CN220509039U - LCR testing device - Google Patents

Abstract

The utility model discloses an LCR testing device, which comprises: the lifting assembly comprises a base, a driving piece fixed on the base and a base plate in transmission connection with the driving piece, and the base is provided with a supporting surface perpendicular to the vertical direction; a test head disposed on the substrate; the micrometer is arranged on the base plate along the vertical direction and comprises a telescopic screw rod; the supporting surface and the screw rod are oppositely arranged, and the driving piece is suitable for driving the base plate to lift and enable the screw rod to support against the supporting surface. The utility model can ensure the moving precision of the driving piece in the vertical direction, ensure the consistent height of the position of each descending test of the test head and improve the test precision; in addition, because of adopting micrometer structure, the screw rod is but extending structure, can accurate regulation flexible length as required, and then can accurate regulation driving piece limit decline position as required.

Description

LCR testing device

Technical Field

The utility model relates to the technical field of electric detection of electric modules, in particular to an LCR test device.

Background

After the production of the electric module is finished, LCR (capacitance and inductance) of the circuit is required to be detected so as to ensure that products are qualified and delivered. In the prior art, the testing device generally comprises a driving member and a testing head in transmission connection with the driving member, wherein a tool for accommodating and positioning the electrical module is positioned below the testing head, and the driving member can drive the testing head to move towards the tool so as to enable the testing head to be in contact with an area to be detected, thereby realizing detection. However, the conventional driving member is usually a linear electric cylinder or an air cylinder, and after long-term use, the moving precision in the vertical direction is poor, the test data of the test head after the test head contacts with the electric module at different height positions will be different, and the influence on the test data is large, so that the test precision is poor.

Accordingly, there is a need for an improvement over the prior art to overcome the deficiencies described in the prior art.

Disclosure of Invention

The utility model aims to provide an LCR test device, which is used for ensuring the position accuracy of a test head after being contacted with an electric module.

The utility model aims at realizing the following technical scheme: an LCR test device comprising:

the lifting assembly comprises a base, a driving piece fixed on the base and a base plate in transmission connection with the driving piece, and the base is provided with a supporting surface perpendicular to the vertical direction;

a test head disposed on the substrate;

the micrometer is arranged on the base plate along the vertical direction and comprises a telescopic screw rod;

the supporting surface and the screw rod are oppositely arranged, and the driving piece is suitable for driving the base plate to lift and enable the screw rod to support against the supporting surface.

Further, the micrometer includes:

the fixed sleeve is fixedly connected with the substrate;

the micro-cylinder is rotatably sleeved outside the fixed sleeve and is fixedly connected with the screw rod;

the nut is axially and limitedly arranged in the fixed sleeve;

the screw rod is at least partially penetrated in the fixed sleeve, and the nut is in threaded fit with the screw rod.

Further, a supporting frame is arranged on the substrate, the supporting frame is arranged on the periphery of the micro-cylinder in a surrounding mode, and the micro-cylinder can rotate relative to the supporting frame.

Further, the micro-cylinder comprises a knob part, the support frame comprises an arc-shaped groove for accommodating the knob part, the knob part is at least partially positioned outside the arc-shaped groove, and the knob part can rotate relative to the arc-shaped groove.

Further, the LCR test device comprises a buffer fixed on the substrate, wherein the end part of the buffer is opposite to the abutting surface, and the buffer is closer to the abutting surface than the screw.

Further, the damper includes a hydraulic damper and a spring damper.

Further, the test head includes:

a fixed block fixed on the lower end surface of the base plate;

the needle die is fixed on the lower end face of the fixed block;

the pin block is arranged on the pin die;

the probe is fixed on the pin block along the vertical direction, and two ends of the probe extend out of the upper end face and the lower end face of the pin die respectively;

a connector fixed on the upper end surface of the substrate;

the base plate and the fixed block are communicated with each other along the vertical direction, a yielding hole for avoiding the probe is formed in the base plate and the fixed block, and the probe is electrically connected with the connector.

Further, the pin die includes:

the needle mould body is provided with an installation groove in an inward concave manner on the upper end surface;

the cover plate is arranged on the upper end surface of the needle mould body and seals the mounting groove;

the pin block can be movably arranged in the mounting groove along the vertical direction, and an elastic piece is abutted between the pin block and the cover plate.

Further, the LCR testing device further comprises a turntable assembly arranged below the testing head, wherein the turntable assembly comprises a turntable and tools uniformly distributed on the turntable along the circumference of the turntable.

Further, the LCR testing device comprises a pressing block fixed on the lower end face of the substrate, the pressing block is arranged opposite to the rotary table, the bottom of the pressing block is higher than the bottom of the probe, and the distance between the pressing block and the rotary table is greater than the distance between the screw and the supporting surface.

Compared with the prior art, the utility model has the following beneficial effects: according to the utility model, the base of the lifting assembly is provided with the abutting surface perpendicular to the vertical direction, and the micrometer is arranged on the substrate along the vertical direction, the screw rod of the micrometer is arranged opposite to the abutting surface, and when the driving piece drives the test head and the micrometer to lift, the screw rod of the micrometer can abut against the abutting surface, so that the descending limit position of the driving piece is limited, the moving precision of the driving piece in the vertical direction is ensured, the height of the position of each descending test of the test head is ensured to be consistent, and the test precision is improved; in addition, because of adopting micrometer structure, the screw rod is but extending structure, can accurate regulation flexible length as required, and then can accurate regulation driving piece limit decline position as required.

Drawings

FIG. 1 is a schematic diagram of an LCR test device according to the present utility model.

Fig. 2 is a schematic view of the structure of the utility model with the turntable mechanism removed.

Fig. 3 is a schematic view of the structure of fig. 2 in the other direction.

Fig. 4 is a schematic view of the structure of fig. 2 with a wrench.

Fig. 5 is a schematic diagram showing an exploded structure of the pin die, the pin block, the probe and the elastic member according to the present utility model.

Reference numerals illustrate:

100. a lifting assembly; 110. a base; 111. a holding surface; 120. a driving member; 130. a substrate; 140. a support frame; 141. an arc-shaped groove; 200. a test head; 210. a fixed block; 220. a needle mold; 221. a needle mold body; 222. a cover plate; 223. a mounting groove; 230. a pin block; 240. a probe; 250. a connector; 260. an elastic member; 300. a micrometer; 310. a screw; 320. fixing the sleeve; 330. a micro-cylinder; 331. a knob portion; 400. a buffer; 500. a wrench; 600. a relief hole; 700. a turntable assembly; 710. a turntable; 720. a tool; 800. pressing blocks.

Detailed Description

In order to make the above objects, features and advantages of the present application more comprehensible, embodiments accompanied with figures are described in detail below. It is to be understood that the specific embodiments described herein are for purposes of illustration only and are not limiting. It should be further noted that, for convenience of description, only some, but not all of the structures related to the present application are shown in the drawings. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.

The terms "comprising" and "having" and any variations thereof herein are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those listed steps or elements but may include other steps or elements not listed or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the present application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.

Referring to fig. 1 and 2, an LCR testing apparatus according to a preferred embodiment of the utility model includes: the lifting assembly 100 comprises a base 110, a driving piece 120 fixed on the base 110 and a base plate 130 in transmission connection with the driving piece 120, wherein the base 110 is provided with a supporting surface 111 vertical to the vertical direction; a test head 200 mounted on the substrate 130; a micrometer 300 mounted on the base plate 130 in a vertical direction, the micrometer 300 including a retractable screw 310; the supporting surface 111 and the screw 310 are disposed opposite to each other, and the driving member 120 is adapted to drive the substrate 130 to lift and lower, and make the screw 310 support against the supporting surface 111.

According to the utility model, the base 110 of the lifting assembly 100 is provided with the supporting surface 111 vertical to the vertical direction, and the micrometer 300 is arranged on the base plate 130 along the vertical direction, the screw 310 of the micrometer 300 is opposite to the supporting surface 111, when the driving piece 120 drives the test head 200 and the micrometer 300 to lift, the screw 310 of the micrometer 300 can support against the supporting surface 111, so that the limiting position of the driving piece 120 in the descending direction is limited, the moving precision of the driving piece 120 in the vertical direction is ensured, the height of the position of each descending test of the test head 200 is ensured to be consistent, and the test precision is improved; in addition, due to the adoption of the micrometer 300 structure, the screw rod 310 is of a telescopic structure, so that the telescopic length can be accurately adjusted according to the needs, and the limit descending position of the driving piece 120 can be accurately adjusted according to the needs.

Further, the micrometer 300 includes a fixed sleeve 320, a micro-cylinder 330 and a nut (not shown), the fixed sleeve 320 is fixedly connected with the base plate 130, the micro-cylinder 330 is rotatably sleeved outside the fixed sleeve 320, the micro-cylinder 330 is fixedly connected with the screw 310, the nut is axially and limitedly installed in the fixed sleeve 320, the screw 310 is at least partially penetrated in the fixed sleeve 320, and the nut is in threaded connection with the screw 310. By rotating the micro-cylinder 330, the screw 310 can be driven to rotate synchronously and move linearly in the vertical direction under the action of the nut. One end of the micro tube 330 abuts against the upper end surface of the substrate 130, thereby restricting the position of the micrometer 300 in the vertical direction.

In this embodiment, the substrate 130 is provided with a first mounting hole penetrating in the vertical direction, and the fixing sleeve 320 is fixedly inserted into the first mounting hole. The fixed connection between the fixed sleeve 320 and the first mounting hole may be achieved by an interference fit, a snap fit, or by threaded fasteners, etc.

Preferably, in order to improve the reliability of the supporting and rotating of the micrometer 300, the supporting frame 140 is fixed on the upper end surface of the base plate 130, the supporting frame 140 is enclosed on the periphery of the micro-cylinder 330, and the micro-cylinder 330 can rotate relative to the supporting frame 140. The micro-cylinder 330 includes a knob portion 331, the support 140 includes an arc slot 141 for accommodating the knob portion 331, and the knob portion 331 is at least partially located outside the arc slot 141, so that a user can dial the knob portion 331, the knob portion 331 is adapted to the arc slot 141, and the knob portion 331 can rotate relative to the arc slot 141 under the guidance of the arc slot 141.

Further, since the micrometer 300 has high accuracy, the screw 310 may be damaged or deformed when being collided, thereby affecting the accuracy. In order to avoid the above situation, in this embodiment, the LCR testing device includes a buffer 400 fixed on the substrate 130, the substrate 130 is provided with a second mounting hole in a penetrating manner along a vertical direction, and the buffer 400 is fixedly disposed in the second mounting hole. The end of the damper 400 is disposed opposite the abutment surface 111, and the damper 400 is closer to the abutment surface 111 than the screw 310. When the driving member 120 drives the substrate 130 to descend, the bottom of the buffer 400 is preferably contacted with the supporting surface 111 to buffer the substrate 130, and then the screw 310 is contacted with the supporting surface 111, so as to avoid damage deformation of the screw 310 caused by direct collision of the screw 310 with the supporting surface 111. The damper 400 includes a hydraulic damper and a spring damper, which are capable of guiding the substrate 130 to slowly descend, and the present utility model is not limited thereto.

In addition, referring to fig. 4, the LCR testing device further includes a wrench 500 for performing coarse adjustment on the micrometer 300, wherein the wrench 500 is detachably connected with the screw 310, the wrench 500 is adapted to directly rotate the screw 310 so that the screw 310 can rapidly stretch and retract, after the coarse adjustment is completed, the wrench 500 is detached from the screw 310, and then the screw 310 is finely adjusted through the knob 331, thereby effectively improving the adjustment efficiency. Preferably, in order to facilitate the wrench 500 to be sleeved on the screw 310, the wrench 500 and the screw are relatively fixed in the circumferential direction of the micrometer 300, and a limiting structure for limiting circumferential rotation can be arranged between the screw 310 and the wrench 500, so that the wrench 500 and the screw 310 are relatively fixed in the circumferential direction of the micrometer 300. The limit structure may be a bump, a groove structure, or the outer contour of the end of the screw 310 may be configured in a non-circular structure.

Further, referring to fig. 2, 3 and 5, the test head 200 includes a fixing block 210, a pin die 220, a pin block 230, a probe 240 and a connector 250, the fixing block 210 is fixed on the lower end surface of the substrate 130, the pin die 220 is fixed on the lower end surface of the fixing block 210, the pin block 230 is arranged on the pin die 220, the probe 240 is fixed on the pin block 230 along the vertical direction, two ends respectively extend out of the upper end surface and the lower end surface of the pin die 220, the connector 250 is fixed on the upper end surface of the substrate 130, the substrate 130 and the fixing block 210 are communicated with a yielding hole 600 provided with a yielding probe 240 along the vertical direction, and the probe 240 and the connector 250 are electrically connected through wires. Through adopting above-mentioned structure, can realize the independent dismouting of connector 250 to the different test function of adaptation, and connector 250 also can very conveniently carry out the electricity with external test host computer and be connected, the convenience is good.

The pin die 220 includes a pin die body 221 and a cover plate 222, the upper end surface of the pin die body 221 is concavely provided with a mounting groove 223, and the cover plate 222 is disposed on the upper end surface of the pin die body 221 and covers the mounting groove 223. The pin block 230 may be movably disposed in the mounting groove 223 along a vertical direction, and an elastic member 260 is abutted between the pin block 230 and the cover plate 222, and the elastic member 260 may be a spring, so that the pin block 230 may float up and down relative to the pin die 220. When the probe 240 contacts the electrical module to be tested and receives an upward force, the pin block 230 can float upward and compress the elastic member 260, thereby playing a role of buffering the probe 240, avoiding damage to the probe 240, and when the probe 240 leaves the electrical module, the elastic member 260 can rebound to drive the pin block 230 to reset.

Further, referring to fig. 1, the LCR testing device further includes a turntable assembly 700 disposed below the testing head 200, where the turntable assembly 700 includes a turntable 710 and tools 720 uniformly distributed on the turntable 710 along a circumference of the turntable 710, and the turntable 710 can drive the tools 720 to turn to the testing head 200 or turn away from the testing head 200, so as to implement automatic feeding and discharging of the electrical module, so as to improve an automation degree and efficiency.

Preferably, referring to fig. 2, the LCR test apparatus includes a pressing block 800 fixed to a lower end surface of the substrate 130, the pressing block 800 being disposed opposite to the turntable 710, a height of a bottom of the pressing block 800 being higher than a height of a bottom of the probe 240, a distance between the pressing block 800 and the turntable 710 being greater than a distance between the screw 310 and the pressing surface 111. When the screw 310 fails and cannot normally abut against the abutment surface 111, and the driving member 120 continues to drive the substrate 130 to descend, the abutment block 800 can abut against the turntable 710, so as to avoid damage to the probe 240 caused by too low descending height of the substrate 130.

The working process of the utility model is as follows: the electrical module to be tested is placed on the fixture 720, the turntable 710 drives the fixture 720 carrying the electrical module to rotate below the test head 200, the driving member 120 drives the substrate 130 to descend, in the process, the buffer 400 is firstly contacted with the supporting surface 111 and guides the substrate 130 to slowly descend, then the screw 310 is contacted with the supporting surface 111, at this time, the substrate 130 descends to a preset height, namely the test head 200 descends to a preset height to contact with the electrical module, and the test is performed.

The foregoing description is only of embodiments of the present application, and is not intended to limit the scope of the patent application, and all equivalent structures or equivalent processes using the descriptions and the drawings of the present application or direct or indirect application in other related technical fields are included in the scope of the patent protection of the present application.

Claims (10)

1. An LCR test device, comprising:

the lifting assembly (100) comprises a base (110), a driving piece (120) fixed on the base (110) and a base plate (130) in transmission connection with the driving piece (120), wherein the base (110) is provided with a supporting surface (111) perpendicular to the vertical direction;

a test head (200) disposed on the substrate (130);

a micrometer (300) mounted on the base plate (130) in a vertical direction, the micrometer (300) including a retractable screw (310);

the supporting surface (111) and the screw (310) are arranged oppositely, and the driving piece (120) is suitable for driving the base plate (130) to lift and enabling the screw (310) to support against the supporting surface (111).

2. The LCR test device according to claim 1, wherein the micrometer (300) comprises:

a fixed sleeve (320) fixedly connected to the base plate (130);

a micro-cylinder (330) rotatably sleeved outside the fixed sleeve (320) and fixedly connected with the screw (310);

the nut is axially and limitedly arranged in the fixed sleeve (320);

the screw rod (310) at least partially penetrates through the fixed sleeve (320), and the nut is in threaded fit with the screw rod (310).

3. The LCR test device according to claim 2, wherein the substrate (130) is provided with a support (140), the support (140) is disposed around the periphery of the micro-cylinder (330), and the micro-cylinder (330) is rotatable relative to the support (140).

4. A LCR testing device according to claim 3, wherein the differential cartridge (330) comprises a knob portion (331), the support (140) comprising an arcuate slot (141) for receiving the knob portion (331), the knob portion (331) being located at least partially outside the arcuate slot (141), the knob portion (331) being rotatable relative to the arcuate slot (141).

5. LCR test device according to claim 1, characterized in that it comprises a buffer (400) fixed to the base plate (130), the end of the buffer (400) being arranged opposite the abutment surface (111), the buffer (400) being closer to the abutment surface (111) than the screw (310).

6. The LCR test device according to claim 5, wherein the buffer (400) comprises a hydraulic buffer and a spring buffer.

7. The LCR test device according to claim 1, wherein the test head (200) comprises:

a fixed block (210) fixed to the lower end surface of the substrate (130);

a needle die (220) fixed to the lower end surface of the fixed block (210);

a pin block (230) disposed on the pin die (220);

the probe (240) is fixed on the pin block (230) along the vertical direction, and two ends of the probe extend out of the upper end face and the lower end face of the pin die (220) respectively;

a connector (250) fixed to an upper end surface of the substrate (130);

wherein, the base plate (130) and the fixed block (210) are provided with a yielding hole (600) which is communicated with the probe (240) along the vertical direction, and the probe (240) is electrically connected with the connector (250).

8. The LCR test device according to claim 7, wherein the pin die (220) comprises:

a needle die body (221) with an installation groove (223) concavely arranged on the upper end surface;

a cover plate (222) which is provided on the upper end surface of the needle mold body (221) and covers the mounting groove (223);

the pin block (230) is movably arranged in the mounting groove (223) along the vertical direction, and an elastic piece (260) is abutted between the pin block (230) and the cover plate (222).

9. The LCR testing device according to claim 7, further comprising a turntable assembly (700) disposed below the test head (200), the turntable assembly (700) comprising a turntable (710) and tooling (720) uniformly distributed on the turntable (710) along a circumference of the turntable (710).

10. The LCR testing device according to claim 9, wherein the LCR testing device includes a pressing block (800) fixed to a lower end surface of the substrate (130), the pressing block (800) being disposed opposite to the turntable (710), a height of a bottom of the pressing block (800) being higher than a height of a bottom of the probe (240), a distance between the pressing block (800) and the turntable (710) being greater than a distance between the screw (310) and the holding surface (111).