CN219657685U - Power supply main board test fixture - Google Patents

Abstract

The utility model discloses a power supply main board testing jig which comprises a workbench, a bracket and a testing unit, wherein the testing unit is arranged on the bracket in a sliding manner through a first moving mechanism, and the bracket is connected to the workbench in a sliding manner through a second moving mechanism; the test unit comprises a probe, a first spring and a lifting mechanism, wherein the probe is connected to the first moving mechanism through the lifting mechanism, and the lifting mechanism can drive the probe to reciprocate back and forth along the vertical direction so as to enable the probe to be close to or far away from the workbench; the lifting mechanism comprises a lifting track and a lifting sliding block; the probe is arranged on the lifting slide block, the lifting slide block can drive the probe to move downwards and stretch the first spring, and the resilience force of the first spring pulls the lifting slide block to drive the probe to move upwards. The power supply main board test fixture provided by the utility model can carry out batch test on the power supply main board, saves test time and test flow, and has the advantages of high test efficiency and low cost.

Description

Power supply main board test fixture

Technical Field

The utility model relates to the technical field of power supply main board testing, in particular to a power supply main board testing jig.

Background

The main board is an important component of the power supply, and in order to ensure the quality of the power supply, the voltage, current and other indexes of the main board of the power supply must be detected and tested after the power supply is assembled. At present, the power supply main board is detected manually and is detected by a single board, and during testing, after the main board is fixed, a probe is contacted with a test point on the main board to detect the main board. When the existing test fixture is used for detection, a manual or automatic mode is generally adopted to enable the probe to be in contact with the main board. The manual mode has better flexibility, but the efficiency is lower, and the testing accuracy is difficult to ensure. The automatic test fixture has higher cost, and when the probe moves to the main board to contact, the probe needs to be prevented from being damaged when contacting the main board, and an auxiliary mechanism needs to be arranged, so that the probe displacement is prevented from exceeding a set value, and the test fixture has a complex structure and higher manufacturing cost.

Disclosure of Invention

The utility model provides a power supply main board testing jig which is used for testing electrical indexes of a main board, improves production efficiency and saves production cost.

In order to solve the above technical problems, the present utility model provides a power motherboard testing fixture, including: the test device comprises a workbench, a bracket and a test unit, wherein the bracket is arranged above the workbench, and the test unit is arranged on the bracket in a sliding manner through a first moving mechanism and can move back and forth along the width direction of the workbench; the bracket is connected to the workbench in a sliding way through a second moving mechanism and can move back and forth along the length direction of the workbench;

the test unit comprises a probe, a first spring and a lifting mechanism, wherein the probe is connected to the first moving mechanism through the lifting mechanism, and the lifting mechanism can drive the probe to reciprocate back and forth along the vertical direction so as to enable the probe to be close to or far away from the workbench; the lifting mechanism comprises a lifting track and a lifting slide block, the lifting track is arranged on a sliding part of the first moving mechanism, the lifting slide block is connected to the lifting track in a sliding manner, one end of the first spring is fixedly connected to the upper end of the lifting track, and the other end of the first spring is fixedly connected to the lifting slide block; the probe is arranged on the lifting slide block, the lifting slide block can drive the probe to move downwards and stretch the first spring, and the resilience force of the first spring pulls the lifting slide block and drives the probe to move upwards.

In some embodiments, the support is disposed on the workbench, two ends and lower ends of the support are respectively disposed on two sides of the workbench in the width direction, and the support can reciprocate back and forth along the length direction of the workbench under the drive of the second moving mechanism.

In some embodiments, the first moving mechanism includes a first track and a first slider, the first track is disposed on the support along a length direction of the support, the first slider is connected to the first track, the test unit is fixedly connected to the first slider, and the first slider can drive the test unit to move back and forth along a width direction of the workbench.

In some embodiments, the second moving mechanism includes a second track and a second slider, the second track is disposed at an edge of the workbench along a length direction of the workbench, the second slider is connected to the second track, a lower end of the bracket is fixedly connected to the second slider, and the second slider can drive the bracket to move back and forth along the length direction of the workbench.

In some embodiments, the lifting rail is connected to the first slider through a mounting plate, and a limit portion is arranged at the lower end of the mounting plate, and is formed by bending the edge of the lower end of the mounting plate.

In some embodiments, the probe comprises a needle body and a needle cylinder, wherein the needle body is arranged in the needle cylinder, the needle cylinder is fixedly connected with the lifting sliding block, a second spring is arranged in the needle cylinder, the second spring is sleeved on the periphery of the needle body, and the second spring can be retracted and extruded by the stress of the needle body.

In some embodiments, the two supports are arranged in parallel and at intervals, the test units are arranged in pairs, and the two test units are respectively installed on the two supports.

In some embodiments, the workbench is provided with a positioning structure for limiting the placement position of the main board, and the positioning structure comprises a positioning pin.

In some embodiments, the first moving mechanism and the second moving mechanism are both provided with locking members.

In some embodiments, the lifting slide block is provided with a handle screw.

The embodiment of the utility model has the beneficial effects that:

the test fixture provided by the embodiment of the utility model can carry out batch test on the power supply main board, saves test time and test flow, and has high test efficiency and low cost.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present utility model, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic diagram of a first embodiment of the present utility model;

FIG. 2 is a schematic diagram of a second embodiment of the present utility model;

FIG. 3 is a schematic diagram of a third embodiment of the present utility model (without the power motherboard and the positioning pins);

FIG. 4 is an enlarged view of A1 in FIG. 3;

fig. 5 is a top view of the present utility model.

Reference numerals illustrate:

the test bench comprises a workbench 1, a bracket 2, a test unit 3, a probe 31, a needle body 311, a needle cylinder 312, an electric wire 313, a second spring 314, a first spring 32, a lifting mechanism 33, a lifting slide block 331, a lifting track 332, a mounting plate 34, a limiting part 341, a first moving mechanism 4, a first track 41, a first slide block 42, a second moving mechanism 5, a second slide block 51, a second track 52, locking screws (6 a and 6 b), a cushion block 7, a positioning pin 8, a power main board 9 and a handle screw 10.

Description of the embodiments

The following description of the embodiments of the present utility model will be made clearly and fully with reference to the accompanying drawings, in which it is evident that the embodiments described are only some, but not all embodiments of the utility model. All other embodiments, which can be made by those skilled in the art based on the embodiments of the utility model without making any inventive effort, are intended to be within the scope of the utility model.

It should be noted that all the directional indicators in the embodiments of the present utility model are only used to explain the relative positional relationship, movement conditions, etc. between the components in a specific posture, and if the specific posture is changed, the directional indicators are correspondingly changed.

The following disclosure provides many different embodiments, or examples, for implementing different structures of the utility model. In order to simplify the present disclosure, components and arrangements of specific examples are described below. They are, of course, merely examples and are not intended to limit the utility model. Furthermore, the present utility model may repeat reference numerals and/or letters in the various examples, which are for the purpose of brevity and clarity, and which do not themselves indicate the relationship between the various embodiments and/or arrangements discussed. In addition, the present utility model provides examples of various specific processes and materials, but one of ordinary skill in the art will recognize the application of other processes and/or the use of other materials.

The utility model is described below with reference to specific embodiments in conjunction with the accompanying drawings.

The embodiment of the utility model discloses a power supply main board test fixture, which solves the technical problems of low manual test efficiency and high purchase cost of an automatic fixture in the prior art.

In order to better understand the above technical solutions, the following detailed description will be made with reference to the accompanying drawings and specific embodiments, and it should be understood that the specific features of the embodiments and examples of the present utility model are detailed descriptions of the technical solutions of the present utility model, and not limiting the technical solutions of the present utility model, and the embodiments and the technical features of the embodiments of the present utility model may be combined with each other without conflict.

Referring to fig. 1-3, the present embodiment discloses a power motherboard testing fixture, including: the test device comprises a workbench 1, a bracket 2 and a test unit 3, wherein the bracket 2 is arranged above the workbench 1, two ends and lower ends of the bracket 2 are respectively arranged on two sides of the workbench in the width direction, as shown in the figure, the bracket is approximately gate-shaped and transversely erected on the workbench, and the test unit 3 is slidably arranged on the bracket 2 through a first moving mechanism 4 and can move back and forth along the width direction of the workbench 1 through the first moving mechanism 4; the bracket 2 is connected with the workbench 1 in a sliding way through a second moving mechanism 5, and can move back and forth along the length direction of the workbench 1 through the second moving mechanism 5; the debugging is firstly carried out before the test, the power supply main board 9 to be tested is placed on a workbench, a positioning structure for limiting the placement position of the power supply main board is arranged on the workbench, the positioning structure in the embodiment comprises a positioning pin 8 and a positioning hole, a plurality of positioning holes are arranged on the workbench, the positioning pin is inserted in a proper position according to the size of the power supply main board, when the power supply main board is fed, the power supply main board can be rapidly positioned by propping against the positioning pin, after the power supply main board is placed, an operator manually adjusts the position of a test unit (respectively moves along the length direction and the width direction of the workbench) to enable a probe to be aligned above a test point of the power supply main board and lock the position of the probe, during the test, a handle screw 10 (which will be described below) on a lifting slider is held by the hand and applies downward force to the probe, the lifting slider drives the probe to move downwards and stretches a first spring 32 (which will be described below) until the test point of the power supply main board is touched, after the test is completed, the handle screw is loosened, the probe moves upwards under the resilience of the first spring returns to the original position, and waits for the next test.

The test unit 3 comprises a probe 31, a first spring 32 and a lifting mechanism 33, wherein the probe is connected to the first moving mechanism 4 through the lifting mechanism, and the lifting mechanism 33 can drive the probe 31 to reciprocate back and forth along the vertical direction so as to enable the probe 31 to be close to or far away from the workbench 1; the lifting mechanism 33 comprises a lifting rail 332 and a lifting slide block 331; the lifting track is arranged on the sliding part of the first moving mechanism 4, the lifting slide block 331 is slidably connected to the lifting track 332, one end of the first spring 32 is fixedly connected to the upper end of the lifting track 332, the other end of the first spring 32 is fixedly connected to the lifting slide block 331 and slides along with the lifting slide block to do telescopic motion, the probe 31 is arranged on the lifting slide block 331, the lifting slide block 331 is stressed to drive the probe 31 to move downwards, the first spring 32 is stretched, and the resilience force of the first spring 32 can pull the lifting slide block 331 and drive the probe 31 to move upwards.

Specifically, the first moving mechanism 4 includes a first rail 41 and a first slider 42, where the first rail is disposed on the support along a length direction of the support (that is, a width direction of the workbench), the first slider is connected to the first rail, the test unit is fixedly connected to the first slider, and the first slider can drive the test unit to move back and forth along the width direction of the workbench.

Specifically, the second moving mechanism 5 includes a second slider 51 and a second track 52, where the second track is disposed at an edge of the workbench along a length direction of the workbench, the second slider is connected to the second track, a lower end of the bracket is fixedly connected to the second slider, and the second slider can drive the bracket to move back and forth along the length direction of the workbench; in order to realize the smooth translation of the support along the workbench, it can be understood that the two ends and the lower end of the support are respectively connected to the workbench through the second moving mechanism to realize the back and forth movement.

When the power supply main board is tested in batches, the position of the testing unit above the workbench can be locked for improving the efficiency, that is, the first moving mechanism and the second moving mechanism are respectively provided with a locking piece, so that the testing unit is positioned and is convenient for batch operation; specifically, locking screws (6 a,6 b) can be respectively installed on the first sliding block and the second sliding block, locking holes (not shown in the figure) are respectively formed in the first sliding block and the second sliding block, the locking screws (6 a,6 b) are respectively penetrated into the locking holes in the first sliding block and the second sliding block, and the locking is realized by tightening the locking screws (6 a,6 b) to respectively prop against the first sliding block and the second sliding block; when the power supply main board is fed, the positioning pin is used for rapidly positioning on the workbench, and as the position on the workbench is fixed, an operator only needs to drive the probe to move downwards to touch the test point on the power supply main board, so that the test time is greatly saved, the test flow is convenient, and the test efficiency is improved.

Specifically, the lifting rail 332 is connected to the first slider 42 through the mounting plate 34, a limit portion 341 is disposed at the lower end of the mounting plate, and the limit portion is formed by bending the edge of the lower end of the mounting plate.

Referring to fig. 3 and 4, the probe 31 includes a needle body 311 and a needle cylinder 312, the needle cylinder is fixedly connected to the lifting slide block, specifically, the needle body is disposed in the needle cylinder, a second spring 314 is disposed in the needle cylinder, and is sleeved on the outer periphery of the needle body, so that the needle body can retract when moving downwards to contact with a product, and in a normal state, the second spring pushes the needle body downwards, and when the needle body moves downwards to touch a harder product, the needle body is stressed to upwards squeeze the second spring to retract, so that damage is avoided when the needle body is stressed too much.

More specifically, one end of the first spring is fixed, the other end is connected with the needle cylinder 312 of the probe, the needle cylinder is fixedly installed on the lifting slide block at the same time, the lifting slide block is provided with a handle screw 10 which is convenient for a user to hold, during testing, an operator holds the handle screw on the lifting slide block and applies downward acting force to the handle screw, the lifting slide block drives the probe to move downward after being stressed, meanwhile, the first spring is stretched, one end, connected with the needle cylinder, of the first spring moves downward along with the lifting slide block, is gradually stretched, in the stretching process, the first spring accumulates pulling energy (namely resilience force), after the test is completed, the handle screw is loosened, the force on the lifting slide block disappears, and the resilience force of the first spring pulls the lifting slide block to move back to the original position rapidly.

The positioning pins and the positioning holes are arranged, as shown in fig. 1 and 5, a plurality of positioning pins are respectively arranged on two adjacent sides of the power supply main board and are positioned on one side far from the feeding direction, and preferably, the positioning pins are distributed at equal intervals; during feeding, the power supply main board is placed on the workbench, and is pushed to move towards the middle of the workbench, and when two adjacent side edges of the far end of the power supply main board are simultaneously propped against the positioning pins, the rapid positioning of the power supply main board can be realized.

In some embodiments, considering the distance between the probe and the power motherboard, a cushion block 7 is disposed on the workbench, as shown in fig. 1 and 2, and when the power motherboard is fed, the probe is placed on the cushion block on the workbench and slides on the cushion block until the probe abuts against the positioning pin to realize quick positioning of the power motherboard.

Under normal conditions, the current test point and the voltage test point of the power supply main board are both paired positive and negative test points, so that two probes, namely a positive probe and a negative probe, are required to be arranged for testing, the positive probe and the negative probe have the same mechanical structure, two corresponding brackets are required to be arranged, the positive probe and the negative probe are respectively arranged on the two brackets through the same connecting structure, the two brackets are arranged on the workbench in parallel at intervals and are respectively connected to the second track through second sliding blocks in a sliding way, and it can be understood that the two brackets share the second tracks on two sides and use different second sliding blocks; the positive probe and the negative probe are arranged between the two brackets, so that an operator can operate the two probes by one hand to perform a test conveniently; before testing, the positions of the two brackets are locked and fixed.

The probe is connected with a wire 313 for transmitting signals, and signals tested on the probe are transmitted to the testing equipment.

The working process of the utility model is as follows:

debugging before testing: placing the power supply main board to be tested on the workbench, arranging a plurality of positioning holes on the workbench, selecting proper positioning holes according to the size of the power supply main board, inserting positioning pins, and thus, when the power supply main board is fed, rapidly positioning the position of the power supply main board can be completed by propping against the positioning pins, after the power supply main board is placed, an operator manually adjusts the position of a test unit (along the length direction and the width direction of the workbench) to enable a probe to be aligned to the upper part of a test point of the power supply main board, after the position is adjusted, the first sliding block and the second sliding block are respectively locked, and thus, the position of the probe does not need to be always adjusted when the batch test is performed, and the test efficiency is improved.

The test is as follows: after the power supply main board is fed, an operator holds the handle screw on the lifting slide block, applies downward force to the lifting slide block, the lifting slide block drives the probe to move downwards and stretch the first spring until the probe touches a test point of the power supply main board, the probe transmits a test signal to the test equipment through an electric wire, after the test is completed, the handle screw is loosened, the probe moves upwards under the resilience force of the first spring to restore to the original position, and the next test is waited.

In the present utility model, unless specifically stated and limited otherwise, the terms "connected," "affixed," and the like are to be construed broadly, and for example, "affixed" may be a fixed connection, a removable connection, or an integral body; can be mechanically or electrically connected; either directly or indirectly, through intermediaries, or both, may be in communication with each other or in interaction with each other, unless expressly defined otherwise. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.

In the description of the present utility model, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings are merely for convenience in describing the present utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model.

Furthermore, descriptions such as those referred to as "first," "second," and the like, are provided for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implying an order of magnitude of the indicated technical features in the present disclosure. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include at least one such feature. In addition, the technical solutions of the embodiments may be combined with each other, but it is necessary to base that the technical solutions can be realized by those skilled in the art, and when the technical solutions are contradictory or cannot be realized, the combination of the technical solutions should be considered to be absent and not within the scope of protection claimed in the present utility model.

In the description of the present utility model, unless explicitly stated and limited otherwise, a first feature "above" or "below" a second feature may include both the first and second features being in direct contact, or may include both the first and second features not being in direct contact but being in contact by another feature therebetween. Moreover, a first feature being "above," "over" and "on" a second feature includes the first feature being directly above and obliquely above the second feature, or simply indicating that the first feature is higher in level than the second feature. The first feature being "under", "below" and "beneath" the second feature includes the first feature being directly under and obliquely below the second feature, or simply means that the first feature is less level than the second feature.

In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the present utility model. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, one skilled in the art can combine and combine the different embodiments or examples described in this specification

While preferred embodiments of the present utility model have been described, additional variations and modifications in those embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. It is therefore intended that the following claims be interpreted as including the preferred embodiments and all such alterations and modifications as fall within the scope of the utility model.

It will be apparent to those skilled in the art that various modifications and variations can be made to the present utility model without departing from the spirit or scope of the utility model. Thus, it is intended that the present utility model also include such modifications and alterations insofar as they come within the scope of the appended claims or the equivalents thereof.

Claims (10)

1. A power supply motherboard test fixture, its characterized in that includes: the test device comprises a workbench, a bracket and a test unit, wherein the bracket is arranged above the workbench, and the test unit is arranged on the bracket in a sliding manner through a first moving mechanism and can move back and forth along the width direction of the workbench; the bracket is connected to the workbench in a sliding way through a second moving mechanism and can move back and forth along the length direction of the workbench;

the test unit comprises a probe, a first spring and a lifting mechanism, wherein the probe is connected to the first moving mechanism through the lifting mechanism, and the lifting mechanism can drive the probe to reciprocate back and forth along the vertical direction so as to enable the probe to be close to or far away from the workbench; the lifting mechanism comprises a lifting track and a lifting slide block, the lifting track is arranged on a sliding part of the first moving mechanism, the lifting slide block is connected to the lifting track in a sliding manner, one end of the first spring is fixedly connected to the upper end of the lifting track, and the other end of the first spring is fixedly connected to the lifting slide block; the probe is arranged on the lifting slide block, the lifting slide block can drive the probe to move downwards and stretch the first spring, and the resilience force of the first spring pulls the lifting slide block and drives the probe to move upwards.

2. The power motherboard testing jig of claim 1, wherein the bracket is disposed on the workbench, two ends and a lower end of the bracket are disposed on two sides of the workbench in a width direction respectively, and the bracket can reciprocate back and forth along a length direction of the workbench under the drive of the second moving mechanism.

3. The power motherboard test fixture as recited in claim 2, wherein the first moving mechanism comprises a first rail and a first slider, the first rail is disposed on the bracket along a length direction of the bracket, the first slider is connected to the first rail, the test unit is fixedly connected to the first slider, and the first slider can drive the test unit to move back and forth along a width direction of the workbench.

4. The power motherboard testing jig of claim 2, wherein the second moving mechanism comprises a second rail and a second slider, the second rail is disposed at an edge of the workbench along a length direction of the workbench, the second slider is connected to the second rail, a lower end of the bracket is fixedly connected to the second slider, and the second slider can drive the bracket to move back and forth along the length direction of the workbench.

5. The power motherboard test fixture as recited in claim 3, wherein said lifting track is connected to said first slider via a mounting plate, a lower end of said mounting plate is provided with a limit portion, and said limit portion is formed by bending a lower end edge of said mounting plate.

6. The power motherboard test fixture as recited in claim 1, wherein the probe comprises a needle body and a needle cylinder, the needle body is arranged in the needle cylinder, the needle cylinder is fixedly connected to the lifting slide block, a second spring is arranged in the needle cylinder, the second spring is sleeved on the periphery of the needle body, and the needle body can retract and squeeze the second spring under the action of force.

7. The power motherboard testing fixture as recited in claim 1, wherein two of said brackets are arranged in parallel and spaced apart, said test units are arranged in pairs, and said test units are mounted on said brackets, respectively.

8. The power motherboard test fixture as recited in claim 1, wherein said workstation is provided with a positioning structure for limiting placement of the motherboard, said positioning structure comprising a positioning pin.

9. The power motherboard testing fixture as recited in claim 1, wherein said first moving mechanism and said second moving mechanism are both provided with locking members.

10. The power motherboard test fixture as recited in claim 1, wherein said lifting slide is provided with a handle screw.