CN218995439U

CN218995439U - Multiport microstrip universal test fixture

Info

Publication number: CN218995439U
Application number: CN202223064972.6U
Authority: CN
Inventors: 帅红春; 刘兴平; 万未航
Original assignee: CHENGDU HONGKE MICROWAVE COMMUNICATION CO LTD
Current assignee: CHENGDU HONGKE MICROWAVE COMMUNICATION CO LTD
Priority date: 2022-11-18
Filing date: 2022-11-18
Publication date: 2023-05-09
Anticipated expiration: 2032-11-18

Abstract

The utility model relates to a multi-port microstrip universal test fixture which comprises a base, a lifting assembly, a debugging table, a plurality of test heads, a moving block and a stand, wherein the lifting assembly is arranged on the base, the upper end of the lifting assembly is connected with the debugging table to drive the debugging table to move up and down, the stand is vertically arranged on the base, the lower ends of the plurality of moving blocks are movably connected with the stand, and the plurality of test heads are arranged at the upper ends of the moving blocks and are enclosed around the debugging table. The device to be tested is placed on the debugging table, the height of the debugging table is adjusted by the lifting assembly, the test head is effectively contacted with the device to be tested by the displacement moving block, the test is further completed, the plurality of clamps are prevented from being used for one-to-one testing of different devices, and the test is more convenient and quicker.

Description

Multiport microstrip universal test fixture

Technical Field

The utility model relates to the technical field of PCB board testing jigs, in particular to a multi-port microstrip universal testing jig.

Background

The micro-wave devices with three micro-strip ports such as the micro-strip circulator and the like have different external dimensions, and the positions of the micro-strip ports are different, so that the test problem is difficult to solve well. At present, a special test fixture is arranged for each device. If the special fixture is used, the test fixture is specially designed according to the microstrip positions of the devices, the fixtures and the devices can only be tested one by one, when several devices are tested simultaneously, the fixtures are required to be replaced and rewiring is required, the working table is very disordered, and the arrangement and the storage are complicated, so that improvement is required.

Disclosure of Invention

Based on this, it is necessary to provide a multi-port microstrip universal test fixture in view of the above-mentioned problems.

The utility model provides a general test fixture of multiport microstrip, includes the base, lifting unit, the debugging platform, a plurality of test heads, movable block and grudging post, lifting unit installs on the base, and lifting unit's upper end is connected with the debugging platform, drives the debugging bench and reciprocates, the grudging post is installed on the base perpendicularly, a plurality of movable block lower extreme and grudging post swing joint, and a plurality of test heads are installed in the movable block upper end to enclose and be in the debugging platform all around.

Preferably, the automatic fine adjustment device further comprises fine adjustment screws, two fine adjustment screws are arranged on two sides of the vertical frame in a mirror image mode, two horizontal cross bars are arranged on the vertical frame at intervals, the lower ends of the three moving blocks are movably connected with the cross bars, and the output ends of the two fine adjustment screws penetrate through the vertical frame and are connected with the lower ends of the two moving blocks in a one-to-one correspondence mode.

Preferably, the upper end of the moving block is provided with a sliding groove, and the lower end of the test head is provided with a clamping block corresponding to the sliding groove.

Preferably, the lifting assembly comprises a pressing rod, a pressing boss, a supporting table and a connecting rod, the pressing boss is arranged on the base, the supporting table is arranged on the pressing boss, the connecting rod is connected with the lower end of the supporting table and penetrates through the pressing boss, the rear end of the pressing rod is hinged to the pressing boss, the middle of the pressing rod is movably connected with the connecting rod, and the debugging table is arranged on the supporting table.

Preferably, protection plates are arranged on two sides of the pressing boss.

Preferably, the base comprises a lower base body, an upper base body and support columns, wherein the upper base body is connected with the lower base body through four support columns, and a gap exists between the upper base body and the lower base body.

Preferably, the end face of the upper seat body is provided with an avoidance groove corresponding to the compression rod.

The utility model has the advantages that: the device to be tested is placed on the debugging table, the height of the debugging table is adjusted by the lifting assembly, the test head is effectively contacted with the device to be tested by the displacement moving block, the test is further completed, the plurality of clamps are prevented from being used for one-to-one testing of different devices, and the test is more convenient and quicker.

Drawings

FIG. 1 is a schematic perspective view of a multi-port microstrip universal test fixture according to one embodiment;

fig. 2 is an exploded schematic view of a multi-port microstrip universal test fixture.

Detailed Description

In order that the above objects, features and advantages of the utility model will be readily understood, a more particular description of the utility model will be rendered by reference to the appended drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present utility model. The present utility model may be embodied in many other forms than described herein and similarly modified by those skilled in the art without departing from the spirit of the utility model, whereby the utility model is not limited to the specific embodiments disclosed below.

It will be understood that when an element is referred to as being "fixed" or "disposed" on another element, it can be directly on the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. The terms "vertical," "horizontal," "left," "right," and the like are used herein for illustrative purposes only and are not meant to be the only embodiment.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this utility model belongs. The terminology used herein in the description of the utility model is for the purpose of describing particular embodiments only and is not intended to be limiting of the utility model. The term "and/or" as used herein includes any and all combinations of one or more of the associated listed items.

As shown in fig. 1-2, the multi-port microstrip universal test fixture comprises a base 1, a lifting assembly 2, a debugging table 3, a plurality of test heads 4, a moving block 5 and a stand 6, wherein the lifting assembly 2 is installed on the base 1, the upper end of the lifting assembly 2 is connected with the debugging table 3 to drive the debugging table 3 to move up and down, the stand 6 is vertically installed on the base 1, the lower ends of the plurality of the moving blocks 5 are movably connected with the stand 6, and the plurality of test heads 4 are installed at the upper ends of the moving blocks 5 and are enclosed around the debugging table 3. Specifically, in the present embodiment, three test heads 4 are mounted on three moving blocks 5 in a one-to-one correspondence, and in other embodiments, other numbers of test heads 4 may be set, which is not limited herein. The movable block 5 is movably connected with the vertical frame 6, so that the test head 4 is conveniently and transversely displaced, the test is completed by effectively contacting with a device to be tested (not shown in the figure) placed on the debugging table 3, a plurality of test heads 4 are arranged on one base 1, and the test heads 4 are detachably connected with the movable block 5, so that the test heads 4 are conveniently replaced to adapt to the devices to be tested with different model sizes. The fixture is not required to be prefabricated for the device to be tested of each signal, so that more fixtures are prevented from being placed on a workbench, and the beam is difficult to be converged and tidied. Further, in order to adjust the height of the device to be tested, a lifting assembly 2 is arranged on the base 1, the lifting assembly 2 can be a screw rod assembly, an electric push rod or other mechanical structures, so long as the debugging table 3 can be driven to move back and forth in the vertical direction, the height of the device to be tested placed on the debugging table 3 is adjusted through the lifting assembly 2, the device to be tested is enabled to be in effective contact with a microstrip line harness at the end part of the test head 4, the test operation is simple and convenient, and the device has extremely strong practicability.

As shown in fig. 1-2, the device further comprises fine tuning screws 7, two fine tuning screws 7 are arranged on two sides of the vertical frame 6 in a mirror image mode, two horizontal cross bars 61 are arranged on the vertical frame 6 at intervals, the lower ends of the three moving blocks 5 are movably connected with the cross bars 61, and the output ends of the two fine tuning screws 7 penetrate through the vertical frame 6 and are correspondingly connected with the lower ends of the two moving blocks 5 one by one. Specifically, the cross bars 61 are round bars, movably penetrate through the moving block 5, and the two cross bars 61 penetrate through the moving block 5 at the same time, so that the moving block 5 can be prevented from rotating around the cross bars 61. The fine tuning screws 7 are arranged on two sides of the vertical frame 6, and a user can drive the movable block 5 to move back and forth by rotating the fine tuning screws 7, and the movable block is close to or far away from the device to be tested on the debugging table 3, so that the test head 4 is in effective contact with a microstrip line bundle of the device to be tested. In this embodiment, the test heads 4 disposed on the middle moving block 5 are used for testing the rear end of the device to be tested, and the test heads 4 on the moving blocks 5 on the left and right sides are used for testing the left and right ends of the device to be tested, and in other embodiments, the positions and the intervals of the test heads 4 can be freely adjusted as required, which is not limited herein.

As shown in fig. 1-2, the upper end of the moving block 5 is provided with a chute 51, and the lower end of the test head 4 is provided with a clamping block 41 corresponding to the chute 51, so that the test head 4 can be moved according to the position of the microstrip line bundle at the edge of the device to be tested, and the test head 4 can be in good contact with the microstrip line bundle.

As shown in fig. 1-2, the lifting assembly 2 comprises a pressing rod 21, a pressing boss 22, a supporting table 23 and a connecting rod 24, wherein the pressing boss 22 is installed on the base 1, the supporting table 23 is installed on the pressing boss 22, the connecting rod 24 is connected with the lower end of the supporting table 23 and penetrates through the pressing boss 22, the rear end of the pressing rod 21 is hinged with the pressing boss 22, the middle part of the pressing rod 21 is movably connected with the connecting rod 24, and the debugging table 3 is installed on the supporting table 23. Specifically, when the height of the debugging table 3 is increased, the user directly presses the pressing rod 21, and then the supporting table 23 can be lifted up from the pressing boss 22 by using the connecting rod 24, so that the height of the debugging table 3 mounted on the supporting table 23 is increased, and a device to be tested placed on the debugging table 3 is effectively contacted with the surrounding test head 4. After the test is finished, the user releases the acting force applied to the pressing rod 21, the supporting table 23 automatically slides downwards under the action of self gravity and falls on the pressing boss 22 again, and the device to be tested can be separated from the test head 4, so that the use is very convenient.

As shown in fig. 1-2, the two sides of the pressing boss 22 are provided with protection plates 221, and the vertical displacement of the supporting stand 23 is limited by matching with the connecting rod 24, so as to prevent the supporting stand from deviating.

As shown in fig. 1-2, the base 1 includes a lower base 11, an upper base 12 and struts 13, the upper base 12 is connected with the lower base 11 through four struts 13, and a gap exists between the upper base 12 and the lower base 11, so that a part of the pressing boss 22 is left at the gap, and the height of the pressing boss 22 is prevented from being too high.

As shown in fig. 1-2, the end surface of the upper base 12 is provided with an avoidance groove 121 corresponding to the pressing rod 21, the downward rotation angle of the pressing rod 21 is larger, and the displacement length of the supporting table 23 is increased.

The above examples illustrate only a few embodiments of the utility model, which are described in detail and are not to be construed as limiting the scope of the utility model. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the utility model, which are all within the scope of the utility model. Accordingly, the scope of protection of the present utility model is to be determined by the appended claims.

Claims

1. The utility model provides a multiport microstrip universal test anchor clamps which characterized in that: the device comprises a base, a lifting assembly, a debugging table, a plurality of test heads, a moving block and a stand, wherein the lifting assembly is arranged on the base, the upper end of the lifting assembly is connected with the debugging table to drive the debugging table to move up and down, the stand is vertically arranged on the base, the lower ends of the plurality of moving blocks are movably connected with the stand, and the plurality of test heads are arranged at the upper ends of the moving blocks and are enclosed around the debugging table.

2. The multi-port microstrip universal test fixture of claim 1 wherein: the automatic fine adjustment device is characterized by further comprising fine adjustment screws, wherein two sides of the vertical frame are installed by the two fine adjustment screws in a mirror image mode, two horizontal cross bars are arranged on the vertical frame at intervals, the lower ends of the moving blocks are movably connected with the cross bars, and the output ends of the fine adjustment screws penetrate through the vertical frame and are connected with the lower ends of the two moving blocks in a one-to-one correspondence mode.

3. The multi-port microstrip universal test fixture of claim 2 wherein: the upper end of the moving block is provided with a chute, and the lower end of the test head is provided with a clamping block corresponding to the chute.

4. A multiport microstrip universal test fixture as in claim 1 or 2, wherein: the lifting assembly comprises a pressing rod, a pressing boss, a supporting table and a connecting rod, the pressing boss is arranged on the base, the supporting table is arranged on the pressing boss, the connecting rod is connected with the lower end of the supporting table and penetrates through the pressing boss, the rear end of the pressing rod is hinged to the pressing boss, the middle of the pressing rod is movably connected with the connecting rod, and the debugging table is arranged on the supporting table.

5. The multi-port microstrip universal test fixture as claimed in claim 4 wherein: and protection plates are arranged on two sides of the compaction boss.

6. The multi-port microstrip universal test fixture of claim 1 wherein: the base comprises a lower base body, an upper base body and supporting columns, wherein the upper base body is connected with the lower base body through four supporting columns, and a gap exists between the upper base body and the lower base body.

7. The multi-port microstrip universal test fixture as claimed in claim 6 wherein: the upper seat body end face is provided with an avoidance groove corresponding to the compression rod.