CN111965448A - Test equipment and test method for equivalent flat plate power reflection - Google Patents
Test equipment and test method for equivalent flat plate power reflection Download PDFInfo
- Publication number
- CN111965448A CN111965448A CN202010764623.1A CN202010764623A CN111965448A CN 111965448 A CN111965448 A CN 111965448A CN 202010764623 A CN202010764623 A CN 202010764623A CN 111965448 A CN111965448 A CN 111965448A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
Abstract
The invention belongs to the technical field of microwave measurement, and particularly relates to test equipment and a test method for equivalent panel power reflection; the test equipment comprises a test instrument, a microwave darkroom, an arc guide rail, a turntable, a test antenna and a tested piece; the test instrument, the arc guide rail, the rotary table, the test antenna and the tested piece are arranged in a microwave darkroom; the test device comprises a turntable, a tested piece, a test antenna, a radio frequency cable and two test antennas, wherein the turntable is symmetrically arranged on an arc guide rail, the test antennas are arranged on the turntable, the center of the tested piece is located on the axis where the circle center of the arc guide rail is located, the test instrument is connected with the two test antennas through the radio frequency cable, and the axis extension lines of the two test antennas intersect on the axis of the circle center of the arc guide rail. The test equipment provided by the invention can effectively save the volume of a microwave darkroom, and the test method of equivalent panel power reflection can effectively improve the test efficiency.
Description
Technical Field
The invention belongs to the technical field of microwave measurement, and particularly relates to equivalent panel power reflection testing equipment and a testing method.
Background
The equivalent flat plate is an indispensable test sample piece in the radome development process, and the electrical property of the equivalent flat plate can reflect the main electrical property of the radome. In order to reduce the technical risk in the development of the radome, an equivalent flat plate is usually manufactured at the initial development stage and is subjected to electrical performance test, and the correctness of the electrical performance design result of the radome is judged according to the test result.
The main test parameters of the equivalent plate include power transfer efficiency, power reflection and insertion phase delay. At present, the equivalent flat power reflection measurement mainly refers to 5.3 of GJB5239-2004 'test method for wave-absorbing property of radio frequency wave-absorbing material', namely an arch method, and the test schematic diagram is shown in FIG. 1.
The main principle of the arch method test is as follows: the output end of the vector network analyzer is connected with the transmitting antenna, the excitation signal is reflected by the tested piece or the metal plate and then received by the receiving antenna, and is sent to the input end of the vector network analyzer connected with the excitation signal, the transmitting antenna and the receiving antenna independently move on the arch frame and point to the circle center, and the ratio of the reflection level of the tested piece to the reflection level of the metal plate is the power reflection of the tested piece.
The power reflection measurement of the equivalent flat plate by using the arch method has certain measurement uncertainty, and mainly comprises coupling between transmitting and receiving antennas, reflection of an arch frame and the surrounding environment, scattering of the edge of the equivalent flat plate and the like. To ensure the accuracy of the measurement result, the whole device needs to be placed in a microwave darkroom, and meanwhile, the arched bracket needs to have a certain height in order to ensure the measurement of the broadband of the measured piece.
For far-field antenna testing, the minimum testing distance of the transmitting and receiving antenna is required to meet the following far-field testing conditions:
wherein R isminThe minimum distance between the transmitting antenna and the receiving antenna;
d is the diameter of the aperture of the antenna;
λminthe minimum wavelength of the working frequency band of the antenna housing to be measured.
Taking 1-18GHz as an example, if the receiving and transmitting antennas are mutually positioned in a far field area of each other, the distance from the antennas to the equivalent flat plate is not less than 3m (the frequency is 2GHz, the aperture of the antennas is 0.33 m), the placing height of the equivalent flat plate is 1.5m, the thickness of the arch frame is 0.5m, the distance from the arch frame to the top of the darkroom is 1.5m, the height of the wave-absorbing material is 0.5m, and the height of the darkroom is not less than 7 m. For a circular arch with the diameter of 6M, a certain distance is reserved for attaching 0.5M wave-absorbing material to the side wall of a darkroom, the length of the darkroom cannot be less than 6+0.5 x 2+ 3-10M, and the width cannot be less than 0.5 x 2+ 4-5M. Therefore, the test of the power reflection of the equivalent flat plate by using the arch method requires a dark room not less than 10m 5m 7m, and only the power reflection test of the equivalent flat plate can be performed.
Disclosure of Invention
The invention has the following aims:
aiming at the problem that the space required for testing the power reflection of the equivalent flat plate by the arch method is large, the testing equipment and the testing method for the power reflection of the equivalent flat plate are designed, the measurement of the power reflection of the equivalent flat plate can be completed, the construction cost is saved, and the testing efficiency is greatly improved.
The technical scheme is as follows:
a test device and test method of equivalent flat power reflection, the said test device includes the test instrument, microwave dark room, circular arc guide rail, revolving stage, test antenna, tested piece; the test instrument, the arc guide rail, the rotary table, the test antenna and the tested piece are arranged in a microwave darkroom; the test device comprises a turntable, a tested piece, a test antenna, a radio frequency cable and two test antennas, wherein the turntable is symmetrically arranged on an arc guide rail, the test antennas are arranged on the turntable, the center of the tested piece is located on the axis where the circle center of the arc guide rail is located, the test instrument is connected with the two test antennas through the radio frequency cable, and the axis extension lines of the two test antennas intersect on the axis of the circle center of the arc guide rail.
Preferably, the turntable is provided with a front-back moving mechanism, and the position of the test antenna is adjusted through the front-back moving mechanism so as to adapt to power reflection measurement of different frequencies.
Preferably, the test antenna is connected with the turntable through a clamp, so that the test antenna is ensured to be always directed to the circular axis of the circular arc guide rail.
Preferably, the two rotary tables can synchronously move on the arc guide rail along the guide rail, so that the included angles between the electromagnetic waves emitted by the test antenna on the rotary table and the tested piece are the same, and the movability of the rotary table can adapt to tests with different frequencies.
Preferably, the turntable is controlled by a motor to move on the guide rail, and the guide rail is provided with scales, so that accurate angle positioning is facilitated.
Preferably, the measured piece is fixed through a fixing clamp, and the verticality of the measured piece is guaranteed.
The invention also provides a method for testing the power reflection of the equivalent flat plate, which comprises the following steps:
step S1, preheating the vector network analyzer for 30 minutes, setting a test frequency range, and selecting S21 measurement parameters;
step S2, the vector network analyzer carries out straight-through calibration, and a calibration path comprises cables connected with transmitting and receiving antennas;
step S3, laying a metal plate on a test rack, connecting the output and input ports of the vector network analyzer with the transmitting and receiving antennas respectively, recording the test result and taking the test result as a reference level;
step S4, placing the tested piece on the test frame, wherein the difference between the reflection level of the tested piece and the decibel value of the reflection level of the metal plate is the reflectivity of the tested piece; and completing the test of the tested piece.
The beneficial technical effects are as follows: the test equipment provided by the invention can effectively save the volume of a microwave darkroom, and the test method of equivalent panel power reflection can effectively improve the test efficiency.
Drawings
FIG. 1 is a schematic view of the arch test
FIG. 2 top view of power reflection test
FIG. 3 front view of power reflection test
Detailed Description
The invention changes the receiving and transmitting antenna placed on the vertical surface in the arch method into the receiving and transmitting antenna placed on the horizontal surface, the receiving and transmitting antenna is respectively placed on two independent single-axis turntables, and the two turntables move along the opposite direction on the arc-shaped guide rail on the ground. The measured flat plate is arranged on the fixed support, the measured flat plate is still in the testing process, the electric axis of the transmitting-receiving antenna always points to the central position of the measured flat plate, the reflection angle is equal to the incident angle, and the testing device is shown in figures 2 and 3. For this test mode, a dark chamber not less than 8m 4m can be used to complete the power reflection test on the equivalent flat panel.
In the specific implementation process, two single-axis turntables are adopted for carrying out the power reflection test. Both turntables move at the same speed, but in opposite directions, along a horizontally disposed circular track. During arrangement, the transmitting and receiving antennas are respectively placed on two independent single-axis turntables, during testing, the two turntables move on a circular guide rail on the ground at the same speed in the opposite direction, and the antennas always point to the circular axis of the circular arc guide rail. The center of the transmitting antenna aperture surface, the center of the receiving antenna aperture surface and the center point of the equivalent flat plate are arranged in equal height.
According to the testing method implemented by the testing equipment for the equivalent flat panel power reflection, the method comprises the following steps:
step S1, selecting a vector network analyzer as a test instrument, preheating for 30 minutes, setting a test frequency range, and selecting a measurement parameter;
step S2, carrying out straight-through calibration on the vector network analyzer, wherein a calibration path comprises a cable connected with a transmitting antenna and a receiving antenna;
step S3, laying a metal plate on a test rack, connecting the output and input ports of the vector network analyzer with the transmitting and receiving antennas respectively, recording the test result and taking the test result as a reference level;
and step S4, placing the tested piece on the test frame, wherein the difference between the reflection level of the tested piece and the decibel value of the reflection level of the metal plate is the reflectivity of the tested piece.
When step S4 is executed, the relative strength of the interference signal level and the metal plate reflection signal level in the test site is judged; and adjusting the test frequency to the concerned frequency point, moving the front-back moving mechanism of the rotary table within the range of 1 wavelength, and observing the free space voltage standing-wave ratio of the interference signal relative to the reflection signal of the metal plate in the moving process.
The invention can complete the test of the power reflection of the equivalent flat plate in a smaller space, and if the guide rail is a whole circle, the method can also perform the test of other electrical performance indexes of the equivalent flat plate, such as power transmission coefficient, insertion phase shift and the like.
Claims (9)
1. The utility model provides a test equipment of equivalent flat power reflection which characterized in that: the test equipment comprises a test instrument, a microwave darkroom, an arc guide rail, a turntable, a test antenna and a tested piece; the test instrument, the arc guide rail, the rotary table, the test antenna and the tested piece are arranged in a microwave darkroom; the test device comprises a turntable, a tested piece, a test antenna, a radio frequency cable and two test antennas, wherein the turntable is symmetrically arranged on an arc guide rail, the test antennas are arranged on the turntable, the center of the tested piece is located on the axis where the circle center of the arc guide rail is located, the test instrument is connected with the two test antennas through the radio frequency cable, and the axis extension lines of the two test antennas intersect on the axis of the circle center of the arc guide rail.
2. The equivalent flat panel power reflection test apparatus of claim 1, wherein: the turntable is provided with a front-back moving mechanism, and the position of the test antenna is adjusted through the front-back moving mechanism so as to adapt to power reflection measurement of different frequencies.
3. The equivalent flat panel power reflection test apparatus of claim 1, wherein: the test antenna is connected with the rotary table through a clamp.
4. The equivalent flat panel power reflection test apparatus of claim 1, wherein: the two rotary tables move synchronously on the arc guide rail along the guide rail, so that the included angle between the electromagnetic wave emitted by the test antenna on the rotary table and the tested piece is the same.
5. The equivalent flat panel power reflection test apparatus of claim 1, wherein: the turntable is controlled by a motor to move on the guide rail.
6. The equivalent flat panel power reflection test apparatus of claim 7, wherein: scales are arranged on the guide rail.
7. The equivalent flat panel power reflection test apparatus of claim 1, wherein: the measured piece is fixed through the fixing clamp, and the perpendicularity of the measured piece is guaranteed.
8. A method for testing a test apparatus based on equivalent flat panel power reflection according to any of claims 1 to 7, characterized in that the method comprises the following steps:
step S1, selecting a vector network analyzer as a test instrument, preheating for 30 minutes, setting a test frequency range, and selecting a measurement parameter;
step S2, carrying out straight-through calibration on the vector network analyzer, wherein a calibration path comprises a cable connected with a transmitting antenna and a receiving antenna;
step S3, laying a metal plate on a test rack, connecting the output and input ports of the vector network analyzer with the transmitting and receiving antennas respectively, recording the test result and taking the test result as a reference level;
and step S4, placing the tested piece on the test frame, wherein the difference between the reflection level of the tested piece and the decibel value of the reflection level of the metal plate is the reflectivity of the tested piece.
9. The method of claim 8, wherein the method comprises: when step S4 is executed, the relative strength of the interference signal level and the metal plate reflection signal level in the test site is judged; and adjusting the test frequency to the concerned frequency point, moving the front-back moving mechanism of the rotary table within the range of 1 wavelength, and observing the free space voltage standing-wave ratio of the interference signal relative to the reflection signal of the metal plate in the moving process.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010764623.1A CN111965448A (en) | 2020-07-31 | 2020-07-31 | Test equipment and test method for equivalent flat plate power reflection |
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| CN202010764623.1A CN111965448A (en) | 2020-07-31 | 2020-07-31 | Test equipment and test method for equivalent flat plate power reflection |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112763515A (en) * | 2020-12-09 | 2021-05-07 | 北京无线电计量测试研究所 | Method for reducing measurement error of reflection performance of darkroom |
| CN113189121A (en) * | 2021-05-11 | 2021-07-30 | 中北大学 | Dynamic test system and method for reflectivity of wave-absorbing material of self-adaptive time domain gate |
| CN116827452A (en) * | 2023-08-30 | 2023-09-29 | 福州物联网开放实验室有限公司 | Internet of things communication terminal antenna debugging device |
| CN116819186A (en) * | 2023-08-30 | 2023-09-29 | 福州物联网开放实验室有限公司 | Method for adjusting and measuring antenna performance of communication terminal of Internet of things |
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| CN201548628U (en) * | 2009-11-05 | 2010-08-11 | 上海波平航空科技有限公司 | Super-wide frequency-band durable microwave testing device |
| CN108152309A (en) * | 2017-12-26 | 2018-06-12 | 北京无线电计量测试研究所 | A kind of high temperature broadband arch method reflectivity calibration system and method |
| CN208188005U (en) * | 2017-11-24 | 2018-12-04 | 东莞天卫隐身技术有限公司 | A kind of novel and multifunctional test platform of absorbing material |
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| CN201548628U (en) * | 2009-11-05 | 2010-08-11 | 上海波平航空科技有限公司 | Super-wide frequency-band durable microwave testing device |
| CN208188005U (en) * | 2017-11-24 | 2018-12-04 | 东莞天卫隐身技术有限公司 | A kind of novel and multifunctional test platform of absorbing material |
| CN108152309A (en) * | 2017-12-26 | 2018-06-12 | 北京无线电计量测试研究所 | A kind of high temperature broadband arch method reflectivity calibration system and method |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112763515A (en) * | 2020-12-09 | 2021-05-07 | 北京无线电计量测试研究所 | Method for reducing measurement error of reflection performance of darkroom |
| CN112763515B (en) * | 2020-12-09 | 2022-11-22 | 北京无线电计量测试研究所 | Method for reducing measurement error of reflection performance of darkroom |
| CN113189121A (en) * | 2021-05-11 | 2021-07-30 | 中北大学 | Dynamic test system and method for reflectivity of wave-absorbing material of self-adaptive time domain gate |
| CN113189121B (en) * | 2021-05-11 | 2024-04-16 | 中北大学 | Dynamic test method for reflectivity of wave-absorbing material of self-adaptive time domain door |
| CN116827452A (en) * | 2023-08-30 | 2023-09-29 | 福州物联网开放实验室有限公司 | Internet of things communication terminal antenna debugging device |
| CN116819186A (en) * | 2023-08-30 | 2023-09-29 | 福州物联网开放实验室有限公司 | Method for adjusting and measuring antenna performance of communication terminal of Internet of things |
| CN116819186B (en) * | 2023-08-30 | 2023-11-24 | 福州物联网开放实验室有限公司 | Method for adjusting and measuring antenna performance of communication terminal of Internet of things |
| CN116827452B (en) * | 2023-08-30 | 2023-12-01 | 福州物联网开放实验室有限公司 | Internet of things communication terminal antenna debugging device |
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