CN112162226B - Measurement characteristic separation testing device and method and terminal equipment - Google Patents
Measurement characteristic separation testing device and method and terminal equipment Download PDFInfo
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Abstract
The embodiment of the invention relates to a separation testing device, a separation testing method and terminal equipment for measurement characteristics, which are applied to a high-voltage direct-current measuring system. The voltage waveform provided by a test voltage source, the voltage waveform provided by a resistor box and the voltage waveform provided by a remote end module are subjected to transient response characteristic, frequency response characteristic and direct current voltage division ratio analysis through a power supply and data analysis operation module to obtain step response time, amplitude error, phase angle error and direct current voltage division ratio, and whether the step response time, the amplitude error, the phase angle error and the direct current voltage division ratio meet technical protocols and further whether the remote end module or the resistor box breaks down is judged, so that the problem that the specific position of the fault of the high-voltage direct current voltage measurement system cannot be accurately positioned at present is solved.
Description
Technical Field
The invention relates to the technical field of power measurement, in particular to a measurement characteristic separation testing device and method and terminal equipment.
Background
The high-voltage direct-current voltage measuring device is installed in a converter station direct-current field of a power system and used for measuring direct-current voltage of a direct-current bus and a direct-current line of a high-voltage direct-current power transmission system. Currently, the existing high-voltage direct-current voltage measuring device is generally a laser power supply type active high-voltage direct-current voltage divider based on a resistance-capacitance voltage division principle. The high-voltage and low-voltage arms of the high-voltage direct-current voltage divider are formed by serially connecting a plurality of sections of modularized resistance-capacitance units, and have the same time constant so as to ensure good frequency characteristics and transient characteristics of the direct-current voltage divider; the resistance box carries out secondary voltage division on a low-voltage signal output by the high-voltage direct-current voltage divider and converts the low-voltage signal into a plurality of paths of mutually independent signal outputs, a resistance-capacitance voltage division network is designed inside the resistance box and consists of a plurality of mutually parallel independent resistance-capacitance voltage division branches, and each resistance-capacitance voltage division branch has the same time constant as a high-voltage arm and a low-voltage arm of the high-voltage direct-current voltage divider so as to ensure that the secondary voltage division plate and the whole high-voltage direct-current voltage measuring device have good frequency characteristics and transient characteristics; each secondary partial pressure plate is correspondingly connected with a remote end module, the remote end module carries out A/D conversion processing on analog voltage signals of the secondary partial pressure plates after filtering and signal conditioning and transmits the analog voltage signals to the merging unit through optical signals, and the merging unit merges and processes data of all sampling channels and transmits the data to the direct current control, protection and fault recording device through the optical signals in real time.
The existing method for carrying out the field handover test and the periodic test of the measurement characteristics of the high-voltage direct-current voltage measurement device adopts a direct-current voltage division ratio rough inspection and comparison mode, cannot accurately master the integral measurement characteristics of the high-voltage direct-current voltage measurement device, is difficult to ensure the operation reliability of the high-voltage direct-current voltage measurement device, and directly influences the safe operation of a direct-current transmission system in serious cases. When the overall measurement characteristic test or the direct current voltage division ratio rough inspection contrast test is carried out on the high-voltage direct current voltage measurement device, the measurement characteristics and the component conditions of each subsystem such as a resistance-capacitance voltage division unit, a resistance box, a remote end module, a merging unit and the like of the high-voltage direct current voltage measurement device cannot be mastered due to the adoption of an overall system test method; according to the statistics of the defect types of the direct-current voltage measuring devices of the conventional high-voltage direct-current transmission system, the fault reasons of the high-voltage direct-current voltage measuring devices are mainly distributed in the subsystems such as the resistance box, the remote end module and the merging unit, the cases that the resistance-capacitance voltage dividing unit has faults are few, however, the measurement characteristics of the subsystems such as the resistance box, the remote end module and the merging unit of the high-voltage direct-current voltage measuring devices at present still lack a credible separation test verification means, and the rapid and accurate diagnosis and positioning of the faults of the high-voltage direct-current voltage measuring systems cannot be completed by a separation test method.
Disclosure of Invention
The embodiment of the invention provides a device and a method for separately testing measurement characteristics and terminal equipment, which are used for solving the technical problems that the measurement characteristics of a resistor box and a far-end module in a high-voltage direct-current voltage measurement device cannot be separately tested and the specific fault position of a high-voltage direct-current voltage measurement system cannot be accurately positioned at present.
In order to achieve the above object, the embodiments of the present invention provide the following technical solutions:
a separation testing device for measurement characteristics is applied to a high-voltage direct-current measuring system, the high-voltage direct-current measuring system comprises a far-end module and a resistance box connected with the far-end module, and the separation testing device for measurement characteristics comprises a test voltage source, a voltage acquisition module and a power supply and data analysis operation module;
the test voltage source is respectively connected with the resistance box and the power supply and data analysis operation module and is used for providing voltages with different time sequences, amplitudes and waveforms;
the input end of the voltage acquisition module is connected between the resistor box and the remote module, and the output end of the voltage acquisition module is connected with the power supply and data analysis operation module and is used for acquiring the voltage of the resistor box, processing the acquired voltage and transmitting the processed voltage to the power supply and data analysis operation module;
and the power supply and data analysis operation module is used for acquiring voltage waveforms transmitted by the remote module, the test voltage source and the voltage acquisition module and analyzing the voltage waveforms to obtain whether the high-voltage direct current measurement system breaks down or not and the position of the breaking down.
Preferably, the measurement characteristic separation testing device further comprises a communication protocol converter, wherein the communication protocol converter is used for converting a transmission data format; the input end of the communication protocol converter is respectively connected with the remote end module and the voltage acquisition module, and the output end of the communication protocol converter is connected with the power supply and data analysis operation module.
Preferably, the power supply and data analysis and operation module comprises a laser and a driving circuit connected with the laser;
the laser is used for providing laser power supply for the voltage acquisition module and the remote end module;
the driving circuit is used for controlling the output laser power of the laser in a closed loop mode.
Preferably, the power supply and data analysis operation module further comprises a display interface, and the display interface is used for displaying the acquired data and the voltage waveform.
Preferably, the sampling rate of the power supply and data analysis operation module for collecting and receiving is 10Hz, 50Hz or 100 Hz.
The invention also provides a separation test method for measurement characteristics, which is applied to a high-voltage direct current measurement system and comprises the following steps:
s1, based on the measurement characteristic separation testing device, connecting a high-voltage direct current measuring system with the measurement characteristic separation testing device;
s2, collecting a first initial voltage waveform of a test voltage source, a second initial voltage waveform of a voltage collection module and a third initial voltage waveform of a remote module before applying voltage to the measurement characteristic separation testing device; the measuring characteristic separation testing device is used for collecting a first voltage waveform transmitted by the testing voltage source, a second voltage waveform and a third voltage waveform transmitted by the testing signal through the voltage collecting module and the far-end module;
s3, with the characteristic signal as a reference, comparing the first voltage waveform, the second voltage waveform, the third voltage waveform with the first initial voltage waveform, the second initial voltage waveform with the third initial voltage waveform to obtain a first measurement voltage waveform, a second measurement voltage waveform and a third measurement voltage waveform corresponding to the first voltage waveform, the second voltage waveform and the third voltage waveform;
and S4, processing the first measurement voltage waveform, the second measurement voltage waveform, the third measurement voltage waveform, the first initial voltage waveform, the second initial voltage waveform and the third initial voltage waveform to obtain step response time, amplitude error, phase angle error and direct current voltage division ratio corresponding to the first measurement voltage waveform, the second measurement voltage waveform and the third measurement voltage waveform, and judging whether a far-end module or a resistor box has faults or not according to whether the step response time, the amplitude error, the phase angle error and the direct current voltage division ratio meet technical protocol requirements or not.
Preferably, the method for separately testing measurement characteristics further includes that if the obtained step response time, amplitude error, phase angle error and dc voltage division ratio do not satisfy the technical protocol when the first measurement voltage waveform is compared with the second measurement voltage waveform, the resistance box is abnormal.
Preferably, the method for separately testing measurement characteristics further includes that if the obtained step response time, amplitude error, phase angle error and dc voltage-to-voltage ratio do not satisfy the technical protocol when the second measurement voltage waveform is compared with the third measurement voltage waveform, the remote module is abnormal; and if the obtained step response time, amplitude error, phase angle error and direct-current voltage division ratio do not meet the technical protocol when the first measurement voltage waveform is compared with the third measurement voltage waveform, the remote module or the resistor box is abnormal.
The present invention also provides a computer-readable storage medium for storing computer instructions which, when executed on a computer, cause the computer to perform the above-described metrology characteristic isolation test method.
The invention also provides a terminal device, comprising a processor and a memory:
the memory is used for storing program codes and transmitting the program codes to the processor;
the processor is configured to execute the measurement characteristic separation test method according to instructions in the program code.
According to the technical scheme, the embodiment of the invention has the following advantages:
1. the measurement characteristic separation testing device provides a test voltage through a test voltage source, a voltage acquisition module acquires the voltage divided by a resistance box, a power supply and data analysis operation module acquires the voltage waveform provided by the test voltage source and the voltage waveform processed by the voltage acquisition module and provided by a remote module to carry out transient response characteristic, frequency response characteristic and direct-current voltage division ratio analysis to obtain the step response time and amplitude error, the phase angle error and the direct current voltage division ratio are judged whether the step response time, the amplitude error, the phase angle error and the direct current voltage division ratio meet the technical protocol to judge whether the remote end module or the resistor box has a fault, and the technical problems that the measurement characteristics of the resistor box and the remote end module in the high-voltage direct current voltage measuring device cannot be separately tested and the specific fault position of the high-voltage direct current voltage measuring system cannot be accurately positioned at present are solved.
2. The method for separately testing the measurement characteristics acquires voltage waveforms of a test voltage source, a voltage acquisition module and a remote module through a power supply and data analysis operation module on a measurement characteristic separation testing device, analyzes transient response characteristics, frequency response characteristics and direct current voltage division ratio of the voltage waveforms and the voltage waveforms to obtain step response time, amplitude errors, phase angle errors and direct current voltage division ratio of the test, judges whether the step response time, the amplitude errors, the phase angle errors and the direct current voltage division ratio meet technical protocols to judge whether the remote module or a resistor box has faults or not, and solves the technical problems that the measurement characteristics of the resistor box and the remote module in a high-voltage direct current voltage measuring device cannot be separately tested and the specific fault position of a high-voltage direct current voltage measuring system cannot be accurately positioned at present.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without inventive exercise.
Fig. 1 is a block diagram of a separation testing apparatus for measuring characteristics according to an embodiment of the present invention.
Fig. 2 is a block diagram of a voltage acquisition module of the separation testing apparatus for measurement characteristics according to the embodiment of the present invention.
Fig. 3 is a block diagram of a system for measuring propagation delay characteristics in signal processing according to an embodiment of the present invention.
Fig. 4 is a flowchart illustrating steps of a separation testing method for measurement characteristics according to an embodiment of the present invention.
Fig. 5 is a block diagram of a conventional high-voltage dc voltage measuring system.
Detailed Description
In order to make the objects, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the embodiments described below are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 5 is a block diagram of a conventional high-voltage dc voltage measuring system.
As shown in fig. 5, the high-voltage direct current voltage measurement system mainly includes a resistance-capacitance voltage division unit, a resistance box, a far-end module, and a merging unit, the respective performance conditions of these four components have important influence on the overall performance of the high-voltage direct current voltage measurement system, and the separation, test and analysis of the performance of each component of the high-voltage direct current voltage measurement system is an important basis for evaluating the performance and reliability of the high-voltage direct current voltage measurement system, and is also an important means for accurately positioning a fault component of the high-voltage direct current voltage measurement system; at present, the research on the separation test technology and the test method of a resistance-capacitance voltage division unit, a resistance box, a far-end module and a merging unit of a high-voltage direct-current voltage measurement system is not deep, and when a measurement characteristic type test and a routine test of the high-voltage direct-current voltage measurement system are carried out, the test is mainly carried out aiming at the integral transient response, the frequency response and the maximum direct-current voltage division ratio.
In the direct-current voltage measuring device of the high-voltage direct-current transmission system of GB/T26217-; aiming at the frequency response test of a high-voltage direct-current voltage measuring system, a measuring device is required to apply sine wave test voltages with the frequencies of 50Hz, 100Hz, 200Hz, 300Hz, 400Hz, 500Hz, 600Hz, 700Hz, 800Hz, 900Hz, 1000Hz, 1200Hz, 2000 Hz and 3000Hz at a primary input end respectively to measure the frequency response characteristics, the measurement comprises the amplitude (alternating current transformation ratio) and the phase position of alternating voltage, the input voltage can adopt sine wave signals or signal waveforms approved by a user, the test input voltage value is greater than 1kV (root mean square value) and the frequency response characteristics are required to meet related requirements; aiming at the maximum direct-current voltage division ratio test of the direct-current voltage measuring device, direct-current voltage measuring errors of a measuring sample under the voltages of 0.01p.u, 0.1p.u, 0.2p.u, 0.8p.u, 1p.u, 1.1p.u and 1.5p.u are specified, and the precision of a voltage measuring system meets the requirement of a technical protocol. p.u. expressing bai is a per unit value, which is one of relative units, and a per unit value is a numerical value marking method commonly used in power system analysis and engineering calculation, and expresses relative values of each physical quantity and parameter.
The existing high-voltage direct-current voltage measurement system generally adopts laser power supply for carrying out measurement characteristic separation test on a remote module, sampling data adopts an optical fiber transmission mode according to a specified sampling rate and a communication protocol, the data sampling rate or the transmission protocol is not completely unified, and a remote module test system which can provide laser power supply for the remote module and can compatibly receive different sampling rates or communication protocols is lacked at present. Because the secondary voltage division output voltage of the resistance box of the laser power supply type high-voltage direct current voltage measurement system is generally low (generally less than 1V) and the voltage division output precision is easily influenced by load impedance and a time constant, the distance between the standard reference voltage sampling point and the far-end module test system is far during field test, and the accuracy of standard reference voltage collection is difficult to ensure by using a mode of directly introducing reference voltage into a long cable for analog sampling.
The embodiment of the application provides a measurement characteristic separation testing device, a measurement characteristic separation testing method and terminal equipment, which are applied to a high-voltage direct current measuring system and used for solving the technical problems that the measurement characteristics of a resistor box and a far-end module in the high-voltage direct current measuring device cannot be separately tested at present and the specific fault position of the high-voltage direct current measuring system cannot be accurately positioned.
The first embodiment is as follows:
fig. 1 is a frame diagram of a separation testing device for measurement characteristics according to an embodiment of the present invention, fig. 2 is a frame diagram of a voltage acquisition module of the separation testing device for measurement characteristics according to an embodiment of the present invention, and fig. 3 is a frame diagram of a power supply and data analysis operation module of the separation testing device for measurement characteristics according to an embodiment of the present invention.
As shown in fig. 1 to fig. 3, an embodiment of the present invention provides a measurement characteristic separation testing apparatus, which is applied to a high-voltage direct current measurement system, where the high-voltage direct current measurement system includes a far-end module 11 and a resistor box 12 connected to the far-end module 11, and the measurement characteristic separation testing apparatus includes a test voltage source 21, a voltage acquisition module 22, and a power supply and data analysis operation module 23;
the test voltage source 21 is respectively connected with the resistor box 12 and the power supply and data analysis operation module 23 and is used for providing voltages with different time sequences, amplitudes and waveforms;
the input end of the voltage acquisition module 22 is connected between the resistor box 12 and the remote module 11, and the output end of the voltage acquisition module 22 is connected with the power supply and data analysis operation module 23, and is used for acquiring the voltage of the resistor box 12, processing the acquired voltage and transmitting the processed voltage to the power supply and data analysis operation module 23;
and the power supply and data analysis and operation module 23 is used for acquiring voltage waveforms transmitted by the remote end module 11, the test voltage source 21 and the voltage acquisition module 22 and analyzing the voltage waveforms to obtain whether the high-voltage direct current measurement system fails and the position of the high-voltage direct current measurement system.
In the embodiment of the present invention, the output end of the test voltage source 21 is externally connected to the input end of the secondary voltage divider of the resistor box 12 of the high voltage dc voltage measuring system 10 through a coaxial cable, and is connected to the analog sampling input end of the power supply and data analysis and operation module 23 through a coaxial cable. The sampling input end of the voltage acquisition module 22 is externally connected with the output end of the resistor box 12 through a coaxial cable, and the sampling input end of the voltage acquisition module 22 is externally connected with the voltage input end of the far-end module 11 through a coaxial cable. An optical signal data output port of the voltage acquisition module 22 is connected with an optical signal data receiving port of the power supply and data analysis operation module 23; a laser power supply signal receiving port of the voltage acquisition module 22 and a laser power supply signal transmitting port of the power supply and data analysis operation module 23. The analog sampling input end of the power supply and data analysis operation module 23 is connected with the input end of the resistance box 12 through a coaxial cable, and the optical signal data receiving port of the power supply and data analysis operation module 23 is connected with the optical signal data output port of the voltage acquisition module 22; the optical signal data receiving port of the power supply and data analysis operation module 23 is connected with the optical signal data output port of the remote module 11; the laser power supply signal transmitting port of the power supply and data analysis operation module 23 is connected with the laser power supply signal receiving port of the remote module 11, and the optical signal data output port of the remote module 11 is connected with the optical signal data receiving port of the power supply and data analysis operation module 23.
In the embodiment of the present invention, the test voltage source 21 mainly outputs a square wave voltage, a step voltage, an impulse voltage, a variable frequency voltage, and a high stability dc voltage or a time sequence combined voltage according to a preset time sequence, an amplitude value, and a waveform, and the corresponding output voltages are received by the power supply and data analysis operation module 23 after being processed by the voltage acquisition module 22, the voltage division of the resistor box 112, the remote module 11, and the like.
In the embodiment of the present invention, the voltage acquisition module 22 may be powered by a lithium battery of itself, or may be powered by a laser of the power supply and data analysis operation module 23.
It should be noted that the processing transmission delay time of the voltage acquisition module 22 is less than or equal to 0.2 us.
In the embodiment of the invention, the power supply and data analysis operation module 23 performs high-speed real-time acquisition on the input voltage of the resistor box 12, the output signal of the voltage acquisition module 22 and the output signal of the remote module 11, the power supply and data analysis operation module 23 is provided with a sampling rate and a digital input rated voltage ratio according to the actual data type of an input channel, the power supply and data analysis operation module 23 can analyze data according to the set test item parameters and calculate the measurement characteristics of the resistor box 12 and the remote module 11 in the high-voltage direct-current voltage measurement system 10, so as to realize the separation test of the measurement characteristics of the resistor box 12 and the remote module 11 in the high-voltage direct-current voltage measurement system 10, and finally, the rapid and accurate diagnosis and positioning of the fault of the high-voltage direct-current voltage measurement system are completed by a separation test method.
It should be noted that the main test parameters analyzed by the power supply and data analysis operation module 23 according to the collected voltage waveforms include parameters such as a transient response characteristic (step response time), a frequency response characteristic (including a maximum amplitude error and a maximum phase angle error under each frequency test voltage), and a maximum dc voltage-to-voltage ratio of the resistor box 12 or the remote module 11 in the high-voltage dc voltage measurement system 10. The power supply and data analysis and operation module 23 may be a computer or an intelligent terminal with a data analysis and processing function.
In the embodiment of the present invention, the power supply and data analysis module 23 processes the error of the data and the voltage ratio determination according to the technical protocol 1/4 specified in 6.5.2 of DL/T282-2012.
The measurement characteristic separation testing device provided by the invention provides a test voltage through a test voltage source, a voltage acquisition module acquires the voltage divided by a resistance box, a power supply and data analysis operation module acquires the voltage waveform provided by the test voltage source and the voltage waveform processed by the voltage acquisition module and provided by a remote module to carry out transient response characteristic, frequency response characteristic and direct current voltage division ratio analysis to obtain the most step response time and amplitude error, the phase angle error and the direct current voltage division ratio are judged whether the step response time, the amplitude error, the phase angle error and the direct current voltage division ratio meet the technical protocol to judge whether the remote end module or the resistor box has a fault, and the technical problems that the measurement characteristics of the resistor box and the remote end module in the high-voltage direct current voltage measuring device cannot be separately tested and the specific fault position of the high-voltage direct current voltage measuring system cannot be accurately positioned at present are solved.
In an embodiment of the present invention, the apparatus for measuring characteristics separation test further includes a communication protocol converter 24, wherein the communication protocol converter 24 is configured to convert a transmission data format; the input end of the communication protocol converter 24 is connected with the remote module 11 and the voltage acquisition module 22 respectively, and the output end of the communication protocol converter 24 is connected with the power supply and data analysis operation module 23. In this embodiment, the optical signal data receiving port of the power supply and data analysis operation module 23 is connected to the signal output port of the communication protocol converter 24, and the optical signal data output port of the remote module 11 is connected to the signal input port of the communication protocol converter 24.
It should be noted that the communication protocol converter 24 is capable of converting transmission in real time for converting data format of a specific communication protocol. The conversion objects may be protocols such as IEC61850-9-1, IEC61850-9-2LE, IEC61850-9-2, IEC60044-8 FT3 and TDM, and the absolute conversion transmission delay time of the communication protocol converter 24 is less than or equal to 0.2 us. The voltage sampling data of the optical signals output by the voltage acquisition module 22 and the remote module 11 may be in a data format of a specific communication protocol and a specific sampling rate, and are output to the power supply and data analysis operation module 23, and the voltage sampling data of the optical signals received by the power supply and data analysis operation module 23 may be in a data format of a specific communication protocol and a specific sampling rate. The specific communication protocol may be IEC61850-9-1, IEC61850-9-2LE, IEC61850-9-2, IEC60044-8 FT3, TDM and the like, and the data format of the specific sampling rate may be 10Hz, 50Hz, 100Hz and the like.
In an embodiment of the present invention, the power supply and data analysis operation module 23 includes a laser and a driving circuit connected to the laser; the laser is used for providing laser power supply for the voltage acquisition module 22 and the remote end module 11; the driving circuit is used for controlling the output laser power of the laser in a closed loop mode.
The power supply and data analysis operation module 23 further includes a display interface for displaying the acquired data and the voltage waveform.
It should be noted that the laser mainly provides laser power for the voltage acquisition device 22 and the remote module 11, the driving circuit performs closed-loop control on the emission power of the corresponding laser according to the received feedback signal, the display interface has the function of displaying acquired information data, and the display interface can also be used for closing the closed-loop automatic control function of the emission power of the related laser and performing manual modification setting on the laser output power parameter.
In an embodiment of the present invention, the voltage acquisition module 22 and the power supply and data analysis operation module 23 implement clock synchronization through a GPS or an external time synchronization unit.
It should be noted that the GPS or the external time synchronization unit has the capability of receiving PTP signals specified by 1PPS, IRIG-B, or GB/T25931-.
Example two:
fig. 4 is a flowchart illustrating steps of a separation testing method for measurement characteristics according to an embodiment of the present invention.
As shown in fig. 4, an embodiment of the present invention further provides a measurement characteristic separation testing method, which is applied to a high voltage direct current measurement system, and includes the following steps:
s1, based on the measurement characteristic separation testing device, connecting a high-voltage direct current measuring system with the measurement characteristic separation testing device;
s2, collecting a first initial voltage waveform of a test voltage source, a second initial voltage waveform of a voltage collection module and a third initial voltage waveform of a remote module before applying voltage to the measurement characteristic separation testing device; the method comprises the steps that a square wave signal with a fixed time window length is used as a characteristic signal, a test voltage source sequentially provides test signals of step voltage, variable frequency alternating current voltage and steady state direct current voltage for a high-voltage direct current measurement system, and a measurement characteristic separation test device collects a first voltage waveform transmitted by the test voltage source, a second voltage waveform and a third voltage waveform transmitted by the test signals through a voltage collection module and a far-end module;
s3, comparing the first voltage waveform, the second voltage waveform, the third voltage waveform with the first initial voltage waveform, the second initial voltage waveform and the third initial voltage waveform by taking the characteristic signal as a reference to obtain a first measurement voltage waveform, a second measurement voltage waveform and a third measurement voltage waveform corresponding to the first voltage waveform, the second voltage waveform and the third voltage waveform;
and S4, processing the first measurement voltage waveform, the second measurement voltage waveform, the third measurement voltage waveform, the first initial voltage waveform, the second initial voltage waveform and the third initial voltage waveform to obtain step response time, amplitude error, phase angle error and direct current voltage division ratio corresponding to the first measurement voltage waveform, the second measurement voltage waveform and the third measurement voltage waveform, and judging whether the far-end module or the resistance box breaks down or not according to whether the step response time, the amplitude error, the phase angle error and the direct current voltage division ratio meet the technical protocol requirements or not.
In the embodiment of the invention, if the obtained step response time, amplitude error, phase angle error and direct-current voltage division ratio do not meet the technical protocol when the first measurement voltage waveform is compared with the second measurement voltage waveform, the resistor box is abnormal; if the obtained step response time, amplitude error, phase angle error and direct-current voltage division ratio do not meet the technical protocol when the second measurement voltage waveform is compared with the third measurement voltage waveform, the remote module is abnormal; and if the obtained step response time, amplitude error, phase angle error and direct-current voltage division ratio do not meet the technical protocol when the first measurement voltage waveform is compared with the third measurement voltage waveform, the remote module or the resistor box is abnormal.
Before testing the resistance box and the remote module of the high-voltage direct-current measurement system, parameters such as driving current, sampling rate, scale factor or secondary rating of each channel of the power supply and data analysis operation module in the measurement characteristic separation testing device are set, and it is determined that the driving current and signal data of the corresponding channel are received normally and the time synchronization is normal. Setting the output of a test voltage source to be zero, presetting test voltage waveform, frequency, amplitude and combination time sequence according to test requirements, starting the test voltage source, and sending a square wave signal with fixed time window length as a characteristic signal before sending out a specified test voltage for carrying out characteristic calibration on sampling data; after the fixed time delay, the test voltage source generates a specified step voltage, impulse voltage, variable frequency voltage or steady-state direct current voltage test signal according to a preset test voltage, and after the fixed time delay, another square wave signal with a fixed time length is sent out to serve as a characteristic signal.
In this embodiment, when the measuring characteristics of the resistor box in the high voltage direct current voltage measuring system are separately tested, the power supply and data analysis operation module performs high-speed real-time acquisition on the input voltage of the resistor box and the output signal of the voltage acquisition module, the first initial voltage waveform U0 (the gain ratio of the sampled data is set according to the rated voltage division ratio K of the resistor box) of the analog input terminal acquired by the power supply and data analysis operation module, the second initial voltage waveform V0 of the voltage acquisition module, the first voltage waveform Un output by the test voltage source and stored by the power supply and data analysis operation module, and the second voltage waveform Vn transmitted by the first measured voltage waveform output by the test voltage source through the resistor box and the voltage acquisition module, the characteristic signals in the second voltage waveform Vn are aligned with the characteristic signals in the first voltage waveform Un by using the characteristic signals at the head and the tail (such as the fixed square wave signal of the time window length output by the test voltage source), if the waveform data are not aligned, the waveform data are indicated to be error and leakage, the group of test results are omitted, and the power supply and data analysis operation module performs resampling; if the waveforms are aligned, the power supply and data analysis operation module removes initial values of Un and Vn in the waveforms to obtain Un-U0 and Vi-Vn-V0, and performs step response time analysis (in a transient response test, whether step response time meets technical protocol requirements or not), amplitude-frequency characteristic analysis and phase-frequency characteristic analysis (in a frequency response test, whether maximum amplitude errors and maximum phase angle errors under various frequency test voltages meet technical protocol requirements or not) or direct current voltage division ratio analysis (in a maximum direct current voltage division ratio test, whether maximum direct current voltage division ratio basic errors meet technical protocol requirements or not) on the Un and Vi. If the relevant measurement characteristic test errors of the Ui and the Vi do not meet the technical protocol requirements, the resistance box is abnormal, and the Ui and the Vi test waveforms, the amplitudes of the corresponding measured values and the average value are displayed on a display interface. The relevant measurement characteristics include data such as step response time, amplitude error, phase angle error and direct current voltage division ratio.
It should be noted that voltage peaks in the same period are obtained in the second voltage waveform Vn and the first voltage waveform Un, corresponding time is obtained according to the voltage peaks, and an absolute value of a subtraction between the voltage peak times of the two voltage waveforms is a step response time. And subtracting the voltage peak value of the first voltage waveform Un from the voltage peak value of the second voltage waveform Vn to obtain a tested voltage Ui, comparing the voltage Ui with Vi to obtain a maximum amplitude error, obtaining a corresponding phase angle according to the voltage amplitude Ui and U0, and calculating to obtain a maximum phase angle error according to the corresponding phase angle, wherein the maximum direct-current voltage division ratio is Vi/Ui. When a frequency response test is carried out, a phase angle error is obtained by subtracting the peak values of the Ui and the Vi in the same period at a certain frequency at the moment, an amplitude error is obtained by comparing the peak values of the Ui and the Vi in the same period at a certain frequency, and the maximum value of the phase angle error and the maximum value of the amplitude error which are obtained by collecting and calculating in each frequency voltage and test period are the maximum amplitude error and the maximum phase angle error under the corresponding frequency; when a direct-current voltage division ratio test is carried out, the applied direct-current test voltage signals are aligned according to the characteristic signals Ui and Vi, and the maximum value of the comparison between Ui and Vi after the characteristic signals are aligned obtains the maximum direct-current voltage division ratio.
In this embodiment, when the remote module in the high-voltage dc voltage measurement system is separately tested for measurement characteristics, the power supply and data analysis operation module performs high-speed real-time acquisition on the input voltage of the resistor box and the output signal of the voltage acquisition module, the power supply and data analysis operation module acquires the second initial voltage waveform V0 of the voltage acquisition module and the third initial voltage waveform W0 of the initial output voltage data of the remote module, the power supply and data analysis operation module stores the third voltage waveform Wn output by the test voltage source through the resistor box and the remote module, and the second voltage waveform Vn output by the test voltage source and transmitted by the resistor box and the voltage acquisition module through the first measurement voltage waveform, and the characteristic signals in the second voltage waveform Vn are aligned with the characteristic signals in the third voltage waveform by using the leading and trailing characteristic signals (e.g. the fixed square wave signal of the time window length output by the test voltage source), if the waveform data are not aligned, the waveform data are indicated to be error and leakage, the group of test results are omitted, and the power supply and data analysis operation module performs resampling; if the waveforms are aligned, the power supply and data analysis operation module removes initial values of Wn and Vn in the waveforms to obtain Wi-Wn-W0 and Vi-Vn-V0, and performs step response time analysis (whether step response time meets technical protocol requirements or not is analyzed and calculated in a transient response test), amplitude-frequency characteristic analysis and phase-frequency characteristic analysis (whether maximum amplitude errors and maximum phase angle errors under various frequency test voltages meet technical protocol requirements or not is calculated in a frequency response test) or direct current voltage division ratio analysis (whether the maximum direct current voltage division ratio basic errors meet technical protocol requirements or not is calculated in a maximum direct current voltage division ratio test) on the Wi and Vi. If the test error of the relevant measurement characteristics of the Wi and the Vi does not meet the requirements of the technical protocol, the fact that the remote module is abnormal is indicated, and the test waveforms of the Wi and the Vi and the amplitudes and the average values of the corresponding measured values are displayed on a display interface.
It should be noted that voltage peaks are obtained in the second voltage waveform Vn and the third voltage waveform Wn, corresponding times are obtained from the voltage peaks, and the absolute value of the subtraction of the voltage peak times of the two voltage waveforms is the step response time. And subtracting the voltage peak values of the second voltage waveform Vn and the third voltage waveform Wn to obtain a tested voltage Wi, comparing the voltage Wi with the voltage Vi to obtain a maximum amplitude error, obtaining a corresponding phase angle according to the voltage amplitude Wi and the voltage amplitude Vi, and calculating to obtain a maximum phase angle error according to the corresponding phase angle comparison, wherein the maximum direct-current voltage division ratio is Wi/Vi. When a frequency response test is carried out, a phase angle error is obtained by subtracting the peak values of Vi and Wi in the same period at a certain frequency at the moment, an amplitude error is obtained by comparing the peak values of Vi and Wi in the same period at a certain frequency, and the maximum value of the phase angle error and the maximum value of the amplitude error which are obtained by collecting and calculating in each frequency voltage and test period are the maximum amplitude error and the maximum phase angle error under the corresponding frequency; when a direct-current voltage division ratio test is carried out, the applied direct-current test voltage signals are aligned according to Vi and Wi characteristic signals, and the maximum value of the comparison between Vi and Wi after the characteristic signals are aligned obtains the maximum direct-current voltage division ratio.
In this embodiment, when the measurement characteristics of the remote module and the resistor box in the high voltage dc voltage measurement system are separately tested, the power supply and data analysis operation module performs high-speed real-time acquisition on the input voltage of the resistor box and the output signal of the voltage acquisition module, the first initial voltage waveform U0 of the test voltage source and the third initial voltage waveform W0 of the initial output voltage data of the remote module, which are acquired by the power supply and data analysis operation module, the power supply and data analysis operation module stores the third voltage waveform Wn output by the test voltage source through the resistor box and the remote module, and the first voltage waveform Un corresponding to the first measurement voltage waveform output by the test voltage source, and the characteristic signals in the first voltage waveform Un and the characteristic signals in the third voltage waveform Wn are aligned by using the characteristic signals from the beginning to the end (e.g. the fixed square wave signal of the length of the time window output by the test voltage source setting), if the waveform data are not aligned, the waveform data are indicated to be error and leakage, the group of test results are omitted, and the power supply and data analysis operation module performs resampling; if the waveforms are aligned, the power supply and data analysis operation module removes initial values of Wn and Un in the waveforms to obtain Wi-Wn-W0 and Ui-Un-U0, and performs step response time analysis (in a transient response test, whether step response time meets technical protocol requirements or not), amplitude-frequency characteristic analysis and phase-frequency characteristic analysis (in a frequency response test, whether maximum amplitude errors and maximum phase angle errors under various frequency test voltages meet technical protocol requirements or not) or direct current voltage division ratio analysis (in a maximum direct current voltage division ratio test, whether maximum direct current voltage division ratio basic errors meet technical protocol requirements or not) on Wi and Ui. If the Wi and Ui related measurement characteristic test errors do not meet the technical protocol requirements, the fact that the resistance box or the remote module is abnormal is indicated, and Wi and Ui test waveforms, corresponding measured value amplitudes and average values are displayed on a display interface.
It should be noted that voltage peaks are obtained in the first voltage waveform Un and the third voltage waveform Wn, corresponding times are obtained from the voltage peaks, and an absolute value of a subtraction of the voltage peak times of the two voltage waveforms is a step response time. And subtracting the voltage peak value of the first voltage waveform Un and the voltage peak value of the third voltage waveform Wn to obtain a tested voltage Wi, comparing the voltage Wi with the Ui to obtain a maximum amplitude error, obtaining a corresponding phase angle according to the voltage amplitude Wi and the Ui, and calculating to obtain a maximum phase angle error according to the corresponding phase angle, wherein the maximum direct-current voltage division ratio is Wi/Ui. When a frequency response test is carried out, subtracting the peak values of the Ui and the Wi in the same period at a certain frequency at the moment to obtain a phase angle error, comparing the peak values of the Ui and the Wi in the same period at a certain frequency to obtain an amplitude error, and collecting and calculating the phase angle error and the maximum value of the amplitude error in each frequency voltage and test period to be the maximum amplitude error and the maximum phase angle error under the corresponding frequency; when a direct-current voltage division ratio test is carried out, the applied direct-current test voltage signals are aligned according to the characteristic signals of the Ui and the Wi, and the maximum value of the comparison between the Ui and the Wi after the characteristic signals are aligned obtains the maximum direct-current voltage division ratio.
The invention provides a measurement characteristic separation test method, which acquires voltage waveforms of a test voltage source, a voltage acquisition module and a remote module through a power supply and data analysis operation module on a measurement characteristic separation test device, analyzes transient response characteristics, frequency response characteristics and a direct current voltage division ratio of the voltage waveforms and the voltage waveforms to obtain tested step response time, amplitude errors, phase angle errors and direct current voltage division ratio, judges whether the step response time, the amplitude errors, the phase angle errors and the direct current voltage division ratio meet technical protocols to judge whether the remote module or a resistor box has faults or not, and solves the technical problems that the measurement characteristics of the resistor box and the remote module in a high-voltage direct current voltage measurement device cannot be separately tested and the specific fault position of a high-voltage direct current voltage measurement system cannot be accurately positioned at present.
Example three:
embodiments of the present invention also provide a computer-readable storage medium for storing computer instructions, which, when executed on a computer, cause the computer to perform the above-mentioned measurement characteristic separation test method.
Example four:
the embodiment of the present invention further provides a terminal device, which is characterized by comprising a processor and a memory:
a memory for storing the program code and transmitting the program code to the processor;
the processor is used for executing the measurement characteristic separation test method according to instructions in the program codes.
Illustratively, a computer program may be partitioned into one or more modules/units, which are stored in a memory and executed by a processor to accomplish the present application. One or more modules/units may be a series of computer program instruction segments capable of performing certain functions, the instruction segments describing the execution of a computer program in a device.
The device may be a computing device such as a desktop computer, a notebook, a palm top computer, a cloud server, and the like. The device may include, but is not limited to, a processor, a memory. Those skilled in the art will appreciate that the device is not limited and may include more or fewer components than those shown, or some components may be combined, or different components, e.g., the device may also include input output devices, network access devices, buses, etc.
The Processor may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), a Field-Programmable gate array (FPGA) or other Programmable logic device, discrete gate or transistor logic device, discrete hardware component, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The storage may be an internal storage unit of the computer device, such as a hard disk or a memory of the computer device. The memory may also be an external storage device of the computer device, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), etc. provided on the computer device. Further, the memory may also include both internal and external storage units of the computer device. The memory is used for storing computer programs and other programs and data required by the computer device. The memory may also be used to temporarily store data that has been output or is to be output.
It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the above-described systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the several embodiments provided in the present application, it should be understood that the disclosed system, apparatus and method may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one logical division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present invention, and not for limiting the same; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (9)
1. A separation test method for measurement characteristics is applied to a high-voltage direct current measurement system and is characterized by comprising the following steps:
s1, based on a measurement characteristic separation testing device, connecting a high-voltage direct current measuring system with the measurement characteristic separation testing device;
s2, collecting a first initial voltage waveform of a test voltage source, a second initial voltage waveform of a voltage collection module and a third initial voltage waveform of a remote module before applying voltage to the measurement characteristic separation testing device; the measuring characteristic separation testing device is used for collecting a first voltage waveform transmitted by the testing voltage source, a second voltage waveform and a third voltage waveform transmitted by the testing signal through the voltage collecting module and the far-end module;
s3, with the characteristic signal as a reference, comparing the first voltage waveform, the second voltage waveform, the third voltage waveform with the first initial voltage waveform, the second initial voltage waveform with the third initial voltage waveform to obtain a first measurement voltage waveform, a second measurement voltage waveform and a third measurement voltage waveform corresponding to the first voltage waveform, the second voltage waveform and the third voltage waveform;
s4, processing the first measurement voltage waveform, the second measurement voltage waveform, the third measurement voltage waveform, the first initial voltage waveform, the second initial voltage waveform and the third initial voltage waveform to obtain step response time, amplitude errors, phase angle errors and direct current voltage division ratios corresponding to the first measurement voltage waveform, the second measurement voltage waveform and the third measurement voltage waveform, and judging whether a far-end module or a resistor box has a fault according to whether the step response time, the amplitude errors, the phase angle errors and the direct current voltage division ratios meet technical protocol requirements;
the high-voltage direct current measurement system comprises a far-end module and a resistance box connected with the far-end module, and the measurement characteristic separation test device comprises a test voltage source, a voltage acquisition module and a power supply and data analysis operation module; the test voltage source is respectively connected with the resistance box and the power supply and data analysis operation module and is used for providing voltages with different time sequences, amplitudes and waveforms;
the input end of the voltage acquisition module is connected between the resistor box and the remote module, and the output end of the voltage acquisition module is connected with the power supply and data analysis operation module and is used for acquiring the voltage of the resistor box, processing the acquired voltage and transmitting the processed voltage to the power supply and data analysis operation module;
and the power supply and data analysis operation module is used for acquiring voltage waveforms transmitted by the remote module, the test voltage source and the voltage acquisition module and analyzing the voltage waveforms to obtain whether the high-voltage direct current measurement system breaks down or not and the position of the breaking down.
2. A method for separation testing of metrology characteristics as in claim 1, further comprising:
and if the obtained step response time, amplitude error, phase angle error and direct-current voltage division ratio do not meet the technical protocol when the first measurement voltage waveform is compared with the second measurement voltage waveform, the resistor box is abnormal.
3. The method of claim 2, wherein if the step response time, the amplitude error, the phase angle error, and the dc voltage divider ratio obtained from the second measurement voltage waveform compared to the third measurement voltage waveform do not satisfy the specification, the remote module is abnormal;
and if the obtained step response time, amplitude error, phase angle error and direct-current voltage division ratio do not meet the technical protocol when the first measurement voltage waveform is compared with the third measurement voltage waveform, the remote module or the resistor box is abnormal.
4. The method of claim 1, wherein the device further comprises a communication protocol converter for converting a format of the transmission data; the input end of the communication protocol converter is respectively connected with the remote end module and the voltage acquisition module, and the output end of the communication protocol converter is connected with the power supply and data analysis operation module.
5. The method of claim 1, wherein the power supply and data analysis module comprises a laser and a driving circuit connected to the laser;
the laser is used for providing laser power supply for the voltage acquisition module and the remote end module;
the driving circuit is used for controlling the output laser power of the laser in a closed loop mode.
6. The method of claim 1, wherein the power supply and data analysis module further comprises a display interface for displaying the collected data and the voltage waveform.
7. The method of claim 1, wherein the sampling rate of the power supply and data analysis module is 10Hz, 50Hz or 100 Hz.
8. A computer-readable storage medium storing computer instructions which, when executed on a computer, cause the computer to perform the method of separation testing of metrology characteristics of any one of claims 1 to 7.
9. A terminal device, comprising a processor and a memory:
the memory is used for storing program codes and transmitting the program codes to the processor;
the processor configured to execute the method of any one of claims 1-7 according to instructions in the program code.
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