CN216622604U - Memory chip testing device - Google Patents
Memory chip testing device Download PDFInfo
- Publication number
- CN216622604U CN216622604U CN202123224455.6U CN202123224455U CN216622604U CN 216622604 U CN216622604 U CN 216622604U CN 202123224455 U CN202123224455 U CN 202123224455U CN 216622604 U CN216622604 U CN 216622604U
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- plate
- fixedly connected
- rack
- placing
- memory chip
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- 238000012360 testing method Methods 0.000 title claims abstract description 32
- 238000001514 detection method Methods 0.000 claims abstract description 13
- 239000000523 sample Substances 0.000 claims abstract description 10
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
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Abstract
The utility model discloses a memory chip testing device which comprises a workbench, wherein a placing plate is arranged on the workbench, and a plurality of placing grooves for placing a printed circuit board are uniformly formed in a top plate of the placing plate; a rack is arranged above the placing plate, a screw rod is rotatably arranged between two vertical plates of the rack, a motor is fixedly connected to one vertical plate, and the output end of the motor is fixedly connected with the screw rod; the screw rod is connected with a sliding block in a threaded manner, a transverse plate of the rack is provided with a sliding groove along the horizontal direction, and the upper part of the sliding block is inserted in the sliding groove in a sliding manner; the bottom of the sliding block is fixedly connected with an electric cylinder, the extending end of the electric cylinder is fixedly connected with a detection plate, and a plurality of probes are arranged on the detection plate; and a test host is arranged on one side of the rack, and the probe is electrically connected with the test host through a lead. The device has the advantages of simple structure, reasonable design, convenient operation, high testing efficiency, high automation degree, reduction of labor intensity of workers and high accuracy.
Description
Technical Field
The utility model relates to the technical field of printed circuit boards, in particular to a memory chip testing device.
Background
A PCB, i.e., a printed wiring board, which is called a printed board for short, is one of important parts in the electronic industry. Almost every electronic device has electronic components such as integrated circuits, and a printed board is used to electrically interconnect the components. The printed circuit board generally comprises a board body and a plurality of memory chips welded on the board body, and after the memory chips are welded on the board body, performance test needs to be carried out on the memory chips. The existing memory chip test fixture generally has the problems of inconvenient operation and low test efficiency. Therefore, it is urgent to design a testing tool for testing a memory chip with convenient operation and high testing efficiency.
SUMMERY OF THE UTILITY MODEL
The utility model provides a memory chip testing device aiming at the defects in the prior art.
The memory chip testing device comprises a workbench, wherein a placing plate is arranged on the workbench, and a plurality of placing grooves used for placing a printed circuit board are uniformly formed in a top plate of the placing plate. Place the board top and be provided with the frame, rotate between two risers of frame and install the lead screw, fixedly connected with motor on the riser, motor output and lead screw fixed connection. The screw rod is connected with a sliding block in a threaded mode, a transverse plate of the rack is provided with a sliding groove in the horizontal direction, and the upper portion of the sliding block is inserted into the sliding groove in a sliding mode. The electric detection device is characterized in that an electric cylinder is fixedly connected to the bottom of the sliding block, a detection plate is fixedly connected to the extending end of the electric cylinder, and a plurality of probes are arranged on the detection plate. And a test host is arranged on one side of the rack, and the probe is electrically connected with the test host through a lead. And the workbench is provided with a control panel.
Furthermore, all be provided with the extension board in the standing groove, four edges of extension board bottom plate all are connected with the spring, the spring other end and standing groove bottom plate fixed connection.
Furthermore, the bottom parts of the vertical plates at the two ends of the rack are fixedly connected with the workbench.
Further, the placing plate bottom plate is fixedly connected with the workbench.
Further, the control panel is electrically connected with the motor, and the control panel controls the motor to work.
Furthermore, control panel and electronic jar electric connection, control panel control electronic jar work.
Compared with the prior art, the utility model has the beneficial effects that: the device has the advantages of simple structure, reasonable design, convenient operation, high testing efficiency, high automation degree, reduction of labor intensity of workers and high accuracy.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a top view of the placement board of the present invention;
FIG. 3 is a schematic view of the placement of the support plate and the support plate according to the present invention.
In the figure: the device comprises a workbench 1, a placing plate 2, a placing groove 21, a support plate 22, a spring 23, a rack 3, a screw rod 31, a motor 32, a sliding block 33, an electric cylinder 4, a detection plate 5, a probe 51, a test host 6 and a control panel 7.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-3, a memory chip testing device includes a worktable 1, and a control panel 7 is installed on the worktable 1. The worktable 1 is provided with a placing plate 2, and a bottom plate of the placing plate 2 is fixedly connected with the worktable 1. A plurality of placing grooves 21 used for placing the printed circuit board are evenly formed in the top plate of the placing plate 2, support plates 22 are arranged in the placing grooves 21, springs 23 are connected to four corners of a bottom plate of each support plate 22, and the other ends of the springs 23 are fixedly connected with the bottom plate of the placing grooves 21.
A rack 3 is arranged above the placing plate 2, and the bottoms of vertical plates at two ends of the rack 3 are fixedly connected with the workbench 1. The lead screw 31 is installed in the rotation between two risers of frame 3, fixedly connected with motor 32 on the riser, motor 32 output and lead screw 31 fixed connection. The control panel 7 is electrically connected with the motor 32, and the control panel 7 controls the motor 32 to work. The screw rod 31 is screwed with a sliding block 33, a transverse plate of the frame 3 is provided with a sliding groove along the horizontal direction, and the upper part of the sliding block 33 is inserted in the sliding groove in a sliding way.
Slider 33 bottom fixedly connected with electronic jar 4, control panel 7 and electronic jar 4 electric connection, control panel 7 control electronic jar 4 work. The extension end of the electric cylinder 4 is fixedly connected with a detection plate 5, and a plurality of probes 51 are arranged on the detection plate 5. A testing host 6 is arranged on one side of the rack 3, and the probe 51 is electrically connected with the testing host 6 through a lead.
When in use, the device is electrified, the printed circuit boards are placed in the placing groove 21 one by one, the side with the memory chip faces upwards, the bottom plate of the printed circuit board is contacted with the support plate 22, the electric cylinder 4 is started through the control panel 7, the extending end of the electric cylinder 4 extends for a certain distance, so that the probe 51 is contacted with the memory chip, the detection data is observed on the test host machine 6, after the detection is finished, the electric cylinder 4 is started through the control panel 7, the extension end of the electric cylinder 4 is retracted to the original position, the motor 32 is started through the control panel 7, the motor 32 works for a certain time, the sliding block 33 is driven to move to the upper part of the adjacent placing groove 21, the test is carried out according to the steps, and repeating the steps until all printed circuit boards on the placing plate 2 are detected, taking the printed circuit boards out of the placing groove 21, and then placing the printed circuit boards to be detected for detection. The utility model has the advantages of simple structure, reasonable design, convenient operation, high testing efficiency and high automation degree, and not only reduces the labor intensity of workers, but also has high accuracy.
Claims (6)
1. The utility model provides a memory chip testing arrangement, includes workstation (1), its characterized in that: a placing plate (2) is arranged on the workbench (1), and a plurality of placing grooves (21) for placing the printed circuit board are uniformly formed in the top plate of the placing plate (2); a rack (3) is arranged above the placing plate (2), a screw rod (31) is rotatably arranged between two vertical plates of the rack (3), a motor (32) is fixedly connected to one vertical plate, and the output end of the motor (32) is fixedly connected with the screw rod (31); the screw rod (31) is in threaded connection with a sliding block (33), a transverse plate of the rack (3) is provided with a sliding groove along the horizontal direction, and the upper part of the sliding block (33) is inserted into the sliding groove in a sliding manner; the bottom of the sliding block (33) is fixedly connected with an electric cylinder (4), the extending end of the electric cylinder (4) is fixedly connected with a detection plate (5), and a plurality of probes (51) are arranged on the detection plate (5); a test host (6) is arranged on one side of the rack (3), and the probe (51) is electrically connected with the test host (6) through a lead; and a control panel (7) is arranged on the workbench (1).
2. The memory chip test device according to claim 1, wherein: all be provided with extension board (22) in standing groove (21), four edges of extension board (22) bottom plate all are connected with spring (23), the spring (23) other end and standing groove (21) bottom plate fixed connection.
3. The memory chip test device according to claim 1, wherein: the bottom parts of the vertical plates at the two ends of the rack (3) are fixedly connected with the workbench (1).
4. The memory chip test device according to claim 1, wherein: the bottom plate of the placing plate (2) is fixedly connected with the workbench (1).
5. The memory chip test device according to claim 1, wherein: the control panel (7) is electrically connected with the motor (32), and the control panel (7) controls the motor (32) to work.
6. The memory chip test device according to claim 1, wherein: the control panel (7) is electrically connected with the electric cylinder (4), and the control panel (7) controls the electric cylinder (4) to work.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123224455.6U CN216622604U (en) | 2021-12-21 | 2021-12-21 | Memory chip testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123224455.6U CN216622604U (en) | 2021-12-21 | 2021-12-21 | Memory chip testing device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN216622604U true CN216622604U (en) | 2022-05-27 |
Family
ID=81706444
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202123224455.6U Active CN216622604U (en) | 2021-12-21 | 2021-12-21 | Memory chip testing device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN216622604U (en) |
-
2021
- 2021-12-21 CN CN202123224455.6U patent/CN216622604U/en active Active
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