CN221042876U - Multi-band OTA test system - Google Patents
Multi-band OTA test system Download PDFInfo
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- CN221042876U CN221042876U CN202321831846.0U CN202321831846U CN221042876U CN 221042876 U CN221042876 U CN 221042876U CN 202321831846 U CN202321831846 U CN 202321831846U CN 221042876 U CN221042876 U CN 221042876U
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- 238000012360 testing method Methods 0.000 title claims abstract description 21
- 239000000523 sample Substances 0.000 claims abstract description 135
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 7
- 238000004891 communication Methods 0.000 claims description 2
- 230000005540 biological transmission Effects 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
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Abstract
The application relates to a multi-band OTA test system which can easily and accurately automatically switch probes in various frequency bands. The multi-band OTA test system comprises: a test object placing table; a probe mount configured to be rotatable about a first axis; the working frequency range is sequentially increased, and the low-frequency probe, the high-frequency probe and the ultrahigh-frequency probe are respectively arranged on the probe mounting seat and are sequentially arranged around the first axis; when the probe mounting seat rotates to a first position around the first axis, the low-frequency probe is opposite to the tested object placing table; when the probe mounting seat rotates to a second position around the first axis, the high-frequency probe is opposite to the tested object placing table; when the probe mounting seat rotates to a third position around the first axis, the ultrahigh frequency probe is opposite to the tested object placing table.
Description
Technical Field
The application relates to a multi-band OTA test system.
Background
Currently, the probe used in The known OTA (Over The Air) test cannot reach a particularly wide probing frequency, so that a low-frequency probe, a high-frequency probe and an ultrahigh-frequency probe are generally used in combination. The working frequency of the low-frequency probe is generally 400MHz-8GHz, the frequency of the high-frequency probe is generally 8GHz-60GHz, and the frequency of the ultrahigh-frequency probe is generally 60Ghz-90Ghz.
However, the conventional multi-probe OTA test system is difficult to automatically switch the probes of three frequency bands, and manual switching is needed, which is labor-consuming. Moreover, due to the operation error of personnel, the position of the probe in each measurement is very accurate in the manual switching process, and the error of the test result is caused.
Disclosure of Invention
In view of the above, the present application provides a multi-band OTA testing system, which can easily and accurately automatically switch probes of various frequency bands.
A multi-band OTA testing system comprising:
A test object placing table;
A probe mount configured to be rotatable about a first axis; and
The working frequency range is sequentially increased, and the low-frequency probe, the high-frequency probe and the ultrahigh-frequency probe are respectively arranged on the probe mounting seat and are sequentially arranged around the first axis;
when the probe mounting seat rotates to a first position around the first axis, the low-frequency probe is opposite to the tested object placing table; when the probe mounting seat rotates to a second position around the first axis, the high-frequency probe is opposite to the tested object placing table; when the probe mounting seat rotates to a third position around the first axis, the ultrahigh frequency probe is opposite to the tested object placing table.
In some possible implementations, the system includes:
A first motor for driving the probe mount to rotate about the first axis;
a position sensor for detecting the first position, the second position and the third position; and
And the controller is respectively in communication connection with the first motor and the position sensor and is used for controlling the first motor to stop rotating when the position sensor detects that the probe mounting seat rotates to the first position, the second position or the third position.
In some possible implementations, the low frequency probe, the high frequency probe, and the ultra-high frequency probe are equally angularly spaced about the first axis.
In some possible implementations, the probe mount includes:
A central portion defining the first axis, and
Three extension portions extending from the central portion at an angle of 120 ° to each other;
Wherein the low frequency probe, the high frequency probe and the ultra-high frequency probe are respectively positioned at the outer ends of the three extension parts.
In some possible implementations, the low frequency probe, the high frequency probe, and the ultra-high frequency probe are arranged on the same circumference, an axis of the circumference coinciding with the first axis.
In some possible implementations, the system includes:
Base frame
A support arm supported by the pedestal and supporting the probe mount, and rotatably connected to the pedestal about a second axis;
Wherein the probe mount is rotatably connected to the support arm about a first axis that is perpendicular to the second axis.
In some possible implementations, the second axis extends horizontally, the system further comprising:
and a second motor for driving the support arm to rotate about the second axis.
In some possible implementations, the subject placement table is configured to be rotatable up and down along a vertical axis and to rotate about the vertical axis.
In some possible implementations, the system includes:
An azimuth turntable configured to be rotatable about a vertical axis; and
A telescopic rod extending vertically upward from the azimuth turntable;
wherein, the testee is placed the platform and is installed in the top of telescopic link.
In some possible implementations, the system includes:
A third motor for driving the azimuth turntable to rotate about the vertical axis;
and the fourth motor is used for driving the telescopic rod to stretch and retract.
According to the multi-band OTA test system provided by the application, probes in various frequency bands can be automatically switched easily and accurately.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following brief description of the drawings of the embodiments will make it apparent that the drawings in the following description relate only to some embodiments of the present application and are not limiting of the present application.
Fig. 1 is a schematic perspective view of an OTA testing system provided by an embodiment of the application when a supporting arm is rotated to 90 ° and a probe mount is in a second position.
Fig. 2 is a schematic side view of the structure shown in fig. 1.
Fig. 3 is a schematic perspective view of an OTA testing system provided by an embodiment of the application when the support arm is rotated to 45 ° and the probe mount is in the second position.
Fig. 4 is a side view schematic of the structure shown in fig. 3.
Fig. 5 is a schematic perspective view of an OTA testing system provided by an embodiment of the application when the support arm is rotated to 90 ° and the probe mount is in the second position.
Fig. 6 is a side view schematic of the structure shown in fig. 5.
Fig. 7 is a schematic perspective view of an OTA testing system provided by an embodiment of the application when the support arm is rotated to 165 ° and the probe mount is in the second position.
Fig. 8 is a side view of the structure of fig. 7.
Reference numerals illustrate:
l1-a first axis, L2-a second axis;
1-a base frame;
2-supporting arm, 2A-main arm section, 2B-auxiliary arm section;
3-a test object placement table;
4-probe mount, 4A-central portion, 4B-extension;
5-a low frequency probe;
6-a high frequency probe;
7-an ultrahigh frequency probe;
8-azimuth turntable;
9-a telescopic rod;
10-position sensor;
11-a first motor;
12-a second motor;
13-a third motor;
14-fourth motor.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present application. It will be apparent that the described embodiments are some, but not all, embodiments of the application. All other embodiments, which can be made by a person skilled in the art without creative efforts, based on the described embodiments of the present application fall within the protection scope of the present application. It is to be understood that some of the technical means of the various embodiments described herein may be interchanged or combined without conflict.
In the description of the present application, the terms "first," "second," and the like, if any, are used merely to distinguish between the described objects and do not have any sequential or technical meaning. Thus, an object defining "first," "second," etc. may explicitly or implicitly include one or more such objects. Also, the terms "a" or "an" and the like do not denote a limitation of quantity, but rather denote the presence of at least one, and "a plurality" of "are used to indicate no less than two.
Fig. 1 to 8 show a specific embodiment of a multi-band OTA testing system (hereinafter referred to as "the system") of the present application, which includes a pedestal 1, a support arm 2, a subject placement table 3, a probe mount 4, a low frequency probe 5, a high frequency probe 6, and an ultra-high frequency probe 7.
The base frame 1 is mainly formed by constructing aluminum profiles, and has good structural strength.
The support arm 2 is supported by the pedestal 1 and supports the probe mount 4, and the support arm 2 is connected to the pedestal 1 in a rotatable manner about the second axis L2. Specifically, the support arm 2 includes a main arm section 2A and a sub arm section 2B fixed to each other and arranged in an L-shape, wherein one end of the main arm section 2A is connected to the base frame 1 via the turntable assembly in such a manner as to be rotatable about the aforementioned second axis L2, and the sub arm section 2B protrudes from the other end of the main arm section 2A in the extending direction of the second axis L2. Furthermore, a second motor 12, fixed to the base frame 1, is in driving connection with the support arm 2 via the aforesaid turret assembly, for driving the support arm 2 in rotation about the second axis L2.
The object placing table 3 is used for placing an object to be tested, which can send electromagnetic waves, and the object to be tested can be an electronic device with an antenna, for example.
The probe mount 4 is supported by the support arm 2, and the probe mount 4 is connected to the support arm 2 in a rotatable manner about the first axis L1. Specifically, the probe mount 4 includes a central portion 4A defining a first axis L1, and three extension portions 4B extending from the central portion 4A at an angle of 120 ° to each other, wherein the central portion 4A is rotatably connected to an end of the aforementioned sub-arm segment 2B by a turret assembly, the length in each extension portion 4B being the phrase the length of the sub-arm segment 2B. And, fixed on the sub-arm section 2B of the support arm 2 is a first motor 11, and the first motor 11 is in transmission connection with the probe mount 4 via the aforementioned turntable assembly, so as to drive the probe mount 4 to rotate around the first axis L1, so as to adjust the angle of the probe relative to the object to be tested.
The working frequency ranges of the low-frequency probe 5, the high-frequency probe 6 and the ultrahigh-frequency probe 7 are sequentially increased, namely, the working frequency range of the high-frequency probe 6 is higher than that of the low-frequency probe 5, the working frequency range of the ultrahigh-frequency probe 7 is higher than that of the high-frequency probe 6, specifically, the working frequency of the low-frequency probe 5 is 400MHz-8GHz, the frequency of the high-frequency probe 6 is 8GHz-60GHz, and the frequency of the ultrahigh-frequency probe 7 is 60Ghz-90Ghz. The low frequency probe 5, the high frequency probe 6, and the ultra high frequency probe 7 are all mounted to the probe mount 4, and are arranged in order around the first axis L1. More specifically, a low frequency probe 5, a high frequency probe 6, and an ultra high frequency probe 7 are respectively mounted at the outer end portions of the aforementioned three extension portions 4B. Further, the aforementioned first axis L1 is located at the center position of the center portion 4A, the three extension portions 4B extend in the same plane, and the lengths of the respective boom are the same, based on which the low frequency probe 5, the high frequency probe 6, and the ultra high frequency probe 7 are arranged on the same circumference, and the axes of the circumferences coincide with the first axis L1. The first axis L1 is perpendicular to the second axis L2, and in the use state, the second axis L2 extends horizontally parallel to the ground.
When the probe mounting seat 4 rotates to a first position around the first axis L1, the low-frequency probe 5 is opposite to the tested object placing table 3 so as to detect radiation data of the tested object in the frequency band of 400MHz-8 GHz; when the probe mounting seat 4 rotates to a second position around the first axis L1, the high-frequency probe 6 is opposite to the tested object placing table 3 so as to detect radiation data of the tested object in the frequency range of 8GHz-60 GHz; when the probe mounting seat 4 rotates to a third position around the first axis L1, the ultrahigh frequency probe 7 is opposite to the tested object placing table 3 so as to detect radiation data of the tested object in an ultrahigh frequency range of 8GHz-60 GHz.
The present embodiment omits schematic views of the probe mount 4 in the first position and the third position, and in fig. 1 to 8, the probe mount 4 is in the aforementioned second position.
And, when the probe mount 4 in any one of the first position, the second position, and the third position is rotated about the first axis L1, the corresponding one of the low-frequency probe 5, the high-frequency probe 6, and the ultra-high-frequency probe 7 is held to be opposed to the object placing table 3. For example, when the probe mount 4 in the first position is rotated about the first axis L1, the low frequency probe 5 is held opposite the object placing table 3, whereby the angle of the low frequency probe 5 with respect to the object to be measured, that is, the detection angle of the object to be measured by the low frequency probe 5 can be adjusted.
Furthermore, the system comprises a position sensor 10 fixed to the support arm 2, in more detail to the auxiliary arm section 2B of the support arm 2, and a controller, not shown. The position sensor 10 is configured to detect the first position, the second position, and the third position, and the controller is communicatively connected to the first motor 11 and the position sensor 10, and is configured to control the first motor 11 to stop rotating when the position sensor 10 detects that the probe mount 4 rotates to the first position, the second position, or the third position, so as to selectively position the probe mount 4 in the first position, the second position, or the third position.
Also, the aforementioned object placing table 3 is configured to be rotatable up and down along a vertical axis and to be rotatable about the vertical axis, in such a manner that the height and angle of the object to be measured can be adjusted. Specifically, the system includes a horizontally arranged azimuth turntable 8 and a vertically extending telescopic rod 9, wherein the azimuth turntable 8 is configured to be rotatable about a vertical axis, the telescopic rod 9 extends vertically upward from the azimuth turntable 8, and the subject placement table 3 is provided at the top end of the telescopic rod 9. The output of the third motor 13 is connected to the azimuth turntable 8 by a transmission assembly to drive rotation about the aforementioned vertical axis. The fourth motor 14 is connected to the telescopic rod 9 through a transmission assembly to drive the telescopic rod 9 to be telescopic in the vertical direction.
Claims (10)
1. A multi-band OTA testing system comprising:
A test object placing table;
A probe mount configured to be rotatable about a first axis; and
The working frequency range is sequentially increased, and the low-frequency probe, the high-frequency probe and the ultrahigh-frequency probe are respectively arranged on the probe mounting seat and are sequentially arranged around the first axis;
when the probe mounting seat rotates to a first position around the first axis, the low-frequency probe is opposite to the tested object placing table; when the probe mounting seat rotates to a second position around the first axis, the high-frequency probe is opposite to the tested object placing table; when the probe mounting seat rotates to a third position around the first axis, the ultrahigh frequency probe is opposite to the tested object placing table.
2. The system according to claim 1, characterized in that the system comprises:
A first motor for driving the probe mount to rotate about the first axis;
a position sensor for detecting the first position, the second position and the third position; and
And the controller is respectively in communication connection with the first motor and the position sensor and is used for controlling the first motor to stop rotating when the position sensor detects that the probe mounting seat rotates to the first position, the second position or the third position.
3. The system of claim 1, wherein the low frequency probe, the high frequency probe, and the ultra-high frequency probe are equiangularly spaced about the first axis.
4. The system of claim 3, wherein the probe mount comprises:
A central portion defining the first axis, and
Three extension portions extending from the central portion at an angle of 120 ° to each other;
Wherein the low frequency probe, the high frequency probe and the ultra-high frequency probe are respectively positioned at the outer ends of the three extension parts.
5. The system of claim 1, wherein the low frequency probe, the high frequency probe, and the ultra-high frequency probe are disposed on a same circumference, an axis of the circumference coinciding with the first axis.
6. The system according to any one of claims 1 to 5, characterized in that the system comprises:
Base frame
A support arm supported by the pedestal and supporting the probe mount, and rotatably connected to the pedestal about a second axis;
wherein the probe mount is rotatably connected to the support arm about the first axis, the first axis being perpendicular to the second axis;
When the probe mount in any one of the first position, the second position, and the third position is rotated about the first axis, a corresponding one of the low frequency probe, the high frequency probe, and the ultra high frequency probe remains opposite the object placing table.
7. The system of claim 6, wherein the second axis extends horizontally, the system further comprising:
and a second motor for driving the support arm to rotate about the second axis.
8. The system of claim 1, wherein the subject placement table is configured to be rotatable up and down along a vertical axis and to rotate about the vertical axis.
9. The system of claim 8, wherein the system comprises:
An azimuth turntable configured to be rotatable about a vertical axis; and
A telescopic rod extending vertically upward from the azimuth turntable;
wherein, the testee is placed the platform and is installed in the top of telescopic link.
10. The system according to claim 9, wherein the system comprises:
A third motor for driving the azimuth turntable to rotate about the vertical axis;
and the fourth motor is used for driving the telescopic rod to stretch and retract.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321831846.0U CN221042876U (en) | 2023-07-12 | 2023-07-12 | Multi-band OTA test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321831846.0U CN221042876U (en) | 2023-07-12 | 2023-07-12 | Multi-band OTA test system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN221042876U true CN221042876U (en) | 2024-05-28 |
Family
ID=91135705
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202321831846.0U Active CN221042876U (en) | 2023-07-12 | 2023-07-12 | Multi-band OTA test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN221042876U (en) |
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2023
- 2023-07-12 CN CN202321831846.0U patent/CN221042876U/en active Active
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