CN220011203U - Function test platform and test production line - Google Patents

Abstract

The utility model discloses a functional test platform and a test production line, and belongs to the technical field of electronic equipment testing. The function test platform is suitable for the function test of electronic equipment, and the electronic equipment is provided with at least a first function module and a second function module; the function test platform comprises a transmission module and at least two test modules; the conveying module comprises a loading and unloading station and a testing station, and is used for conveying the electronic equipment between the loading and unloading station and the testing station; the at least two test modules are close to the test station respectively, and the first functional module and the second functional module correspond to the at least one test module respectively; the functional test platform is configured to test the test module and the second functional module, respectively, by at least two test modules when the electronic device is in the test station. The functional test platform provided by the utility model realizes single-station multiple tests, is beneficial to shortening the test production line of electronic equipment and increasing the test efficiency of products.

Description

Function test platform and test production line

Technical Field

The present utility model relates to the field of electronic device testing technologies, and in particular, to a functional testing system and a testing production line.

Background

FCT (Function Test) is a series of functional tests close to a product level for electronic devices, including touch tests, sensing tests, charge and discharge tests, and the like, and various Test tools are required to be used, and the Test tools are usually arranged at different stations, so that the electronic devices can complete all the tests through multiple transferring and plugging, which results in a longer Test production line in a workshop, limits Test productivity, and limits production efficiency of the electronic devices.

Disclosure of Invention

The utility model provides a functional test platform and a test production line, which can solve the problems that electronic equipment test tools are arranged at different stations, the test productivity of electronic equipment is low, and the test production line is long.

The technical scheme is as follows:

in one aspect, a functional test platform is provided, the functional test platform is suitable for functional testing of an electronic device, and the electronic device at least comprises a first functional module and a second functional module;

the function test platform comprises a transmission module and at least two test modules;

the conveying module comprises a loading and unloading station and a testing station, and is used for conveying the electronic equipment between the loading and unloading station and the testing station;

the at least two test modules are close to the test station respectively, and the first functional module and the second functional module correspond to at least one test module respectively;

the functional test platform is configured to test the test module and the second functional module respectively by the at least two test modules when the electronic device is in the test station.

In some embodiments, the first functional module is located on a first side of the electronic device and the second functional module is located on a second side of the electronic device;

the at least two test modules include a first test module facing the first side and a second test module facing the second side.

In some embodiments, the first side is located at a bottom of the electronic device, and the first test module includes a first calibration plate movably located under the electronic device.

In some embodiments, the first test module further includes a first movement mechanism, the first calibration plate is connected to the first movement mechanism, and the first movement mechanism can drive the first calibration plate to move so as to adjust a distance between the first calibration plate and the first functional module.

In some embodiments, the second side is located at a front end of the electronic device, and the second test module includes a second calibration plate located in front of the electronic device.

In some embodiments, the second test module further includes a second movement mechanism, the second calibration plate is connected to the second movement mechanism, and the second movement mechanism can drive the second calibration plate to move so as to adjust a distance between the second calibration plate and the second functional module.

In some embodiments, the electronic device further comprises a touch detection module, a data interface module, and a wired charge-discharge module, wherein the touch detection module, the data interface module, and the wired charge-discharge module are located on top of the electronic device;

the functional test platform further comprises a comprehensive test assembly and a third movement mechanism, wherein the comprehensive test assembly is connected to the third movement mechanism, and the third movement mechanism can drive the comprehensive test assembly to move;

when the electronic equipment is in the testing station, the third movement mechanism can drive the comprehensive testing assembly to move to the top of the electronic equipment to test at least one of the touch detection module, the data interface module and the wired charge-discharge module.

In some embodiments, the integrated test assembly is provided with a plurality of test probes, and the plurality of test probes can be respectively electrically connected with the electronic device when the integrated test assembly moves to the top of the electronic device.

In some embodiments, the electronic device further comprises a wireless charging module located at a bottom of the electronic device;

the at least two test modules comprise a third test module, the third test module comprises a charging coil and a fourth movement mechanism, the charging coil is connected with the fourth movement mechanism, and the fourth movement mechanism can drive the charging coil to move to the bottom of the electronic equipment and is connected with the wireless charging module in a coupling way.

On the other hand, a test production line is provided, which comprises the functional test platform.

The technical scheme provided by the utility model has the beneficial effects that at least:

according to the functional test platform, the electronic equipment is conveyed between the feeding and discharging stations and the testing station by utilizing the conveying module, at least two testing modules are arranged at the testing station, and can test the first functional module and the second functional module of the electronic equipment at the same time, so that a plurality of tests in a single station are realized, the test production line of the electronic equipment is shortened, and the test efficiency of products is improved.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required for the description of the embodiments will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

Fig. 1 is a schematic structural diagram of an electronic device according to an embodiment of the present utility model;

FIG. 2 is a schematic structural diagram of a functional test platform according to an embodiment of the present utility model;

FIG. 3 is a schematic diagram of the relative positions of a first test module, a second test module and an electronic device according to an embodiment of the present utility model;

FIG. 4 is a schematic diagram of a partial structure of a functional test platform according to an embodiment of the present utility model;

FIG. 5 is a schematic diagram of another partial structure of a functional test platform according to an embodiment of the present utility model;

fig. 6 is a structural perspective view of a functional test platform according to an embodiment of the present utility model.

Reference numerals in the drawings are respectively expressed as:

100. an electronic device;

01. a first functional module; 02. a second functional module; 03. a touch detection module; 04. a data interface module; 05. a wired charge-discharge module; 06. a wireless charging module;

1. a transfer module; 101. a loading and unloading station; 102. a testing station;

2. a test module;

21. a first test module; 211. a first calibration plate; 212. a first movement mechanism;

22. a second test module; 221. a second calibration plate; 222. a second movement mechanism;

23. a third test module; 231. a charging coil; 232. a fourth movement mechanism;

3. a comprehensive test assembly;

4. a third movement mechanism;

5. a frame;

51. and a feeding and discharging port.

Detailed Description

Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the utility model. Rather, they are merely examples of apparatus and methods consistent with aspects of the utility model as detailed in the accompanying claims.

In the description of the present utility model, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in fig. 1 and 2 are merely for convenience in describing the present utility model and simplify the description, and do not indicate or imply that the device or element being referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present utility model.

Unless defined otherwise, all technical terms used in the embodiments of the present utility model have the same meaning as commonly understood by one of ordinary skill in the art.

For the purpose of making the objects, technical solutions and advantages of the present utility model more apparent, the embodiments of the present utility model will be described in further detail with reference to the accompanying drawings.

In one aspect, as shown in fig. 1 and 2, the present embodiment provides a functional test platform, where the functional test platform is suitable for functional testing of an electronic device 100, and the electronic device 100 has at least a first functional module 01 and a second functional module 02.

The functional test platform comprises a transfer module 1 and at least two test modules 2.

The conveying module 1 comprises an loading and unloading station 101 and a testing station 102, and the conveying module 1 is used for conveying the electronic equipment 100 between the loading and unloading station 101 and the testing station 102.

At least two test modules 2 are respectively close to the test station 102, and the first functional module 01 and the second functional module 02 respectively correspond to the at least one test module 2.

The functional test platform is configured such that at least two test modules 2 test the test module 2 and the second functional module 02, respectively, while the electronic device 100 is in the test station 102.

The functional test platform of this embodiment utilizes the transfer module 1 to carry electronic equipment 100 between last unloading station 101 and test station 102, and test station 102 has arranged two at least test module 2, and two at least test module 2 can test the first functional module 01 and the second functional module 02 of electronic equipment 100 simultaneously, realizes single-station multiple test, is favorable to shortening the test production line of electronic equipment 100, increases the test efficiency of product.

Illustratively, the number of test modules 2 is, for example, two, three, four, etc. Alternatively, at least two test modules 2 may be of a split structure, each independently disposed around the test station 102, and each independently tested from different angles or orientations on the first functional module 01 and the second functional module 02 of the electronic device 100. Alternatively, at least two test modules 2 may be integrally formed, and at least two test modules 2 are integrally disposed around the test station 102, and the first functional module 01 and the second functional module 02 of the electronic device 100 are tested from the same or different angles or orientations.

It should be noted that the number of the test modules 2 for testing the first functional module 01 may be one, two, three, or the like; the number of test modules 2 for testing the second functional module 02 may be one, two, three, etc., and the present utility model is not particularly limited thereto.

In some possible implementations, the first functional module 01 of the electronic device 100 is a ranging module, the first functional module 01 including, but not limited to, an ultrasonic ranging sensor, a laser ranging sensor, an infrared ranging sensor, a radar sensor, and the like.

The second functional module 02 of the electronic device 100 is an obstacle detection module, and the second functional module includes, but is not limited to, an ultrasonic obstacle avoidance sensor, an infrared obstacle avoidance sensor, a laser obstacle avoidance sensor, and the like.

As shown in connection with fig. 1 and 2, in some embodiments, the first functional module 01 is located on a first side of the electronic device 100 and the second functional module 02 is located on a second side of the electronic device 100.

The at least two test modules 2 comprise a first test module 21 facing the first side and a second test module 22 facing the second side.

The first functional module 01 and the second functional module 02 of the electronic device 100 are respectively arranged on different sides of the electronic device 100, and the corresponding test modules 2 with corresponding test capabilities are respectively arranged on each side, so that the first functional module 01 and the second functional module 02 of the electronic device 100 can be independently tested in one test production beat on the same test station 102, the length of a test production line is reduced, and the test production efficiency is improved.

As shown in connection with fig. 1 and 3, in some embodiments, the first side is located at the bottom of the electronic device 100, and the first test module 21 includes a first calibration plate 211, where the first calibration plate 211 is movably located below the electronic device 100. Optionally, the transfer module 1 is two parallel rails, and the rails are suspended therebetween, so that the bottom of the electronic device 100 is exposed.

The bottom of the electronic device 100 is used for arranging a first functional module 01 for detecting the distance between the bottom of the electronic device 100 and the ground and providing corresponding data feedback for the operation of the electronic device 100. The first test module 21 includes a first calibration board 211 located below the electronic device 100, and when the first calibration board 211 is disposed at a standard distance, the first functional module 01 feeds back measurement data after performing ranging operation, and when the measurement data matches the standard distance, it indicates that the first functional module 01 functions normally, and when the measurement data does not match the standard distance, it indicates that the first functional module 01 functions abnormally.

It should be noted that, in the present specification, the "bottom", "top" and "front" of the electronic device 100 are understood as a part of the electronic device 100, and the "below", "front" and "above" of the electronic device 100 are understood as spatial regions corresponding to the corresponding positions of the electronic device 100, but having no membership to each other.

In some embodiments, as shown in fig. 3, the first test module 21 further includes a first movement mechanism 212, where the first calibration plate 211 is connected to the first movement mechanism 212, and the first movement mechanism 212 can drive the first calibration plate 211 to move so as to adjust a distance between the first calibration plate 211 and the first functional module 01.

In order to further ensure that the first functional module 01 functions normally, the first calibration plate 211 is connected with the first movement mechanism 212, and the first movement mechanism 212 can drive the first calibration plate 211 to move to adjust the distance between the first calibration plate 211 and the first functional module 01, so that a plurality of measurement data can be obtained, and a plurality of comparison is performed with a plurality of standard distances.

In addition, the first movement mechanism 212 is configured to provide the first test module 21 with a flexible test capability, so that the first test module 21 can test the first functional modules 01 of different types of electronic devices 100 by adjusting the position of the first calibration plate 211.

In some possible implementations, the first movement mechanism 212 is a linear movement mechanism, so as to move the first calibration plate 211.

Alternatively, the first motion mechanism 212 may utilize a linear motion mechanism common in the art, such as a telescoping cylinder, rack and pinion arrangement, belt drive arrangement, linear motor, and the like.

When the first motion mechanism 212 is a telescopic cylinder, one of a cylinder body and a push rod of the cylinder is connected with the first calibration plate 211, and when the first motion mechanism 212 works, the push rod extends or retracts along the cylinder body, and the positions of the cylinder body and the push rod are far away from and close to each other, so that the first calibration plate 211 is driven to move, and the distance between the first calibration plate 211 and the first functional module 01 is adjusted.

As shown in connection with fig. 1 and 3, in some embodiments, the second side is located at a front end of the electronic device 100, and the second test module 22 includes a second calibration plate 221, where the second calibration plate 221 is located in front of the electronic device 100.

The front end of the electronic device 100 is configured to arrange a second functional module 02, which is configured to detect whether an obstacle exists in a travel route of the electronic device 100, and provide corresponding data feedback for operation of the electronic device 100. The second test module 22 includes a second calibration board 221 located in front of the electronic device 100, and the second calibration board 221 is disposed at a standard distance during the test, and the second function module 02 feeds back obstacle detection data after performing the obstacle detection work, and when the detection data matches the standard distance, it indicates that the second function module 02 functions normally, and when the detection data does not match the standard distance, it indicates that the second function module 02 functions abnormally.

In some embodiments, as shown in fig. 3, the second testing module 22 further includes a second movement mechanism 222, where the second calibration plate 221 is connected to the second movement mechanism 222, and the second movement mechanism 222 can drive the second calibration plate 221 to move so as to adjust a distance between the second calibration plate 221 and the second functional module 02.

In order to further ensure that the second functional module 02 functions normally, the second calibration plate 221 is connected with the second movement mechanism 222, and the second movement mechanism 222 can drive the second calibration plate 221 to move to adjust the distance between the second calibration plate 221 and the second functional module 02, so that a plurality of measurement data can be obtained, and a plurality of comparison can be performed with a plurality of standard distances.

In addition, the second movement mechanism 222 is configured to provide the second test module 22 with a flexible test capability, so that the second test module 22 can test the second functional module 02 of the electronic device 100 with different models by adjusting the position of the second calibration plate 221.

In some possible implementations, the second movement mechanism 222 is a linear movement mechanism, so as to move the second calibration plate 221.

Alternatively, the second motion mechanism 222 may utilize a linear motion mechanism common in the art, such as a telescoping cylinder, rack and pinion arrangement, belt drive arrangement, linear motor, and the like.

When the second movement mechanism 222 is a telescopic cylinder, one of a cylinder body and a push rod of the cylinder is connected with the second calibration plate 221, and when the second movement mechanism 222 works, the push rod extends or retracts along the cylinder body, and the positions of the cylinder body and the push rod are far away from and close to each other, so that the second calibration plate 221 is driven to move, and the distance between the second calibration plate 221 and the second functional module 02 is adjusted.

As shown in connection with fig. 1, 2, and 5, in some embodiments, the electronic device 100 further includes a touch detection module 03, a data interface module 04, and a wired charge-discharge module 05, where the touch detection module 03, the data interface module 04, and the wired charge-discharge module 05 are located on top of the electronic device 100.

The functional test platform further comprises a comprehensive test assembly 3 and a third movement mechanism 4, wherein the comprehensive test assembly 3 is connected to the third movement mechanism 4, and the third movement mechanism 4 can drive the comprehensive test assembly 3 to move.

When the electronic device 100 is at the test station 102, the third movement mechanism 4 can drive the comprehensive test assembly 3 to move to the top of the electronic device 100 to test at least one of the touch detection module 03, the data interface module 04 and the wired charge-discharge module 05.

For a plurality of modules simultaneously arranged on the top of the electronic device 100, the functional test platform of the embodiment adopts the comprehensive test assembly 3, and the comprehensive test assembly 3 is driven to move by using the third movement mechanism 4, so that when the comprehensive test assembly 3 moves to the top of the electronic device 100, the comprehensive test assembly 3 can be respectively contacted or connected with one or more of the plurality of modules, and a plurality of tests of a single station are realized.

In some possible implementations, the touch detection module 03 includes a touch sensor, which may also be referred to as a touch detector, that is a device that captures and records physical touches or hugs on the device and/or object that enable the device or object to detect touches, typically by a human user or operator.

In some possible implementations, the data interface module 04 includes, but is not limited to, SCSI (Small Computer System Interface) interface, DB interface, PS/2 interface, USB interface, type-C interface, lighting interface, dock interface, RJ interface, AV interface, DIN interface, VGA (Video Graphics Array) interface, DVI (Digital Visual Interface) interface.

Illustratively, when the integrated test component 3 is moved to the top of the electronic device 100, one or more of the touch detection module 03 connection, the data interface module 04, and the wired charge-discharge module 05 may be tested at the same time or time.

In some embodiments, the integrated test assembly 3 is provided with a plurality of test probes, and when the integrated test assembly 3 moves to the top of the electronic device 100, the plurality of test probes can be electrically connected with the electronic device 100 respectively.

The comprehensive test assembly 3 can be respectively connected with one or more of the touch detection module 03, the data interface module 04 and the wired charge-discharge module 05 by using different test probes for testing. When different signal sources are connected to different test probes, the properties of the test probes can be changed, so that the test probes have different test functions.

As shown in connection with fig. 1 and 5, in some embodiments, the electronic device 100 further includes a wireless charging module 06, where the wireless charging module 06 is located at the bottom of the electronic device 100.

The at least two test modules 2 include a third test module 23, the third test module 23 includes a charging coil 231 and a fourth movement mechanism 232, the charging coil 231 is connected with the fourth movement mechanism 232, and the fourth movement mechanism 232 can drive the charging coil 231 to move to the bottom of the electronic device 100 and be coupled with the wireless charging module 06.

The bottom of the electronic device 100 is further used for arranging a wireless charging module 06 for charging the electronic device 100. The third test module 23 includes a charging coil 231 located below the electronic device 100, and during testing, the fourth movement mechanism 232 drives the charging coil 231 to move upwards to be close to the wireless charging module 06, so that when the electronic device 100 can be charged normally, the wireless charging module 06 is indicated to be normal, otherwise, the wireless charging module 06 is indicated to be abnormal.

As shown in fig. 2 and 6, the functional test platform further includes a rack 5, where the rack 5 is used to support and fix the structures such as the transmission module 1 and the test module 2, and plays a role in protection. Optionally, a feeding and discharging hole 51 is provided in the region of the frame 5 corresponding to the feeding and discharging station 101 of the transmission module, and the electronic device 100 can be put into or taken out from the functional test platform by using a manual or handling tool.

On the other hand, the embodiment provides a test production line, which comprises the functional test platform.

The test production line of the embodiment adopts the functional test platform of the utility model, and has all the beneficial technical effects of all the embodiments.

It should be noted that references herein to "a number", "at least one" means one or more, and "a plurality", "at least two" means two or more. "and/or", describes an association relationship of an association object, and indicates that there may be three relationships, for example, a and/or B, and may indicate: a exists alone, A and B exist together, and B exists alone. The character "/" generally indicates that the context-dependent object is an "or" relationship.

It is noted that in the present utility model, unless explicitly specified and limited otherwise, a first feature "above" or "below" a second feature may include both the first and second features being in direct contact, as well as the first and second features not being in direct contact but rather being in contact with each other by way of further features therebetween. Moreover, a first feature being "above," "over" and "on" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature includes the first feature being directly under and obliquely below the second feature, or simply means that the first feature is less level than the second feature.

In the description of the present specification, reference to the terms "certain embodiments," "one embodiment," "some embodiments," "an exemplary embodiment," "an example," "a particular example," or "some examples" means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present utility model.

The foregoing description of the embodiments of the utility model is not intended to limit the utility model, but rather, the utility model is to be construed as limited to the embodiments disclosed.

Claims (10)

1. A functional test platform, characterized in that the functional test platform is suitable for functional testing of an electronic device (100), the electronic device (100) having at least a first functional module (01) and a second functional module (02);

the functional test platform comprises: a transfer module (1) and at least two test modules (2);

the conveying module (1) comprises a loading and unloading station (101) and a testing station (102), and the conveying module (1) is used for conveying the electronic equipment (100) between the loading and unloading station (101) and the testing station (102);

the at least two test modules (2) are respectively close to the test station (102), and the first functional module (01) and the second functional module (02) respectively correspond to at least one test module (2) in position;

the functional test platform is configured such that the at least two test modules (2) test the first functional module (01) and the second functional module (02) respectively, while the electronic device (100) is in the test station (102).

2. The functional test platform of claim 1, wherein the first functional module (01) is located on a first side of the electronic device (100) and the second functional module (02) is located on a second side of the electronic device (100);

the at least two test modules (2) comprise a first test module (21) facing the first side and a second test module (22) facing the second side.

3. The functional test platform of claim 2, wherein the first side is located at a bottom of the electronic device (100), the first test module (21) comprises a first calibration plate (211), and the first calibration plate (211) is movably located below the electronic device (100).

4. A functional test platform according to claim 3, characterized in that the first test module (21) further comprises a first movement mechanism (212), the first calibration plate (211) being connected to the first movement mechanism (212), the first movement mechanism (212) being capable of driving the first calibration plate (211) to move for adjusting the distance between the first calibration plate (211) and the first functional module (01).

5. The functional test platform of claim 2, wherein the second side is located at a front end of the electronic device (100), the second test module (22) comprises a second calibration plate (221), and the second calibration plate (221) is located in front of the electronic device (100).

6. The functional test platform of claim 5, wherein the second test module (22) further comprises a second movement mechanism (222), the second calibration plate (221) is connected to the second movement mechanism (222), and the second movement mechanism (222) can drive the second calibration plate (221) to move so as to adjust a distance between the second calibration plate (221) and the second functional module (02).

7. The functional test platform of claim 1, wherein the electronic device (100) further comprises a touch detection module (03), a data interface module (04), and a wired charge-discharge module (05), the touch detection module (03), the data interface module (04), and the wired charge-discharge module (05) being located on top of the electronic device (100);

the functional test platform further comprises a comprehensive test assembly (3) and a third movement mechanism (4), wherein the comprehensive test assembly (3) is connected to the third movement mechanism (4), and the third movement mechanism (4) can drive the comprehensive test assembly (3) to move;

when the electronic equipment (100) is located at the testing station (102), the third movement mechanism (4) can drive the comprehensive testing assembly (3) to move to the top of the electronic equipment (100) to test at least one of the touch detection module (03), the data interface module (04) and the wired charging and discharging module (05).

8. The functional test platform of claim 7, wherein the integrated test assembly (3) is provided with a plurality of test probes, which are capable of being electrically connected with the electronic device (100) when the integrated test assembly (3) is moved to the top of the electronic device (100), respectively.

9. The functional test platform of any one of claims 1 to 8, wherein the electronic device (100) further comprises a wireless charging module (06), the wireless charging module (06) being located at a bottom of the electronic device (100);

the at least two test modules (2) comprise a third test module (23), the third test module (23) comprises a charging coil (231) and a fourth movement mechanism (232), the charging coil (231) is connected with the fourth movement mechanism (232), and the fourth movement mechanism (232) can drive the charging coil (231) to move to the bottom of the electronic equipment (100) and be connected with the wireless charging module (06) in a coupling mode.

10. A test line comprising a functional test platform according to any one of claims 1 to 9.