CN2483835Y

CN2483835Y - Register parts of holding unit of sequencer used for IC measurement

Info

Publication number: CN2483835Y
Application number: CN 01208016
Authority: CN
Inventors: 谢来福; 黄清荣; 廖沐盛; 谢宜璋
Original assignee: Silicon Integrated Systems Corp
Current assignee: Silicon Integrated Systems Corp
Priority date: 2001-03-16
Filing date: 2001-03-16
Publication date: 2002-03-27
Anticipated expiration: 2011-03-16

Abstract

The utility model provides a sleeved component of attracting and holding device of an integrated circuit (IC) testing and sorting machine. The utility model is sleeved and fixed on one IC attracting and holding end of the attracting and holding device. The integrated components are as follows: a fixing plate which is provided with an opening on the center and fixes the attracting and holding device on one surface of the fixing plate; a sleeved ring wall which takes the opening of the fixing plate as center and vertically extends to the other surface. An inclined surface which cooperates with the IC appearance is arranged on the inner wall of the sleeved ring wall outer end. By the structure above, the sleeved component is connected with the IC via the inclined surface, thus an interval which is easy to be introduced and convenient for sleeve-connection without retention is formed. So when the IC is located, no offset is existed and the testing accuracy can be achieved.

Description

The engagement piece of IC testing sorter holding device

The utility model relates to integrated circuit (IC) testing sorter, relates in particular to a kind of engagement piece of IC testing sorter holding device.

The IC of BGA or PGA pattern needs to do the function test with the IC testing sorter again after manufacturing is finished, and faulty materials are detected.See also Fig. 1, the IC testing sorter includes a holding device 11, a test board 12, reaches a test bench 13, wherein: an end of this holding device 11 connects a mechanical arm (figure does not show), the other end is provided with a sucker 111 can draw IC15, inside is provided with an air pipe line 112 to this sucker 111, provide air-breathing by this air pipe line 112, form the suction of drawing IC.See also Fig. 2, this holding device 11 is in order to locate IC15, its outer race is provided with an engagement piece 14, this engagement piece 14 is formed with a fixed head 141 and a shrinking ring wall 142, the centre of this fixed head 141 is provided with a square opening 143, four corners are provided with four perforation 144, use with this holding device 11 and fix, and these four 144 of perforation are arranged with four perforation 145; This shrinking ring wall 142 is corresponding to opening 143 vertical extent of this fixed head 141.This test board 12 is in order to be electrically connected with IC15, and whether test I C function is normal.This test bench 13 is located on the test board 12, on it four perforation 145 that should engagement piece 14 are provided with four card tips 131, the position that location IC15 is put in this test board 12 is used in the perforation 145 that this card tip 131 can pass this engagement piece 14 when this holding device 11 is drawn IC15 to these test board 12 do tests.The colloid 152 that the profile of this IC15 includes a circuit board 151 and protrudes, this circuit board 151 is provided with most spaced tin balls 153, and the outer end inner edge of this shrinking ring wall 142 promptly overlaps should the colloid 152 of IC15.By above-mentioned explanation as can be known this IC15 of IC testing sorter sticking locate by this engagement piece 14 to the position that this test board 12 is done test.

Because the shrinking ring wall 142 outer end inner edges of known engagement piece 14 are not provided with the oblique angle, for convenience with colloid 152 fits of IC15, the wide colloid 152 that must be slightly larger than this IC15 within this shrinking ring wall 142, so make both behind fit, then be formed with gap b, this holding device 11 is difficult to accurate location when this IC15 of sticking does test, and because tin ball 153 spacings of present IC only have 1.27mm, very accurate, make more because of the error on the location, and produce incorrect test result, cause product losses, if i.e. IC normally originally if locate badly, can make the error that contacted of tin ball and test board when test, thereby may obtain bad test result, and then be mistaken for defective products.

The purpose of this utility model is to overcome above the deficiencies in the prior art, provides the outline edge oblique angle of a kind of IC of cooperation to make fit, and the location is good, can avoid causing in test the engagement piece of the IC testing sorter holding device of error.

For reaching above-mentioned purpose, the engagement piece of IC testing sorter holding device of the present utility model, fit are fixed in the end of holding device sticking IC, use fit IC, it is provided with integratedly: be provided with the fixed head of an opening in the middle of one, the one side of fixed head is fixed with holding device; With an opening with fixed head be the vertically extending shrinking ring wall of middle mind-set another side, the inwall of shrinking ring wall outer end is provided with the inclined plane of the profile that cooperates IC.

By above structure, this engagement piece and IC engage by the face that inclines, can form to be easy to import, and need not remain with the gap that makes things convenient for fit, so do not have off normal when locating IC, can reach the accuracy of test.

Above-mentioned and other purpose, advantage and characteristic of the present utility model are by following preferred embodiment and be elaborated in conjunction with the accompanying drawings.

Cross sectional side view when Fig. 1 is the test of known IC testing sorter.

Fig. 2 is the engagement piece stereogram of the holding device of known IC testing sorter.

Fig. 3 is the engagement piece stereogram of the holding device of the utility model preferred embodiment.

Cross sectional side view when Fig. 4 is the test of the utility model preferred embodiment.

The number in the figure explanation

11---holding device 12---test board

The 13---test bench 131---card tip

15---IC 151---circuit board

152---colloid 153---tin ball

The 2---engagement piece

21---fixed head 22---opening

23---perforation 24---perforation

25---shrinking ring wall 251---inclined plane

See also Fig. 3,4 and be a preferred embodiment of the present utility model, this IC testing sorter includes a holding device 11, a test board 12, reaches a test bench 13, this partly is known, do not repeat superfluous words at this, engagement piece 2 fits of the present utility model are fixed in the end of this holding device 11 sticking IC15, use fit IC15, be provided with integratedly:

One fixed head 21, centre are provided with an opening 22, four corners and are provided with four perforation 23, use with this holding device 11 and fix, and these four 23 of perforation are arranged with four perforation 24, use the card tip 131 fastenings with test bench 13; And

One shrinking ring wall 25 is corresponding to opening 22 vertical extent of this fixed head 21, make this opening 22 be positioned among this shrinking ring wall 25, the inwall of its outer end is provided with the inclined plane 251 that is 30 degree angles with vertical walls, use the profile that cooperates this IC15, spend the face that inclines because the edge of the colloid 152 of this integrated circuit (IC) also is provided with 30.

By above structure, when holding device 11 sticking IC15, the inclined plane 251 of this engagement piece shrinking ring wall 25 can with colloid 152 fluid-tight engagement of IC, because both are by the joint of the face that inclines, can mat incline face and form and be easy to import, do not need again in remaining with the gap as prior art for convenience of fit between the two, so can off normal not arranged because of the gap, so can reach very firm and correct positioning effect, the tin ball 153 of IC can have correct contacting with test board, reach correct test, can not cause off normal to cause test to go up the loss of erroneous judgement because of the tin ball.

The specific embodiment that in preferred embodiment describes in detail, is proposed; only for technology contents of the present utility model is described; and unrestricted protection range of the present utility model, all many variations of doing according to spirit of the present utility model and claim are implemented, and all belong to protection range of the present utility model.

Claims

1. the engagement piece of an integrated circuit (IC) testing sorter holding device, its fit is fixed on the end of described holding device sticking IC, and it is provided with integratedly: be provided with the fixed head of an opening in the middle of one, the one side of described fixed head is fixed with described holding device; With an opening with described fixed head be the vertically extending shrinking ring wall of middle mind-set another side, it is characterized in that: the inwall of described shrinking ring wall outer end is provided with the inclined plane of the profile that cooperates IC.

2. the engagement piece of IC testing sorter holding device as claimed in claim 1 is characterized in that: the inclined plane of described shrinking ring wall and wall are 30 degree angles.