CN219039181U - Vertical probe card for testing solder ball chip - Google Patents
Vertical probe card for testing solder ball chip Download PDFInfo
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- CN219039181U CN219039181U CN202223205872.0U CN202223205872U CN219039181U CN 219039181 U CN219039181 U CN 219039181U CN 202223205872 U CN202223205872 U CN 202223205872U CN 219039181 U CN219039181 U CN 219039181U
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- thread groove
- plate
- probe card
- cover plate
- fixing screw
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The utility model discloses a vertical probe card for testing a solder ball chip, which comprises a reinforcing plate, wherein a substrate is connected to a second fixing screw, an enameled wire is connected to the substrate, the other end of the enameled wire is connected to an adapter plate, a black glue is arranged on the adapter plate, a probe is fixedly connected to the black glue, a first thread groove is formed in the reinforcing plate, a first fixing screw is connected with an inner thread of the first thread groove, a mounting ring is connected to the first fixing screw in a threaded manner, an upper cover plate is connected to a third fixing screw in a threaded manner, and a lower cover plate is connected to the third fixing screw in a threaded manner.
Description
Technical Field
The utility model relates to the technical field of vertical probe cards, in particular to a vertical probe card for testing a solder ball chip.
Background
At present, in the semiconductor packaging process, a tin ball chip needs to be detected, the appearance defect and the surface defect of a product are rarely detected, the electrical performance test is mainly carried out through a probe in the tin ball packaging product detection, the appearance defect detection is usually observed by an artificial eye, the test is carried out by using a probe card, and the conventional vertical probe card for testing the tin ball material chip has high contact failure rate, low manufacturing efficiency and high maintenance difficulty.
For this purpose, we have devised a vertical probe card for solder ball chip testing.
Disclosure of Invention
The utility model aims to solve the problems of high contact failure rate, low manufacturing efficiency and high maintenance difficulty of a vertical probe card in the prior art, and provides a vertical probe card for testing a solder ball chip.
In order to achieve the above purpose, the present utility model adopts the following technical scheme:
the utility model provides a vertical probe card for tin ball chip test, includes the stiffening plate, the second thread groove has been seted up on the stiffening plate, and second thread groove internal thread has the second set screw, be connected with the base plate on the second set screw, the fourth thread groove has been seted up on the stiffening plate, and fourth thread groove internal thread has the fourth set screw, be connected with the enameled wire on the base plate, and the other end of enameled wire is connected with the keysets, be equipped with the black glue on the keysets, and fixedly connected with probe on the black glue, the first thread groove has been seted up to the stiffening plate, and first thread groove internal thread has first set screw, threaded connection has the collar on the first set screw, third thread groove has been seted up on the collar, and third thread groove internal thread has the third set screw, threaded connection has the upper cover plate on the third set screw, threaded connection has the lower apron on the third set screw.
Preferably, a first micropore is formed in the adapter plate, and the black glue is used for fixing the enameled wire through the first micropore.
Preferably, the upper cover plate and the lower cover plate are both provided with second micropores, and the probes penetrate through the upper cover plate and the lower cover plate through the second micropores.
Preferably, the first fixing screw fixes the mounting ring through the first thread groove.
Preferably, the third fixing screw fixes the upper cover plate and the lower cover plate through a third thread groove.
Preferably, the fourth fixing screw fixes the reinforcing plate through a fourth thread groove.
The beneficial effects of the utility model are as follows:
1. according to the utility model, the second fixing screw is arranged on the reinforcing plate, and the reinforcing plate is locked and attached on the substrate through the second fixing screw, so that the contact property of the probe card is improved, and meanwhile, the arrangement of the fixing screw is convenient for maintaining the vertical probe card, so that the working efficiency is effectively improved.
2. The utility model adopts the arrangement of the second micropores on the upper cover plate and the lower cover plate, and the head of the probe vertically passes through the micropores of the lower cover plate through the arrangement of the second micropores, so that the manufacturing difficulty of the vertical probe card is reduced, the detection is more convenient, and the vertical arrangement of the probe is convenient for the disassembly and the maintenance of the probe.
Drawings
FIG. 1 is a schematic diagram of a vertical probe card for solder ball chip testing according to the present utility model;
FIG. 2 is a schematic diagram of a vertical probe card fixture for solder ball chip testing;
FIG. 3 is a schematic diagram of a portion of a vertical probe card for solder ball chip testing.
In the figure: 1 base plate, 2 stiffening plate, 3 keysets, 4 collar, 5 upper cover plate, 6 lower cover plate, 7 probe, 8 first fixed screws, 9 enameled wire, 10 black glue, 11 second fixed screws, 12 third fixed screws, 13 fourth fixed screws.
Detailed Description
Referring to fig. 1-3, a vertical probe card for testing a solder ball chip comprises a reinforcing plate 2, wherein a second thread groove is formed in the reinforcing plate 2, a second fixing screw 11 is connected in the second thread groove in a threaded manner, a substrate 1 is connected to the second fixing screw 11, the second fixing screw 11 is inserted into the second thread groove, so that the reinforcing plate 2 is locked on the substrate 1 through the second fixing screw 11, the contact performance of the probe card is improved, and meanwhile, the vertical probe card is convenient to maintain due to the arrangement of the fixing screw, so that the working efficiency is effectively improved;
a fourth thread groove is formed in the reinforcing plate 2, a fourth fixing screw 13 is connected in the fourth thread groove in a threaded manner, the reinforcing plate 2 is fixed by the fourth fixing screw 13 through the fourth thread groove, an enameled wire 9 is connected to the base plate 1, the other end of the enameled wire 9 is connected with an adapter plate 3, a first micropore is formed in the adapter plate 3, the enameled wire 9 is fixed through the first micropore, a black glue 10 is arranged on the adapter plate 3, a probe 7 is fixedly connected to the black glue 10, the adapter plate 3 is locked and attached to the reinforcing plate 2 through a third fixing screw 12, the enameled wire 9 penetrates through the first micropore on the adapter plate 3, and after being poured into the reinforcing plate 2 through the black glue 10, the enameled wire 9 is fixed in the micropore of the adapter plate 3, and the head of the probe 7 penetrates through the second micropore of the lower cover plate 6;
the reinforcing plate 2 is provided with a first thread groove, a first fixing screw 8 is connected with the first thread groove in a threaded manner, the first fixing screw 8 is connected with a mounting ring 4 in a threaded manner, the mounting ring 4 is fixed by the first fixing screw 8 through the first thread groove, the tail of a probe 7 corresponding to a second micropore of the upper cover plate 6 is attached to the lower cover plate 6, and a fourth fixing screw 13 sequentially penetrates through the upper cover plate 5 and the lower cover plate 6 to be locked and attached to the mounting ring 4;
the third thread groove is formed in the mounting ring 4, the third fixing screw 12 is connected with the third fixing screw 12 in an internal thread mode, the upper cover plate 5 is connected with the third fixing screw 12 in an threaded mode, the lower cover plate 6 is connected with the third fixing screw 12 in a threaded mode, the second micropores are formed in the upper cover plate 5 and the lower cover plate 6, the probe 7 penetrates through the micropores of the upper cover plate 5 and the lower cover plate 6 through the second micropores, the third fixing screw 12 penetrates through the adapter plate 3 through the third thread groove, the adapter plate 3 is attached to the reinforcing plate 2 under the action of the third fixing screw 12 in a locking mode, the first fixing screw 8 is rotated, the mounting ring 4 is attached to the adapter plate 3 and the reinforcing plate 2 through the first thread groove in a locking mode, the tail portion of the probe 7 is in contact conduction with one end of an enameled wire 9 on the adapter plate 3, the other end of the enameled wire 9 is fixedly connected with the base plate 1 to form a loop, the head portion of the probe 7 vertically penetrates through the micropores of the lower cover plate 6 through the second micropores, manufacturing difficulty of the vertical probe card is reduced, meanwhile detection is enabled to be more convenient, and the vertical setting of the probe 7 is convenient to detach.
The working principle of the utility model is as follows: firstly, the second fixing screw 11 is rotated through the second thread groove, so that the reinforcing plate 2 is locked and attached on the substrate through the second fixing screw 11, the contact performance of the probe card is improved, and meanwhile, the fixing screw is convenient for maintaining the vertical probe card, so that the working efficiency is effectively improved;
further, rotate third set screw 12 for third set screw 12 passes through the fixed keyless entry board 3 of third thread groove, make keyless entry board 3 lock attach on stiffening plate 2, rotate fourth set screw 13, make fourth set screw 13 pass through the fixed upper cover plate 5 of fourth thread groove and lower apron 6, make upper cover plate 5 and lower apron 6 lock attach on collar 4, simultaneously make the laminating of the second micropore of seting up on upper cover plate 5 and the lower apron 6, rotate first set screw 8 through first thread groove, make first set screw 8 pass through first thread groove with keyless entry board 3 and collar 4 lock attach on stiffening plate 2, enameled wire 9 pass first micropore on the keyless entry board 3, pour into the inside back of stiffening plate 2 through the black glue 10 and flow into in the first micropore of keyless entry board 3 make its fixed 9, probe 7 head passes the second micropore of lower apron 6, thereby reduce the preparation degree of difficulty of vertical probe card, simultaneously make the detection more convenient, the perpendicular setting of probe 7 is convenient for the dismantlement maintenance of probe 7, probe 7 afterbody and 9 on the enameled wire contact with 3, 9 forms fixed circuit connection with one end of the fixed circuit 1.
The foregoing is only a preferred embodiment of the present utility model, but the scope of the present utility model is not limited thereto, and any person skilled in the art, who is within the scope of the present utility model, should make equivalent substitutions or modifications according to the technical scheme of the present utility model and the inventive concept thereof, and should be covered by the scope of the present utility model.
Claims (6)
1. The utility model provides a vertical probe card for tin ball chip test, includes stiffening plate (2), its characterized in that, set up the second thread groove on stiffening plate (2), and second thread groove internal thread has second set screw (11), be connected with base plate (1) on second set screw (11), set up fourth thread groove on stiffening plate (2), and fourth thread groove internal thread has fourth set screw (13), be connected with enameled wire (9) on base plate (1), and the other end of enameled wire (9) is connected with keysets (3), be equipped with black glue (10) on keysets (3), and fixedly connected with probe (7) on black glue (10), first thread groove has been seted up to stiffening plate (2), and first thread groove internal thread has first set screw (8), threaded connection has collar (4) on first set screw (8), set up the third thread groove internal thread connection has third thread (12) on collar (4), threaded connection has on third screw (12).
2. The vertical probe card for testing the solder ball chip according to claim 1, wherein the adapter plate (3) is provided with a first micropore, and the black glue is used for fixing the enameled wire (9) through the first micropore.
3. The vertical probe card for solder ball chip testing according to claim 1, wherein the upper cover plate (5) and the lower cover plate (6) are provided with second micropores, and the probes (7) penetrate through the upper cover plate (5) and the lower cover plate (6) through the second micropores.
4. A vertical probe card for solder ball chip testing according to claim 1, wherein the first set screw (8) secures the mounting ring (4) through the first thread groove.
5. The vertical probe card for solder ball chip test according to claim 1, wherein the third fixing screw (12) fixes the upper cover plate (5) and the lower cover plate (6) through a third thread groove.
6. The vertical probe card for solder ball chip test according to claim 1, wherein the fourth fixing screw (13) fixes the reinforcing plate (2) through a fourth thread groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223205872.0U CN219039181U (en) | 2022-11-30 | 2022-11-30 | Vertical probe card for testing solder ball chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223205872.0U CN219039181U (en) | 2022-11-30 | 2022-11-30 | Vertical probe card for testing solder ball chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219039181U true CN219039181U (en) | 2023-05-16 |
Family
ID=86289384
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202223205872.0U Active CN219039181U (en) | 2022-11-30 | 2022-11-30 | Vertical probe card for testing solder ball chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219039181U (en) |
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2022
- 2022-11-30 CN CN202223205872.0U patent/CN219039181U/en active Active
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