CN220438494U

CN220438494U - Chip test equipment

Info

Publication number: CN220438494U
Application number: CN202321968717.6U
Authority: CN
Inventors: 陶云彬
Original assignee: Shanghai Lingyun Microelectronics Co ltd
Current assignee: Shanghai Lingyun Microelectronics Co ltd
Priority date: 2023-07-25
Filing date: 2023-07-25
Publication date: 2024-02-02
Anticipated expiration: 2033-07-25

Abstract

The utility model discloses chip testing equipment, which comprises a base, wherein a vertical block is fixed on one side of the base, a lifting detection mechanism is arranged in the vertical block, a detection table is fixed on the top of the base, a buffer protection component is arranged in the detection table, a collecting box is arranged on the top of the base, one side of the collecting box is attached to one side of the detection table, and an automatic collecting and pushing mechanism is arranged on the top of the base; the utility model relates to the technical field of chip testing, and discloses a lifting detection mechanism which comprises a vertical groove formed in one side of a vertical block, a screw rod is rotatably connected between the top and the bottom of the inner wall of the vertical groove, a motor I is fixed at the top of the vertical block, and the top end of the screw rod penetrates through the vertical block and extends to the top of the vertical block. This chip test equipment through the setting of automatic collection pushing equipment, has realized the automatic pushing of chip and has concentrated the collection after the chip detects, does not need manual picking up one by one, and degree of automation is high, labour saving and time saving.

Description

Chip test equipment

Technical Field

The utility model relates to the technical field of chip testing, in particular to chip testing equipment.

Background

Chips are one way of miniaturizing circuits (mainly including semiconductor devices, also including passive components, etc.) in electronics and are often manufactured on semiconductor wafer surfaces, and the chips must be subjected to rigorous testing to be able to be applied in production, whose functions are required to meet the device requirements and to perform reliably for a long period of time.

Referring to China patent, a novel chip testing device (publication No. CN218497081U, publication No. 2023-02-17) solves the problems that the existing chip testing is directly placed on the chip, shaking easily occurs during detection, so that the testing value is affected, meanwhile, the size of the tested chip is different, the chip is not fixed and convenient to adjust due to the lack of a fixed structure, so that the operation difficulty of a user is increased, the existing chip is required to be picked up manually one by one after the completion of the test, time and labor are wasted, an automatic device is not needed for centralized collection, and in addition, the existing chip is easy to move down too much during the test, so that a plurality of chips are extruded, and a buffer protection mechanism is not needed for protecting the chip.

Disclosure of Invention

Aiming at the defects of the prior art, the utility model provides chip testing equipment, which solves the technical problems mentioned in the background art.

In order to achieve the above purpose, the utility model is realized by the following technical scheme: the chip testing equipment comprises a base, wherein a vertical block is fixed on one side of the base, a lifting detection mechanism is arranged in the vertical block, a detection table is fixed on the top of the base, a buffer protection component is arranged in the detection table, a collecting box is placed on the top of the base, one side of the collecting box is attached to one side of the detection table, and an automatic collecting and pushing mechanism is arranged on the top of the base;

the lifting detection mechanism comprises a vertical groove formed in one side of a vertical block, a screw rod is rotatably connected between the top and the bottom of the inner wall of the vertical groove, a first motor is fixed at the top of the vertical block, the top of the screw rod penetrates through the vertical block and extends to the top of the vertical block, the output end of the first motor is fixed at the top of the screw rod through a coupler, the inner surface of the vertical groove is slidably connected with a sliding block, one end of the screw rod penetrates through the sliding block and extends to the outside of the sliding block, the outer surface of the screw rod is in threaded connection with the inner surface of the sliding block, a lifting plate is slidably connected on one side of the vertical block, one side of the sliding block is fixed with one side of the lifting plate, and a test pen is arranged at the bottom of the lifting plate.

Preferably, the automatic collecting and pushing mechanism comprises two first fixing plates fixed on one side of the top of the base, two second fixing plates are fixed on the other side of the top of the base, and threaded rods are connected between the opposite sides of the first fixing plates in a rotating mode.

Preferably, a cross bar is fixed between opposite sides of the two fixing plates, one side of the first fixing plate is fixed with the second motor, and one end of the threaded rod penetrates through the fixing plate and extends to the outside of the first fixing plate.

Preferably, the output end of the second motor is fixed with one end of a threaded rod through a coupler, the top of the detection table is slidably connected with a pushing plate, and one ends of the threaded rod and the cross rod penetrate through the pushing plate and extend to the outside of the pushing plate.

Preferably, the surface of threaded rod and the internal surface threaded connection of pushing away the flitch, the surface of horizontal pole and the internal surface sliding connection of pushing away the flitch, one side of pushing away the flitch is fixed with two baffles, two the bottom of baffle all with detect the top sliding connection of platform.

Preferably, the buffering protection subassembly is including seting up the square groove at detecting the bench top, the internal surface sliding connection of square groove has the buffer board, be fixed with four buffer springs between the diapire of bottom and the square groove of buffer board.

Advantageous effects

The utility model provides chip testing equipment. Compared with the prior art, the method has the following beneficial effects:

(1) According to the chip testing equipment, through the arrangement of the buffer protection component, excessive extrusion of the chip after excessive downward movement of the test pen after the lifting detection mechanism is started is avoided, so that the chip is damaged by pressure, and the buffer protection of the chip is effectively realized.

(2) This chip test equipment through the setting of automatic collection pushing equipment, has realized the automatic pushing of chip and has concentrated the collection after the chip detects, does not need manual picking up one by one, and degree of automation is high, labour saving and time saving.

Drawings

FIG. 1 is a perspective view of an external structure of the present utility model;

FIG. 2 is an exploded perspective view of the lift detection mechanism of the present utility model;

fig. 3 is an exploded perspective view of the cushioning protection assembly of the present utility model.

In the figure: 1. a base; 2. a vertical block; 3. a lifting detection mechanism; 4. a detection table; 5. a buffer protection assembly; 6. a collection box; 7. automatic collecting and pushing mechanism; 31. a vertical groove; 32. a screw rod; 33. a first motor; 34. a slide block; 35. a lifting plate; 36. a test pen; 71. a first fixing plate; 72. a second fixing plate; 73. a threaded rod; 74. a cross bar; 75. a second motor; 76. a pushing plate; 77. a baffle; 51. a square groove; 52. a buffer plate; 53. and a buffer spring.

Detailed Description

The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

Referring to fig. 1-3, the present utility model provides a technical solution: the chip testing equipment comprises a base 1, wherein a vertical block 2 is fixed on one side of the base 1, a lifting detection mechanism 3 is arranged in the vertical block 2, a detection table 4 is fixed at the top of the base 1, a buffer protection component 5 is arranged in the detection table 4, a collection box 6 is arranged at the top of the base 1, the collection box 6 can collect chips meeting the standard after detection, one side of the collection box 6 is attached to one side of the detection table 4, and an automatic collection pushing mechanism 7 is arranged at the top of the base 1;

the lifting detection mechanism 3 comprises a vertical groove 31 formed in one side of the vertical block 2, a screw rod 32 is rotatably connected between the top and the bottom of the inner wall of the vertical groove 31, a first motor 33 is fixed on the top of the vertical block 2, the first motor 33 is a three-phase asynchronous motor, can be controlled by an external switch and is electrically connected with an external power supply, the top end of the screw rod 32 penetrates through the vertical block 2 and extends to the top of the vertical block 2, the output end of the first motor 33 is fixed with the top end of the screw rod 32 through a coupler, the inner surface of the vertical groove 31 is slidably connected with a sliding block 34, one end of the screw rod 32 penetrates through the sliding block 34 and extends to the outside of the sliding block 34, the outer surface of the screw rod 32 is in threaded connection with the inner surface of the sliding block 34, one side of the vertical block 2 is slidably connected with a lifting plate 35, one side of the sliding block 34 is fixed with one side of the lifting plate 35, the bottom of the lifting plate 35 is provided with a test pen 36, and the test pen 36 can carry out pressure test on a chip.

The automatic collecting and pushing mechanism 7 comprises two first fixing plates 71 fixed on one side of the top of the base 1, two second fixing plates 72 are fixed on the other side of the top of the base 1, and threaded rods 73 are rotatably connected between the opposite sides of the two first fixing plates 71.

A cross bar 74 is fixed between opposite sides of the two fixing plates 72, a motor two 75 is fixed on one side of one fixing plate one 71, the motor two 75 is a three-phase asynchronous motor, can rotate forward and backward, is controlled by an external switch and is electrically connected with an external power supply, and one end of a threaded rod 73 penetrates through the fixing plate one 71 and extends to the outside of the fixing plate one 71.

The output end of the second motor 75 is fixed with one end of a threaded rod 73 through a coupler, the top of the detection table 4 is connected with a pushing plate 76 in a sliding mode, and one ends of the threaded rod 73 and a cross rod 74 penetrate through the pushing plate 76 and extend to the outside of the pushing plate 76.

The surface of threaded rod 73 and the internal surface threaded connection of pushing away flitch 76, the surface of horizontal pole 74 and the internal surface sliding connection of pushing away flitch 76, one side of pushing away flitch 76 is fixed with two baffles 77, the bottom of two baffles 77 all with detect the top sliding connection of platform 4, two baffles 77 can carry out spacing blocking to the chip, avoid the chip to drop from the both sides of detecting platform 4, through the setting of automatic collection pushing mechanism 7, after the chip detects the completion, realized collecting in a concentrated way the automatic pushing away of chip, do not need manual picking up one by one, degree of automation is high, labour saving and time saving.

The buffer protection component 5 is including seting up the square groove 51 at detecting the platform 4 top, and the internal surface sliding connection of square groove 51 has buffer board 52, is fixed with four buffer springs 53 between the diapire of buffer board 52 bottom and square groove 51, through the setting of buffer protection component 5, has avoided after the test pencil 36 excessively moves down after the lift detection mechanism 3 starts, and too much extrusion chip leads to the chip to be pressed the loss, has effectively realized the buffer protection to the chip.

And all that is not described in detail in this specification is well known to those skilled in the art.

During operation, the chip is placed at the top of the buffer plate 52, the first motor 33 is further started, the first motor 33 drives the screw rod 32 to rotate, the screw rod 32 drives the sliding block 34 to move downwards, the sliding block 34 drives the lifting plate 35 and the test pen 36 to move downwards, after the bottom end of the test pen 36 contacts with the chip, the first motor 33 is closed, the test pen 36 can test the chip, when the test pen 36 moves downwards excessively, the chip drives the buffer plate 52 to slide downwards along the inner surface of the square groove 51 after the chip is extruded, the buffer plate 52 starts to extrude the compression buffer spring 53, at this time, the chip is buffered and protected by the elasticity of the buffer spring 53, the second motor 75 is started, the second motor 75 drives the threaded rod 73 to rotate, the threaded rod 73 drives the pushing plate 76 to slide forwards along the transverse rod 74, the pushing plate 76 pushes the chip forwards, finally, the chip is pushed into the collecting box 6 after detection is completed, and meanwhile, the two baffles 77 can limit and block the chip from falling from the two sides of the detection table 4.

The foregoing describes one embodiment of the present utility model in detail, but the description is only a preferred embodiment of the present utility model and should not be construed as limiting the scope of the utility model. All equivalent changes and modifications within the scope of the present utility model are intended to be covered by the present utility model.

Claims

1. Chip test equipment, including base (1), its characterized in that: a vertical block (2) is fixed on one side of the base (1), a lifting detection mechanism (3) is arranged in the vertical block (2), a detection table (4) is fixed on the top of the base (1), a buffer protection component (5) is arranged in the detection table (4), a collecting box (6) is arranged on the top of the base (1), one side of the collecting box (6) is attached to one side of the detection table (4), and an automatic collecting and pushing mechanism (7) is arranged on the top of the base (1);

the lifting detection mechanism (3) comprises a vertical groove (31) formed in one side of a vertical block (2), a screw rod (32) is rotatably connected between the top and the bottom of the inner wall of the vertical groove (31), a first motor (33) is fixed at the top of the vertical block (2), the top end of the screw rod (32) penetrates through the vertical block (2) and extends to the top of the vertical block (2), the output end of the first motor (33) is fixed with the top end of the screw rod (32) through a coupler, a sliding block (34) is slidably connected to the inner surface of the vertical groove (31), one end of the screw rod (32) penetrates through the sliding block (34) and extends to the outer part of the sliding block (34), a lifting plate (35) is slidably connected to one side of the vertical block (2), one side of the sliding block (34) is fixed with one side of the lifting plate (35), and a test pen (36) is arranged at the bottom of the lifting plate (35);

the automatic collection pushing mechanism (7) comprises two first fixed plates (71) fixed on one side of the top of the base (1), two second fixed plates (72) are fixed on the other side of the top of the base (1), threaded rods (73) are connected between opposite sides of the first fixed plates (71) in a rotating mode, transverse rods (74) are fixed between opposite sides of the second fixed plates (72), one of the two fixed plates (71) is fixed with a second motor (75), one end of each threaded rod (73) penetrates through the first fixed plates (71) and extends to the outer portion of the first fixed plates (71), the output end of each second motor (75) is fixed with one end of each threaded rod (73) through a coupler, the tops of the detection platforms (4) are connected with pushing plates (76) in a sliding mode, one ends of each threaded rod (73) and each transverse rod (74) penetrate through the pushing plates (76) and extend to the outer portions of the pushing plates (76), the outer surfaces of each threaded rods (73) are in threaded connection with the inner surfaces of the pushing plates (76), and the two outer surfaces of the two sliding plates (77) are connected with the bottom of the two baffles (77) in a sliding mode.

2. A chip testing apparatus according to claim 1, wherein: the buffer protection assembly (5) comprises a square groove (51) formed in the top of the detection table (4), a buffer plate (52) is slidably connected to the inner surface of the square groove (51), and four buffer springs (53) are fixed between the bottom of the buffer plate (52) and the bottom wall of the square groove (51).