CN219836834U - Integrated chip detection device - Google Patents
Integrated chip detection device Download PDFInfo
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- CN219836834U CN219836834U CN202320989881.9U CN202320989881U CN219836834U CN 219836834 U CN219836834 U CN 219836834U CN 202320989881 U CN202320989881 U CN 202320989881U CN 219836834 U CN219836834 U CN 219836834U
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- conveyor belt
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- integrated chip
- retrieve
- detection
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- 238000001514 detection method Methods 0.000 title claims abstract description 65
- 238000011084 recovery Methods 0.000 claims abstract description 47
- 238000012360 testing method Methods 0.000 claims description 13
- 239000000523 sample Substances 0.000 claims description 10
- 238000000034 method Methods 0.000 abstract description 7
- 230000008569 process Effects 0.000 abstract description 4
- 238000007689 inspection Methods 0.000 abstract 1
- 230000009471 action Effects 0.000 description 3
- 238000011990 functional testing Methods 0.000 description 2
- WSNMPAVSZJSIMT-UHFFFAOYSA-N COc1c(C)c2COC(=O)c2c(O)c1CC(O)C1(C)CCC(=O)O1 Chemical compound COc1c(C)c2COC(=O)c2c(O)c1CC(O)C1(C)CCC(=O)O1 WSNMPAVSZJSIMT-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000005856 abnormality Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Abstract
The utility model discloses an integrated chip detection device which comprises a base, wherein a conveyor belt structure is arranged at the top end of the base, 2 brackets are arranged at two sides of the top end of the base, a first detection structure is arranged at the top of a bracket at the left side, a second detection structure is arranged at the top of a bracket at the right side, 2 recovery structures are arranged at the top of the base, the 2 recovery structures are respectively arranged at the right sides of the 2 brackets, the conveyor belt structure comprises a conveyor belt bracket and a conveyor belt, a plurality of groups of positioning grooves are formed in the outer surface of the conveyor belt, each group of positioning grooves comprises 5 pairs of positioning grooves, a plurality of groups of rotating plates are arranged at one side of the outer surface of the conveyor belt, and each group of rotating plates corresponds to each group of positioning grooves. The utility model discloses be provided with two detection structures simultaneously, can once only accomplish two inspections of integrated chip. And meanwhile, the positioning groove and the rotating plate are arranged, so that the position of the integrated chip cannot deviate in the detection process.
Description
Technical Field
The utility model relates to the field of chip detection, in particular to an integrated chip detection device.
Background
An integrated chip is a microelectronic device or component, and is mainly used for integrating a circuit on a tiny silicon wafer, and is a key component in electronic equipment. Integrated chips are now widely used in the development of various electronic products. But the production to the point of use of an integrated chip necessarily requires passing the test. Chip tests that are common to date include performance tests, functional tests, reliability tests, and the like.
The existing chip detection device has the following defects: the existing detection device has single detection function, a chip generally needs multiple tests, the chip position is easy to deviate in the test process, and the detection result can be influenced after the deviation of the chip, namely the object with high precision and small volume.
Disclosure of Invention
The present utility model is directed to an integrated chip testing device, which solves the above-mentioned problems of the related art.
In order to achieve the above purpose, the present utility model provides the following technical solutions: the utility model provides an integrated chip detection device, includes the base, the conveyer belt structure is installed on the top of base, 2 supports are installed to the both sides on base top, detect structure one is installed at the top of off-left side support, detect structure two is installed at the top of off-right side support, 2 recovery structures are installed at the top of base, and 2 recovery structures are on the right side of 2 supports respectively, the conveyer belt structure includes conveyer belt support and conveyer belt, the surface of conveyer belt is provided with multiunit constant head tank, and every constant head tank contains 5 pairs of constant head tanks, multiunit rotor plate is installed to one side of conveyer belt outer surface, every group the rotor plate is corresponding with every constant head tank.
Preferably, the bottom of the conveyor belt support is connected with the top of the base, the inner walls of the two sides of the conveyor belt support are connected with the conveyor belt, and one side of the conveyor belt is connected with a motor.
Preferably, the first detection structure comprises a functional detection box and 5 functional detection probes, wherein the bottom of the functional detection box is connected with a bracket on the left side, and 5 functional detection probes are connected with the bottom of the functional detection box.
Preferably, the detection structure II comprises an environment changing box and a telescopic plate, and the inner wall of the environment changing box is connected with the telescopic plate.
Preferably, the rotor plate includes fixing base, 2 rotation locating plates, the bottom of fixing base is connected with one side of the surface of conveyer belt, the both sides of fixing base are connected with 2 rotation locating plates respectively, fixing base internally mounted has the motor.
Preferably, the recovery structure comprises a recovery controller, 5 recovery clamps and a recovery bracket, the recovery bracket is installed at the top of the base, the recovery controller is installed at the top of the recovery bracket, the bottom of the recovery controller is connected with 5 recovery clamps, the inside of the recovery controller is provided with a receiving module and a control motor, and the recovery controller is externally connected with a power supply.
Compared with the prior art, the utility model has the beneficial effects that:
1. the utility model discloses two supports are installed at the top of base, and wherein the base top is by installing detection structure one on the left support, and detection structure one carries out the functional test to integrated chip, installs detection structure two on the support of base top by the right side, and detection structure two carries out the reliability test to integrated chip. And the right sides of the first detection structure and the second detection structure are respectively provided with a recovery structure, so that unqualified synthetic chips are recovered, and the chips can be subjected to various detection and separated from qualified chips.
2. The utility model discloses install multiunit constant head tank and multiunit rotor plate, detect the time measuring to integrated chip, at first place integrated chip in the constant head tank, guarantee that integrated chip can not take place to control the skew, the rotatory locating plate in the motor control adjustment rotor plate makes the bottom of rotatory locating plate parallel with the top of base, and 2 rotatory locating plate is inboard apart from one side that is near, the inboard of rotatory locating plate and the outer wall connection of constant head tank for the chip can not take place to the skew around the in-process that detects.
Drawings
FIG. 1 is a schematic view of the external structure of the present utility model;
FIG. 2 is a schematic view of the outer structure of a rotating plate;
FIG. 3 is a schematic side view of the present utility model;
in the figure: 1. a base; 2. a conveyor belt structure; 3. a bracket; 4. detecting a first structure; 5. detecting a second structure; 6. a recovery structure; 7. a conveyor belt support; 8. a conveyor belt; 9. a positioning groove; 10. a rotating plate; 11. a fixing seat; 12. rotating the positioning plate; 13. a function detection box; 14. a functional detection probe; 15. an environment change box; 16. a retractable plate; 17. a recovery controller; 18. a recovery clamp; 19. and (5) recovering the bracket.
Detailed Description
The following description of the embodiments of the present utility model will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.
Referring to fig. 1-3, the utility model provides a technical scheme that an integrated chip detection device comprises a base 1, wherein a conveyor belt structure 2 is arranged at the top end of the base 1, 2 brackets 3 are arranged at two sides of the top end of the base 1, a first detection structure 4 is arranged at the top of a bracket 3 on the left side, a second detection structure 5 is arranged at the top of a bracket 3 on the right side, 2 recovery structures 6 are arranged at the top of the base 1, the 2 recovery structures 6 are respectively arranged on the right side of the 2 brackets 3, the conveyor belt structure 2 comprises a conveyor belt bracket 7 and a conveyor belt 8, a plurality of groups of positioning grooves 9 are arranged on the outer surface of the conveyor belt 8, each group of positioning grooves 9 comprise 5 pairs of positioning grooves 9, a plurality of groups of rotating plates 10 are arranged on one side of the outer surface of the conveyor belt 8, and each group of rotating plates 10 corresponds to each group of positioning grooves 9.
The bottom of conveyer belt support 7 is connected with the top of base 1, and conveyer belt support 7's both sides inner wall is connected with conveyer belt 8, and one side of conveyer belt 8 is connected with the motor, and the motor is the control motor, and built-in receiving module, can open and close the motor according to the signal of receiving.
The first detection structure 4 comprises a functional detection box 13 and 5 functional detection probes 14, the bottom of the functional detection box 13 is connected with the support 3 on the left side, the 5 functional detection probes 14 are connected with the bottom of the functional detection box 13, the functional detection box 13 comprises a detection device, an inductor, a transmitting module and a controller, when the inductor senses that a chip arrives, the controller controls the functional detection probes 14 to stretch and contact the chip, the detection device starts to detect through the contact of the functional detection probes 14, when the chip is found to have a fault, an electric signal is sent to the recovery structure on the right side of the first detection structure 4, and when the inductor senses that the chip arrives, the sensor simultaneously transmits a signal to the conveyor belt 8.
The second detection structure 5 comprises an environment changing box 15 and a telescopic plate 16, wherein the inner wall of the environment changing box 15 is connected with the telescopic plate 16, the inside of the environment changing box 15 comprises a controller, an inductor and a transmitting module, after the inductor senses that a chip enters, the controller controls the telescopic plate 16 to stretch so that the chip is in a relatively sealed environment, and reliability test is carried out on the chip. If a problem with one or more chips is detected, an electrical signal is sent to the recovery structure 6 on the right and when the sensor senses the chip entry, a signal is simultaneously sent to the conveyor belt 8.
The rotating plate 10 comprises a fixed seat 11 and 2 rotating positioning plates 12, the bottom of the fixed seat 11 is connected with one side of the outer surface of the conveyor belt 8, 2 rotating positioning plates 12 are respectively connected with two sides of the fixed seat 11, a motor is arranged in the fixed seat 11 and is a control motor with a signal receiving module, the rotating positioning plates 12 are controlled to rotate to be opened and closed, when an integrated chip is placed in the integrated chip and remotely sends out an electric signal, the motor receives the signal and then controls the rotating positioning plates 12 to be closed, the bottom of the rotating positioning plates 12 is in a closed state when the outer surface of the conveyor belt 8 is horizontal, and the bottom of the rotating positioning plates 12 is in an open state when the outer surface of the conveyor belt 8 is vertical.
The recovery structure 6 comprises a recovery controller 17, 5 recovery clamps 18 and a recovery support 19, the recovery support 19 is installed at the top of the base 1, the recovery controller 17 is installed at the top of the recovery support 19, 5 recovery clamps 18 are connected to the bottom of the recovery controller 17, a receiving module, a transmitting module and a control motor are installed in the recovery controller 17, the recovery controller 17 is externally connected with a power supply, the receiving module is installed in the recovery controller 17, when the first detection structure 4 or the second detection structure 5 detects abnormality, the recovery clamps 18 which send out electric signals to the corresponding positions are controlled to recover abnormal chips after the electric signal recovery structure receives the electric signals, and when the recovery controller 17 receives the electric signals, the electric signals are sent out to the fixing seat 11, the fixing seat 11 controls the rotary positioning plate 12 to be opened, the recovery clamps 18 can recover fault chips smoothly, a sucker is installed in the interior of the recovery clamps 18, and after the rotary positioning plate 12 is opened, the chips are recovered through the sucker.
Working principle: and (3) opening the conveyor belt, putting a group of 5 integrated chips into the positioning groove 9, closing the rotary positioning plate 12, sequentially putting a plurality of groups of integrated chips, and closing the rotary positioning plate 12 after putting the integrated chips. When the conveyor belt 8 transmits a group of chips to the position right below the first detection structure, the detection structure sends an electric signal to stop the conveyor belt 8, the functional detection probe 14 stretches to detect the integrated chips, if a fault exists, the functional detection box sends an electric signal to the recovery structure on the right of the first detection structure, the recovery structure receives the signal and then controls the corresponding recovery clamp 18 to recover, when the conveyor belt 8 transmits a group of chips to the second detection structure, the second detection structure sends an electric signal to stop the conveyor belt 8, the second detection structure detects the chips, if a fault exists, the environment changes the recovery structure on the right of the second detection structure, the recovery structure receives the signal and then controls the corresponding recovery clamp 18 to recover.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus.
Although embodiments of the present utility model have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the principles and spirit of the utility model, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. An integrated chip detection device, includes base (1), its characterized in that: the utility model discloses a conveyer belt structure (2) are installed on the top of base (1), 2 supports (3) are installed on the both sides on base (1) top, detect structure one (4) are installed at the top of off-left side support (3), detect structure two (5) are installed at the top of off-right side support (3), 2 retrieve structure (6) are installed at the top of base (1), and 2 retrieve structure (6) are on the right side of 2 supports (3) respectively, conveyer belt structure (2) include conveyer belt support (7) and conveyer belt (8), the surface of conveyer belt (8) is provided with multiunit constant head tank (9), and every constant head tank (9) contain 5 pairs of constant head tank (9), multiunit rotor plate (10) are installed to one side of conveyer belt (8) surface, every group rotor plate (10) correspond with every constant head tank (9).
2. The integrated chip testing device of claim 1, wherein: the bottom of the conveyor belt support (7) is connected with the top of the base (1), the inner walls of the two sides of the conveyor belt support (7) are connected with the conveyor belt (8), and one side of the conveyor belt (8) is connected with a motor.
3. The integrated chip testing device of claim 1, wherein: the first detection structure (4) comprises a functional detection box (13) and 5 functional detection probes (14), wherein the bottom of the functional detection box (13) is connected with a bracket (3) on the left side, and the 5 functional detection probes (14) are connected with the bottom of the functional detection box (13).
4. The integrated chip testing device of claim 1, wherein: the second detection structure (5) comprises an environment changing box (15) and a telescopic plate (16), and the inner wall of the environment changing box (15) is connected with the telescopic plate (16).
5. The integrated chip testing device of claim 1, wherein: the rotary plate (10) comprises a fixed seat (11) and 2 rotary positioning plates (12), wherein the bottom of the fixed seat (11) is connected with one side of the outer surface of the conveyor belt (8), two sides of the fixed seat (11) are respectively connected with 2 rotary positioning plates (12), and a motor is installed inside the fixed seat (11).
6. The integrated chip testing device of claim 5, wherein: recovery structure (6) are including retrieving controller (17), 5 retrieve clamp (18) and retrieve support (19), retrieve support (19) are installed at the top of base (1), retrieve controller (17) are installed at the top of retrieving support (19), the bottom of retrieving controller (17) is connected with 5 and retrieve clamp (18), retrieve controller (17) internally mounted has receiving module and control motor, just retrieve external power supply of controller (17).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202320989881.9U CN219836834U (en) | 2023-04-27 | 2023-04-27 | Integrated chip detection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202320989881.9U CN219836834U (en) | 2023-04-27 | 2023-04-27 | Integrated chip detection device |
Publications (1)
Publication Number | Publication Date |
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CN219836834U true CN219836834U (en) | 2023-10-17 |
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CN202320989881.9U Active CN219836834U (en) | 2023-04-27 | 2023-04-27 | Integrated chip detection device |
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CN (1) | CN219836834U (en) |
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2023
- 2023-04-27 CN CN202320989881.9U patent/CN219836834U/en active Active
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