CN2570870Y - Motherboard testing arrangement - Google Patents
Motherboard testing arrangement Download PDFInfo
- Publication number
- CN2570870Y CN2570870Y CN 02234862 CN02234862U CN2570870Y CN 2570870 Y CN2570870 Y CN 2570870Y CN 02234862 CN02234862 CN 02234862 CN 02234862 U CN02234862 U CN 02234862U CN 2570870 Y CN2570870 Y CN 2570870Y
- Authority
- CN
- China
- Prior art keywords
- test
- fixing blocks
- pedestal
- hole
- test card
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model relates to a mainboard testing device. The test module comprises a base, a plurality of fixing blocks and a test card, wherein, the lower part of the base can be used for arranging the fixing blocks. The upper part of the base is provided with rows of positioning holes. A plurality of long grooves are horizontally arranged at the point near each row of the long grooves. Positioning holes are arranged above each of the fixing blocks. The lower parts of the fixing blocks can be assembled with the test card. More than one positioning segmental hole is respectively arranged on both side of the test card. Positioning segmental holes can be used for bolts, and each of the positioning segmental holes can be chosen for each of the bolt. The bolts penetrate into horizontally through holes of the fixing blocks to fix the test card. Screws can be fixedly locked outside the holes between the base and the fixing blocks by means of the fixing blocks of the test module. The screw can also penetrate in the long grooves of the base. An exact positioning point is selected for combination and fixed lock. The arranged positions of the fixing blocks can be matched with the memory inserting grooves to regulate and move the fixing blocks. Moreover, the arranged height of the test card can be selected according to the positioning segmental hole of the test card so that the test module can give full play to the perfect testing performance.
Description
Technical field
The utility model is relevant for a kind of mainboard test equipment, is meant the mainboard test equipment with adjustable structure especially, and the circuit board that it helps adapting to all size contacts with plugging and unplugging easily and reach preferable.
Background technology
Present functional lifting, the also apparent more complexity of the arrangement of components of its motherboard relatively along with electronic product; With regard to main frame, its line design is accurate and connected the associated electrical part at each position, if a bit little error is arranged, then easily influence the quality of this motherboard, therefore behind motherboard weld critical part, then must test, further to detect the defective products situation to motherboard.
Present stage, the emphasis of Test Host plate is whether the slot that focuses on its internal memory, adapter partly has situations such as loose contact partly, and whether detected by measurement jig be non-defective unit.And the measurement jig of general test memory bank is to make at various different sizes, therefore if between the memory bank apart from or highly change or change, then general fixed tool is difficult to cooperate, must change and organize member separately, and make that easily depth cooperation is affectedly bashful difficult between slotting getting, and make interference phenomenons such as deriving loose contact, loss of signal decay, test instability when testing, relative has harmful effect to the test quality.
Summary of the invention
The purpose of this utility model is exactly to provide a kind of can have the mainboard test equipment of adjusting the functional test structure at the deficiencies in the prior art, this device can allow the test stay in grade, and save the conversion testing structure, make test module and memory bank relevant position to change flexibly.
The purpose of this utility model realizes by following technical proposals, mainboard test equipment of the present utility model, mainly be to be provided with joint detector in a platform one side, the top is provided with the test pressing plate, is provided with the proving installation of array array test module, test module and other part in the test pressing plate; It is characterized in that: this test module includes a pedestal, several maintenance piece and test cards, wherein the pedestal below is provided with the recessed groove of putting, and it can be for being provided with several maintenance pieces, and the position has number row above pedestal, several pilot holes of every row, and contiguous place laterally has several elongated slots in every registration hole; This each maintenance piece top vertically is provided with respect to the elongated slot of pedestal and the locking hole of pilot hole, and maintenance piece below indent is fluted, groove both side ends in the maintenance piece laterally is penetrated with transversal openings, can be in groove for being embedded with test card, and the test card both sides have scarce hole, more than one location respectively, available pin is also selected scarce hole, a location, test card is positioned the transversal openings of maintenance piece.
Maintenance piece by test module is located at outside pedestal and the maintenance piece pilot hole between the two with the screw pin, can also be in the elongated slot of pedestal by screw, select a definite anchor point in conjunction with locking, utilize the position is set cooperates memory bank and adjust mobile of maintenance piece, and being provided with highly of test card, can lack the hole as selection with its location again, make test module can bring into play splendid tested performance.
Description of drawings
Fig. 1 is the utility model proving installation stereoscopic figure;
Shown in Figure 2 is the stereographic map of the utility model proving installation inner structure;
Shown in Figure 3 is the exploded perspective view of test module in the proving installation of the present utility model;
Shown in Figure 4 is the relative position planimetric map of overlooking when testing between circuit board and the joint detector of the present utility model.
The figure number explanation
1...... platform 322.... locking hole
11..... reference column 323.... transversal openings
12..... test pressing plate 324.... pin
121.... guide pillar 33..... test card
122.... bumping post 331.... location lacks the hole
2...... the recessed external port of groove 43..... 312..... elongated slot 5...... joint 313..... locating hole 511, the 531..... elongated slot 314..... screw 52..... cylinder 32...... maintenance piece 53..... portable plate 321..... groove 54..... test lead put of test module 4...... circuit board 3....... test module 41..... interface card expansion slot 31...... pedestal 42..... memory slots 311.....
Embodiment
For enabling further to understand above-mentioned and other purpose, effect, technological means and the characteristics etc. of the utility model, lift the utility model now than specific embodiment, and cooperate icon to be described in detail as follows, believing has more clearly understanding to the utility model.
See also Fig. 1 and Fig. 2, mainboard test equipment of the present utility model is to be provided with joint detector 5 in a platform 1 one sides, the top is provided with test pressing plate 12, wherein test place, pressing plate 12 inboard four corners and respectively be provided with a guide pillar 121, it can import will test pressing plate 12 location in the platform 1, and the position has bumping post 122 at each guide pillar 121 contiguous place, can be for the stroke that presses down of support and restriction test pressing plate 12, and on platform 1, be provided with several reference columns 11, can make the usefulness of location for running through circuit board 4.
Above-mentioned test pressing plate 12 is provided with array test module 2, test module 3 and tests the proving installation of other part, test module 3 is to do test at the adapter expansion slot 41 of circuit board 4,3 of test modules are to test at memory bank 42, and are located at the external port of number on circuit board 4 one lateral edges 43 for to do detection by joint detector 5.
See also Fig. 2 and Fig. 3, this test module 3 can contain internal memories such as RAM, DDI, RAMBUS for test pack, its modular structure includes a pedestal 31, several maintenance pieces 32 and test card 33, wherein pedestal 31 belows are provided with the recessed groove 311 of putting, it can be for several maintenance pieces 32 are set, the position has number row and several pilot holes 313 of every row above pedestal 31, and 313 contiguous places laterally have several elongated slots 312 in every registration hole; These each maintenance piece 32 tops vertically are provided with respect to the elongated slot 312 of pedestal 31 and the locking hole 322 of pilot hole 313, and maintenance piece 32 below indents fluted 321, groove 321 both side ends in maintenance piece 32 laterally are penetrated with transversal openings 323, can be in groove 321 for being embedded with test card 33, and test card 33 both sides have scarce hole 331, more than one location respectively, available pin 324 is also selected a suitable location and is lacked hole 331, and runs through in the transversal openings 323 of maintenance piece 32 and test card 33 is fixing.
In addition, because test module 3 must cooperate the memory bank 42 on the circuit board 4 that state is set, therefore maintenance piece 32 is except being located at pilot hole 313 and locking hole 322 between the two with screw 314 pin, can also be in the elongated slot 312 of pedestal 31 by screw 314, select an anchor point really the time, and combine locking with the locking hole 322 of maintenance piece 32, therefore being provided with that the position can cooperate memory bank 42 of maintenance piece 32 and adjust and move, and being provided with highly of test card 33, can lack hole 331 as selecting, so test module 3 can be brought into play its good tested performance with its location again.
See also Fig. 2 and Fig. 4 again, its external port 43 of number of being located on circuit board 4 one sides can be by joint detector 5 test of being pegged graft, this joint detector 5 includes base plate 51 casing top halfs 52 and several portable plates 53 and test lead 54, the position is to be provided with cylinder 52 at base plate 51, and cylinder 52 can be done a left side on the elongated slot 511 of base plate 51, the right adjustment, with cylinder 52 affixed portable plate 53, also simultaneously can be before cylinder 52 be done in the elongated slot 531 of portable plate 53 according to external-connected port 43 the position being set, the back is adjusted, reach test action the most accurately to fill part, when test, utilize the propelling of cylinder 52 to move, can make portable plate 53 inner set test leads 54 do slotting with external port 43, pull out the electric test of contact.
Claims (2)
1, a kind of mainboard test equipment, it mainly is that a platform one side is provided with joint detector, the top is provided with the test pressing plate, is provided with the proving installation of many group test module, test module and other parts in the test pressing plate; It is characterized in that: this test module includes a pedestal, a plurality of maintenance piece and test card, wherein the pedestal below is provided with the recessed groove of putting, and it can be for being provided with a plurality of maintenance pieces, and the position has many rows above pedestal, the a plurality of pilot holes of every row, and contiguous place laterally has a plurality of elongated slots in every registration hole; This each maintenance piece top vertically is provided with respect to the elongated slot of pedestal and the locking hole of pilot hole, and maintenance piece below indent is fluted, groove both side ends in the maintenance piece laterally is penetrated with transversal openings, can be in groove for being embedded with test card, and the test card both sides have scarce hole, more than one location respectively, available pin is also selected scarce hole, a location, test card is positioned in the groove perforation of maintenance piece; Maintenance piece by test module is located at pedestal and maintenance piece pilot hole between the two with the screw pin.
2, mainboard test equipment according to claim 1, it is characterized in that screw in the elongated slot of pedestal to select a definite anchor point in conjunction with locking.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 02234862 CN2570870Y (en) | 2002-05-21 | 2002-05-21 | Motherboard testing arrangement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN 02234862 CN2570870Y (en) | 2002-05-21 | 2002-05-21 | Motherboard testing arrangement |
Publications (1)
Publication Number | Publication Date |
---|---|
CN2570870Y true CN2570870Y (en) | 2003-09-03 |
Family
ID=33709532
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN 02234862 Expired - Fee Related CN2570870Y (en) | 2002-05-21 | 2002-05-21 | Motherboard testing arrangement |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN2570870Y (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103348327A (en) * | 2011-01-27 | 2013-10-09 | 爱德万测试(新加坡)私人有限公司 | Test card for testing one or more devices under test and tester |
CN103414065A (en) * | 2013-07-25 | 2013-11-27 | 昆山维金五金制品有限公司 | Bottom terminal plate of memory detector |
-
2002
- 2002-05-21 CN CN 02234862 patent/CN2570870Y/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103348327A (en) * | 2011-01-27 | 2013-10-09 | 爱德万测试(新加坡)私人有限公司 | Test card for testing one or more devices under test and tester |
CN103348327B (en) * | 2011-01-27 | 2016-05-04 | 爱德万测试公司 | For testing test card and the tester of one or more Devices to tests |
CN103414065A (en) * | 2013-07-25 | 2013-11-27 | 昆山维金五金制品有限公司 | Bottom terminal plate of memory detector |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C19 | Lapse of patent right due to non-payment of the annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |