CN221631468U - Singlechip testing arrangement - Google Patents

Abstract

The application discloses a single chip microcomputer testing device, which relates to the technical field of single chip microcomputer testing and comprises a workbench, wherein a bearing plate is assembled at the center of the top of the workbench; the pair of moving bars are movably assembled at the top of the workbench through the screw thread mechanism and are used for contacting the singlechip; the telescopic mechanism is fixedly arranged at the top of the corresponding movable bar and comprises an electric push rod fixedly assembled on the side face of the movable bar, the output end of the electric push rod is fixedly assembled with a movable bar, a pair of slide bars are fixedly connected to the side face of the movable bar, the side ends of the slide bars are penetrated through the movable bar, and clamping plates are simultaneously arranged at one ends, close to the bearing plates, of the slide bars, so that batch clamping tests can be carried out on single chip computers of the same type.

Description

Singlechip testing arrangement

Technical Field

The application relates to the technical field of single-chip microcomputer testing, in particular to a single-chip microcomputer testing device.

Background

The single chip microcomputer is an integrated circuit chip integrating functional units such as a microprocessor core, a memory, an input/output interface, a timer and the like. The single chip microcomputer is widely applied to the development of the embedded system, can control various peripheral devices, sensors and actuators, and can realize functions of automatic control, data processing and the like. Because the singlechip has the advantages of low cost, small volume, high integration level, flexibility and the like, the singlechip is widely applied to various fields such as household appliances, communication, medical treatment, automobiles, industrial control and the like.

The utility model provides a singlechip testing arrangement is provided to current patent publication number CN218675204U, it includes the regulating box, two spouts have been seted up to the inside bottom surface of regulating box, and two the equal sliding connection slider in inside of spout, two the equal fixed mounting in one side of slider has the connecting rod, the top surface fixed mounting of slider has branch, the slide hole has been seted up to the top surface of regulating box, the one end of branch is passed the slide hole extends to the outside of regulating box, the one end fixed mounting of branch has the locating piece, and the user is at first placed the singlechip that needs the test on placing the board, then rotates the threaded rod, rotates through the threaded rod to conveniently drive the connecting rod and control the removal, and drive the branch motion from the convenience slider, make the locating piece can be quick fix a position the singlechip on the placing the board, improve the efficiency of test.

However, the device still has certain defects in use, when a large number of singlechips are required to be tested, the adjustment of the two clamping plates is carried out only by rotating the bidirectional threaded rod, so that the device is laborious and time-consuming, and is not beneficial to testing the singlechips in a large number. Based on the above problems, we provide a single chip microcomputer testing device.

Disclosure of utility model

In order to solve the problems in the background art, the application provides a singlechip testing device.

The application provides a singlechip testing device which adopts the following technical scheme:

The single chip microcomputer testing device comprises a workbench, wherein a receiving plate is assembled at the center of the top of the workbench; the pair of moving bars are movably assembled at the top of the workbench through the screw thread mechanism and are used for contacting the singlechip; the telescopic mechanisms are fixedly arranged at the tops of the corresponding movable bars and comprise electric push rods fixedly assembled on the sides of the movable bars, movable bars are fixedly assembled at the output ends of the electric push rods, a pair of slide bars are fixedly connected to the sides of the movable bars, the side ends of the two slide bars are penetrated through the movable bars, and clamping plates are simultaneously arranged at one ends, close to the bearing plates, of the two slide bars.

By adopting the technical scheme, batch clamping test can be carried out on single-chip computers of the same model.

Preferably, the opposite side surfaces of the two clamping plates are provided with arc-shaped grooves.

Through adopting above-mentioned technical scheme, set up the arc recess for when splint centre gripping singlechip, the side of singlechip can be contacted to the arc recess, increases the steadiness of singlechip centre gripping location from this.

Preferably, the screw thread mechanism is including rotating the inside two-way threaded rod of connection at the workstation, and two the movable strip screw thread assembly is in the middle part of two-way threaded rod, the outside at the workstation is arranged to the side end of two-way threaded rod, and the side end fixedly connected with carousel of two-way threaded rod.

Through adopting above-mentioned technical scheme, two removal strips are close to each other or keep away from each other on two-way threaded rod, adjust the distance between two splint from this, adapt the centre gripping location of not equidimension singlechip from this.

Preferably, a support panel is arranged in the workbench, and the bottom ends of the two moving strips are movably connected to the top of the support panel.

Through adopting above-mentioned technical scheme, set up support panel for track on the support panel can restrict the movable strip, ensures the steadiness that the movable strip removed.

Preferably, the bottom of workstation still is provided with a plurality of telescopic links, each the bottom of telescopic link is connected with the base simultaneously, base top center department fixed mounting has flexible jar, just the output of flexible jar is connected in the bottom of workstation.

Through adopting above-mentioned technical scheme, can also promote the workstation through the telescopic cylinder and reciprocate, the use of adaptation different height crowds.

In summary, the application has the following beneficial technical effects:

The two moving strips are driven to be close to each other through the threaded mechanism, so that the side surfaces of the two clamping plates are in contact with the side surface of the single chip microcomputer, the single chip microcomputer is clamped, then an operator tests the single chip microcomputer, after the test is finished, the two corresponding moving strips are pushed through the two electric push rods, the moving strips drive the two sliding rods to move, the clamping plates are far away from the single chip microcomputer, and then the operator takes the single chip microcomputer to clamp and place the next single chip microcomputer; through the structural design, batch clamping test can be carried out on single-chip computers of the same model.

Drawings

FIG. 1 is a schematic diagram of a single chip microcomputer testing device in an embodiment of the application;

FIG. 2 is a schematic diagram of the top structure of a single-chip microcomputer testing device according to an embodiment of the application;

FIG. 3 is a schematic diagram of another structure of a single-chip microcomputer testing device according to an embodiment of the present application;

fig. 4 is a schematic diagram of an internal structure of a single chip microcomputer testing device according to an embodiment of the present application.

Reference numerals illustrate: 1. a work table; 2. a receiving plate; 3. moving the bar; 4. a screw mechanism; 400. a two-way threaded rod; 401. a support panel; 5. a telescoping mechanism; 500. an electric push rod; 501. a movable bar; 502. a slide bar; 503. a clamping plate; 6. a telescopic rod; 7. and a telescopic cylinder.

Detailed Description

The application is described in further detail below with reference to fig. 1 to 4.

It is noted that the figures are schematic and not drawn to scale. Relative dimensions and proportions of parts of the figures have been shown exaggerated or reduced in size, for the sake of clarity and convenience in the drawings, and any dimensions are merely illustrative and not limiting. The same reference numerals are used for the same structures, elements, or accessories appearing in more than two figures to embody similar features.

The embodiment of the application discloses a singlechip testing device. Referring to fig. 1 to 4, a single chip microcomputer testing device comprises a workbench 1, wherein a bearing plate 2 is arranged at the center of the top of the workbench 1; a pair of moving bars 3 which are movably assembled at the top of the workbench 1 through a screw thread mechanism 4 and are used for contacting the singlechip; the telescopic mechanism 5 is fixedly arranged at the top of the corresponding movable bar 3, the telescopic mechanism 5 comprises an electric push rod 500 fixedly assembled on the side face of the movable bar 3, a movable bar 501 is fixedly assembled at the output end of the electric push rod 500, a pair of sliding bars 502 are fixedly connected to the side face of the movable bar 501, the side ends of the two sliding bars 502 penetrate through the movable bar 3, and clamping plates 503 (all electric components in the device are powered by an external power supply) are simultaneously arranged at one ends of the two sliding bars 502, which are close to the receiving plate 2.

Specifically, the singlechip to be detected is placed on the top of the bearing plate 2, then the two moving bars 3 are driven to approach each other through the screw thread mechanism 4, so that the side surfaces of the two clamping plates 503 are mutually contacted with the side surface of the singlechip, the singlechip is clamped, then an operator can test the singlechip, after the test is finished, the corresponding moving bar 501 is pushed by the two electric push rods 500, the moving bar 501 drives the two sliding bars 502 to move, the clamping plates 503 are far away from the singlechip, and then the operator can clamp and place the next singlechip after taking the singlechip; through the structural design, batch clamping test can be carried out on single-chip computers of the same model.

Referring to fig. 1, fig. 2 and fig. 3, the opposite sides of the two clamping plates 503 are provided with arc grooves, and by arranging the arc grooves, when the clamping plates 503 clamp the single chip microcomputer, the arc grooves can contact the side of the single chip microcomputer, so that the stability of clamping and positioning of the single chip microcomputer is improved.

Referring to fig. 4, the screw mechanism 4 includes a bi-directional threaded rod 400 rotatably connected inside the table 1, and two moving bars 3 are screw-fitted in the middle of the bi-directional threaded rod 400, side ends of the bi-directional threaded rod 400 are disposed outside the table 1, and side ends of the bi-directional threaded rod 400 are fixedly coupled with a turntable.

Specifically, for the use of the screw mechanism 4, an operator rotates the bidirectional threaded rod 400, so that the two moving bars 3 are close to or far away from each other on the bidirectional threaded rod 400, and the distance between the two clamping plates 503 is adjusted, so that the clamping and positioning of singlechips with different sizes are adapted.

Referring to fig. 4, a support panel 401 is disposed in the workbench 1, the bottom ends of the two moving bars 3 are movably connected to the top of the support panel 401, a track groove for moving the moving bars 3 is formed in the top of the workbench 1, and the support panel 401 is disposed, so that the track on the support panel 401 can limit the moving bars 3, and the moving stability of the moving bars 3 is guaranteed.

Referring to fig. 3, the bottom of the workbench 1 is further provided with a plurality of telescopic rods 6, the bottom ends of the telescopic rods 6 are simultaneously connected with a base, a telescopic cylinder 7 is fixedly assembled at the center of the top of the base, and the output end of the telescopic cylinder 7 is connected to the bottom of the workbench 1.

Specifically, the workbench 1 can be pushed to move up and down through the telescopic cylinder 7, and the use of people with different heights is adapted.

Standard parts used in the utility model can be purchased from the market, special-shaped parts can be customized according to the description of the specification and the drawings, the specific connection modes of all parts adopt conventional means such as mature bolts, rivets and welding in the prior art, the machinery, the parts and the equipment adopt conventional models in the prior art, and the circuit connection adopts conventional connection modes in the prior art, so that the details are not described.

The implementation principle of the singlechip testing device provided by the embodiment of the application is as follows: placing the singlechip to be detected at the top of the bearing plate 2, driving two moving strips 3 to be close to each other through the screw mechanism 4, so that the side surfaces of two clamping plates 503 are mutually contacted with the side surface of the singlechip, further clamping the singlechip, then an operator can test the singlechip, after the test is finished, the corresponding moving strip 501 is pushed by two electric push rods 500, the moving strip 501 drives two sliding rods 502 to move, the clamping plates 503 are far away from the singlechip, and then the operator can clamp and place the next singlechip by taking the singlechip.

For the use of the screw mechanism 4, an operator rotates the bidirectional threaded rod 400 to enable the two moving bars 3 to be close to or far away from each other on the bidirectional threaded rod 400, so that the distance between the two clamping plates 503 is adjusted, and the clamping and positioning of singlechips with different sizes are adapted.

Moreover, the workbench 1 can be pushed to move up and down through the telescopic cylinder 7, so that the use of people with different heights is adapted.

The last points to be described are: first, in the description of the present application, it should be noted that, unless otherwise specified and defined, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be mechanical or electrical, or may be a direct connection between two elements, and "upper," "lower," "left," "right," etc. are merely used to indicate relative positional relationships, which may be changed when the absolute position of the object being described is changed;

Secondly: in the drawings of the disclosed embodiments, only the structures related to the embodiments of the present disclosure are referred to, and other structures can refer to the common design, so that the same embodiment and different embodiments of the present disclosure can be combined with each other under the condition of no conflict;

Finally: the foregoing description of the preferred embodiments of the utility model is not intended to limit the utility model to the precise form disclosed, and any such modifications, equivalents, and alternatives falling within the spirit and principles of the utility model are intended to be included within the scope of the utility model.

Claims (5)

1. A singlechip testing arrangement, characterized by that includes:

the workbench (1), wherein a bearing plate (2) is assembled at the center of the top of the workbench (1);

a pair of moving bars (3) which are movably assembled at the top of the workbench (1) through a screw thread mechanism (4) and are used for contacting the singlechip;

The pair of telescopic machanism (5), fixed setting is at the removal strip (3) top that corresponds, telescopic machanism (5) are including fixed assembly electric putter (500) on removing strip (3) side, the output fixed mounting of electric putter (500) has moves strip (501), the side rigid coupling that moves strip (501) has a pair of slide bar (502), and two the side of slide bar (502) all alternates and removes strip (3), two slide bar (502) are close to the one end of holding plate (2) and are provided with splint (503) simultaneously.

2. The single-chip microcomputer testing device according to claim 1, wherein: arc-shaped grooves are formed in the opposite side surfaces of the two clamping plates (503).

3. The single-chip microcomputer testing device according to claim 1, wherein: the screw thread mechanism (4) comprises a bidirectional threaded rod (400) which is rotationally connected inside the workbench (1), the two movable bars (3) are assembled in the middle of the bidirectional threaded rod (400) in a threaded mode, the lateral ends of the bidirectional threaded rod (400) are arranged outside the workbench (1), and the lateral ends of the bidirectional threaded rod (400) are fixedly connected with a rotary table.

4. A single-chip microcomputer testing device according to claim 3, characterized in that: the inside of workstation (1) is provided with support panel (401), and the bottom of two movable strip (3) all moves and connects at support panel (401) top.

5. The single-chip microcomputer testing device according to claim 1, wherein: the bottom of workstation (1) still is provided with a plurality of telescopic links (6), and the bottom of each telescopic link (6) is connected with the base simultaneously, base top center department fixed mounting has telescopic cylinder (7), just the output of telescopic cylinder (7) is connected in the bottom of workstation (1).