CN218782375U

CN218782375U - Analog circuit fault self-diagnosis system

Info

Publication number: CN218782375U
Application number: CN202221505529.5U
Authority: CN
Inventors: 巩彬; 杜先君; 安爱民; 王志文; 石耀科; 卢延荣; 李龙; 王登科
Original assignee: Lanzhou University of Technology
Current assignee: Lanzhou University of Technology
Priority date: 2022-06-16
Filing date: 2022-06-16
Publication date: 2023-03-31
Anticipated expiration: 2032-06-16

Abstract

The utility model discloses analog circuit fault self-diagnosis system, the data acquisition unit adopts voltage detector or oscilloscope collection analog circuit test point signal, get into fault characteristic extraction unit, and by acquisition control unit control test frequency, the working frequency channel, catch and trigger, wherein, acquisition control unit can preset or fault determination unit output risk level trigger control, do benefit to the integrality that improves collection test point signal, the precision, fault characteristic extraction unit adopts the filtering to extract analog circuit abnormal parameter signal, get into the emulation analysis unit, the emulation analysis unit adopts LabVIEW software emulation out the fault type, get into the fault determination unit, the fault type of historical fault storage unit storage gets into the fault determination unit, the fault determination unit compares, for example, can adopt the similarity algorithm to compare two parameter signal, judge the fault type, the position, can carry out automated inspection diagnosis to analog circuit fault.

Description

Analog circuit fault self-diagnosis system

Technical Field

The utility model relates to an analog circuit fault diagnosis technical field, especially analog circuit fault self-diagnosis system.

Background

The analog circuit is a circuit used for transmitting, converting, processing, amplifying, measuring, displaying and other operations of analog signals, is a basis of an electronic circuit, and has difficulties in fault detection and diagnosis due to continuous change, nonlinearity, component tolerance and the like of an electric signal of the analog circuit, and most of the prior art uses a measuring instrument for detection, for example, a nonlinear analog circuit fault diagnosis device with application number of 201920209301.3, which uses an oscilloscope to measure waveforms of test points of the analog circuit, and a voltage measuring device with application number of 202122882597.5, which uses a voltage detector to measure and obtain voltages of the test points of the analog circuit, but the instruments play an auxiliary role, and still rely on workers to diagnose faults and analyze fault causes, and still perform fault diagnosis, judge fault types and fault location based on experience, and cannot realize self-diagnosis of faults of the analog circuit.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing an analog circuit fault self-diagnosis system, through data acquisition, fault feature extraction, emulation analysis out the trouble, judge fault type, position with historical fault combination, can carry out the automated inspection diagnosis to analog circuit fault.

The technical scheme for solving the problem is that the fault diagnosis device comprises a data acquisition unit, an acquisition control unit, a simulation analysis unit, a fault feature extraction unit, a historical fault storage unit and a fault judgment unit, wherein the data acquisition unit is connected with the acquisition control unit and the fault feature extraction unit, the fault feature extraction unit is connected with the simulation analysis unit, and the simulation analysis unit and the historical fault storage unit are connected with the fault judgment unit.

Preferably, the data acquisition unit acquires the test point signal of the analog circuit by using a voltage detector or an oscilloscope.

Preferably, the acquisition control unit outputs a control signal to the data acquisition unit according to a preset risk level or a risk level output by the fault determination unit, and controls the test frequency, the working frequency band and the capture trigger.

Preferably, the fault feature extraction unit extracts an analog circuit abnormal parameter signal by filtering, and the analog circuit abnormal parameter signal enters the simulation analysis unit, and the simulation analysis unit simulates the fault type by adopting LabVIEW software.

Preferably, the fault determination unit compares the simulated fault type with the fault types stored in the historical fault storage unit to determine the fault type and location.

Preferably, the capture trigger is generated by a pulse generation circuit.

The utility model has the advantages that: the method comprises the following steps that 1, a data acquisition unit is arranged to acquire a test point signal of an analog circuit, the test point signal enters a fault feature extraction unit, an abnormal parameter signal of the analog circuit is extracted by adopting filtering and enters a simulation analysis unit, the simulation analysis unit simulates a fault type by adopting LabVIEW software, a fault judgment unit compares the simulated fault type with a fault type stored in a historical fault storage unit, the fault type and the fault position are judged, and automatic detection and diagnosis can be carried out on the fault of the analog circuit;

and 2, setting an acquisition control unit, outputting a control signal to the data acquisition unit according to the preset or fault judgment unit output risk level, controlling the test frequency, the working frequency band and capturing trigger, and being beneficial to improving the integrity and the precision of the acquired test point signal.

Drawings

Fig. 1 is a circuit block diagram of the present invention.

Detailed Description

The foregoing and other technical and scientific aspects, features and advantages of the present invention will be apparent from the following detailed description of the embodiments, which is to be read in connection with the accompanying fig. 1. The structural contents mentioned in the following embodiments are all referred to the attached drawings of the specification.

Exemplary embodiments of the present invention will be described below with reference to the accompanying drawings.

The first embodiment of the invention provides an analog circuit fault self-diagnosis system, which comprises a data acquisition unit, an acquisition control unit, a simulation analysis unit, a fault feature extraction unit, a historical fault storage unit and a fault judgment unit, wherein the data acquisition unit acquires a signal of a test point of an analog circuit by using a voltage detector or an oscilloscope, enters the fault feature extraction unit, and controls test frequency, a working frequency range and capture trigger by the acquisition control unit, wherein the acquisition control unit can preset or the fault judgment unit outputs risk level trigger control (which can be generated by a pulse generation circuit and triggers and adjusts pulse duty ratio generated by pulses by fault risk levels).

In a second embodiment, on the basis of the first embodiment, the data acquisition unit acquires the analog circuit test point signal by using a voltage detector or an oscilloscope.

In a third embodiment, on the basis of the first embodiment, the acquisition control unit outputs a control signal to the data acquisition unit according to a preset or fault judgment unit output risk level, and controls the test frequency, the working frequency band, and the capture trigger.

In a fourth embodiment, on the basis of the first embodiment, the fault feature extraction unit extracts an abnormal parameter signal of the analog circuit by filtering, and the abnormal parameter signal enters the simulation analysis unit, and the simulation analysis unit simulates the fault type by adopting LabVIEW software.

Fifth embodiment is that, in addition to the first embodiment, the fault determination unit compares the simulated fault type with the fault types stored in the historical fault storage unit, and for example, a similarity algorithm may be used to compare two parameter signals to determine the fault type and location.

Sixth, based on the third embodiment, the capture trigger is generated by a pulse generation circuit, such as an oscillator, which is a prior art and will not be described in detail herein.

The utility model discloses during specific practicality, the data acquisition unit adopts voltage detector or oscilloscope to gather analog circuit test point signal, get into fault characteristics extraction unit, and by acquisition control unit control test frequency, the working frequency range, catch and trigger, wherein, acquisition control unit can preset or failure determination unit output risk level trigger control, for example, when fault risk level is high, the test frequency of acquisition control unit control is high, catch trigger frequency height, do benefit to the integrality that improves acquisition test point signal, the precision, can control acquisition control unit's working frequency range according to analog circuit's working frequency range, do benefit to and fall the noise, improve the precision of acquisition test point signal, fault characteristics extraction unit adopts the filtering to extract analog circuit abnormal parameter signal, get into the emulation analysis unit, the emulation analysis unit adopts LabVIEW software emulation out the fault type, get into the failure determination unit, the fault type that history trouble storage unit stored gets into the failure determination unit, the fault determination unit compares, for example, can adopt the similarity algorithm to compare two parameter signal, judge the fault type, the position, can carry out automated inspection diagnosis to analog circuit trouble.

Claims

1. The analog circuit fault self-diagnosis system comprises a data acquisition unit, an acquisition control unit, a simulation analysis unit, a fault feature extraction unit, a historical fault storage unit and a fault judgment unit, and is characterized in that the data acquisition unit is connected with the acquisition control unit and the fault feature extraction unit, the fault feature extraction unit is connected with the simulation analysis unit, and the simulation analysis unit and the historical fault storage unit are connected with the fault judgment unit;

the data acquisition unit adopts a voltage detector or an oscilloscope to acquire analog circuit test point signals;

the fault feature extraction unit adopts filtering to extract an analog circuit abnormal parameter signal, the analog circuit abnormal parameter signal enters the simulation analysis unit, and the simulation analysis unit adopts LabVIEW software to simulate a fault type;

and the fault judging unit compares the simulated fault type with the fault type stored in the historical fault storage unit by adopting a similarity algorithm to judge the type and the position of the fault.

2. The analog circuit fault self-diagnosis system according to claim 1, wherein the acquisition control unit outputs a control signal to the data acquisition unit to control the test frequency, the operating frequency band, and the capture trigger according to a preset or fault determination unit output risk level.

3. An analog circuit fault self-diagnosis system according to claim 2, wherein the capture trigger is generated by a pulse generation circuit.