CN2804878Y - Novel nanometer measuring means - Google Patents
Novel nanometer measuring means Download PDFInfo
- Publication number
- CN2804878Y CN2804878Y CN 200520058404 CN200520058404U CN2804878Y CN 2804878 Y CN2804878 Y CN 2804878Y CN 200520058404 CN200520058404 CN 200520058404 CN 200520058404 U CN200520058404 U CN 200520058404U CN 2804878 Y CN2804878 Y CN 2804878Y
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- CN
- China
- Prior art keywords
- testing needle
- vertical
- gauge
- rubber substrate
- measuring
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model relates to a measuring means particularly a novel nanometer measuring means. The existing measuring means has complicated structure and high cost and a circuit board to be measured is easy to damage; to solve the technical problem, the novel nanometer measuring means comprises a probe bed composed of an insulation board, a measuring probe and a measuring interface, wherein the measuring probe is directly fixed on the insulation board or penetrates through the insulation board and is glidingly matched with the insulation board; in addition, the lower end of the measuring probe is in contact with the upper surface of the insulation board. The utility model is characterized in that the utility model also comprises an elastic and vertical conducting layer covered on the probe bed; the measuring probe is connected with the measuring interface by a conducting wire; the elastic and vertical conducting layer is made of oriented conducting materials. Adopting the technical scheme, the utility model has the advantages of simple structure and low cost; the circuit board is not easy to damage; the utility model is widely used in various printed circuit boards during the process of measuring.
Description
Technical field
The utility model relates to a kind of tool, particularly a kind of New Nanometer Gauge.
Background technology
The tool that uses comprises insulcrete, probe and sleeve pipe now, and sleeve pipe is inserted on the insulcrete, and probe is placed in the sleeve pipe, be provided with spring in the probe, the sleeve pipe below is connected to lead, and lead interface after tested is connected with testing tool, during test circuit board is placed on the probe, circuit board is contacted with probe.Its structure is too complicated, high, the fragile circuit board under test of cost.
The utility model content
The technical problems to be solved in the utility model is the above-mentioned defective that how to overcome existing tool, and a kind of simple in structure, with low cost, New Nanometer Gauge of fragile circuit board under test not is provided.
For solving the problems of the technologies described above, this New Nanometer Gauge comprises the needle-bar of being made up of insulcrete, testing needle, test interface, wherein, testing needle is fixed on the insulcrete, perhaps pass insulcrete and sliding with it joining, and the lower end of testing needle contacts with the upper surface of insulating base, it is characterized in that: it also comprises the elastic and vertical conductive layer that covers on the needle-bar; Described testing needle is connected with test interface by lead; Described elastic and vertical conductive layer is made by directed conductive material.So design utilizes the elastic and vertical conductive layer to replace the probe of existing band spring, saves manually, has reduced cost.
As optimization, described directed conductive material is directed metallic conduction rubber, comprise rubber substrate with evenly, the vertical tinsel in rubber substrate of gathering, above-mentioned tinsel is separated from each other, its two ends end face exposes the upper and lower surface of rubber substrate respectively.So design, tinsel rely on rubber-covered and fixing, simultaneously because the elasticity of rubber can guarantee that tinsel contacts well with the solder joint of printed circuit board (PCB) to be measured.During use, printed circuit board (PCB) to be measured is pressed on this New Nanometer Gauge, test interface is connected Test Host and can be tested.
As optimization, described directed conductive material is a nanometer vertical conduction cloth, comprise rubber substrate with evenly, the vertical carbon nano-tube in rubber substrate of gathering, the two ends end face of above-mentioned carbon nano-tube exposes the upper and lower surface of rubber substrate respectively.
Because carbon nano-tube only shows electric conductivity in the vertical, be difficult for short circuit between the adjacent carbon nano-tube.Adjacent carbon nano-tube is insulated from each other, and needn't be as the tinsel in the directed metallic conduction rubber, like that by the rubber-covered between adjacent wire.Carbon nano-tube is more than common metal wire slim, and its electric conductivity is also better than copper wire.So design, the carbon nano-tube in the nanometer vertical conduction cloth is dense distribution very, and needn't worry to be short-circuited between the adjacent nanotube, is convenient to make the tool of measuring high-density printed circuit board.
As optimization, described testing needle is radioactivity to be arranged, so as to strengthening the distance between each testing needle, thereby guarantees the testing needle mutually insulated.So design can avoid taking place the short circuit between the testing needle.
As optimization, described testing needle scribbles insullac except that the upper surface reaches the position that joins with lead.So design, insulation effect is good, can prevent short circuit between tinsel, influences test result.
After adopting technique scheme, it is simple in structure, with low cost that this New Nanometer Gauge has, and the advantage of easy damaged circuit board is not widely used in the testing process of various printed circuit board (PCB)s.
Description of drawings
Fig. 1 is the structural representation of this New Nanometer Gauge embodiment one;
Fig. 2 is the structural representation of the elastic and vertical conductive layer of this New Nanometer Gauge embodiment one;
Fig. 3 is the insulcrete of this New Nanometer Gauge embodiment one and the structural representation of testing needle;
Fig. 4 is the insulating base of this New Nanometer Gauge embodiment one and the structural representation of testing needle;
Fig. 5 is the structural representation of this New Nanometer Gauge embodiment two;
Fig. 6 is the structural representation of the elastic and vertical conductive layer of this New Nanometer Gauge embodiment two;
Fig. 7 is the structural representation of this New Nanometer Gauge embodiment three.
1 is that insulcrete, 2 is carbon nano-tube for tinsel, 11 for rubber substrate, 10 for the solder joint on the printed circuit board (PCB) 6 to be measured, 9 for lead, 8 for elastic and vertical conductive layer, 7 for printed circuit board (PCB) to be measured, 6 for test interface, 5 for insulating base, 4 for testing needle, 3 among the figure.
Embodiment
Below in conjunction with accompanying drawing this New Nanometer Gauge is described further:
Embodiment one: shown in Fig. 1 to 4, this New Nanometer Gauge comprises the needle-bar of being made up of insulcrete 1, testing needle 2, insulating base 3 and test interface 4, wherein, testing needle 2 is fixed on the insulcrete 1, it is characterized in that: it also comprises the elastic and vertical conductive layer 6 that covers on the needle-bar; Described testing needle 2 is connected with test interface 4 by lead 7; Described elastic and vertical conductive layer 6 is made by directed conductive material.Described directed conductive material is directed metallic conduction rubber, comprise rubber substrate 9 with evenly, the vertical tinsel 10 in rubber substrate 9 of gathering, above-mentioned tinsel 10 is separated from each other, its two ends end face exposes the upper and lower surface of rubber substrate 9 respectively.
Embodiment two: shown in Fig. 5,6, described testing needle 2 is radioactivity to be arranged, so as to strengthening the distance between each testing needle 2, thereby guarantees testing needle 2 mutually insulateds.Described directed conductive material is a nanometer vertical conduction cloth, comprise rubber substrate 9 with evenly, the vertical carbon nano-tube 11 in rubber substrate 9 of gathering, the two ends end face of above-mentioned carbon nano-tube 11 exposes the upper and lower surface of rubber substrate 9 respectively.Remaining part and structure are as described in the enforcement mode one.
Embodiment three: as shown in Figure 7, comprise the needle-bar of being made up of insulcrete 1, testing needle 2 and test interface 4, wherein, testing needle 2 is fixed on the insulcrete 1, it is characterized in that: it also comprises the elastic and vertical conductive layer 6 that covers on the needle-bar; Described testing needle 2 is connected with test interface 4 by lead 7; Described elastic and vertical conductive layer 6 is made by directed conductive material.
Certainly, the insulcrete of the utility model nanometer tool can be one, also can be polylith.Testing needle can directly be fixed on the insulcrete; Also can pass insulcrete, by the insulating base support fixation.
When using this measurement jig, the testing needle 2 in the insulcrete 1 is corresponding with the solder joint of printed circuit board (PCB) 5 to be measured.Testing tool is pressed in printed circuit board (PCB) 5 to be measured downwards on the elastic and vertical conductive layer 6, solder joint on the printed circuit board (PCB) 5 to be measured, communicate with testing needle 2 by tinsel 10 or carbon nano-tube 11 in the elastic and vertical conductive layer 6, testing needle 2 is further connected test interface 4 by lead 9, and test interface 4 is connected testing tool and can be tested.
Claims (5)
1, a kind of New Nanometer Gauge, comprise the needle-bar of forming by insulcrete, testing needle, test interface, wherein, testing needle directly is fixed on the insulcrete or passes insulcrete and sliding with it joining, and the lower end of testing needle contacts with the upper surface of insulating base, it is characterized in that: it also comprises the elastic and vertical conductive layer that covers on the needle-bar; Described testing needle is connected with test interface by lead; Described elastic and vertical conductive layer is made by directed conductive material.
2, New Nanometer Gauge according to claim 1, it is characterized in that: described directed conductive material is directed metallic conduction rubber, comprise rubber substrate with evenly, vertical tinsel in rubber substrate gathers, above-mentioned tinsel is separated from each other, and its two ends end face exposes the upper and lower surface of rubber substrate respectively.
3, New Nanometer Gauge according to claim 2, it is characterized in that: described directed conductive material is a nanometer vertical conduction cloth, comprise rubber substrate with evenly, the vertical carbon nano-tube in rubber substrate of gathering, the two ends end face of above-mentioned carbon nano-tube exposes the upper and lower surface of rubber substrate respectively.
4, according to the arbitrary described New Nanometer Gauge of claim 1 to 3, it is characterized in that: described testing needle is radioactivity to be arranged, so as to strengthening the distance between each testing needle, thereby guarantees the testing needle mutually insulated.
5, according to the described New Nanometer Gauge of claim, it is characterized in that: described testing needle scribbles insullac except that the upper surface reaches the position that joins with lead.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200520058404 CN2804878Y (en) | 2005-05-20 | 2005-05-20 | Novel nanometer measuring means |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200520058404 CN2804878Y (en) | 2005-05-20 | 2005-05-20 | Novel nanometer measuring means |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2804878Y true CN2804878Y (en) | 2006-08-09 |
Family
ID=36910167
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200520058404 Expired - Fee Related CN2804878Y (en) | 2005-05-20 | 2005-05-20 | Novel nanometer measuring means |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2804878Y (en) |
-
2005
- 2005-05-20 CN CN 200520058404 patent/CN2804878Y/en not_active Expired - Fee Related
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Dongguan Shengyi Electronics Ltd. Assignor: Guo Hongjian Contract fulfillment period: 2005.11.10 to 2010.11.10 Contract record no.: 2009440000055 Denomination of utility model: Novel nanometer measuring means Granted publication date: 20060809 License type: Exclusive license Record date: 20081225 |
|
| LIC | Patent licence contract for exploitation submitted for record |
Free format text: EXCLUSIVE LICENSE; TIME LIMIT OF IMPLEMENTING CONTACT: 2005.11.10 TO 2010.11.10; CHANGE OF CONTRACT Name of requester: DONGGUAN SHENGYI ELECTRONICS CO., LTD. Effective date: 20081225 |
|
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20060809 Termination date: 20120520 |