CN219008999U - Conveying track of crimping diode inspection machine - Google Patents
Conveying track of crimping diode inspection machine Download PDFInfo
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- CN219008999U CN219008999U CN202320177631.5U CN202320177631U CN219008999U CN 219008999 U CN219008999 U CN 219008999U CN 202320177631 U CN202320177631 U CN 202320177631U CN 219008999 U CN219008999 U CN 219008999U
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Abstract
The utility model belongs to the technical field of diode inspection tools, and particularly relates to a conveying track of a crimping diode inspection machine. The utility model comprises the following steps: the guide rail comprises two opposite vertical plates; the support plate can be arranged between the two vertical plates in an up-down, front-back and back-up mode, a plurality of spaced positioning grooves are formed in the top end of the support plate, the depth of each positioning groove is matched with the thickness of the PN junction packaging body of the crimping diode, and the length of each positioning groove is matched with the diameter of the PN junction packaging body of the crimping diode. The utility model is used for solving the technical problems that the linear chute of the inspection machine in the prior art easily causes the situation that the conveyed crimping diode is subjected to material pouring or clamping, and the inspection efficiency and the inspection accuracy are affected.
Description
Technical Field
The utility model belongs to the technical field of diode inspection tools, and particularly relates to a conveying track of a crimping diode inspection machine.
Background
Because the PN junction packaging body of the crimping diode is larger and heavier, the lead wire of the diode is lighter, and the original track of the inspection machine is a simple linear chute, the phenomenon of material pouring (under normal conditions, the PN junction packaging body of the crimping diode is under, the lead wire is over, the PN junction packaging body slides in the conveying track, and material pouring is that the crimping diode is poured due to the fact that the lead wire is scratched to an external object or other reasons) or material clamping (a plurality of crimping diodes are stacked in the conveying track to cause clamping) frequently occurs when the crimping diode is conveyed in the original conveying track of the inspection machine. Therefore, the press-connection diode for manually removing the clamping materials and the dumping materials is needed, the labor hour is consumed, and the labor cost is increased; and each time a fault of material pouring or material clamping occurs, the follow-up test data is deviated, even reversed in polarity, and the test efficiency and the test accuracy are affected.
Disclosure of Invention
The utility model aims to solve the technical problems of overcoming the defects of the prior art, providing a conveying track of a crimping diode inspection machine, and solving the technical problems that the linear chute of the inspection machine in the prior art easily causes the condition of material pouring or clamping of the conveyed crimping diode, and the inspection efficiency and the inspection accuracy are affected.
The technical scheme for solving the technical problems is as follows: a crimped diode inspection machine conveyor track, comprising:
the guide rail comprises two opposite vertical plates;
a supporting plate which can be arranged between the two vertical plates in an up-down, front-back moving way,
the top of layer board has seted up a plurality of spaced constant head tanks, the degree of depth of constant head tank with the thickness adaptation of crimping diode's PN junction encapsulation body, the length of constant head tank with the diameter adaptation of crimping diode's PN junction encapsulation body.
The PN junction packaging body of the crimping diode is embedded into the positioning groove of the supporting plate, and the guide rails at the two sides of the supporting plate are used for auxiliary positioning, so that the crimping diode can not displace, the material pouring or the material clamping can be prevented, and the supporting plate can move up, down, front and back so as to realize relative displacement with the guide rails and the testing port of the testing machine, thereby separating the crimping diode embedded into the positioning groove from the supporting plate.
Further: the opposite surfaces of the two vertical plates are respectively provided with a step, and grooves formed by the two steps are matched with the diameter of the PN junction packaging body of the crimping diode.
The beneficial effects of the adoption of this step are: the groove is used for preventing the crimping diode embedded in the positioning groove from rollover.
Further: the lower extreme of layer board is connected with at least one first cylinder of vertical setting, first cylinder is established on the fly leaf, the fly leaf with the frame of inspection machine passes through the slide rail connection that the level set up, the fly leaf drives through at least one second cylinder that the level set up.
The beneficial effects of the adoption of this step are: the first cylinder can enable the supporting plate to move up and down, and the second cylinder can drive the movable plate to enable the supporting plate to move forward and backward; the supporting plate can be subjected to multidirectional displacement by controlling the first air cylinder and the second air cylinder respectively.
Further: and chamfer angles are arranged at two ends of the notch of the positioning groove.
The beneficial effects of the adoption of this step are: the chamfer is to help the crimp diode embed into the locating slot.
Further: the distance between the positioning grooves is matched with the distance between the test ports of the inspection machine.
The beneficial effects of the adoption of this step are: therefore, the crimping diode can accurately enter the test port through the positioning groove, and the test efficiency and the test quality are improved.
Further: the thickness of the supporting plate is 1/3-1/2 of the diameter of the PN junction packaging body of the crimping diode.
The beneficial effects of the adoption of this step are: mainly in order to circumvent the following two risk points,
1. the thickness of the supporting plate is less than 1/3;
the contact area between the top end of the supporting plate and the crimping diode is too small, so that the crimping diode is easy to turn over;
2. the thickness of the supporting plate is larger than 1/2;
because the pallet will move up and down in the guide rail, when the pallet is below the guide rail, the gap of the guide rail for accommodating the pallet will be exposed, and the risk of the falling crimping diode will be blocked in due to the overlarge gap.
The beneficial effects of the utility model are as follows:
1. according to the utility model, each crimping diode can be accurately conveyed to the position of the test port, and the deepened positioning groove ensures that no material pouring or clamping occurs in the conveying process, so that the efficiency of a detection process is greatly improved, and the labor cost is reduced;
2. the detection precision and the material detection efficiency are improved, the detection reliability of the crimping diode is improved, and the quality of the crimping diode is stably controlled.
Drawings
In order to more clearly illustrate the embodiments of the present utility model or the technical solutions in the prior art, the drawings that are needed in the description of the embodiments or the prior art will be briefly described, and it is obvious that the drawings in the description below are some embodiments of the present utility model, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a conveying track of a crimping diode inspection machine according to the present utility model;
FIG. 2 is a schematic diagram of a conveying track of a crimping diode inspection machine according to the second embodiment of the present utility model;
FIG. 3 is a schematic diagram of a pallet in a conveyor track of a crimping diode inspection machine according to the present utility model;
fig. 4 is a working schematic diagram of a pallet in a conveying track of a crimping diode inspection machine provided by the utility model.
Reference numerals:
1-a guide rail; 2-supporting plates; 3-crimping the diode; 4-test port;
11-steps; 12-grooves; 21-a positioning groove; 31-PN junction packaging body; 32-lead wires;
211-chamfering.
Detailed Description
Embodiments of the technical scheme of the present utility model will be described in detail below with reference to the accompanying drawings. The following examples are only for more clearly illustrating the technical aspects of the present utility model, and thus are merely examples, and are not intended to limit the scope of the present utility model.
It is noted that unless otherwise indicated, technical or scientific terms used herein should be given the ordinary meaning as understood by one of ordinary skill in the art to which this utility model pertains.
In the description of the present application, it should be understood that the terms "center," "longitudinal," "transverse," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like indicate an orientation or positional relationship based on that shown in the drawings, merely for convenience of describing the present utility model and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present utility model.
Furthermore, the terms "first," "second," and the like, are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. In the description of the present utility model, the meaning of "plurality" is two or more unless specifically defined otherwise.
In this application, unless specifically stated and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.
In this application, unless expressly stated or limited otherwise, a first feature "up" or "down" a second feature may be the first and second features in direct contact, or the first and second features in indirect contact via an intervening medium. Moreover, a first feature being "above," "over" and "on" a second feature may be a first feature being directly above or obliquely above the second feature, or simply indicating that the first feature is level higher than the second feature. The first feature being "under", "below" and "beneath" the second feature may be the first feature being directly under or obliquely below the second feature, or simply indicating that the first feature is less level than the second feature.
Examples
As shown in fig. 1 and 2, the conveying track of the press-bonding diode inspection machine provided by the utility model comprises:
the guide rail 1 comprises two opposite vertical plates;
a supporting plate 2, wherein the supporting plate 2 is arranged between the two vertical plates in a way of moving up and down, front and back,
the top of the supporting plate 2 is provided with a plurality of positioning grooves 21 at intervals, the depth of each positioning groove 21 is matched with the thickness of the PN junction packaging body 31 of the crimping diode 3, and the length of each positioning groove 21 is matched with the diameter of the PN junction packaging body 31 of the crimping diode 3.
The PN junction packaging body 31 of the crimping diode 3 is embedded into the positioning groove 21 of the supporting plate 2, and the guide rails 1 at two sides of the supporting plate 2 are used for auxiliary positioning, so that the crimping diode 3 can not displace, the material pouring or the material clamping can be prevented, the supporting plate 2 can move up and down, front and back, and the purpose of realizing relative displacement with the guide rails 1 and the testing port 4 of the testing machine is achieved, and the crimping diode 3 embedded into the positioning groove 21 is separated from the supporting plate 2.
The working principle of the utility model is shown in figure 4;
firstly, placing crimping diodes 3 in the positioning grooves 21 of the supporting plate 2;
secondly, the supporting plate 2 moves forward, and then the lead wire of the crimping diode 3 is clamped by the test port 4;
thirdly, the supporting plate 2 moves downwards, and the supporting plate 2 is separated from the clamped crimping diode 3;
fourth, the pallet 2 moves backwards, the pallet 2 and the clamped crimping diode 3 are misplaced, the crimping diode 3 at the forefront end is separated from the bearing range of the pallet 2, and a positioning groove 21 is also vacated at the rear end of the pallet 2 for accommodating a new crimping diode 3;
fifthly, the supporting plate 2 moves upwards, the test port 4 is loosened, and the crimping diode 3 returns to the positioning groove 21 again;
the above-described process is repeated in such a manner that the plurality of crimping diodes 3 can be tested in sequence. It is noted that the test port 4 comprises different test uses.
As shown in fig. 1, the opposite surfaces of the two vertical plates are respectively provided with a step 11, and the grooves 12 formed by the two steps 11 are matched with the diameter of the PN junction package 31 of the crimping diode 3.
The groove 12 is used for preventing the side turning of the crimping diode 3 embedded in the positioning groove 21.
The lower end of the supporting plate 2 is connected with at least one first cylinder which is vertically arranged, the first cylinder is arranged on a movable plate, the movable plate is connected with a rack of the inspection machine through a horizontally arranged sliding rail, and the movable plate is driven through at least one horizontally arranged second cylinder.
The first cylinder can enable the supporting plate 2 to move up and down, and the second cylinder can drive the movable plate to enable the supporting plate 2 to move forward and backward; the pallet 2 can be displaced in multiple directions by controlling the first cylinder and the second cylinder respectively.
As shown in fig. 3, chamfer 211 is provided at both ends of the notch of the positioning groove 21.
Wherein the distance between the positioning grooves 21 is matched with the interval between the test ports 4 of the inspection machine; thus, the crimping diode 3 can accurately enter the test port 4 through the positioning groove 21, and the test efficiency and the test quality are improved.
Wherein the thickness of the pallet 2 is 1/3-1/2 of the diameter of the PN junction package 31 of the crimping diode 3.
Mainly in order to circumvent the following two risk points,
1. the thickness of the supporting plate 2 is smaller than 1/3 of the diameter of the PN junction packaging body 31 of the crimping diode 3;
the contact area between the top end of the supporting plate 2 and the crimping diode 3 is too small, so that the crimping diode 3 is easy to turn over;
2. the thickness of the supporting plate 2 is larger than 1/2 of the diameter of the PN junction packaging body 31 of the crimping diode 3;
since the pallet 2 will move up and down in the guide rail 1, when the pallet 2 is below the guide rail 1, the gap of the guide rail 1 for accommodating the pallet 2 will be exposed, and the risk of the falling crimping diode 3 being snapped in may be caused by the excessive gap.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present utility model, and not for limiting the same; although the utility model has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some or all of the technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit of the utility model.
Claims (6)
1. A crimped diode inspection machine delivery track, comprising:
the guide rail comprises two opposite vertical plates;
a supporting plate which can be arranged between the two vertical plates in an up-down, front-back moving way,
the top of layer board has seted up a plurality of spaced constant head tanks, the degree of depth of constant head tank with the thickness adaptation of crimping diode's PN junction encapsulation body, the length of constant head tank with the diameter adaptation of crimping diode's PN junction encapsulation body.
2. The conveyor track of claim 1, wherein two of said risers are each provided with a step on opposite sides thereof, the grooves formed by the steps being adapted to the diameter of the PN junction package of the crimped diode.
3. The crimped diode inspection machine delivery track according to claim 1, wherein the lower end of the pallet is connected with at least one first cylinder arranged vertically, the first cylinder is arranged on a movable plate, the movable plate is connected with a rack of the inspection machine through a horizontally arranged slide rail, and the movable plate is driven through at least one second cylinder arranged horizontally.
4. The crimped diode inspection machine delivery track of claim 1, wherein the locating slots are provided with chamfers at both ends of the slot opening.
5. The crimped diode inspection machine delivery track of claim 1, wherein a distance between a plurality of the detents is adapted to a pitch of a plurality of test ports of the inspection machine.
6. The crimped diode inspection machine conveyor track according to claim 1, wherein the thickness of the pallet is 1/3-1/2 of the diameter of the PN junction package of the crimped diode.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320177631.5U CN219008999U (en) | 2023-01-31 | 2023-01-31 | Conveying track of crimping diode inspection machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202320177631.5U CN219008999U (en) | 2023-01-31 | 2023-01-31 | Conveying track of crimping diode inspection machine |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN219008999U true CN219008999U (en) | 2023-05-12 |
Family
ID=86248899
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202320177631.5U Active CN219008999U (en) | 2023-01-31 | 2023-01-31 | Conveying track of crimping diode inspection machine |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN219008999U (en) |
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2023
- 2023-01-31 CN CN202320177631.5U patent/CN219008999U/en active Active
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