CN208313848U - A kind of bonding defect detection device based on parital vacuum load - Google Patents
A kind of bonding defect detection device based on parital vacuum load Download PDFInfo
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- CN208313848U CN208313848U CN201821016615.3U CN201821016615U CN208313848U CN 208313848 U CN208313848 U CN 208313848U CN 201821016615 U CN201821016615 U CN 201821016615U CN 208313848 U CN208313848 U CN 208313848U
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Abstract
The utility model discloses a kind of bonding defect detection devices based on parital vacuum load, including laser, sliding block, CCD camera, slide bar, shear mirror, vacuum pump, organic glass case and beam expanding lens, the laser and CCD camera pass through screw rod respectively and are mounted on sliding block, and it is fixed using nut, beam expanding lens is installed in the front end of the laser, shear mirror is installed in the front end of the CCD camera, two sliding blocks drive laser and CCD camera to slide on slide bar respectively, the sliding block can be fixed on slide bar by screw, the organic glass case is controlled to a vacuum pump by pipeline.The utility model uses parital vacuum loading method, can be realized the detection of the position to bonding defect, size and shape, and can be applied to the on-the-spot test of large-scale component.
Description
Technical field
It is especially a kind of based on the viscous of parital vacuum load the utility model relates to bonding defect detection device technology field
Connect defect detecting device.
Background technique
Composite material leans on lamination to be fabricated with technique for sticking mostly, and the inside of material and bonding plane be often during this
Will appear be mingled with, unsticking, layering, affinity unsticking, weak bonding and the defects of fibrous fracture, especially the most with unsticking, lamination defect
It is common, it is the most immediate cause for influencing its performance, so the non-destructive testing of composite material bonding interface defect is particularly significant.
Electric speckle-shearing pattern interferometer method is a kind of laser interferometry techniques for measuring acoplanarity displacement derivative field.It is in addition to dissipating
The features such as outside many advantages of spot interferometry, it is simple that there are also optical paths, low to measurement environmental requirement, can be used for in-site measurement.Due to
Speckle-shearing interferometry method is measurement displacement derivatives, and the strain loaded for defect concentrates ten while eliminating rigid body displacement automatically
Divide sensitive.Based on These characteristics, electric speckle-shearing pattern interferometer method is a kind of good lossless detection method, lossless in optics at present
It is played a very important role in detection technique.Electric speckle-shearing pattern interferometer method is illuminated using single beam, preposition in CCD camera
Shear mirror carries out double exposure record to before object deformation and after deformation.It is to pass through that electric speckle-shearing pattern interferometer method, which obtains information,
Subtract each other before deformation with deformed two images, obtains the information (as shown in Figure 1) of striped.
The principle that electric speckle-shearing pattern interferometer method carries out non-destructive testing is the zero power of adhesion region using fault location, certain
Interior of articles defect is set to generate the deformation bigger than under normal circumstances on the surface under load effect, this small deformation will
Shown in the form of interference fringe.Loading method is an essential ring in electronic cutting speckle nondestructive detection system
Section.For different defects, used loading method is most important to non-destructive testing.Common loading method has vacuum to add
Load, heat load, electromagnetic exciting load, audio load etc..Wherein vacuum load minimum affected by environment, but to large scale test specimen
Detection will make large scale vacuum tank, or even can not be detected, so having certain limitation, so this patent proposes to use
Parital vacuum loading method detects bonding defect.Small deformation is detected with electric speckle-shearing pattern interferometer method,
If deformation is excessive, coherence can be lost, is detected so being proposed for large deformation with projection moire method.
The basic principle of projection moire method is when optical grating projection is to testee surface, due to by testee height
Modulation, grating can generate deformation, contain object height information in deformed grating.Profiling object surface is measured with projection moire method,
It can accomplish non-cpntact measurement.As shown in Fig. 2, being recorded grating loss to body surface with CCD due to body surface injustice
And deformed grid line, then be superimposed with undeformed grid line, the contour of body surface can be obtained.
Utility model content
In view of the above problems, the purpose of the utility model is to provide a kind of bondings based on parital vacuum load to lack
Fall into detection device.
The technical solution of the utility model is: a kind of bonding defect detection device based on parital vacuum load, including swashs
Light device, sliding block, CCD camera, slide bar, shear mirror, vacuum pump, organic glass case and beam expanding lens, the laser and CCD camera shooting
Machine passes through screw rod respectively and is mounted on sliding block, and is fixed using nut, installs beam expanding lens in the front end of the laser,
Shear mirror is installed in the front end of the CCD camera, and two sliding blocks drive laser and CCD camera sliding on slide bar respectively
Dynamic, the sliding block can be fixed on slide bar by screw, and the organic glass case is controlled to a vacuum pump by pipeline.
Further, sealing strip is installed at organic glass case edge.
Compared with prior art, the utility model has the beneficial effects that the utility model uses parital vacuum loading method,
It can be realized the detection of the position to bonding defect, size and shape, and can be applied to the on-the-spot test of large-scale component.
Detailed description of the invention
Fig. 1 is the index path of electronic cutting speckle method.
Fig. 2 projection moire method optical path.
Fig. 3 the utility model structure diagram.
The Section A-A schematic diagram of Fig. 4 Fig. 3.
Fig. 5 circular flaw bonding defect interference fringe picture.
The rectangular defect bonding defect interference fringe picture of Fig. 6.
Fig. 7 triangle defect bonding defect interference fringe picture.
The circular flaw bar graph of the undeformed projection grating of Fig. 8.
The circular flaw bar graph of the projection grating of Fig. 9 deformation.
The circular flaw bar graph of the superimposed contour of Figure 10.
In figure: 1- laser, 2- sliding block, 3-CCD video camera, 4- slide bar, 5- shear mirror, 6- vacuum pump, 7- organic glass
Case, 8- sealing strip, 9- beam expanding lens, 10- test specimen, 11- nut, 12- screw rod, 13- screw.
Specific embodiment
In the description of the present invention, it should be understood that term " center ", " longitudinal direction ", " transverse direction ", "upper", "lower",
The orientation or positional relationship of the instructions such as "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside" is
It is based on the orientation or positional relationship shown in the drawings, is merely for convenience of describing the present invention and simplifying the description, rather than indicate
Or imply that signified device or element must have a particular orientation, be constructed and operated in a specific orientation, therefore cannot understand
For limitations of the present invention.In addition, term " first ", " second " etc. are used for description purposes only, and should not be understood as indicating
Or it implies relative importance or implicitly indicates the quantity of indicated technical characteristic." first ", " second " etc. are defined as a result,
Feature can explicitly or implicitly include one or more of the features.It is in the description of the present invention, unless another
It is described, the meaning of " plurality " is two or more.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " is pacified
Dress ", " connected ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integrally
Connection；It can be mechanical connection, be also possible to be electrically connected；Can be directly connected, can also indirectly connected through an intermediary,
It can be the connection inside two elements.For the ordinary skill in the art, on being understood by concrete condition
State the concrete meaning of term in the present invention.
The utility model is further described with reference to the accompanying drawings and examples.
As shown, a kind of bonding defect detection device based on parital vacuum load, including laser 1, sliding block 2, CCD
Video camera 3, slide bar 4, shear mirror 5, vacuum pump 6, organic glass case 7 and beam expanding lens 9, the laser 1 and CCD camera 3 divide
Not Tong Guo screw rod 11 be mounted on sliding block 2, and be fixed using nut 12, beam expanding lens be installed in the front end of the laser 1
9, shear mirror 5 is installed in the front end of the CCD camera 3, the sliding block 2 is mounted on slide bar 4 by screw 13, described in two
Sliding block 2 drives laser 1 and CCD camera 3 to slide on slide bar 4 respectively, and the organic glass case 7 passes through pipeline and vacuum pump
6 connections, vacuumize organic glass case using vacuum pump, and 8 high vacuum of sealing strip is installed at 7 edge of organic glass case
Degree.
Working principle:
The utility model proposes detected using parital vacuum loading method to bonding defect.It is lacked if there is unsticking
Fall into, then unsticking position can be mingled with a small amount of air, under vacuum conditions, due to there are pressure difference can make defective locations surface generate from
Face displacement, can test acoplanarity displacement with electric speckle-shearing pattern interferometer method and projection moire method, according to test result energy
Enough detections realized to the position of bonding defect, size and shape.
Deformation refers to generating on the surface at test specimen bonding defect under vacuum conditions more greatly bigger than under normal circumstances
Deformation.Deformation is small, so being detected with electric speckle-shearing pattern interferometer method and projection moire method.
Under vacuum conditions, the deformation bigger than under normal circumstances is generated at test specimen bonding defect on the surface, it is this micro-
Small deformation will be shown in the form of interference fringe, and different shape bonding defect interference fringe picture is as shown in Figure 5-Figure 7.It is right
It is detected in small deformation with electronic cutting speckle technology, large deformation is detected with projection moire method, at this time will
Laser is changed to projector.
Operating procedure:
By the organic glass case 7 equipped with sealing strip 8 as the surface of tested test block 10, by adjusting the cunning on slide bar 4
Block 2 adjusts the position of laser 1 and CCD camera 3, and acquires the speckle pattern before vacuum load.Vacuum pump 6 is opened, and is adopted
Speckle pattern after collecting vacuum load.By subtracting each other to two width speckle patterns before and after vacuum load, reflection bonding defect is obtained
Position, size and shape bar graph.If deformation is excessive, coherence can be lost, so being proposed for large deformation with throwing
Shadow moire method is detected.The laser 1 that front end is installed to beam expanding lens 9 is needed to change projector at this time, by grating loss to examination
10 surface of part, is recorded with CCD camera 3 due to the grating figure before and after surface of test piece vacuum load, then by two width grating figures into
The position of reflection bonding defect, the contour bar graph of size and shape can be obtained, as Figure 8-Figure 10 in row superposition.
It is enlightenment, through the above description, related work people with the above-mentioned desirable embodiment according to the utility model
Member can carry out various changes and amendments in the range of without departing from this item utility model technical idea completely.This item is real
It is not limited to the contents of the specification with novel technical scope, it is necessary to its technology is determined according to scope of the claims
Property range.
Claims (2)
1. a kind of bonding defect detection device based on parital vacuum load, which is characterized in that taken the photograph including laser, sliding block, CCD
Camera, slide bar, shear mirror, vacuum pump, organic glass case and beam expanding lens, the laser and CCD camera pass through screw rod respectively
It is mounted on sliding block, and is fixed using nut, beam expanding lens is installed in the front end of the laser, in the CCD camera
Front end shear mirror is installed, two sliding blocks drive laser and CCD camera to slide on slide bar respectively, and the sliding block can
It is fixed on slide bar by screw, the organic glass case is controlled to a vacuum pump by pipeline.
2. a kind of bonding defect detection device based on parital vacuum load according to claim 1, which is characterized in that institute
State organic glass case edge installation sealing strip.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821016615.3U CN208313848U (en) | 2018-06-29 | 2018-06-29 | A kind of bonding defect detection device based on parital vacuum load |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201821016615.3U CN208313848U (en) | 2018-06-29 | 2018-06-29 | A kind of bonding defect detection device based on parital vacuum load |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108918534A (en) * | 2018-06-29 | 2018-11-30 | 天津城建大学 | A kind of bonding defect detection device based on parital vacuum load |
| CN115046823A (en) * | 2022-06-02 | 2022-09-13 | 上海工程技术大学 | Method for identifying interface defect type of coating layer of solid propellant grain |
-
2018
- 2018-06-29 CN CN201821016615.3U patent/CN208313848U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108918534A (en) * | 2018-06-29 | 2018-11-30 | 天津城建大学 | A kind of bonding defect detection device based on parital vacuum load |
| CN115046823A (en) * | 2022-06-02 | 2022-09-13 | 上海工程技术大学 | Method for identifying interface defect type of coating layer of solid propellant grain |
| CN115046823B (en) * | 2022-06-02 | 2024-08-09 | 上海工程技术大学 | Identification method for interface defect type of solid propellant grain coating layer |
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