CN108918534A - A kind of bonding defect detection device based on parital vacuum load - Google Patents
A kind of bonding defect detection device based on parital vacuum load Download PDFInfo
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- CN108918534A CN108918534A CN201810702638.8A CN201810702638A CN108918534A CN 108918534 A CN108918534 A CN 108918534A CN 201810702638 A CN201810702638 A CN 201810702638A CN 108918534 A CN108918534 A CN 108918534A
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- ccd camera
- laser
- sliding block
- slide bar
- bonding defect
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- 230000007547 defect Effects 0.000 title claims abstract description 31
- 238000001514 detection method Methods 0.000 title claims abstract description 16
- 239000011521 glass Substances 0.000 claims abstract description 14
- 238000007789 sealing Methods 0.000 claims description 5
- 238000009434 installation Methods 0.000 claims description 2
- 238000012360 testing method Methods 0.000 abstract description 9
- 238000011068 loading method Methods 0.000 abstract description 7
- 238000000034 method Methods 0.000 description 21
- 238000010008 shearing Methods 0.000 description 9
- 238000006073 displacement reaction Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- 238000009659 non-destructive testing Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000002131 composite material Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000005305 interferometry Methods 0.000 description 2
- 238000003475 lamination Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000011982 device technology Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000004556 laser interferometry Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000011017 operating method Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
Abstract
The invention discloses a kind of bonding defect detection devices based on parital vacuum load, including laser, sliding block, CCD camera, slide bar, shear mirror, vacuum pump, organic glass case and beam expanding lens, the laser and CCD camera pass through screw rod respectively and are mounted on sliding block, and it is fixed using nut, beam expanding lens is installed in the front end of the laser, shear mirror is installed in the front end of the CCD camera, two sliding blocks drive laser and CCD camera to slide on slide bar respectively, the sliding block can be fixed on slide bar by screw, the organic glass case is controlled to a vacuum pump by pipeline.The present invention uses parital vacuum loading method, can be realized the detection of the position to bonding defect, size and shape, and can be applied to the on-the-spot test of large-scale component.
Description
Technical field
The present invention relates to bonding defect detection device technology field, especially a kind of bonding based on parital vacuum load is lacked
Fall into detection device.
Background technique
Composite material leans on lamination to be fabricated with technique for sticking mostly, and the inside of material and bonding plane be often during this
Will appear be mingled with, unsticking, layering, affinity unsticking, weak bonding and the defects of fibrous fracture, especially the most with unsticking, lamination defect
It is common, it is the most immediate cause for influencing its performance, so the non-destructive testing of composite material bonding interface defect is particularly significant.
Electric speckle-shearing pattern interferometer method is a kind of laser interferometry techniques for measuring acoplanarity displacement derivative field.It is in addition to dissipating
The features such as outside many advantages of spot interferometry, it is simple that there are also optical paths, low to measurement environmental requirement, can be used for in-site measurement.Due to
Speckle-shearing interferometry method is measurement displacement derivatives, and the strain loaded for defect concentrates ten while eliminating rigid body displacement automatically
Divide sensitive.Based on These characteristics, electric speckle-shearing pattern interferometer method is a kind of good lossless detection method, lossless in optics at present
It is played a very important role in detection technique.Electric speckle-shearing pattern interferometer method is illuminated using single beam, preposition in CCD camera
Shear mirror carries out double exposure record to before object deformation and after deformation.It is to pass through that electric speckle-shearing pattern interferometer method, which obtains information,
Subtract each other before deformation with deformed two images, obtains the information (as shown in Figure 1) of striped.
The principle that electric speckle-shearing pattern interferometer method carries out non-destructive testing is the zero power of adhesion region using fault location, certain
Interior of articles defect is set to generate the deformation bigger than under normal circumstances on the surface under load effect, this small deformation will
Shown in the form of interference fringe.Loading method is an essential ring in electronic cutting speckle nondestructive detection system
Section.For different defects, used loading method is most important to non-destructive testing.Common loading method has vacuum to add
Load, heat load, electromagnetic exciting load, audio load etc..Wherein vacuum load minimum affected by environment, but to large scale test specimen
Detection will make large scale vacuum tank, or even can not be detected, so having certain limitation, so this patent proposes to use
Parital vacuum loading method detects bonding defect.Small deformation is detected with electric speckle-shearing pattern interferometer method,
If deformation is excessive, coherence can be lost, is detected so being proposed for large deformation with projection moire method.
The basic principle of projection moire method is when optical grating projection is to testee surface, due to by testee height
Modulation, grating can generate deformation, contain object height information in deformed grating.Profiling object surface is measured with projection moire method,
It can accomplish non-cpntact measurement.As shown in Fig. 2, being recorded grating loss to body surface with CCD due to body surface injustice
And deformed grid line, then be superimposed with undeformed grid line, the contour of body surface can be obtained.
Summary of the invention
In view of the above problems, the object of the present invention is to provide a kind of bonding defect inspections based on parital vacuum load
Survey device.
The technical scheme is that:A kind of bonding defect detection device based on parital vacuum load, including laser,
Sliding block, CCD camera, slide bar, shear mirror, vacuum pump, organic glass case and beam expanding lens, the laser and CCD camera point
It is not mounted on sliding block by screw rod, and is fixed using nut, beam expanding lens is installed in the front end of the laser, described
Shear mirror is installed in the front end of CCD camera, and two sliding blocks drive laser and CCD camera to slide on slide bar respectively,
The sliding block can be fixed on slide bar by screw, and the organic glass case is controlled to a vacuum pump by pipeline.
Further, sealing strip is installed at organic glass case edge.
Compared with prior art, the beneficial effects of the invention are as follows:The present invention uses parital vacuum loading method, can be realized
Detection to the position of bonding defect, size and shape, and can be applied to the on-the-spot test of large-scale component.
Detailed description of the invention
Fig. 1 is the index path of electronic cutting speckle method.
Fig. 2 projection moire method optical path.
Fig. 3 schematic structural view of the invention.
The Section A-A schematic diagram of Fig. 4 Fig. 3.
Fig. 5 circular flaw bonding defect interference fringe picture.
The rectangular defect bonding defect interference fringe picture of Fig. 6.
Fig. 7 triangle defect bonding defect interference fringe picture.
The circular flaw bar graph of the undeformed projection grating of Fig. 8.
The circular flaw bar graph of the projection grating of Fig. 9 deformation.
The circular flaw bar graph of the superimposed contour of Figure 10.
In figure:1- laser, 2- sliding block, 3-CCD video camera, 4- slide bar, 5- shear mirror, 6- vacuum pump, 7- organic glass
Case, 8- sealing strip, 9- beam expanding lens, 10- test specimen, 11- nut, 12- screw rod, 13- screw.
Specific embodiment
In the description of the present invention, it is to be understood that, term " center ", " longitudinal direction ", " transverse direction ", "upper", "lower",
The orientation or positional relationship of the instructions such as "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside" is
It is based on the orientation or positional relationship shown in the drawings, is merely for convenience of description of the present invention and simplification of the description, rather than instruction or dark
Show that signified device or element must have a particular orientation, be constructed and operated in a specific orientation, therefore should not be understood as pair
Limitation of the invention.In addition, term " first ", " second " etc. are used for description purposes only, it is not understood to indicate or imply phase
To importance or implicitly indicate the quantity of indicated technical characteristic.The feature for defining " first ", " second " etc. as a result, can
To explicitly or implicitly include one or more of the features.In the description of the present invention, unless otherwise indicated, " multiple "
It is meant that two or more.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " installation ", " phase
Even ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected;It can
To be mechanical connection, it is also possible to be electrically connected;It can be directly connected, can also can be indirectly connected through an intermediary
Connection inside two elements.For the ordinary skill in the art, above-mentioned term can be understood by concrete condition
Concrete meaning in the present invention.
The present invention is further illustrated with reference to the accompanying drawings and examples.
As shown, a kind of bonding defect detection device based on parital vacuum load, including laser 1, sliding block 2, CCD
Video camera 3, slide bar 4, shear mirror 5, vacuum pump 6, organic glass case 7 and beam expanding lens 9, the laser 1 and CCD camera 3 divide
Not Tong Guo screw rod 11 be mounted on sliding block 2, and be fixed using nut 12, beam expanding lens be installed in the front end of the laser 1
9, shear mirror 5 is installed in the front end of the CCD camera 3, the sliding block 2 is mounted on slide bar 4 by screw 13, described in two
Sliding block 2 drives laser 1 and CCD camera 3 to slide on slide bar 4 respectively, and the organic glass case 7 passes through pipeline and vacuum pump
6 connections, vacuumize organic glass case using vacuum pump, and 8 high vacuum of sealing strip is installed at 7 edge of organic glass case
Degree.
Working principle:
The present invention proposes to detect bonding defect using parital vacuum loading method.If there is debonding defect, then
Unsticking position can be mingled with a small amount of air, under vacuum conditions, since there are pressure differences, and defective locations surface can be made to generate from face position
It moves, acoplanarity displacement can be tested with electric speckle-shearing pattern interferometer method and projection moire method, it can be real according to test result
Now to the detection of the position of bonding defect, size and shape.
Deformation refers to generating on the surface at test specimen bonding defect under vacuum conditions more greatly bigger than under normal circumstances
Deformation.Deformation is small, so being detected with electric speckle-shearing pattern interferometer method and projection moire method.
Under vacuum conditions, the deformation bigger than under normal circumstances is generated at test specimen bonding defect on the surface, it is this micro-
Small deformation will be shown in the form of interference fringe, and different shape bonding defect interference fringe picture is as shown in Figure 5-Figure 7.It is right
It is detected in small deformation with electronic cutting speckle technology, large deformation is detected with projection moire method, at this time will
Laser is changed to projector.
Operating procedure:
By the organic glass case 7 equipped with sealing strip 8 as the surface of tested test block 10, by adjusting the cunning on slide bar 4
Block 2 adjusts the position of laser 1 and CCD camera 3, and acquires the speckle pattern before vacuum load.Vacuum pump 6 is opened, and is adopted
Speckle pattern after collecting vacuum load.By subtracting each other to two width speckle patterns before and after vacuum load, reflection bonding defect is obtained
Position, size and shape bar graph.If deformation is excessive, coherence can be lost, so being proposed for large deformation with throwing
Shadow moire method is detected.The laser 1 that front end is installed to beam expanding lens 9 is needed to change projector at this time, by grating loss to examination
10 surface of part, is recorded with CCD camera 3 due to the grating figure before and after surface of test piece vacuum load, then by two width grating figures into
The position of reflection bonding defect, the contour bar graph of size and shape can be obtained, as Figure 8-Figure 10 in row superposition.
Taking the above-mentioned ideal embodiment according to the present invention as inspiration, through the above description, relevant staff is complete
Various changes and amendments can be carried out without departing from the scope of the technological thought of the present invention' entirely.The technology of this invention
Property range is not limited to the contents of the specification, it is necessary to which the technical scope thereof is determined according to the scope of the claim.
Claims (2)
1. a kind of bonding defect detection device based on parital vacuum load, which is characterized in that taken the photograph including laser, sliding block, CCD
Camera, slide bar, shear mirror, vacuum pump, organic glass case and beam expanding lens, the laser and CCD camera pass through screw rod respectively
It is mounted on sliding block, and is fixed using nut, beam expanding lens is installed in the front end of the laser, in the CCD camera
Front end shear mirror is installed, two sliding blocks drive laser and CCD camera to slide on slide bar respectively, and the sliding block can
It is fixed on slide bar by screw, the organic glass case is controlled to a vacuum pump by pipeline.
2. a kind of bonding defect detection device based on parital vacuum load according to claim 1, which is characterized in that institute
State organic glass case edge installation sealing strip.
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