CN102621349A - Accelerometer test device and accelerometer test method - Google Patents
Accelerometer test device and accelerometer test method Download PDFInfo
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- CN102621349A CN102621349A CN2011104574406A CN201110457440A CN102621349A CN 102621349 A CN102621349 A CN 102621349A CN 2011104574406 A CN2011104574406 A CN 2011104574406A CN 201110457440 A CN201110457440 A CN 201110457440A CN 102621349 A CN102621349 A CN 102621349A
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Abstract
The invention discloses an accelerometer test device and an accelerometer test method, which synchronously realize screening test and data acquisition and processing of accelerometers. Accelerometer testing can be completed rapidly, automatically, highly precisely and highly reliably, and automation level in control of an accelerometer production process is improved.
Description
Technical field
The device that the present invention relates to a kind of method of testing of instrument and use this method of testing relates more specifically to a kind of apparatus and method of the dynamic perfromance of accelerometer being carried out integrated test.
Background technology
Accelerometer is the responsive inertial sensor of high precision that is used for measuring the carrier accekeration; Its performance directly influences the effect of hi-Fix orientation system; Therefore in process of production; Need test each item dynamic perfromance of accelerometer gauge outfit, so that itself and corresponding servo circuit are accurately mated.At present, the proving installation that generally adopts traditional instrument to constitute is tested accelerometer, adopts discrete instrument test system building, and is main with manual measurement, and the test duration is long, test error is big, test result is repeatable poor.
Summary of the invention
Technical matters to be solved by this invention is to overcome the deficiency of above-mentioned existing method, and a kind of automatic Synthesis proving installation and method of testing thereof of accelerometer is provided, and system constitutes simply, test speed is fast, reliability is high.
Implementation of the present invention is following:
A kind of accelerometer proving installation; Comprise computing machine, interface card, gpib bus, servo circuit, multipath conversion unit, function generator, oscillograph, digital voltmeter, signal conditioner; Wherein multipath conversion unit, function generator, oscillograph, digital voltmeter are connected respectively with signal conditioner with gpib bus; Interface card connects computing machine and gpib bus; Be used to realize the communication between testing tool, the computing machine; Multipath conversion unit, function generator, oscillograph, digital voltmeter connect accelerometer and servo circuit through signal conditioner, and the multipath conversion unit is used to realize the circuit switching controls, and signal conditioner is used to produce required pumping signal and reference signal.
Described computing machine loads display module, data management module, testing control module and output module, and wherein the control of above-mentioned module and management are undertaken by the master routine control module.
A kind of method of testing of using above-mentioned accelerometer proving installation may further comprise the steps:
The first step starts said accelerometer proving installation, carries out initial work such as the basic test parameter is provided with;
In second step, select said accelerometer proving installation to carry out manual test or test automatically;
The 3rd step, selected according to the test in a last step, adopt manual test or automatic test that the parameter of accelerometer is tested by master routine control module scheduling tests control module;
The 4th step is to the coupling and the debugging of accelerometer and servo circuit;
In the 5th step, output test result, and test data is inquired about and handled.
Said test event comprises, the screening of realization accelerometers such as resonance peak, bandwidth, overshoot, noise, triangular wave functional test and servo circuit voltage regulation performance and mate required test.
The present invention compared with prior art; A kind of rapid, reliable accelerometer proving installation and method are provided; Shortened and tested the required time, a plurality of parameters of accelerometer have been tested and coupling according to the condition of setting automatically, and can realize data automatic collecting, transmission, preservation, processing and analysis; Improve the automatization level of accelerometer test greatly, had stronger versatility and extensibility simultaneously.
Description of drawings
Fig. 1 is the hardware block diagram of proving installation of the present invention.
Fig. 2 is the high-level schematic functional block diagram of computing machine in the proving installation of the present invention.
Fig. 3 is the process flow diagram of method of testing of the present invention.
Fig. 4 is the process flow diagram according to method of testing test bandwidth parameter of the present invention.
Fig. 5 is the process flow diagram according to method of testing test resonance peak parameter of the present invention.
Description of reference numerals
1 accelerometer gauge outfit, 2 signal conditioners, 3 servo circuits, 4 multipath conversion unit, 5 function generators
6 oscillographs, 7 digital voltmeter 8GPIB buses, 9 interface cards, 10 computing machines
Embodiment
Shown in Figure 1 is the hardware block diagram of proving installation of the present invention, comprises accelerometer 1, signal conditioner 2, servo circuit 3, multipath conversion unit 4, function generator 5, oscillograph 6, digital voltmeter 7, gpib bus 8, interface card 9 and computing machine 10.Degree of will speed up meter 1 lies in a horizontal plane on the work support, and is connected with servo circuit 3 through the signal conditioning circuit in the signal conditioner 2; Get 4 gpib bus 8, respectively function generator 5, digital oscilloscope 6, digital voltmeter 7 are connected with interface card 9; Interface card 9 is connected with computing machine 10 through connecting line, realizes the communication between testing tool, the computing machine.Multipath conversion unit, function generator, oscillograph, digital voltmeter connect accelerometer and servo circuit through signal conditioner, and the multipath conversion unit is used to realize the circuit switching controls, and signal conditioner is used to produce required pumping signal and reference signal.Wherein, interface card 9 is communicated by letter through between GPIB data bus and computing machine, function generator, the testing tool.Each testing tool is connected with gpib bus, realizes one of following three kinds of functions: 1. accept data; 2. send data; 3. the exchanges data of all appts on the control bus, this function is usually by computer realization.
Be illustrated in figure 2 as the high-level schematic functional block diagram of computing machine in the proving installation, wherein be mounted with display module, data management module, testing control module and output module, wherein the control of above-mentioned module and management are undertaken by the master routine control module.Wherein, Display module comprises abnormal monitoring alarm module, test result display module, program interface display module, test function display module and instrument state display module; Data management module comprises test data processing and test data enquiry module, and testing control module comprises functional test module, harmonic peak module, bandwidth test module, overshoot test module, noise testing module, triangular wave test module and servo circuit voltage stabilizing test module.In the process that the accelerometer parameters is measured, accelerometer is carried out manual test or test automatically by master routine control module scheduling tests control module.Test parameter comprises, test events such as resonance peak, bandwidth, overshoot, noise, triangular wave, function and servo circuit voltage regulation performance.
Be illustrated in figure 3 as the process flow diagram of method of testing of the present invention.Steps of the method are:
The first step starts testing tool, and the operation test procedure checks whether each instrument connects normal, and the operator can be provided with or select the default setting instrument voluntarily, accomplishes system initialization work such as being provided with of underlying instrument test controlled variable.
Second step, select manual test or test automatically, as selecting manual test, can carry out individual event or combined test respectively to the accelerometer parameters; As select automatic test, then adopt multipath conversion unit, signal conditioner, function generator to gather in real time, handle, analyze, screen, show, analyze and automatically judge whether output is satisfied pre-conditioned.
The 3rd step, selected according to the test in a last step, by master routine control module scheduling tests control module accelerometer is carried out manual test or test automatically.Test parameter comprises, test events such as resonance peak, bandwidth, overshoot, noise, triangular wave, functional test and servo circuit voltage regulation performance.In this step; At first switch to the passage 2 of multipath conversion unit; Utilize signal conditioner to realize selecting then, adopt function generator to produce frequency signal then, then switch to the passage 1 of multipath conversion unit; Utilize signal conditioner realize to select once more, judge automatically according to whether the output signal of the accelerometer of digital voltmeter test being satisfied the parameter preset condition to the condition of different parameters test setting.Avoided because the imperfect and inaccurate problem of DATA REASONING that user's misoperation causes through the fault freedom of system in this step process.
The testing process of Fig. 4 and the peak parameters of bandwidth resonant respectively shown in Figure 5.
As shown in Figure 4, when the test bandwidth parameter, produce the sinusoidal perturbation signal by function generator; Signal keeps that amplitude is 1, frequency is zero; Load on servo circuit, system gathers system's output this moment M (0) automatically, wherein; M (0) is output in 0 o'clock for accelerometer frequency signal last time, and M (ω) exports during for ω for this frequency signal.Few according to first sampling number, the principle more than post-sampling is counted increases frequency and makes system's output
ω
0Be the bandwidth frequency of system., the concrete setting value of sinusoidal signal frequency should be followed following principle: can be earlier with the even recruitment of 200Hz value, and promptly sampling number is few, exports to system to be lower than
This moment, frequency was ω
200Make the sinusoidal perturbation signal frequency from (ω then
200-200), evenly increase with the 50Hz variable quantity, promptly increase sampling number, according to same quadrat method, the variation value that successively decreases can obtain the system bandwidth frequencies omega
0
As shown in Figure 5, when test resonance peak parameter, produce the sinusoidal perturbation signal by function generator; Amplitude is 1V, from the low frequency to the high frequency, is added on the accelerometer circuit, and system gathers system's output this moment automatically; And accomplish relatively, up to being output as maximal value, and satisfy: M (ω
p)=M
Max, ω
pBe resonance frequency.Wherein, through formula (1), (2) computing system model equation damping ratio, undamped natural frequency.
In the above-mentioned formula, M (ω
p) for recording the resonance peak of system, ξ is a system model equation damping ratio, ω
pBe the crest frequency of system, ω
nBe system model equation undamped natural frequency.
In Fig. 5, M (ω ') is the output in ω ' time for the last frequency signal of accelerometer, and M (ω ") is ω for this frequency signal " time exports.The principle that frequency interval is chosen is that choose at low-frequency range and high band can be greatly, and promptly sampling number is few, finds corner frequency; At the corner frequency place be set the less time interval, promptly sampled point is many.Owing to the existence of system resonance frequency, should reduce the amplitude of disturbance voltage at the tuning-points near zone.Wherein, through to test data analysis repeatedly, the sinusoidal signal amplitude is preferably set according to following rule: during less than 100Hz, get 1V; 100Hz gets 0.7V to 400Hz; Greater than 400HZ, get 1.6V.Then, it is 1V that the sinusoidal perturbation signal amplitude is set, and frequency is a resonance frequency omega
p, obtain the resonance peak M (ω of system
p).
Testing control module also is used for testing other parameters such as overshoot, triangular wave, noise, functional test and servo circuit voltage regulation performance.With test overshoot parameter is example, produces square-wave signal by function generator, to replace unit step signal as the disturbance input acceleration, passes through the overshoot of oscillograph testing acceleration meter automatically.
In the 4th step, to the coupling and the debugging of accelerometer and servo circuit, whole test is accomplished, and ejects and tests into dialog box automatically, and provide this coupling filler test result description at test interface.If all indexs meet, test result is with green font; There is index not meet, shows with red font; Abnormal conditions appear in the test process, this EOT end of test then, and provide prompting.Test result is preserved automatically.
The 5th step, by master routine control module control output module, the summary sheet that outputs test result, and accomplish data and print; Master routine control module control data administration module can be inquired about and handle the test data of all accelerometers.
Proving installation and method that the present invention adopts have made up modularization, universalization, standardized test macro; Avoided building of discrete instrument in the test screening process; The instrument setting is controlled by computing machine automatically; Accelerometer measures increasingly automated, quick, high reliability that this test macro has been realized has stronger versatility and extendability, is of value to the process control of accelerometer production technology.
In addition, owing in the test screening process, reduced manually-operated, produce required pumping signal and reference signal by system's control; Can be accurate to more than the 1Hz; And in test process, the signals collecting precision is 8, so whole test system has higher measuring accuracy.
Degree of will speed up meter gauge outfit and servo circuit are tested screening automatically and the number pick is gathered, handled and can realize synchronously, have simplified testing process; Test result need not hand-kept, will count pick and save as database automatically, and realize the derivation and the storage of data, and therefore, whole test system has higher automatization level.
Owing to designed visual operation interface, realized the real-time demonstration of test result; In the test process, system can monitor ruuning situation automatically, and automatic alarm tester disposes to undesirable test data, and therefore, whole test system has higher reliability.
Claims (4)
1. accelerometer proving installation; It is characterized in that; Said proving installation comprises computing machine, interface card, gpib bus, servo circuit, multipath conversion unit, function generator, oscillograph, digital voltmeter, signal conditioner; Wherein multipath conversion unit, function generator, oscillograph, digital voltmeter are connected respectively with signal conditioner with gpib bus; Interface card connects computing machine and gpib bus, and multipath conversion unit, function generator, oscillograph, digital voltmeter connect accelerometer and servo circuit through the signal conditioner bag, and wherein the multipath conversion unit is used to realize the circuit switching controls; Signal conditioner contains acquisition module, current limliting module, filtering circuit, is used to produce required pumping signal and reference signal.Described computing machine loads display module, data management module, testing control module and output module, and is used for master routine control module that above-mentioned module is managed and controlled.
2. accelerometer proving installation as claimed in claim 1; It is characterized in that; Described display module comprises abnormal monitoring alarm module, test result display module, program interface display module, test function display module and instrument state display module; Data management module comprises that test data is handled and test number pick enquiry module, and testing control module comprises functional test module, harmonic peak module, bandwidth test module, overshoot test module, noise testing module, triangular wave test module and servo circuit voltage regulation performance test module.
3. the method that application rights requires 1 described proving installation that accelerometer is tested is characterized in that, may further comprise the steps:
The first step starts said accelerometer proving installation, carries out initialization;
In second step, select said accelerometer proving installation to carry out manual test or test automatically;
The 3rd goes on foot, and the test in a last step of root pick is selected, and adopts manual test or automatic test that the parameter of accelerometer is tested by master routine control module scheduling tests control module;
In the 4th step, accelerometer and servo circuit are mated and debug;
In the 5th step, output test result, and test data is inquired about and handled.
4. method of testing according to claim 3 is characterized in that, the test parameter of said accelerometer comprises, resonance peak, bandwidth, overshoot, noise, triangular wave, functional test and the test of servo circuit voltage regulation performance.
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
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CN104535799A (en) * | 2014-12-29 | 2015-04-22 | 杭州士兰微电子股份有限公司 | Testing device and method for inertial sensor |
CN105868064A (en) * | 2016-04-15 | 2016-08-17 | 浪潮电子信息产业股份有限公司 | Method for automatic testing of server memory power supply |
CN107102171A (en) * | 2017-03-21 | 2017-08-29 | 苏州纳芯微电子股份有限公司 | Error diagnosis detection method for accelerometer |
CN110514870A (en) * | 2019-08-13 | 2019-11-29 | 中国航空工业集团公司西安飞行自动控制研究所 | A kind of silicon pendulum accelerometer signal conditioning device and system |
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CN1971296A (en) * | 2005-11-21 | 2007-05-30 | 洛阳卓航测控设备有限责任公司 | Universal testing interface device and its universal testing system |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104535799A (en) * | 2014-12-29 | 2015-04-22 | 杭州士兰微电子股份有限公司 | Testing device and method for inertial sensor |
CN105868064A (en) * | 2016-04-15 | 2016-08-17 | 浪潮电子信息产业股份有限公司 | Method for automatic testing of server memory power supply |
CN107102171A (en) * | 2017-03-21 | 2017-08-29 | 苏州纳芯微电子股份有限公司 | Error diagnosis detection method for accelerometer |
CN107102171B (en) * | 2017-03-21 | 2019-09-20 | 苏州纳芯微电子股份有限公司 | Error diagnosis detection method for accelerometer |
CN110514870A (en) * | 2019-08-13 | 2019-11-29 | 中国航空工业集团公司西安飞行自动控制研究所 | A kind of silicon pendulum accelerometer signal conditioning device and system |
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Application publication date: 20120801 |