CN218917553U

CN218917553U - IGBT multifunctional tester

Info

Publication number: CN218917553U
Application number: CN202222745940.6U
Authority: CN
Inventors: 武金柱; 吴百宁; 刘宏开; 孙晓东; 刘浩
Original assignee: Qingdao Branch Of Cecep Shandong Solar Energy Technology Co ltd
Current assignee: Qingdao Branch Of Cecep Shandong Solar Energy Technology Co ltd
Priority date: 2022-10-18
Filing date: 2022-10-18
Publication date: 2023-04-25
Anticipated expiration: 2032-10-18

Abstract

The utility model discloses an IGBT multifunctional tester, comprising: the device comprises a PWM wave generating circuit, a voltage regulating circuit, a first test device and a second test device; the PWM wave generating circuit is connected with the voltage regulating circuit; the first test device is respectively connected with the PWM wave generating circuit and the voltage regulating circuit; the first test device is used for testing the IGBT module, the second test device is used for testing the circuit board, and the circuit board is connected with the IGBT module. According to the utility model, the first test device is inserted into the test hole of the IGBT module, so that the test of the large-scale packaged IGBT module is realized, the first test device has a simple structure and a small volume, the movement and the operation are convenient, and the test efficiency of the IGBT module is effectively improved; meanwhile, the peripheral circuit board connected with the IGBT module is connected with the second testing device, so that the peripheral circuit board can be tested, the application range of the IGBT tester is effectively improved, the IGBT tester is simple to use, and factory maintenance personnel can conveniently maintain and use on site.

Description

IGBT multifunctional tester

Technical Field

The application relates to the technical field of electronics, in particular to an IGBT multifunctional tester.

Background

IGBT (Insulated Gate Bipolar Transistor) the insulated gate bipolar transistor is a compound full-control voltage-driven power semiconductor device composed of BJT (bipolar transistor) and MOS (insulated gate field effect transistor), and has the advantages of high input impedance of MOSFET and low conduction voltage drop of GTR.

The IGBT module is a modularized semiconductor product formed by bridging and packaging an IGBT (insulated gate bipolar transistor chip) and an FWD (diode chip) through a specific circuit, and the packaged IGBT module is directly applied to equipment such as a frequency converter, a UPS (uninterrupted power supply) and the like.

IGBT modules and peripheral circuit boards connected to the IGBT modules are used in large numbers in machinery such as lifting equipment in ports, tractors in rail locomotives, equipment with speed regulation in various manufacturing industries, and the like. When the IGBT module is used, the parameters of the IGBT module are required to be tested, the existing IGBT test instrument is large in size and difficult to move and operate, and the test efficiency is low; meanwhile, the existing IGBT test instrument cannot test a peripheral circuit board connected with the IGBT module, and is small in application range.

Disclosure of Invention

Based on the above, to the technical problem, the multifunctional IGBT tester is provided, and the problems that the existing IGBT tester is large in size, difficult to move and operate, low in testing efficiency and incapable of testing a peripheral circuit board connected with an IGBT module can be solved.

In a first aspect, an IGBT multifunctional tester includes: the device comprises a PWM wave generating circuit, a voltage regulating circuit, a first test device and a second test device;

the PWM wave generating circuit is connected with the voltage regulating circuit;

the first test device is respectively connected with the PWM wave generating circuit and the voltage regulating circuit;

the second test device is respectively connected with the PWM wave generating circuit and the voltage regulating circuit;

the first test device is used for testing the IGBT module, the second test device is used for testing a circuit board, and the circuit board is connected with the IGBT module.

Optionally, the PWM wave generating circuit includes a first PWM wave generating circuit and a second PWM wave generating circuit.

Further optionally, the voltage regulating circuit includes a step-up voltage stabilizing circuit, a first step-down voltage stabilizing circuit, and a second step-down voltage stabilizing circuit;

the first end of the voltage boosting and stabilizing circuit is connected with the first end of the first voltage reducing and stabilizing circuit;

the second end of the first buck voltage stabilizing circuit is connected with the first end of the second buck voltage stabilizing circuit, and the third end of the first buck voltage stabilizing circuit is connected with the first end of the first PWM wave generating circuit;

the second end of the second step-down voltage stabilizing circuit is connected with the first end of the second PWM wave generating circuit.

Further optionally, the first test device includes a first test pen, a second test pen, and a third test pen;

the first end of the first test pen is connected with the second end of the voltage boosting and stabilizing circuit;

the first end of the second test pen is connected with the third end of the voltage boosting and stabilizing circuit;

the third test pen is connected with the second end of the first PWM wave generation circuit.

Further optionally, the IGBT tester further includes a pointer header;

the first end of the pointer gauge head is connected with the first end of the first test pen, and the second end of the pointer gauge head is connected with the second end of the voltage boosting and stabilizing circuit.

Further optionally, the second test device includes a first test interface, a second test interface, a third test interface, and a fourth test interface;

a first end of the first test interface is connected with a third end of the first PWM wave generation circuit;

the first end of the second test interface is connected with the fourth end of the first PWM wave generation circuit;

the third test interface is connected with a third end of the second step-down voltage stabilizing circuit through a first signal matching circuit;

the fourth test interface is connected with the second end of the second PWM wave generation circuit through a second signal matching circuit.

Further optionally, the IGBT tester further includes a charger and a charging protection circuit;

the first end of the charger is connected with a power supply, and the second end of the charger is connected with the first end of the charging protection circuit;

the second end of the charging protection circuit is connected with the battery, and the third end of the charging protection circuit is connected with the fourth end of the voltage boosting and stabilizing circuit.

Further optionally, the IGBT tester further includes a high voltage generation control circuit;

the first end of the high-voltage generation control circuit is connected with the fifth end of the voltage boosting and stabilizing circuit;

the second end of the high-voltage generation control circuit is connected with the first end of the high-voltage power supply;

the third end of the high-voltage generation control circuit is connected with the second end of the high-voltage power supply;

the fourth end of the high-voltage generation control circuit is connected with a control key;

the fifth end of the high voltage generation control circuit is connected with the electric quantity indicating unit.

The utility model has at least the following beneficial effects:

according to the utility model, the first test device is inserted into the test hole of the IGBT module, so that the test of the large-scale packaged IGBT module is realized, the first test device has a simple structure and a small volume, the movement and the operation are convenient, and the test efficiency of the IGBT module is effectively improved; meanwhile, the peripheral circuit board connected with the IGBT module is connected with the second testing device, so that the peripheral circuit board can be tested, the application range of the IGBT tester is effectively improved, the IGBT tester is simple to use, and factory maintenance personnel can conveniently maintain and use on site.

Drawings

Fig. 1 is a schematic block diagram of a circuit of an IGBT tester according to an embodiment of the present utility model.

Detailed Description

In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.

In one embodiment, as shown in fig. 1, there is provided an IGBT multifunction tester including a PWM wave generating circuit, a voltage regulating circuit, a first test device, and a second test device;

In this embodiment, the circuits in the IGBT tester are all controlled by a single chip microcomputer. The single chip microcomputer is an integrated circuit chip, and adopts the ultra-large scale integrated circuit technology to realize the functions of a CPU random access memory RAM, a ROM, various I/O ports, an interrupt system, a timer/timer and the like with data processing capacity.

In the embodiment, the first test device is inserted into the test hole of the IGBT module to test the large-scale packaged IGBT module, and the first test device has the advantages of simple structure, small volume, convenient movement and operation and effective improvement of the test efficiency of the IGBT module; meanwhile, the peripheral circuit board connected with the IGBT module is connected with the second testing device, so that the peripheral circuit board can be tested, the application range of the IGBT tester is effectively improved, the IGBT tester is simple to use, and factory maintenance personnel can conveniently maintain and use on site.

In one embodiment, as shown in fig. 1, the PWM wave generating circuit includes a first PWM wave generating circuit and a second PWM wave generating circuit.

In this embodiment, the first PWM wave generating circuit and the second PWM wave generating circuit have the same structure.

In one embodiment, as shown in fig. 1, the voltage regulating circuit includes a voltage boosting and stabilizing circuit, a first voltage reducing and stabilizing circuit, and a second voltage reducing and stabilizing circuit;

In this embodiment, the voltage boosting and stabilizing circuit is a 24V voltage boosting and stabilizing circuit, the first voltage reducing and stabilizing circuit is a 15V voltage reducing and stabilizing circuit, and the second voltage reducing and stabilizing circuit is a 5V voltage reducing and stabilizing circuit.

In this embodiment, the voltage boosting and stabilizing circuit is configured to perform voltage boosting processing on the voltage input to the voltage boosting and stabilizing circuit, so that the voltage boosting and stabilizing circuit outputs 24V voltage to the first voltage reducing and stabilizing circuit; the first voltage reduction and stabilization circuit is used for performing first voltage reduction treatment on the 24V voltage output by the voltage reduction and stabilization circuit, so that the first voltage reduction and stabilization circuit outputs 15V voltage to the second voltage reduction and stabilization circuit; the second step-down voltage stabilizing circuit is used for performing second step-down processing on the 15V voltage output by the first step-down voltage stabilizing circuit so that the second step-down voltage stabilizing circuit outputs 5V voltage.

In this embodiment, the voltage boosting and stabilizing circuit, the first voltage reducing and stabilizing circuit and the second voltage reducing and stabilizing circuit with different voltages are provided, so that the detection heads in the different circuits can be suitable for testing the IGBT module and the peripheral circuit board connected with the IGBT module; the peripheral circuit board can be a driving board, a driving bottom board and an adapter board.

In one embodiment, as shown in fig. 1, the first test device includes a first test pen, a second test pen, and a third test pen;

In this embodiment, in actual use, the first test pen is a positive stylus, the second test pen is a negative stylus, and the third test pen is a trigger stylus.

In this embodiment, through being provided with positive table pen, negative table pen and trigger table pen respectively, can test TO TO3P, TO247, TO264 encapsulation's IGBT module direct insertion test hole, and only need use positive table pen, negative table pen and trigger table pen 3 test pens TO the IGBT module of large-scale encapsulation just can test it, test device simple structure, and small, remove and convenient operation, effectively improved the test efficiency of IGBT module.

In one embodiment, as shown in fig. 1, the IGBT tester further includes a pointer header;

In this embodiment, the pointer header is provided on the positive pointer, and the measurement value of the positive pointer is displayed by setting the pointer header.

In one embodiment, the second test device includes a first test interface, a second test interface, a third test interface, and a fourth test interface;

In this embodiment, in actual use, the first test interface is an IGBT upper bridge interface, the second test interface is an IGBT lower bridge interface, the third test interface is an optical fiber input interface, and the fourth test interface is an optical fiber output interface.

In this embodiment, the first signal matching circuit and the second signal matching circuit are both optical fiber signal matching circuits.

In this embodiment, in actual use, the IGBT upper bridge interface is connected to the IGBT module, and the IGBT lower bridge interface is connected to the ground.

In this embodiment, through IGBT bridge connection, IGBT bridge connection down, optic fibre input interface and optic fibre output interface be connected with the peripheral circuit board that IGBT module is connected respectively, test peripheral circuit board, effectively improved the application scope of this IGBT tester, and this IGBT tester is simple to use, has small, advantage simple to use, the mill maintenance personnel of being convenient for carries out on-the-spot maintenance and uses.

In one embodiment, as shown in fig. 1, the first test device further includes a charger and a charge protection circuit;

In the present embodiment, the charger is enabled to protect the battery when charging the battery by providing the charging protection circuit.

In one embodiment, as shown in FIG. 1, the high voltage generation control circuit;

In this embodiment, after the optical fiber input is performed through the input end of the first signal matching circuit, the indicator light on the IGBT tester is turned on, and the optical fiber output is performed through the optical fiber signal output end on the second PWM wave generating circuit.

The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.

The above examples merely represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the utility model. It should be noted that it would be apparent to those skilled in the art that various modifications and improvements could be made without departing from the spirit of the present application, which would be within the scope of the present application. Accordingly, the scope of protection of the present application is to be determined by the claims appended hereto.

Claims

1. An IGBT multifunctional tester, comprising: the device comprises a PWM wave generating circuit, a voltage regulating circuit, a first test device and a second test device;

2. The IGBT multifunction tester of claim 1 wherein the PWM wave generating circuit comprises a first PWM wave generating circuit and a second PWM wave generating circuit.

3. The IGBT multifunction tester of claim 2, wherein the voltage regulating circuit comprises a step-up voltage stabilizing circuit, a first step-down voltage stabilizing circuit, and a second step-down voltage stabilizing circuit;

4. The IGBT multifunction tester of claim 3, wherein the first test device comprises a first test pen, a second test pen, and a third test pen;

5. The IGBT multifunction tester of claim 4, further comprising a pointer header;

6. The IGBT multifunction tester of claim 3, wherein the second test device comprises a first test interface, a second test interface, a third test interface, and a fourth test interface;

7. The IGBT multifunction tester of claim 3, further comprising a charger and a charge protection circuit;

8. The IGBT multifunction tester of claim 3, further comprising a high voltage generation control circuit;