CN216979134U

CN216979134U - Multifunctional chip testing device

Info

Publication number: CN216979134U
Application number: CN202123188700.2U
Authority: CN
Inventors: 代彬; 姜豪
Original assignee: Jiangsu Haina Electronic Technology Co ltd
Current assignee: Jiangsu Haina Electronic Technology Co ltd
Priority date: 2021-12-17
Filing date: 2021-12-17
Publication date: 2022-07-15
Anticipated expiration: 2031-12-17

Abstract

The utility model discloses a multifunctional chip testing device which comprises a workbench, wherein a testing machine is fixed on one side of the upper surface of the workbench, a first air cylinder is arranged at the bottom end of the testing machine, a probe structure is arranged at the bottom end of the first air cylinder, a rotary table structure is arranged on the upper surface of the workbench, and a supporting frame is fixed on one side, away from the testing machine, of the upper surface of the workbench. According to the utility model, the workbench, the testing machine, the probe structure, the rotary table structure, the guide rail, the linear motor, the second cylinder, the sucker, the first collecting box, the second collecting box and the feeding structure are arranged, so that the chips can be fed through the feeding structure, then the chips on the feeding structure are conveyed to the surface of the disc of the rotary table structure through the linear motor, the second cylinder and the sucker, the disc can rotate circularly under the driving of the first motor, the chips in the two positioning grooves on the surface of the disc rotate to the bottom of the probe structure in turn for testing, the testing can be continuously carried out, and the detection efficiency is greatly improved.

Description

Multifunctional chip testing device

Technical Field

The utility model relates to the technical field of multifunctional chip testing, in particular to a multifunctional chip testing device.

Background

In the production process of the microprocessor chip, in order to ensure that each performance of the chip reaches an index, the chip needs to be tested in detail, and at this time, a testing device needs to be used for testing the chip.

However, when the existing device for testing the chip is used, the chip needs to be fixed at the bottom of the test probe, and then after the test is completed, the chip is taken down and replaced again for fixation, so that a certain time is delayed by feeding and discharging, and the chip cannot be continuously tested by the same testing device, and the testing efficiency is not high. Secondly, when the test probe descends to contact with the chip, the test probe is directly and rigidly pressed on the chip, and the chip is easy to damage, so the utility model provides a multifunctional chip test device.

SUMMERY OF THE UTILITY MODEL

The utility model aims to solve the defects in the prior art and provides a multifunctional chip testing device.

In order to achieve the purpose, the utility model adopts the following technical scheme: a multifunctional chip testing device comprises a workbench, a testing machine is fixed on one side of the upper surface of the workbench, a first air cylinder is arranged at the bottom end of the testing machine, a probe structure is arranged at the bottom end of the first cylinder, a turntable structure is arranged on the upper surface of the workbench, a support frame is fixed on one side of the upper surface of the workbench, which is far away from the testing machine, a guide rail is fixed at the top end of the support frame, a linear motor is connected on the surface of the guide rail in a sliding way, a second cylinder is fixed on the outer side wall of the linear motor, a sucker is fixed at the telescopic end of the bottom of the second cylinder, four supporting legs are fixed on the lower surface of the workbench, and the bottom ends of the four supporting legs are jointly fixed with a bottom plate, the workbench is positioned below the guide rail and is provided with an opening, the upper surface of the bottom plate is provided with a first collecting box and a second collecting box below the opening, and the bottom end of the opening is provided with a feeding structure close to the second collecting box.

Furthermore, the probe structure comprises a fixed plate and a buffer plate, the fixed plate is fixedly connected with the telescopic end of the first air cylinder, guide rods are fixed on two sides of the upper surface of the buffer plate, the top ends of the guide rods penetrate through the fixed plate and are in sliding connection with the fixed plate, springs are fixedly connected between the buffer plate and the fixed plate together, a probe body is fixed on the lower surface of the buffer plate, and the probe body is electrically connected with the testing machine, so that when the first air cylinder drives the probe body to descend, the springs can play a certain buffering role, the probes cannot be in hard contact with chips, and the probes are prevented from damaging the chips.

Further, the revolving stage structure includes disc and first motor, and first motor and workstation lower surface fixed connection, first motor drive shaft passes workstation and disc lower surface fixed connection, is convenient for drive the disc through first motor and rotates.

Furthermore, two positioning grooves are formed in two sides of the upper surface of the disc, so that the chip can be fixed in the positioning grooves, and the two positioning grooves rotate to the position under the probe body in turn.

Furthermore, the sucker is communicated with an external suction pump, so that the sucker can be conveniently grabbed by the sucker.

Furthermore, the feeding structure comprises a feeding box and a second motor, the second motor is fixedly connected with the bottom plate, a placing plate is connected inside the feeding box in a sliding mode, a strip-shaped opening is formed in one side, away from the second collecting box, of the feeding box, a connecting plate is fixed to one side, close to the strip-shaped opening, of the placing plate, the connecting plate penetrates through the strip-shaped opening and extends to the outer side of the feeding box, a lead screw is fixed to the driving end of the second motor, penetrates through the connecting plate and is connected with the connecting plate in a threaded rotating mode, the lead screw is driven to rotate through the second motor, and therefore the placing plate can ascend or descend inside the feeding box.

Furthermore, a side door is rotatably connected to one side of the outer side wall of the feeding box, and chips can be placed on the surface of the placing plate by opening the side door.

The utility model has the beneficial effects that:

1. when the test table is used, the test machine, the probe structure, the rotary table structure, the guide rail, the linear motor, the second cylinder, the sucker, the first collecting box, the second collecting box and the feeding structure are arranged, so that a chip can be fed through the feeding structure, then the chip on the feeding structure is fed to the surface of the disc of the rotary table structure through the linear motor, the second cylinder and the sucker, the disc can rotate circularly under the driving of the first motor, and the chips in the two positioning grooves on the surface of the disc rotate to the bottom of the probe structure in turn to be tested, so that the test can be continuously carried out, and the detection efficiency is greatly improved.

2. When the probe structure is used, the probe structure comprises the fixing plate, the buffer plate, the guide rod, the spring and the probe body, so that when the first cylinder drives the probe structure to descend and is communicated with a chip, the probe body can be in flexible connection with the chip under the buffer of the spring, and the chip cannot be crushed.

Drawings

FIG. 1 is a perspective view of the present invention;

FIG. 2 is a main sectional view of the present invention;

fig. 3 is an enlarged view of the utility model at a.

Illustration of the drawings:

1. a work table; 101. an opening; 2. a testing machine; 3. a first cylinder; 4. a probe structure; 41. a fixing plate; 42. a buffer plate; 43. a guide bar; 44. a spring; 45. a probe body; 5. a turntable structure; 51. a disc; 52. positioning a groove; 53. a first motor; 6. a support frame; 7. a guide rail; 8. a linear motor; 9. a second cylinder; 10. a suction cup; 11. supporting legs; 12. a base plate; 13. a first collection tank; 14. a second collection tank; 15. a feeding structure; 151. a feeding box; 152. placing the plate; 153. a strip-shaped opening; 154. a connecting plate; 155. a second motor; 156. and a screw rod.

Detailed Description

As shown in figure 1, the multifunctional chip testing device comprises a workbench 1, a testing machine 2 is fixed on one side of the upper surface of the workbench 1, a first air cylinder 3 is arranged at the bottom end of the testing machine 2, a probe structure 4 is arranged at the bottom end of the first air cylinder 3, a turntable structure 5 is arranged on the upper surface of the workbench 1, a support frame 6 is fixed on one side of the upper surface of the workbench 1 away from the testing machine 2, a guide rail 7 is fixed at the top end of the support frame 6, a linear motor 8 is connected on the surface of the guide rail 7 in a sliding manner, a second air cylinder 9 is fixed on the outer side wall of the linear motor 8, a sucker 10 is fixed at the telescopic end of the bottom of the second air cylinder 9, four supporting legs 11 are fixed on the lower surface of the workbench 1, a bottom plate 12 is fixed at the bottom ends of the four supporting legs together, an opening 101 is arranged below the guide rail 7 of the workbench 1, a first collecting box 13 and a second collecting box 14 are arranged below the opening 101 on the upper surface of the bottom plate 12, the bottom end of the opening 101 is provided with a feeding structure 15 near the second collecting box 14. The suction cup 10 is in communication with an external suction pump.

As shown in fig. 2 and 3, the probe structure 4 includes a fixing plate 41 and a buffer plate 42, the fixing plate 41 is fixedly connected to the telescopic end of the first cylinder 3, guide rods 43 are fixed to two sides of the upper surface of the buffer plate 42, the top ends of the guide rods 43 pass through the fixing plate 41 and are slidably connected to the fixing plate 41, a spring 44 is fixedly connected between the buffer plate 42 and the fixing plate 41, a probe body 45 is fixed to the lower surface of the buffer plate 42, and the probe body 45 is electrically connected to the testing machine 2. The turntable structure 5 comprises a disc 51 and a first motor 53, the first motor 53 is fixedly connected with the lower surface of the workbench 1, and a driving shaft of the first motor 53 penetrates through the workbench 1 and is fixedly connected with the lower surface of the disc 51. Two positioning grooves 52 are formed on both sides of the upper surface of the disc 51. The feeding structure 15 comprises a feeding box 151 and a second motor 155, the second motor 155 is fixedly connected with the bottom plate 12, a placing plate 152 is connected inside the feeding box 151 in a sliding mode, a strip-shaped opening 153 is formed in one side, away from the second collecting box 14, of the feeding box 151, a connecting plate 154 is fixed on one side, close to the strip-shaped opening 153, of the placing plate 152, the connecting plate 154 penetrates through the strip-shaped opening 153 and extends to the outer side of the feeding box 151, a driving end of the second motor 155 is fixed with a lead screw 156, and the lead screw 156 penetrates through the connecting plate 154 and is in threaded rotating connection with the connecting plate 154. A side door is rotatably connected to one side of the outer side wall of the feeding box 151.

When in use: opening a side door at one side of a feeding box 151, stacking chips on the surface of a placing plate 152 and closing the side door, driving a second cylinder 9 to transversely move to the position right above the feeding box 151 by a linear motor 8 during testing, driving a sucking disc 10 to descend by the second cylinder 9 to adsorb and grab the chips, shortening and resetting the second cylinder 9 after the chip grabbing is finished, driving the second cylinder 9 to move to the position right above a positioning groove 52 at the left side of the surface of a disc 51 by the linear motor 8, extending the second cylinder 9, placing the chips in the positioning groove 52, rotating a first motor 53 by one hundred eighty degrees to enable the positioning groove 52 at the left side to rotate to the position right below a probe body 45, driving the probe structure 4 to descend by a first cylinder 3 at the moment, enabling the probe body 45 to be communicated with the chips, and automatically testing by a testing machine 2 (the testing machine 2 is the prior art, and the working principle is not repeated), meanwhile, the second motor 155 drives the screw rod 156 to rotate, so that the connecting plate 154 drives the placing plate 152 to ascend by the thickness of one chip, feeding of the chip is achieved, at the moment, the linear motor 8 and the second cylinder 9 continue to drive the suction cup 10 to descend, grab a new chip and place the new chip in the positioning groove 52 on the left side of the surface of the disc 51, after the last chip is tested, the first motor 53 continues to rotate by one hundred and eighty degrees, the tested chip returns to the left side, and the chip which is just put in can rotate to the position below the probe body 45 for immediately testing. Then the linear motor 8 and the second cylinder 9 are matched to take out the chip in the tested left positioning slot 52, and if the chip test is passed, the chip is put into the first collection box 13 through the linear motor 8 and the second cylinder 9, and if the chip is not passed, the chip is put into the second collection box 14. And then circulating the operation and carrying out continuous testing.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the utility model, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims

1. The utility model provides a multi-functional chip testing arrangement, includes workstation (1), its characterized in that: a testing machine (2) is fixed on one side of the upper surface of the workbench (1), a first air cylinder (3) is arranged at the bottom end of the testing machine (2), a probe structure (4) is arranged at the bottom end of the first air cylinder (3), a rotary table structure (5) is arranged on the upper surface of the workbench (1), a support frame (6) is fixed on one side, away from the testing machine (2), of the upper surface of the workbench (1), a guide rail (7) is fixed at the top end of the support frame (6), a linear motor (8) is connected to the surface of the guide rail (7) in a sliding manner, a second air cylinder (9) is fixed on the outer side wall of the linear motor (8), a sucker (10) is fixed at the telescopic end of the bottom of the second air cylinder (9), four supporting legs (11) are fixed on the lower surface of the workbench (1), a bottom plate (12) is fixed at the bottoms of the four supporting legs (11) together, and an opening (101) is formed below the guide rail (7) in the workbench (1), the upper surface of the bottom plate (12) is provided with a first collecting box (13) and a second collecting box (14) below the opening (101), and a feeding structure (15) is arranged at the bottom end of the opening (101) close to the second collecting box (14).

2. The multifunctional chip testing device according to claim 1, wherein: the probe structure (4) comprises a fixing plate (41) and a buffer plate (42), the fixing plate (41) is fixedly connected with the telescopic end of the first cylinder (3), guide rods (43) are fixed on two sides of the upper surface of the buffer plate (42), the top ends of the guide rods (43) penetrate through the fixing plate (41) and are in sliding connection with the fixing plate (41), springs (44) are fixedly connected between the buffer plate (42) and the fixing plate (41) together, a probe body (45) is fixed on the lower surface of the buffer plate (42), and the probe body (45) is electrically connected with the testing machine (2).

3. The multifunctional chip testing device according to claim 1, wherein: the turntable structure (5) comprises a disc (51) and a first motor (53), the first motor (53) is fixedly connected with the lower surface of the workbench (1), and a driving shaft of the first motor (53) penetrates through the workbench (1) to be fixedly connected with the lower surface of the disc (51).

4. The multifunctional chip testing device according to claim 3, wherein: two positioning grooves (52) are formed in two sides of the upper surface of the disc (51).

5. The multifunctional chip testing device according to claim 1, wherein: the sucker (10) is communicated with an external suction pump.

6. The multifunctional chip testing device according to claim 1, wherein: the feeding structure (15) comprises a feeding box (151) and a second motor (155), the second motor (155) is fixedly connected with the bottom plate (12), a placing plate (152) is connected to the inside of the feeding box (151) in a sliding mode, a strip-shaped opening (153) is formed in one side, away from the second collecting box (14), of the feeding box (151), a connecting plate (154) is fixed to one side, close to the strip-shaped opening (153), of the placing plate (152), the connecting plate (154) penetrates through the strip-shaped opening (153) and extends to the outer side of the feeding box (151), a screw rod (156) is fixed to a driving end of the second motor (155), and the screw rod (156) penetrates through the connecting plate (154) and is in threaded rotation connection with the connecting plate (154).

7. The multifunctional chip testing device according to claim 6, wherein: and one side of the outer side wall of the feeding box (151) is rotatably connected with a side door.