CN220730354U - Thermal resistor integrated testing tool - Google Patents

Thermal resistor integrated testing tool Download PDF

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Publication number
CN220730354U
CN220730354U CN202320981588.8U CN202320981588U CN220730354U CN 220730354 U CN220730354 U CN 220730354U CN 202320981588 U CN202320981588 U CN 202320981588U CN 220730354 U CN220730354 U CN 220730354U
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China
Prior art keywords
terminal
sliding
contact
channel
sliding block
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CN202320981588.8U
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Chinese (zh)
Inventor
孙浩
陈振民
徐欢
周水生
孙世龙
田世千
杜冲
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Huaneng Hainan Changjiang Nuclear Power Co ltd
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Huaneng Hainan Changjiang Nuclear Power Co ltd
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Abstract

The utility model relates to the technical field of non-safety DCS systems of nuclear power plants, and particularly discloses a thermal resistance integrated testing tool which comprises a substrate body, a testing loop and a sliding device, wherein a terminal A and a terminal B are arranged on the substrate body; the test loops are arranged on the substrate body; the sliding device comprises a sliding rail and a sliding block, the sliding rail is connected to the substrate body, the sliding block is suitable for being connected to the sliding rail in a sliding manner, and the sliding block is electrically connected to the terminal A and the terminal B; the sliding block can be used for respectively connecting the terminal A and the terminal B into each test loop. Therefore, in the thermal resistance integrated test, the target value of the thermal resistance value to be input can be rapidly given, the operation time is shortened, and the working efficiency is improved.

Description

Thermal resistor integrated testing tool
Technical Field
The utility model relates to the technical field of non-safety-level DCS systems of nuclear power plants, in particular to a thermal resistance integrated testing tool.
Background
During the factory testing stage of the non-safety-level DCS system or the debugging or overhaul period of the nuclear power plant, the non-safety-level DCS system is required to be debugged and maintained, when the IO board AI232 corresponding to the thermal resistor is subjected to integrated inspection, the resistor box is required to simulate the resistance value input of the thermal resistor in different states, at the moment, the resistor box is sequentially connected to each channel of the terminal row, and a plurality of resistance values in the measuring range and a plurality of resistance values in the exceeding range are required to be sequentially input every time the resistor box is connected to one channel. Because the use case resistance value of the thermal resistor integrated test is a uniform fixed value, if a traditional method is used, six gears of the resistor box are rotated to a target value every time one resistance value is input, and six gears are required to be rotated again when the next resistance value is input, so that a great deal of manpower and time are consumed, and the working efficiency is reduced.
Disclosure of Invention
In view of the above, the present utility model provides a thermal resistor integrated test tool, which can quickly give a target value of a thermal resistor value to be input in a thermal resistor integrated test, shorten an operation time, and improve a working efficiency.
The embodiment of the utility model provides a thermal resistance integrated test tool, which comprises a substrate body, a test loop and a sliding device, wherein a terminal A and a terminal B are arranged on the substrate body; the test loops are arranged on the substrate body; the sliding device comprises a sliding rail and a sliding block, the sliding rail is connected to the substrate body, the sliding block is suitable for being connected to the sliding rail in a sliding manner, and the sliding block is electrically connected to the terminal A and the terminal B; the sliding block can be used for respectively connecting the terminal A and the terminal B into each test loop.
Further, the test loop comprises an accurate resistor, a first contact, a second contact and a third contact, and the first contact is arranged at the input end of the test loop; the second contact and the third contact are arranged at the output end of the test loop.
Further, a functional area is arranged on the substrate body, and the first contact, the second contact and the third contact are located in the functional area.
Further, the test loop also comprises a wire-wound potentiometer which is connected in series with the accurate resistor.
Further, a first channel, a second channel and a third channel are arranged on the sliding block, the bottom of the first channel is suitable for being electrically connected with the first contact, the bottom of the second channel is suitable for being electrically connected with the second contact, and the bottom of the third channel is suitable for being electrically connected with the third contact; wherein the first channel top is electrically connected to terminal a, and the second channel top and the third channel top are electrically connected to terminal B.
Further, the sliding rails are positioned at two sides of the functional area, and sliding grooves are formed in the sliding rails relatively; the slider both sides still are provided with the connecting block, and the connecting block is suitable for sliding connection in the spout to make the slider can follow the slide rail and slide.
Further, the thermal resistance integrated testing tool further comprises a diode and a bulb, wherein the diode is electrically connected to the terminal A, and the diode is positioned between the terminal A and the input end of the testing loop; the bulb is connected in series with the diode.
The technical scheme provided by the embodiment of the utility model has the beneficial effects that at least: a thermal resistance integrated testing tool comprises a substrate body, a testing loop and a sliding device, wherein a terminal A and a terminal B are arranged on the substrate body; the test loops are arranged on the substrate body; the sliding device comprises a sliding rail and a sliding block, the sliding rail is connected to the substrate body, the sliding block is suitable for being connected to the sliding rail in a sliding manner, and the sliding block is electrically connected to the terminal A and the terminal B; the sliding block can be used for respectively connecting the terminal A and the terminal B into each test loop. Therefore, in the thermal resistance integrated test, the target value of the thermal resistance value to be input can be rapidly given, the time for setting the target value by using the rotary gear of the resistor box is saved, the operation time is shortened, and the working efficiency is improved.
The resistance of the accurate resistor can be finely adjusted by arranging the wire-wound potentiometer, so that the resistance is not affected when the temperature and weather of the test loop change.
The bulb and the diode with the connection direction consistent with the current direction in the line of the terminal A are arranged, so that whether the device to be tested is successfully connected into the test loop can be judged rapidly.
The foregoing description is only an overview of the technical solutions of the present application, and may be implemented according to the content of the specification in order to make the technical means of the present application more clearly understood, and in order to make the above-mentioned and other objects, features and advantages of the present application more clearly understood, the following detailed description of the present application will be given.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the utility model. Also, like reference numerals are used to designate like parts throughout the figures. Wherein:
FIG. 1 is a schematic diagram showing a thermal resistance integrated testing tool according to a first embodiment of the present utility model;
FIG. 2 is a schematic diagram showing a thermal resistance integration testing tool according to a second embodiment of the present utility model;
fig. 3 is a schematic structural diagram of a first view of a sliding rail according to an embodiment of the present utility model;
fig. 4 is a schematic structural diagram illustrating a second view angle of a sliding rail according to an embodiment of the present utility model;
fig. 5 is a schematic structural diagram illustrating a third view angle of a sliding rail according to an embodiment of the present utility model;
FIG. 6 is a schematic view of a first view of a slider according to an embodiment of the present utility model;
FIG. 7 is a schematic view of a second view of a slider according to an embodiment of the present utility model;
fig. 8 is a schematic structural view of a third view of a slider according to an embodiment of the present utility model.
The correspondence between the reference numerals and the component names in fig. 1 to 8 is:
11 terminal a,111 diode, 112 bulb, 12 terminal B,13 functional area, 14 flying lead, 21 precision resistor, 22 first contact, 23 second contact, 24 third contact, 25 wire wound potentiometer, 31 slide rail, 311 slide slot, 32 slide block, 321 first channel, 322 second channel, 323 third channel, 324 connecting block.
Detailed Description
In order that the above-recited objects, features and advantages of the present utility model will be more clearly understood, a more particular description of the utility model will be rendered by reference to the appended drawings and appended detailed description. It should be noted that, without conflict, the embodiments of the present utility model and features in the embodiments may be combined with each other.
In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present utility model, however, the present utility model may be practiced in other ways than those described herein, and therefore the scope of the present utility model is not limited to the specific embodiments disclosed below.
When the fin system cabinet is used for thermal resistance integrated test, six gears of the resistance box are required to be rotated to a target value every time resistance is input, and when the next resistance is input, the six gears are required to be rotated to the next target value again, so that a large amount of labor and time are consumed, and the working efficiency is reduced. Considering that the resistance value of each channel test input is fixed, a thermal resistance integration test tool is designed.
A thermal resistance integration test tool provided according to some embodiments of the present utility model is described below with reference to fig. 1 through 8.
As shown in fig. 1 to 2, a thermal resistance integrated testing tool according to an embodiment of the present utility model includes a substrate body, a testing circuit, and a sliding device, where a terminal a11 and a terminal B12 are disposed on the substrate body, for electrically connecting with a device to be tested; the test circuits are arranged on the substrate body, wherein each test circuit is provided with different resistance values; the sliding device comprises a sliding rail 31 and a sliding block 32, wherein the sliding rail 31 is connected to the substrate body, the sliding block 32 is suitable for being connected to the sliding rail 31 in a sliding manner, and the sliding block 32 is electrically connected to the terminal A11 and the terminal B12; the sliding block 32 can connect the terminal a11 and the terminal B12 to each test circuit, thereby realizing inputting a specific resistance value to the device under test. Therefore, in the thermal resistance integrated test, the target value of the thermal resistance value to be input can be rapidly given, the time for setting the target value by using the rotary gear of the resistor box is saved, the operation time is shortened, and the working efficiency is improved.
It will be appreciated that the specific number of test loops is not limited herein and may be 2, 3, 4 or more, as may be provided as desired for thermal resistance integration testing.
As shown in fig. 1 to 2, the test loop includes an accurate resistor 21, a first contact 22, a second contact 23, and a third contact 24, the accurate resistor 21 being used to provide a target value of a thermal resistance value for the test loop; the first contact 22 is disposed at an input end of the test circuit, the second contact 23 and the third contact 24 are disposed at an output end of the test circuit, and are used for electrically connecting the test circuit to the slider 32, so that the device to be tested can be connected to different test circuits through the slider 32. Preferably, the first contact 22, the second contact 23 and the third contact 24 are made of metal.
As shown in fig. 1, the substrate body is provided with a functional area 13, and the first contact 22, the second contact 23, and the third contact 24 are located in the functional area 13. Wherein each test circuit is provided with a set of first, second and third contacts 22, 23, 24, each set of first, second and third contacts 22, 23, 24 being distributed in sequence inside the functional area 13, so that sliding the slider 32 along the slide rail 31, i.e. enabling the device under test to be accessed into different test circuits.
As shown in fig. 1 to 2, the test circuit further comprises a wire-wound potentiometer 25, and the wire-wound potentiometer 25 is connected in series with the precision resistor 21. Specifically, by setting the wire-wound potentiometer 25 to finely adjust the resistance of the precise resistor 21, the resistance of the test circuit can be prevented from being affected when the temperature and weather change.
The wire-wound potentiometer 25 works stably, has good heat resistance and small error range, and is preferably a wire-wound potentiometer 25 with a resistance of 10Ω and an accuracy of 0.01Ω, and the resistance is set to 5Ω, so that the accuracy requirement of the input resistance can be met.
As shown in fig. 1 to 5, the slider 32 is provided with a first channel 321, a second channel 322 and a third channel 323 for electrically connecting the slider 32 with other elements; the bottom of the first channel 321 is adapted to be electrically connected to the first contact 22, the bottom of the second channel 322 is adapted to be electrically connected to the second contact 23, and the bottom of the third channel 323 is adapted to be electrically connected to the third contact 24, so that the slider 32 can be electrically connected to different test loops, respectively.
Wherein the top of the first channel 321 is electrically connected to the terminal a11, the top of the second channel 322 and the top of the third channel 323 are electrically connected to the terminal B12, specifically, the flying leads 14 are led out from the line ends of the terminal a11 and the terminal B12, and the flying leads 14 led out from the terminal a11 are electrically connected to the top of the first channel 321; the flying lead 14 led out by the terminal B12 is electrically connected to the top of the second channel 322 and the top of the third channel 323, so that when the terminal a11 and the terminal B12 are connected to the device to be tested, a closed loop can be formed between the terminal a11 and the terminal B12 and the test loop through the slider 32, and thermal resistance integration test is performed.
As shown in fig. 1, 3 to 8, the sliding rail 31 is located at two sides of the functional area 13, so that when the sliding block 32 slides along the sliding rail 31, the bottom of the first channel 321, the bottom of the second channel 322 and the bottom of the third channel 323 can be electrically connected with the first contact 22, the second contact 23 and the third contact 24 respectively; the sliding rail 31 is relatively provided with a sliding groove 311, two sides of the sliding block 32 are also provided with connecting blocks 324, and the connecting blocks 324 are suitable for being connected with the sliding groove 311 in a sliding manner, so that the sliding block 32 can slide along the sliding rail 31, and the device to be tested can be connected into different test loops.
As shown in fig. 1 to 2, the thermal resistance integration test tool further includes a diode 111 and a bulb 112 for judging whether the access is successful. The diode 111 is electrically connected to the terminal a11, and the diode 111 is located between the terminal a11 and the input end of the test circuit, wherein the connection direction of the diode 111 is consistent with the current direction inside the circuit of the terminal a 11; the bulb 112 is connected in series with the diode 111, and after the test circuit is connected, if the bulb 112 is lighted, the connection is successful.
Embodiment one:
preferably, as shown in fig. 1, in an application of a fin system cabinet, seven resistance values need to be set as precise resistances 21 of the test target values, that is, seven test loops are set. The resistance values for the thermal resistor integration test are as follows:
table 1 example resistance values for one-resistor integration test
Embodiment two:
in another fin system cabinet application, as shown in fig. 2, three resistors 21 are required as the precise target values, i.e. three test loops are provided. The resistance values for the thermal resistor integration test are as follows:
table 2 example resistance values for two-thermal-resistor integrated test
In the description of the present utility model, the term "plurality" means two or more, unless explicitly defined otherwise, the orientation or positional relationship indicated by the terms "upper", "lower", etc. are orientation or positional relationship based on the drawings, merely for convenience of description of the present utility model and to simplify the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus should not be construed as limiting the present utility model; the terms "coupled," "mounted," "secured," and the like are to be construed broadly, and may be fixedly coupled, detachably coupled, or integrally connected, for example; can be directly connected or indirectly connected through an intermediate medium. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.
In the description of the present utility model, the terms "one embodiment," "some embodiments," "particular embodiments," and the like, mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present utility model. In the present utility model, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
The above is only a preferred embodiment of the present utility model, and is not intended to limit the present utility model, but various modifications and variations can be made to the present utility model by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present utility model should be included in the protection scope of the present utility model.

Claims (7)

1. A thermal resistance integrated test tool, comprising:
the circuit board comprises a substrate body, wherein a terminal A and a terminal B are arranged on the substrate body;
the test loops are arranged on the substrate body;
the sliding device comprises a sliding rail and a sliding block, the sliding rail is connected to the base plate body, the sliding block is suitable for being connected to the sliding rail in a sliding manner, and the sliding block is electrically connected to the terminal A and the terminal B;
the sliding block is slid, and the terminal A and the terminal B can be respectively connected into each test loop.
2. The thermal resistance integrated test tool of claim 1, wherein the test loop comprises:
an accurate resistor;
the first contact is arranged at the input end of the test loop;
and the second contact and the third contact are arranged at the output end of the test loop.
3. The thermal resistance integrated test tool of claim 2, wherein:
the substrate body is provided with a functional area, and the first contact, the second contact and the third contact are positioned in the functional area.
4. The thermal resistance integrated test tool of claim 2, wherein the test loop further comprises:
and the wire-wound potentiometer is connected in series with the precise resistor.
5. The thermal resistance integrated test tool of claim 2, wherein:
the sliding block is provided with a first channel, a second channel and a third channel, the bottom of the first channel is suitable for being electrically connected with the first contact, the bottom of the second channel is suitable for being electrically connected with the second contact, and the bottom of the third channel is suitable for being electrically connected with the third contact;
wherein the first channel top is electrically connected to the terminal a, and the second channel top and the third channel top are electrically connected to the terminal B.
6. A thermal resistance integrated test tool according to claim 3, wherein:
the sliding rails are positioned at two sides of the functional area, and sliding grooves are formed in the sliding rails relatively;
the sliding block is characterized in that connecting blocks are further arranged on two sides of the sliding block and are suitable for being connected to the sliding groove in a sliding mode, so that the sliding block can slide along the sliding rail.
7. The thermal resistance integrated test tool of claim 1, further comprising:
a diode electrically connected to the terminal a, the diode being located between the terminal a and an input of the test loop;
and the bulb is connected in series with the diode.
CN202320981588.8U 2023-04-26 2023-04-26 Thermal resistor integrated testing tool Active CN220730354U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202320981588.8U CN220730354U (en) 2023-04-26 2023-04-26 Thermal resistor integrated testing tool

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202320981588.8U CN220730354U (en) 2023-04-26 2023-04-26 Thermal resistor integrated testing tool

Publications (1)

Publication Number Publication Date
CN220730354U true CN220730354U (en) 2024-04-05

Family

ID=90492947

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202320981588.8U Active CN220730354U (en) 2023-04-26 2023-04-26 Thermal resistor integrated testing tool

Country Status (1)

Country Link
CN (1) CN220730354U (en)

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