CN2771816Y - Large-shearing electronic speckle interfering instrument - Google Patents
Large-shearing electronic speckle interfering instrument Download PDFInfo
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- CN2771816Y CN2771816Y CN 200520040324 CN200520040324U CN2771816Y CN 2771816 Y CN2771816 Y CN 2771816Y CN 200520040324 CN200520040324 CN 200520040324 CN 200520040324 U CN200520040324 U CN 200520040324U CN 2771816 Y CN2771816 Y CN 2771816Y
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Abstract
The utility model provides a large-shearing electronic speckle interfering instrument. It comprises an instrument container, a laser installed inside the container, a beam expanding lens, a large shearing mirror, a polarizer and an imaging mechanism. The beam expanding lens is installed on the light path of the laser. The large shearing mirror, the polarizer and the imaging mechanism are installed on the light path of the reflected light of the measured object sequentially. The laser adopts the solid pumping green laser. The utility model can obtain the interference fringe of displacement of the distorted object and can realize time and space phase shift. It is also endued with the advantages of small volume, strong power, light weight, single module output, long coherence length and convenience for carrying; it is adapted for the field service and can be mounted on the anti-vibration platform to work. It provides a tool of high sensitivity, non-contact, full field and digitization for the engineering measurement structure displacement field. It is an organically combined product of high and new technologies of the laser, the precision machinery, the computer, etc. It fills in the domestic blank of this field.
Description
Technical field
The utility model relates to a kind of photoelectron instrument, particularly a kind of big shearing electronic speckle interference instrument.
Background technology
(Electronic Shearographic Speckle PatternInterferometry ESSPI), is a kind of complex art that Computer Image Processing, laser and interference combine in the electronic cutting speckle interference.
Electronic cutting speckle interferometer is used in the optical measurement mechanics field, research and teaching is of many uses in testing, and non-cpntact measurement can obtain measured object whole audience displacement gradient (strain); For finite element provides reliable boundary condition; Can be used for structure optimization; Can be applied in mesomechanics; Residual stress measurement, compound substance research.Especially in structure analysis and non-destructive detection, be widely used.Aftertreatment by necessity can obtain the needed information of deviser (digitizing).And do not need as the research of traditional photodynamics, to be equipped with dark place, show the photographic fixing wet process, the complicated light path etc. of building, saved extensive work.
Utilize the big shearing shear mirror, can realize that (Electronic Speckle PatternInterferometry ESPI), measures acoplanarity displacement to electronic speckle pattern interferometry.
The electronic cutting speckle interferometer of domestic production at present can only be measured the acoplanarity displacement gradient, energy measurement acoplanarity displacement not, and can not realize digitizing.
The index path of external a kind of three-dimensional electronic speckle interferometer of producing as shown in Figure 1.This instrument comprises parts such as camera 31, completely reflecting mirror 32, laser instrument 33, and 34 is measured object, and 35 is direction of measurement.As seen from Figure 1, this instrument can obtain the striped of acoplanarity displacement gradient fields, but owing to do not introduce effective phase change device, so can not realize time or spatial phase shift, obtains the digitized result of whole audience striped; And the apparatus structure complexity, antivibration requires high.
Summary of the invention
The purpose of this utility model is to solve the problems referred to above that the prior art electronic cutting speckle interferometer exists, and a kind of interference fringe that can directly obtain acoplanarity displacement is provided, and can realizes the big shearing electronic speckle interference instrument of time and spatial phase shift.
The technical solution adopted in the utility model is: a kind of big shearing electronic speckle interference instrument, comprise instrument box and be installed in the interior laser instrument of casing, beam expanding lens, big shear mirror, polaroid and imaging mechanism, beam expanding lens is installed on the light path of laser instrument, and big shear mirror, polaroid and imaging mechanism are installed on the reflected light path of measured object in proper order; Described laser instrument is the solid pumping green laser.
Described cabinet base is provided with an arc chute, the front end of described laser instrument is movably connected on the base of casing by pin, its rear end is positioned on the arc chute by dog screw, and dog screw can move along arc chute, and laser instrument can rotate around pin with moving of dog screw.
Described casing front end is provided with a cover phase shift and realizes mechanism, and this mechanism comprises guide frame, guide rail, tapped housing, is with externally threaded inside casing, spiral micrometer head and fastening nail; Guide frame is fixedly connected on the casing body, guide rail is vertically mounted in the guide frame, the inner of housing is connected on the guide rail and can moves up and down along guide rail, inside casing is threaded with housing and can moves horizontally, the spiral micrometer head is arranged on guide frame top scalable housing and moves up and down along guide rail, and fastening nail is arranged on a side of housing can internally confine the position; Be installed in the inside casing before and after described big shear mirror and the polaroid.
Described imaging mechanism comprises CCD charge coupled device, adapter ring and imaging lens, the coaxial two ends that are connected adapter ring of CCD charge coupled device and imaging lens.
Described beam expanding lens is the sphere beam expanding lens excessively of minor diameter high index of refraction.
Described casing has four supporting seats, is connected with the magnetic force gauge stand under each supporting seat respectively.
The big shearing electronic speckle interference instrument of the utility model makes it compared with prior art owing to adopted above technical scheme, and following advantage and characteristics are arranged:
1, owing to adopt pumping green laser as light source, have that volume is little, power is big, in light weight, single mode output, long, the portable advantage of coherent length, be applicable to on-the-spot the use, and can be contained on the vibrationproof platform and work; The optical maser wavelength that pumping green laser produces is 532nm, and the short 101nm of wavelength than the helium-neon laser of general 633nm can make the sensitivity of measurement improve 20%;
2, have the time-phase displacement function, can realize that the precision rotation of mechanism changes shear direction, can realize phase shift in 360 degree scopes by phase shift;
3, have the spatial phase shift function, can realize that the accurate spiral of mechanism moves stable, rectilinearity and the spatial frequency may command that realizes carrier fringe by phase shift, and good reproducibility;
4, have noncontact, high sensitivity, without dark place and apparent photographic fixing wet process, even can be directly used in the scene, be convenient to aftertreatment; For the measurement and the nondestructive inspection of engineering structure displacement field gradient (strain) provides a kind of simple, small and exquisite instrument;
5, since adopted minor diameter, high index of refraction cross the sphere beam expanding lens, can make the laser diffusion area bigger, the survey area at the 1m place is Φ 300mm;
6, can directly obtain the digitizing of acoplanarity displacement gradient fields striped; Used software can be realized computer-automatic collection, calculating and post processing of image;
7, can be used for teaching, the effect in electron interference has deep understanding to computing machine to make the student of photo-measuring experimental mechanics and physical optics specialty, and can be used as the strong instrument that master and doctoral candidate are engaged in correlative study;
8, the boundary condition that calculates for FEM (finite element) obtains to provide a kind of effective ways.
Description of drawings
Fig. 1 is the index path of prior art three-dimensional electronic speckle interferometer;
Fig. 2 is the primary structure synoptic diagram of the big shearing electronic speckle interference instrument of the utility model;
Fig. 3 is the construction profile figure of the big shearing electronic speckle interference instrument of the utility model;
Fig. 4 is that the A of big shearing electronic speckle interference instrument shown in Figure 3 is to view;
Fig. 5 is the measurement index path of the big shearing electronic speckle interference instrument of the utility model.
Embodiment
Referring to Fig. 2, cooperate referring to Fig. 3, Fig. 4.The big shearing electronic speckle interference instrument of the utility model comprises instrument box 1 and is installed in the interior laser instrument 2 of casing, beam expanding lens 3, big shear mirror 4, polaroid 5 and imaging mechanism 6.
Two parts before and after the body of casing 1 is separated into by dividing plate 11, the front end at casing 1 body is provided with a cover phase shift realization mechanism 12 in addition, is provided with four supporting seats 13 below casing 1 body, is connected with magnetic force gauge stand 14 under each supporting seat respectively.Instrument can be adsorbed on the experiment table.
Phase shift realizes that mechanism 12 comprises guide frame 121, guide rail (not shown), tapped housing 122, is with externally threaded inside casing 123, spiral micrometer head 124 and fastening nail 125.Guide frame 121 is fixedly connected on casing 1 body, guide rail is vertically mounted in the guide frame 121, the inner of housing 122 is connected on the guide rail and can moves up and down along guide rail, inside casing 123 is threaded with housing 122, spiral micrometer head 124 is arranged on guide frame 121 tops, and fastening nail 125 is arranged on a side of housing.Inside casing 123 can along continuous straight runs flexible translation in housing 122, regulate distance with image-forming block behind suitable position, by fastening nail 125 positioning and lockings; Can move up and down by the rotation of spiral micrometer head 124 again.
Light path of the present utility model can be described as follows in conjunction with Fig. 5:
Instrument realizes that the principle of time-phase displacement is: rotating screw micrometer head 124, make housing 122 move up and down along the guide rail in the guide frame 121, inside casing 123 and the big shear mirror 4 and the polaroid 5 that are located in the inside casing move up and down together synchronously in company with housing 122 like this, observe striped and change in computing machine, angle of spiral micrometer head 124 every rotations just produces time-phase displacement one time.
The principle of instrument implementation space phase shift is: rotation inside casing 123, its along continuous straight runs under the screw thread guide effect is moved, at this moment, be located at big shear mirror 4 in the inside casing and polaroid 5 in company with inside casing 123 synchronous translations, observing striped in computing machine changes, angle of inside casing 123 every rotations just produces the straight line carrier fringe of certain frequency, implementation space phase shift thus.
Claims (6)
1, a kind of big shearing electronic speckle interference instrument, it is characterized in that: comprise instrument box and be installed in the interior laser instrument of casing, beam expanding lens, big shear mirror, polaroid and imaging mechanism, beam expanding lens is installed on the light path of laser instrument, and big shear mirror, polaroid and imaging mechanism are installed on the reflected light path of measured object in proper order; Described laser instrument is the solid pumping green laser.
2, big shearing electronic speckle interference instrument as claimed in claim 1, it is characterized in that: described cabinet base is provided with an arc chute, the front end of described laser instrument is movably connected on the base of casing by pin, its rear end is positioned on the arc chute by dog screw, dog screw can move along arc chute, and laser instrument can rotate around pin with moving of dog screw.
3, big shearing electronic speckle interference instrument as claimed in claim 1, it is characterized in that: described casing front end is provided with a cover phase shift and realizes mechanism, and this mechanism comprises guide frame, guide rail, tapped housing, is with externally threaded inside casing, spiral micrometer head and fastening nail; Guide frame is fixedly connected on the casing body, guide rail is vertically mounted in the guide frame, the inner of housing is connected on the guide rail and can moves up and down along guide rail, inside casing is threaded with housing and can moves horizontally, the spiral micrometer head is arranged on guide frame top scalable housing and moves up and down along guide rail, and fastening nail is arranged on a side of housing can internally confine the position; Be installed in the inside casing before and after described big shear mirror and the polaroid.
4, big shearing electronic speckle interference instrument as claimed in claim 1, it is characterized in that: described imaging mechanism comprises CCD charge coupled device, adapter ring and imaging lens, the coaxial two ends that are connected adapter ring of CCD charge coupled device and imaging lens.
5, big shearing electronic speckle interference instrument as claimed in claim 1 is characterized in that: described beam expanding lens is the sphere beam expanding lens excessively of minor diameter high index of refraction.
6, big shearing electronic speckle interference instrument as claimed in claim 1, it is characterized in that: described casing has four supporting seats, is connected with the magnetic force gauge stand under each supporting seat respectively.
Priority Applications (1)
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CN 200520040324 CN2771816Y (en) | 2005-03-23 | 2005-03-23 | Large-shearing electronic speckle interfering instrument |
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CN 200520040324 CN2771816Y (en) | 2005-03-23 | 2005-03-23 | Large-shearing electronic speckle interfering instrument |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100439857C (en) * | 2006-11-28 | 2008-12-03 | 山东师范大学 | Large-shearing carrier-frequency electronic speckle interference displacement field separating method |
CN105123284A (en) * | 2015-08-28 | 2015-12-09 | 北京农业智能装备技术研究中心 | Seedling cutting device |
CN105423949A (en) * | 2015-12-15 | 2016-03-23 | 北京康拓红外技术股份有限公司 | Four-dimensional imaging method and device based on structured light |
CN105660202A (en) * | 2016-02-26 | 2016-06-15 | 北京农业智能装备技术研究中心 | Melon stock seedling cotyledon excising device |
CN108918534A (en) * | 2018-06-29 | 2018-11-30 | 天津城建大学 | A kind of bonding defect detection device based on parital vacuum load |
-
2005
- 2005-03-23 CN CN 200520040324 patent/CN2771816Y/en not_active Expired - Fee Related
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100439857C (en) * | 2006-11-28 | 2008-12-03 | 山东师范大学 | Large-shearing carrier-frequency electronic speckle interference displacement field separating method |
CN105123284A (en) * | 2015-08-28 | 2015-12-09 | 北京农业智能装备技术研究中心 | Seedling cutting device |
CN105423949A (en) * | 2015-12-15 | 2016-03-23 | 北京康拓红外技术股份有限公司 | Four-dimensional imaging method and device based on structured light |
CN105423949B (en) * | 2015-12-15 | 2018-06-19 | 北京康拓红外技术股份有限公司 | One kind ties up imaging method and device based on structure light 4 |
CN105660202A (en) * | 2016-02-26 | 2016-06-15 | 北京农业智能装备技术研究中心 | Melon stock seedling cotyledon excising device |
CN105660202B (en) * | 2016-02-26 | 2018-09-14 | 北京农业智能装备技术研究中心 | Melon rootstock seedling cotyledon device for excising |
CN108918534A (en) * | 2018-06-29 | 2018-11-30 | 天津城建大学 | A kind of bonding defect detection device based on parital vacuum load |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20060412 Termination date: 20100323 |