CN219978457U - Automatic testing equipment for BGA chip - Google Patents
Automatic testing equipment for BGA chip Download PDFInfo
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- CN219978457U CN219978457U CN202320243979.XU CN202320243979U CN219978457U CN 219978457 U CN219978457 U CN 219978457U CN 202320243979 U CN202320243979 U CN 202320243979U CN 219978457 U CN219978457 U CN 219978457U
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Abstract
The utility model discloses automatic testing equipment for BGA chips, which comprises a frame, an X-axis driving mechanism, a main sucking and discharging mechanism, an auxiliary sucking and discharging mechanism, a beam mechanism and a Y-axis driving mechanism, wherein the X-axis driving mechanism is arranged on the frame; a first workbench and a second workbench are arranged on the machine frame, the first workbench is provided with a test piece storage area to be tested and a tested storage area, the second workbench is positioned in front of the first workbench, and at least two testing mechanisms are arranged on the second workbench; the main suction and discharge mechanism and the auxiliary suction and discharge mechanism are respectively arranged on the beam mechanism side by side left and right and move in the first workbench and the second workbench; the automatic feeding, automatic testing and automatic discharging of the BGA chip are realized, the overall automation degree is high, and the improvement of the testing efficiency is facilitated; particularly, after a testing mechanism finishes testing, the auxiliary suction and discharge mechanism firstly performs blanking, then the main suction and discharge mechanism performs feeding, so that the feeding and discharging time is shortened, and the testing efficiency is improved.
Description
Technical Field
The utility model relates to the technology in the field of automatic testing equipment of BGA chips, in particular to automatic testing equipment of BGA chips.
Background
The BGA chip is a chip packaged by BGA, the thickness of the BGA chip is reduced by more than 1/2 compared with that of a common QFP, the weight of the BGA chip is reduced by more than 3/4, and the BGA chip has the characteristics of improved electric heating performance, small parasitic parameter, small signal transmission delay, wide adaptation frequency, coplanar welding for assembly, high reliability and the like, so the BGA chip is widely applied to integrated circuits with high density, high performance and multiple pins and portable mobile terminals with higher requirements on volume and quality, such as tablet personal computers, PADs and the like.
The loading and unloading of current BGA test is generally gone up the unloading by the manual work, goes up unloading speed slowly, influences holistic test efficiency.
Accordingly, in the present patent application, the applicant has studied a BGA chip automatic test apparatus to solve the above-mentioned problems.
Disclosure of Invention
In view of the above, the utility model aims at the defects existing in the prior art, and mainly aims to provide an automatic testing device for BGA chips, which realizes automatic feeding, automatic testing and automatic discharging of the BGA chips, has higher overall automation degree and is beneficial to improving the testing efficiency; particularly, after a testing mechanism finishes testing, the auxiliary suction and discharge mechanism firstly performs blanking, then the main suction and discharge mechanism performs feeding, so that the feeding and discharging time is shortened, and the testing efficiency is improved.
In order to achieve the above purpose, the present utility model adopts the following technical scheme:
the automatic BGA chip testing equipment comprises a frame, an X-axis driving mechanism, a main sucking and discharging mechanism for sucking and discharging materials, an auxiliary sucking and discharging mechanism for sucking and discharging materials, a beam mechanism which is positioned above the frame and spans the frame along the X-axis direction, and a Y-axis driving mechanism for driving the beam mechanism to reciprocate along the Y-axis direction;
the Y-axis driving mechanism drives the beam mechanism to reciprocate in the front-back direction on the first workbench and the second workbench; the first workbench is provided with a to-be-tested test piece storage area and a tested storage area, the to-be-tested test piece storage area is provided with at least one first tray for storing to-be-tested test pieces, and the tested storage area is provided with at least one second tray for storing tested test pieces; the second workbench is positioned in front of the first workbench, and at least two testing mechanisms are arranged on the second workbench;
the main suction and discharge mechanism and the auxiliary suction and discharge mechanism are respectively arranged on the beam mechanism in a left-right side-by-side manner, the X-axis driving mechanism is in driving connection with the main suction and discharge mechanism and the auxiliary suction and discharge mechanism so as to enable the main suction and discharge mechanism and the auxiliary suction and discharge mechanism to reciprocate along the X-axis direction, and the main suction and discharge mechanism and the auxiliary suction and discharge mechanism move in the first workbench and the second workbench;
the device also comprises a main control unit, wherein the main control unit is respectively and electrically connected with the X-axis driving mechanism, the main sucking and discharging mechanism, the auxiliary sucking and discharging mechanism, the Y-axis driving mechanism and the testing mechanism.
As a preferable scheme, the Y-axis driving mechanism comprises a driving motor, a transmission mechanism, a Y-axis sliding rail arranged on the frame and a Y-axis translation sliding seat which can be arranged along the Y-axis sliding rail in a reciprocating displacement manner; the beam mechanism is arranged on the Y-axis translation sliding seat, the driving motor is connected with the transmission mechanism in a driving mode, and the transmission mechanism is connected with the Y-axis translation sliding seat.
As a preferred scheme, drive mechanism includes drive belt, auxiliary pulley and connecting block, and aforementioned driving motor's output shaft has the motor band pulley, the drive belt cover is located between motor band pulley and the auxiliary pulley in order to make motor band pulley and auxiliary pulley synchronous rotation, Y axial translation sliding seat is connected to the inboard of connecting block, the outside of drive belt is connected in the outside of connecting block.
As a preferable scheme, the front end and the rear end of the Y-axis sliding rail are respectively provided with a front stop block and a rear stop block, and the front end and the rear end of the Y-axis translational sliding seat are respectively limited by the corresponding front stop block and the rear stop block.
As a preferable scheme, a plurality of photoelectric switches distributed along the Y-axis at intervals are arranged on the rack, and a light blocking plate is arranged on the Y-axis translation sliding seat and slides along with the Y-axis translation sliding seat to block a light receiving opening of the corresponding photoelectric switch.
As a preferable scheme, the main suction and discharge mechanism comprises a lifting driving unit for driving the first suction nozzle to lift, the auxiliary suction and discharge mechanism comprises a second suction nozzle and a second lifting driving unit for driving the second suction nozzle to lift, and the main control unit is respectively and electrically connected with the first suction nozzle, the second suction nozzle, the lifting driving unit and the second lifting driving unit.
Compared with the prior art, the utility model has obvious advantages and beneficial effects, in particular:
the automatic feeding, automatic testing and automatic discharging of the BGA chip are realized through the matching of the main control unit, the X-axis driving mechanism, the main suction and discharge mechanism, the auxiliary suction and discharge mechanism, the Y-axis driving mechanism and the testing mechanism, the overall automation degree is higher, and the improvement of the testing efficiency is facilitated; particularly, after a testing mechanism finishes testing, the auxiliary suction and discharge mechanism firstly performs blanking, and then the main suction and discharge mechanism performs feeding, so that the feeding and discharging time is shortened, and the testing efficiency is improved;
secondly, the specific structural design of the Y-axis driving mechanism ensures that the whole testing equipment has better stability and reliability in the running process;
and the first workbench is provided with a test piece storage area to be tested and a tested storage area, so that feeding and discharging are facilitated, and feeding and discharging efficiency is improved.
In order to more clearly illustrate the structural features and efficacy of the present utility model, the present utility model will be described in detail below with reference to the accompanying drawings and examples.
Drawings
FIG. 1 is a schematic diagram of an embodiment of the present utility model.
The attached drawings are used for identifying and describing:
10. rack
101. First table 102, second table
103. First tray 104, second tray
20. X-axis driving mechanism
30. Main suction and discharge mechanism
31. First suction nozzle 32, first lifting drive unit
40. Auxiliary sucking and releasing mechanism
41. Second suction nozzle 42, second lifting drive unit
50. Beam mechanism 60, Y-axis drive mechanism
61. Driving motor 611 and motor belt wheel
62. Y-axis sliding rail
621. Front block 622, rear block
63. Y-axis translation sliding seat 631 and light barrier
641. Drive belt 642, auxiliary pulley
643. Connecting block
65. Photoelectric switch 70, test mechanism.
Detailed Description
Referring to fig. 1, a specific structure of an embodiment of the utility model is shown, and an automatic BGA chip testing apparatus includes a frame 10, an X-axis driving mechanism 20, a main control unit, a main suction and discharge mechanism 30 for sucking and discharging materials, an auxiliary suction and discharge mechanism 40 for sucking and discharging materials, a beam mechanism 50 located above the frame 10 and crossing the frame 10 along the X-axis direction, and a Y-axis driving mechanism 60 for driving the beam mechanism 50 to reciprocate along the Y-axis direction.
The machine frame 10 is provided with a first workbench 101 for storing a test piece to be tested and a tested test piece and a second workbench 102 for testing, the first workbench 101 is provided with a test piece storage area to be tested and a tested storage area, the test piece storage area to be tested is provided with at least one first tray 103 for storing the test piece to be tested, and the tested storage area is provided with at least one second tray 104 for storing the tested test piece; the second workbench 102 is located in front of the first workbench 101, and at least two test mechanisms 70 are arranged on the second workbench 102; the main control unit is electrically connected to the X-axis driving mechanism 20, the main suction and discharge mechanism 30, the auxiliary suction and discharge mechanism 40, the Y-axis driving mechanism 60 and the testing mechanism 70, respectively.
The Y-axis driving mechanism 60 drives the beam mechanism 50 to reciprocate on the first workbench 101 and the second workbench 102 along the front-back direction;
the main suction and discharge mechanism 30 and the auxiliary suction and discharge mechanism 40 are respectively arranged on the beam mechanism 50 side by side left and right, the X-axis driving mechanism 20 is in driving connection with the main suction and discharge mechanism 30 and the auxiliary suction and discharge mechanism 40 so as to enable the main suction and discharge mechanism 30 and the auxiliary suction and discharge mechanism 40 to reciprocate along the X-axis direction, and the main suction and discharge mechanism 30 and the auxiliary suction and discharge mechanism 40 move in the first workbench 101 and the second workbench 102.
In this embodiment, the main suction and discharge mechanism 30 includes a first suction nozzle 31, a first lifting driving unit 32 for driving the first suction nozzle 31 to lift, the auxiliary suction and discharge mechanism 40 includes a second suction nozzle 41, and a second lifting driving unit 42 for driving the second suction nozzle 41 to lift, and the main control unit is electrically connected to the first suction nozzle 31, the second suction nozzle 41, the first lifting driving unit 32, and the second lifting driving unit 42, respectively. The auxiliary suction and discharge mechanism 40 is used for removing the tested test piece located on the test mechanism 70 before feeding the test piece to be tested.
In this embodiment, the Y-axis driving mechanism 60 includes a driving motor 61, a transmission mechanism, a Y-axis sliding rail 62 disposed on the frame 10, and a Y-axis translational sliding seat 63 mounted along the Y-axis sliding rail 62 in a reciprocally displaceable manner; the beam mechanism 50 is disposed on the Y-axis translational sliding seat 63, and the front and rear ends of the Y-axis sliding rail 62 are respectively provided with a front stop 621 and a rear stop, and the front and rear ends of the Y-axis translational sliding seat 63 are respectively limited by the corresponding front stop 621 and rear stop 622.
The main control unit is electrically connected to the driving motor 61, the driving motor 61 is in driving connection with a transmission mechanism, and the transmission mechanism is connected with the Y-axis translation sliding seat 63. The transmission mechanism comprises a transmission belt 641, an auxiliary pulley 642 and a connecting block 643, the output shaft of the driving motor 61 is connected with the motor pulley 611, the transmission belt 641 is sleeved between the motor pulley 611 and the auxiliary pulley 642 to enable the motor pulley 611 and the auxiliary pulley 642 to synchronously rotate, the inner side of the connecting block 643 is connected with the Y-axis translation sliding seat 63, and the outer side of the connecting block 643 is connected with the outer side of the transmission belt 641.
The frame 10 is provided with a plurality of photoelectric switches 65 distributed along the Y-axis at intervals, the Y-axis translation sliding seat 63 is provided with a light barrier 631, and the light barrier 631 slides along with the Y-axis translation sliding seat 63 to block the light receiving opening of the corresponding photoelectric switch 65.
The following generally describes the following working principles: (two test mechanisms 70, two main suction and discharge mechanisms 30 and an auxiliary suction and discharge mechanism 40 are illustrated as examples)
Before testing, the main control unit drives the two main sucking and discharging mechanisms 30 to the first tray 103 to suck the test piece to be tested respectively by controlling the X-axis driving mechanism 20 and the Y-axis driving mechanism 60, and then moves to the corresponding testing mechanism 70 to test the test piece respectively;
after the test operation of any test mechanism 70 is completed, the test mechanism 70 sends a test completion signal to the main control unit, and the main control unit drives the two main suction and discharge mechanisms 30 to the first tray 103 to respectively suck the test piece to be tested by controlling the X-axis driving mechanism 20 and the Y-axis driving mechanism 60, so that the auxiliary suction and discharge mechanism 40 is empty; then, the main control unit goes to the position of the testing mechanism 70 with the testing operation completed, the auxiliary sucking and discharging mechanism 40 takes away the tested test piece on the testing mechanism 70 with the testing operation completed, wherein a main sucking and discharging mechanism 30 places the test piece to be tested on the testing mechanism 70 with the testing operation completed;
then, if the other testing mechanism 70 also completes the testing operation, one of the main sucking and discharging mechanisms 30 takes away the tested piece on the other testing mechanism 70 which completes the testing operation, and the other main sucking and discharging mechanism 30 places the tested piece on the testing mechanism 70 which completes the testing operation;
otherwise, the auxiliary suction and discharge mechanism 40 discharges the tested part to the second tray 104, and the empty main suction and discharge mechanism 30 to the first tray 103 sucks the tested part to wait for the test operation of the test mechanism 70 to be completed.
The utility model mainly realizes automatic feeding, automatic testing and automatic discharging of BGA chips by matching the main control unit, the X-axis driving mechanism, the main suction and discharge mechanism, the auxiliary suction and discharge mechanism, the Y-axis driving mechanism and the testing mechanism, has higher integral automation degree and is beneficial to improving the testing efficiency; particularly, after a testing mechanism finishes testing, the auxiliary suction and discharge mechanism firstly performs blanking, and then the main suction and discharge mechanism performs feeding, so that the feeding and discharging time is shortened, and the testing efficiency is improved;
secondly, the specific structural design of the Y-axis driving mechanism ensures that the whole testing equipment has better stability and reliability in the running process;
and the first workbench is provided with a test piece storage area to be tested and a tested storage area, so that feeding and discharging are facilitated, and feeding and discharging efficiency is improved.
The foregoing description is only a preferred embodiment of the present utility model, and is not intended to limit the technical scope of the present utility model, so any minor modifications, equivalent changes and modifications made to the above embodiments according to the technical principles of the present utility model are still within the scope of the technical solutions of the present utility model.
Claims (6)
1. An automatic testing equipment of BGA chip, its characterized in that: the automatic feeding device comprises a frame, an X-axis driving mechanism, a main suction and discharge mechanism for sucking and discharging materials, an auxiliary suction and discharge mechanism for sucking and discharging materials, a beam mechanism which is positioned above the frame and spans the frame along the X-axis direction, and a Y-axis driving mechanism for driving the beam mechanism to reciprocate along the Y-axis direction;
the Y-axis driving mechanism drives the beam mechanism to reciprocate in the front-back direction on the first workbench and the second workbench; the first workbench is provided with a to-be-tested test piece storage area and a tested storage area, the to-be-tested test piece storage area is provided with at least one first tray for storing to-be-tested test pieces, and the tested storage area is provided with at least one second tray for storing tested test pieces; the second workbench is positioned in front of the first workbench, and at least two testing mechanisms are arranged on the second workbench;
the main suction and discharge mechanism and the auxiliary suction and discharge mechanism are respectively arranged on the beam mechanism in a left-right side-by-side manner, the X-axis driving mechanism is in driving connection with the main suction and discharge mechanism and the auxiliary suction and discharge mechanism so as to enable the main suction and discharge mechanism and the auxiliary suction and discharge mechanism to reciprocate along the X-axis direction, and the main suction and discharge mechanism and the auxiliary suction and discharge mechanism move in the first workbench and the second workbench;
the device also comprises a main control unit, wherein the main control unit is respectively and electrically connected with the X-axis driving mechanism, the main sucking and discharging mechanism, the auxiliary sucking and discharging mechanism, the Y-axis driving mechanism and the testing mechanism.
2. The BGA chip automatic test apparatus of claim 1, wherein: the Y-axis driving mechanism comprises a driving motor, a transmission mechanism, a Y-axis sliding rail arranged on the frame and a Y-axis translation sliding seat which can be arranged along the Y-axis sliding rail in a reciprocating displacement manner; the beam mechanism is arranged on the Y-axis translation sliding seat, the driving motor is connected with the transmission mechanism in a driving mode, and the transmission mechanism is connected with the Y-axis translation sliding seat.
3. The BGA chip automatic test apparatus of claim 2, wherein: the transmission mechanism comprises a transmission belt, an auxiliary belt pulley and a connecting block, wherein an output shaft of the driving motor is connected with the motor belt pulley, the transmission belt is sleeved between the motor belt pulley and the auxiliary belt pulley so that the motor belt pulley and the auxiliary belt pulley synchronously rotate, the inner side of the connecting block is connected with a Y-axis translation sliding seat, and the outer side of the connecting block is connected with the outer side of the transmission belt.
4. The BGA chip automatic test apparatus of claim 2, wherein: the front end and the rear end of the Y-axis sliding rail are respectively provided with a front stop block and a rear stop block, and the front end and the rear end of the Y-axis translation sliding seat are respectively limited by the corresponding front stop block and the rear stop block.
5. The BGA chip automatic test apparatus of claim 1, wherein: the frame is provided with a plurality of photoelectric switches distributed along the Y axial direction at intervals, the Y axial direction translation sliding seat is provided with a light blocking plate, and the light blocking plate slides along with the Y axial direction translation sliding seat to block a light receiving port of the corresponding photoelectric switch.
6. The BGA chip automatic test apparatus of claim 1, wherein: the main suction and discharge mechanism comprises a first suction nozzle, a lifting driving unit for driving the first suction nozzle to lift, the auxiliary suction and discharge mechanism comprises a second suction nozzle and a second lifting driving unit for driving the second suction nozzle to lift, and the main control unit is respectively and electrically connected with the first suction nozzle, the second suction nozzle, the lifting driving unit and the second lifting driving unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320243979.XU CN219978457U (en) | 2023-02-17 | 2023-02-17 | Automatic testing equipment for BGA chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320243979.XU CN219978457U (en) | 2023-02-17 | 2023-02-17 | Automatic testing equipment for BGA chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219978457U true CN219978457U (en) | 2023-11-07 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320243979.XU Active CN219978457U (en) | 2023-02-17 | 2023-02-17 | Automatic testing equipment for BGA chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219978457U (en) |
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2023
- 2023-02-17 CN CN202320243979.XU patent/CN219978457U/en active Active
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