-2.5；
(4) 95 sampled points in (1) are divided into three sampling intervals, the first sampling interval sampled point serial number 1 arrives
40, the second sampling interval sampled point serial number 41 to 75；Third sampling interval sampled point serial number 76 to 95；
(5) according to 1 step of embodiment (4) table obtain the first sampling interval testing time be 0.1ms, the second sampling interval
Testing time is 0.7ms, and the third sampling interval testing time is 0.2ms.First sampling interval DA value range between 0-1.5,
Second sampling interval DA value range is between 1.5-2；Third sampling interval DA value range is between 2-2.5.
(6) electronic load is adjusted within the testing time of each sampled point setting and DA value, obtains the test of the sampled point
Current value and test voltage value.
(7) all test current values of 95 sampled points and test voltage value are collected, obtains Isc and Voc value, simultaneously will
The corresponding test current value in each collection point and test voltage value product, wherein the maximum value of product numerical value is the solar cell
Maximum power value Pmax；Test result is as follows for it shown in table:
。
Embodiment 3:
The present embodiment is the parallel testing of embodiment 2, and test result is as follows shown in table:
。
Embodiment 4
The present embodiment selects p-type monocrystalline PERC component, and using 12 acquisition systems, its pulse of Isc-Voc acquisition mode is wide
Degree is 10ms, and DAmax value 2.5, using such as identical test method of embodiment 2, test result is as follows:
(1) determine that total testing time T is 10ms；
(2) due to using 12 acquisition systems, and total testing time T is 10ms, therefore sets 95 sampled points；
(3) DAmax is 2.5, therefore the value range of DA is between 0-2.5；
(4) 95 sampled points in (1) are divided into three sampling intervals, the first sampling interval sampled point serial number 1 arrives
40, the second sampling interval sampled point serial number 41 to 75；Third sampling interval sampled point serial number 76 to 95；
(5) according to 1 step of embodiment (4) table obtain the first sampling interval testing time be 0.1ms, the second sampling interval
Testing time is 0.7ms, and the third sampling interval testing time is 0.2ms.First sampling interval DA value range between 0-1.5,
Second sampling interval DA value range is between 1.5-2；Third sampling interval DA value range is between 2-2.5.
(6) electronic load is adjusted within the testing time of each sampled point setting and DA value, obtains the test of the sampled point
Current value and test voltage value.
(7) all test current values of 95 sampled points and test voltage value are collected, obtains Isc and Voc value, simultaneously will
The corresponding test current value in each collection point and test voltage value product, wherein the maximum value of product numerical value is the solar cell
Maximum power value Pmax；Test result is as follows for it shown in table:
。
Embodiment 5
The present embodiment is the parallel testing of embodiment 4, and test result is as follows shown in table:
。
Claims (8)
1. a kind of solar cell and component short pulse width electric performance test method, it is characterised in that including following testing procedure:
(1) determine that total testing time T, the total testing time T are the corresponding solar simulator test of solar cell to be tested
Pulse width；
(2) according to acquisition system and total testing time T, determine that sampling number n, n are the natural number greater than 1；
(3) determine that total sampling interval voltage corresponds to the test model of acquisition system output according to solar cell electrical property acquisition mode
It encloses, the output valve that the voltage of each sampled point corresponds to acquisition system is denoted as DA, and wherein the maximum value DAmax of DA is solar cell
The theoretical maximum voltage of electrical property corresponds to the output valve of acquisition system；
(4) n sampled point in (2) being divided into three sampling intervals, the first sampling interval sampled point serial number 1 arrives n1, the
Two sampling interval sampled point serial number n1+1 to n2；Third sampling interval sampled point serial number n2+1 to n；
(5) sampling interval divided according to step (4) determines that the testing time of each sampling interval accounts for total testing time T's
Percentage；Determine that each sampling interval DA value range accounts for the percentage of DAmax:
(6) electronic load is adjusted within the testing time of each sampled point setting and DA value, obtains the test electric current of the sampled point
Value and test voltage value；
(7) all test current values of n sampled point and test voltage value are collected, obtains Isc and Voc value, and adopt each
The corresponding test current value of sampling point and test voltage value product, wherein the maximum value of product numerical value is the maximum of the solar cell
Output power value Pmax.
2. a kind of solar cell and component short pulse width electric performance test method as described in claim 1, it is characterised in that: institute
Stating acquisition system is 12-bit data acquisition system.
3. a kind of solar cell and component short pulse width electric performance test method as claimed in claim 2, it is characterised in that: institute
Stating acquisition mode is Isc-Voc acquisition mode.
4. a kind of solar cell and component short pulse width electric performance test method as claimed in claim 2, it is characterised in that: institute
Stating acquisition mode is Voc-Isc acquisition mode.
5. a kind of solar cell and component short pulse width electric performance test method as claimed in claim 3, it is characterised in that: institute
Stating solar cell is crystal silicon solar battery.
6. a kind of solar cell and component short pulse width electric performance test method as claimed in claim 5, it is characterised in that: institute
Stating sampling number is 95, and total testing time T is 10ms, and total sampling test section DA value range is between 0-2.5, wherein first
Sampling interval sampled point serial number number is 1 to 40；Second sampling interval sampled point serial number number is 41 to 75；The sampling of third sampling interval
Point serial number number is 76 to 95.
7. a kind of solar cell and component short pulse width electric performance test method as claimed in claim 4, it is characterised in that: institute
Stating solar cell is crystal silicon solar battery.
8. a kind of solar cell and component short pulse width electric performance test method as claimed in claim 7, it is characterised in that: institute
Stating sampling number is 95, and total testing time T is 10ms, and total sampling test section DA value range is between 2.5-0, wherein first
Sampling interval sampled point serial number number is 1 to 40；Second sampling interval sampled point serial number number is 41 to 75；The sampling of third sampling interval
Point serial number number is 76 to 95.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610761450.1A CN106411258B (en) | 2016-08-30 | 2016-08-30 | A kind of solar cell and component short pulse width electric performance test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610761450.1A CN106411258B (en) | 2016-08-30 | 2016-08-30 | A kind of solar cell and component short pulse width electric performance test method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106411258A CN106411258A (en) | 2017-02-15 |
| CN106411258B true CN106411258B (en) | 2019-05-28 |
Family
ID=58003511
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610761450.1A Active CN106411258B (en) | 2016-08-30 | 2016-08-30 | A kind of solar cell and component short pulse width electric performance test method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106411258B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113497588B (en) * | 2021-08-17 | 2022-08-23 | 陕西众森电能科技有限公司 | Method and device for testing electrical performance of solar cell and solar cell module |
| CN114076897B (en) * | 2021-11-10 | 2024-03-12 | 陕西众森电能科技有限公司 | Electrical performance testing method for solar cell and assembly |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN86101321A (en) * | 1986-03-01 | 1987-10-21 | 西安交通大学 | Short pulse test equipment of solar cells technical scheme |
| CN102436285A (en) * | 2011-11-16 | 2012-05-02 | 深圳航天科技创新研究院 | Method and device for tracking maximum power point of photovoltaic array |
| CN104980105A (en) * | 2015-06-01 | 2015-10-14 | 北京汇能精电科技股份有限公司 | Method for testing maximum power point tracing algorithm performance of solar photovoltaic power generation system |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI383283B (en) * | 2009-08-20 | 2013-01-21 | Richtek Technology Corp | A method and a circuit for tracking a photo-voltaic array to output the maximum power |
| CN103748620A (en) * | 2011-04-22 | 2014-04-23 | 艾克潘尔基公司 | Systems and methods for analyzing energy usage |
-
2016
- 2016-08-30 CN CN201610761450.1A patent/CN106411258B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN86101321A (en) * | 1986-03-01 | 1987-10-21 | 西安交通大学 | Short pulse test equipment of solar cells technical scheme |
| CN102436285A (en) * | 2011-11-16 | 2012-05-02 | 深圳航天科技创新研究院 | Method and device for tracking maximum power point of photovoltaic array |
| CN104980105A (en) * | 2015-06-01 | 2015-10-14 | 北京汇能精电科技股份有限公司 | Method for testing maximum power point tracing algorithm performance of solar photovoltaic power generation system |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106411258A (en) | 2017-02-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103633937B (en) | A kind of solar cell parameter extracting method based on Lambert W function and fitting of a polynomial | |
| CN107229824B (en) | Photovoltaic power station power generation unit power curve modeling method and device | |
| CN102288891B (en) | Method for extracting parameters of solar cell | |
| CN106443491A (en) | Storage battery pack with automatic capacity verifying function and used for power substation | |
| CN106411258B (en) | A kind of solar cell and component short pulse width electric performance test method | |
| CN103105573B (en) | Solar battery parameter extraction method based on Lambert W function | |
| Alshushan et al. | Power degradation and performance evaluation of PV modules after 31 years of work | |
| CN104113281A (en) | Novel multi-channel solar cell module test system and double intelligent scan method | |
| Gao et al. | Effects of I–V measurement parameters on the hysteresis effect and optimization in high-capacitance PV module testing | |
| CN201392382Y (en) | Generating energy testing instrument of solar cell component | |
| CN103308841B (en) | The method of a kind of demarcation four main grid taps | |
| CN110865307B (en) | Battery module complementary energy detection method | |
| Erkaya et al. | Development of a string level I–V curve tracer | |
| CN106597151B (en) | Photovoltaic power station switched inverter tracking efficiency testing method and system | |
| Gao et al. | A direct current-voltage measurement method for smart photovoltaic modules with submodule level power optimizers | |
| CN105759159B (en) | Wind power plant SVG response time testing system adopting partial pressure adjusting device | |
| CN103353576B (en) | Based on the photovoltaic module energy output method of measurement of volt-ampere characteristic | |
| Kabalci et al. | The low cost voltage and current measurement device design for power converters | |
| CN104967406B (en) | The measuring instrument of a kind of photovoltaic module array DC generation characteristic and measuring method thereof | |
| Soares et al. | Simulation of a photovoltaic model using bisection method | |
| CN103105574B (en) | Analytic method for extracting solar battery parameter | |
| CN103091616B (en) | New analytic method for extracting solar battery parameters | |
| Killam et al. | Characterization of modules and arrays with suns voc | |
| CN207573311U (en) | Two-sided solar irradiation simulated testing system | |
| Meiqin et al. | Research and development of fast field tester for characteristics of solar array |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |