CN111239664A - System and method for testing frequency response characteristic of far-end module box - Google Patents
System and method for testing frequency response characteristic of far-end module box Download PDFInfo
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Abstract
A frequency response characteristic test system of a far-end module box body comprises a standard harmonic voltage test source and waveform data recording and analyzing equipment. And the standard harmonic voltage test source is used for providing a sinusoidal voltage signal required by the frequency response characteristic test of the remote module box body. And the far-end module box body is connected with the standard harmonic voltage test source, receives the sinusoidal voltage signal, converts the sinusoidal voltage signal and outputs a test signal. And the waveform data recording and analyzing equipment is connected with the standard harmonic voltage test source and the far-end module box body and is used for synchronously acquiring and storing the sinusoidal voltage signal and the test signal, converting serial data, aligning, analyzing and calculating to obtain frequency response characteristic data of the far-end module box body. The test system realizes the test of the frequency response characteristic of the remote module box body for the high-voltage direct-current voltage measuring device, and has the characteristics of convenient operation and high reliability of test results.
Description
Technical Field
The invention belongs to the technical field of power measurement, and particularly relates to a system and a method for testing frequency response characteristics of a remote module box.
Background
With the top-level design of a national power grid, the global energy Internet is proposed and constructed, global clean energy power generation is transmitted to various users, and the requirements on long-distance high-voltage power transmission and system operation reliability are higher and higher. The high-voltage direct-current voltage measuring device in the high-voltage direct-current transmission system is an indispensable main device, provides reliable transmission signals for direct-current control and protection, electric energy metering and has reliability related to the stability of the high-voltage direct-current transmission system. The frequency response characteristic is an important performance of the high-voltage direct-current voltage measuring device, and has important influence on relay protection, harmonic measurement and transient measurement. The frequency response characteristic of the DC voltage measuring device is an important basis for evaluating the precision, dynamic characteristic and reliability of the DC voltage measuring device.
In the prior art, the frequency response characteristic of the whole direct current voltage measuring device is tested, and an alternating current voltage source with high frequency and large voltage is required to be used. Due to the technical limitation of the alternating-current voltage source, the test input voltage value (root-mean-square value) can not reach the rated value generally, so that the test range is narrow, and the test frequency points are few. Meanwhile, the high-frequency large-voltage alternating-current voltage source supporting multi-frequency output is expensive in manufacturing cost, heavy in size and inconvenient to carry, and cannot meet the field test requirement of the frequency response characteristic of the direct-current voltage measuring device. In addition, in the prior art, when a test obstacle occurs in the frequency characteristic test process, the obtained result of the frequency response characteristic has larger deviation, and the reliability of the test data is lack of necessary discrimination, so that the result accuracy cannot be judged. In summary, the frequency response characteristic of the high-voltage direct-current voltage measuring device at higher frequency lacks a credible test verification means, so that the reliable operation of the high-voltage direct-current voltage measuring device cannot be ensured, and the safe operation of a power grid can be damaged in serious cases.
Therefore, a new system and method for testing frequency response characteristics are needed to obtain reliable test results of the frequency response characteristics of the high-voltage direct-current voltage measuring device.
Disclosure of Invention
The invention provides a system and a method for testing the frequency response characteristic of a far-end module box body, which are used for accurately testing the frequency response characteristic of the far-end module box body.
According to a first aspect of the embodiments of the present invention, there is provided a system for testing frequency response characteristics of a remote module box, the system including: a standard harmonic voltage test source and waveform data recording and analyzing device;
the standard harmonic voltage test source is used for providing a sinusoidal voltage signal required by the far-end module box frequency response characteristic test and outputting the sinusoidal voltage signal to the waveform data recording and analyzing equipment;
the input end of the far-end module box body is connected with the standard harmonic voltage test source, receives the sinusoidal voltage signal, converts the sinusoidal voltage signal and outputs a test signal;
waveform data admission analytical equipment, with standard harmonic voltage test source with far end module box body connects, includes:
the data acquisition module is used for acquiring and storing the sinusoidal voltage signal and the test sample signal;
the data processing module is connected with the data acquisition module and is used for converting the sinusoidal voltage signal and the test sample signal into serial data and aligning the serial data corresponding to the sinusoidal voltage signal and the test sample signal;
and the data analysis module is connected with the data processing module and used for analyzing and calculating the serial data to obtain the frequency response characteristic data of the remote module box body.
Further, the sample signal output by the far-end module box body is an analog electrical signal or an analog optical signal.
Furthermore, the waveform data recording and analyzing device is further provided with a photoelectric conversion module for converting the analog optical signal into the analog electrical signal.
Further, the sample signal and the sinusoidal voltage signal are synchronously acquired by the data acquisition module.
Furthermore, the waveform data recording and analyzing equipment is an intelligent terminal with a data analyzing and processing function.
Further, the standard harmonic voltage test source may output a sinusoidal voltage signal with adjustable frequency and amplitude.
According to a second aspect of the embodiments of the present invention, there is provided a method for testing a frequency response characteristic of a remote module box, where the system for testing a frequency response characteristic of a remote module box provided in the first aspect of the embodiments of the present invention is used, the method including:
the standard harmonic voltage test source sends out a sinusoidal voltage signal which comprises a characteristic signal and acts on the far-end module box body;
the far-end module box body receives the sinusoidal voltage signal and outputs a test signal;
the waveform data recording and analyzing equipment synchronously acquires the sinusoidal voltage signal and the test sample signal and processes the sinusoidal voltage signal and the test sample signal to obtain serial data Sn and Vn;
the waveform data recording and analyzing equipment aligns the Sn and Vn digital bits;
judging whether the alignment is carried out;
if not, the Sn and the Vn are discarded, and the standard harmonic voltage test source is controlled to emit a sinusoidal voltage signal again;
and if the data is aligned, analyzing and calculating the Sn and the Vn by the waveform data recording and analyzing equipment to obtain the amplitude-frequency response data and the phase-frequency response data of the far-end module box body.
Further, the characteristic signal is a high-frequency sinusoidal voltage signal and comprises a first characteristic signal and a second characteristic signal.
Further, before the standard harmonic voltage test source sends out a sinusoidal voltage signal, the method further comprises:
setting the initial voltage S0 output by the standard harmonic voltage test source to be zero;
and the waveform data recording and analyzing equipment records the initial output data of the far-end module box body and calculates the average value V0 of the initial output data.
Further, the waveform data recording and analyzing device analyzes and calculates the Sn and Vn, and comprises the following steps:
removing the S0 from the Sn and the V0 from the Vn to obtain Si-Sn-S0 and Vi-Vn-V0;
removing the first characteristic signal and the second characteristic signal from the Si and the Vi;
and carrying out spectrum analysis on the Si and the Vi.
Based on the above embodiments, the embodiments of the present invention provide a system and a method for testing frequency response characteristics of a remote module box. The system directly connects a standard harmonic voltage test source with a high-voltage direct-current voltage measuring device through a far-end module box body, and directly tests the frequency response characteristic of the far-end module box body. Compared with the prior art, the standard harmonic voltage test source adopted by the test system is a low-voltage test source, and a high-voltage test source is not needed, so that the problems of narrow test range, few test frequency points, high cost, large volume and the like caused by technical limitation of an alternating-current voltage source are effectively solved. The waveform data recording and analyzing equipment synchronously receives the optical signal or the analog electric signal output by the remote module and the sinusoidal voltage signal output by the standard harmonic voltage test source, processes the optical signal or the analog electric signal and the sinusoidal voltage signal to obtain serial data, aligns the two strings of serial data, and then calculates and analyzes the serial data to obtain the amplitude-frequency response and the phase-frequency response of the remote module box body, so that the discrimination of problem data in the test process is effectively realized, a reliable test result is obtained, and the problem that the test result is unreliable is solved.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.
Drawings
In order to more clearly explain the technical solution of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious to those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic diagram illustrating a frequency response characteristic testing system of a remote module box according to an embodiment of the present invention;
fig. 2 is a schematic diagram illustrating a waveform data recording and analyzing apparatus according to an embodiment of the present invention;
fig. 3 is a flowchart of a method for testing frequency response characteristics of a remote module box according to an embodiment of the present invention.
Detailed Description
In order to make those skilled in the art better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Fig. 1 is a system for testing frequency response characteristics of a remote module box according to an embodiment of the present invention; fig. 2 is a waveform data recording and analyzing apparatus according to an embodiment of the present invention. As shown in fig. 1, the frequency response characteristic testing system of the remote module box comprises a standard harmonic voltage test source 1 and a waveform data recording and analyzing device 3; further, as shown in fig. 2, the waveform data recording and analyzing device 3 includes a first input terminal 31, a second input terminal 32, a third input terminal 33, a photoelectric conversion module 34, a data acquisition module 35, a data processing module 36, and a data analysis module 37.
Specifically, the standard harmonic voltage test source 1 can output a sinusoidal voltage signal with adjustable frequency and amplitude, provide a required sinusoidal voltage signal for the frequency response characteristic test of the far-end module box 2, and output the sinusoidal voltage signal to the waveform data recording and analyzing device 3.
The far-end module box body 2 is used for a high-voltage direct-current voltage measuring device, the input end of the far-end module box body is connected with the standard harmonic voltage test source 1, the sinusoidal voltage signal output by the standard harmonic voltage test source 1 is received, then the sinusoidal voltage signal is converted, and a test sample signal is output, wherein the output test sample signal is an analog electrical signal or an analog optical signal due to different configurations of the far-end module box body 2.
As shown in fig. 2, the waveform data recording and analyzing device 3 is an intelligent terminal with data analysis and processing functions, and has 3 input terminals, which are respectively: a first input terminal 31, configured to connect to the remote module box 2 and receive an optical signal output by the remote module box 2; a second input end 32, configured to connect to the remote module box 2 and receive the analog electrical signal output by the remote module box 2; and a third input terminal 33, configured to connect to the standard harmonic voltage test source 1, and receive the sinusoidal voltage signal output by the standard harmonic voltage test source 1. Further, the waveform data recording and analyzing device 3 further includes a photoelectric conversion module 34, a data acquisition module 35, a data processing module 36, and a data analysis module 37. The analog optical signal received by the first input terminal 31 and output by the remote module box 2 is transmitted to the photoelectric conversion module 34, the photoelectric conversion module 34 converts the analog optical signal into an analog electrical signal and then transmits the analog electrical signal to the data acquisition module 35, and the arrangement of the photoelectric conversion module 34 enables the test to be conveniently carried out when the sample signal output by the remote module box 2 is the analog optical signal; the analog electric signals output by the far-end module box bodies 2 and received by the second input end 32 are directly transmitted to the data acquisition module 35, and the first input end 31 and the second input end 32 enable the test system to conveniently test the far-end module box bodies 2 of different models; the sinusoidal voltage signal output by the standard harmonic voltage test source 1 and received by the third input terminal 33 is transmitted to the data acquisition module 35. The data acquisition module 35 is connected to the first input terminal 31, the second input terminal 32 and the photoelectric conversion module 34, and is configured to acquire and store the analog electrical signal transmitted by the first input terminal 31 or the photoelectric conversion module 34 and the sinusoidal voltage signal transmitted by the third input terminal 33, and the acquisition of the analog electrical signal and the sinusoidal voltage signal by the data acquisition module 35 is performed synchronously, so as to ensure that two sets of signals correspond to each other one to one. The data processing module 36 is connected with the data acquisition module 35, reads the analog electrical signal and the sinusoidal voltage signal stored in the data acquisition module 35, converts the sinusoidal voltage signal and the analog electrical signal into serial data, aligns the serial data corresponding to the sinusoidal voltage signal and the test sample signal, and then transmits the serial data to the data analysis module 37; the serial data is data transmitted in sequence of one bit and one bit, has the characteristic of convenient identification, and provides conditions for alignment and analysis of two groups of signals, namely a sinusoidal voltage signal and an analog electric signal. And the data analysis module 37 is connected with the data processing module 36, receives the serial data transmitted by the data processing module 36, and analyzes and calculates the serial data to obtain the frequency response characteristic data of the remote module box 2.
Fig. 3 is a method for testing the frequency response of the remote module box according to the embodiment of the present invention, and as shown in fig. 3, the method for testing the frequency response of the remote module box includes the following steps:
s01: and setting the initial voltage S0 output by the standard harmonic voltage test source to be zero.
S02: the waveform data recording and analyzing equipment records the initial output data of the far-end module box body and calculates the mean value V0 of the initial output data.
In the testing method provided by this embodiment, the zero point correction is performed on the testing system first, so that the deviation of the testing result is reduced and the testing result is more accurate. Specifically, the initial voltage S0 output by the standard harmonic voltage test source is set to be zero, the waveform data recording and analyzing equipment records the initial output data of the remote module box, and the average value V0 of the initial output data is calculated.
S03: the standard harmonic voltage test source sends out sinusoidal voltage signals which contain characteristic signals and act on the far-end module box body.
And after the zero point correction is finished, starting the frequency response characteristic test, and sending out a sinusoidal voltage signal by the standard harmonic voltage test source. According to the frequency response test requirement of GB/T26217-. Therefore, the frequency of the sinusoidal voltage signal emitted by the standard harmonic voltage test source needs to be set to meet the test requirements. The standard harmonic voltage test source firstly sends out a high-frequency sinusoidal voltage signal with a certain time length as a first characteristic signal before sending out a sinusoidal voltage signal with a preset frequency, then sends out a sinusoidal voltage signal with a preset frequency with a certain time length, and sends out a high-frequency sinusoidal voltage signal with a certain time length again as a second characteristic signal after sending out the sinusoidal voltage signal with the preset frequency. For example, if the standard harmonic voltage test source is set to emit a sine wave test voltage with a frequency of 50Hz, the standard harmonic voltage test source firstly emits a high-frequency sine voltage signal with a duration of 1s and a frequency of 5000Hz, then emits a sine voltage signal with a duration of 15s and a frequency of 50Hz, and then emits a high-frequency sine voltage signal with a duration of 1s and a frequency of 5000Hz again. The first characteristic signal and the second characteristic signal are arranged to identify the start and end of the test signal in preparation for alignment of the data.
S04: the far-end module box body receives the sine voltage signal and outputs a test signal.
After the far-end module box body receives a sinusoidal voltage signal sent by a standard harmonic voltage test source, the sinusoidal voltage signal is filtered and signal conditioned, then subjected to A/D conversion and digital signal processing, and finally subjected to electro-optical conversion to obtain a sample signal, wherein the sample signal obtained at the moment is an analog optical signal. In addition, because some far-end module boxes are not provided with electro-optical conversion devices, the obtained test signal is an analog electrical signal.
S05: the waveform data recording and analyzing equipment synchronously acquires a sinusoidal voltage signal and a sample signal and processes the sinusoidal voltage signal and the sample signal to obtain serial data Sn and Vn.
According to the configuration of the far-end module box body, when the far-end module box body outputs an analog optical signal, an operator connects the far-end module box body with a first input end of the waveform data recording and analyzing equipment; the first input end receives the analog optical signal and converts the analog optical signal into an analog electrical signal through the photoelectric conversion module. When the far-end module box body outputs an analog electric signal, an operator connects the far-end module box body with the second input end of the waveform data recording and analyzing device; a second input of the waveform data acquisition and analysis device receives the analog electrical signal. The data acquisition module synchronously acquires and stores the sinusoidal voltage signal and the analog electric signal. The data processing module converts the sinusoidal voltage signal and the sample signal into serial data to obtain serial data Sn and Vn, wherein the serial data Sn corresponding to the sinusoidal voltage signal and the serial data Vn corresponding to the sample signal are obtained.
S06: the waveform data recording and analyzing equipment aligns Sn and Vn digital bits.
And the data processing module identifies the starting end and the terminating end of the serial data Sn and Vn by using the first characteristic signal and the second characteristic signal, and then aligns the digital bits of the serial data Sn and Vn according to a one-bit-to-one-bit mode.
S07: and judging whether the alignment is carried out.
And the data processing module identifies the starting end and the ending end of the serial data Sn and Vn by using the first characteristic signal and the second characteristic signal and judges whether the serial data Sn and Vn are aligned. If there is no alignment, indicating that there is a loss of signal during the test, and therefore the set of data is problematic and cannot be used, S08 is executed; if aligned, S09 is performed.
S08: and (4) discarding Sn and Vn, and controlling the standard harmonic voltage test source to emit a sinusoidal voltage signal again.
And judging that the two groups of serial data Sn and Vn are not aligned in the step S07, discarding the group of data, and controlling the standard harmonic voltage test source to send out the sinusoidal voltage signal again.
S09: and analyzing and calculating Sn and Vn by the waveform data recording and analyzing equipment to obtain amplitude-frequency response data and phase-frequency response data of the far-end module box body.
And judging that the two groups of serial data Sn and Vn are aligned through the step S07, transmitting the groups of Sn and Vn to a data analysis module, removing S0 from Sn and V0 from Vn by the data analysis module to obtain Si-Sn-S0 and Vi-Vn-V0, then removing the first characteristic signal and the second characteristic signal from Si and Vi, and finally performing spectrum analysis on Si and Vi. The specific method of the spectrum analysis is that a measured value within 3 seconds is selected according to national standard for Si, Fourier transform is carried out on the measured value in every 10 wave periods as a time window, and the amplitude Sp and the phase angle Sa of the corresponding frequency f are obtained. The same method finds the amplitude Vp and phase angle Va of the corresponding frequency f for the same time window for Vi. The amplitude-frequency characteristic may be expressed as a (f) ═ Vp/Sp, and the phase-frequency characteristic may be expressed as θ (f) ═ Vp/Sp; and finally, taking the average value of all time windows within 3 seconds as the test output result.
According to the frequency response characteristic test system of the far-end module box, the data recording and analyzing equipment receives sinusoidal voltage signals with different frequencies generated by the standard harmonic voltage test source and test product signals output by the far-end module, and frequency response amplitude errors, phase offset errors and composite errors of the far-end module are calculated according to the sinusoidal voltage signals and the test product signals. And testing the frequency response characteristic of the remote module for the high-voltage direct-current voltage measuring device according to the frequency response amplitude error, the phase offset error and the composite error of the remote module. The testing system realizes the testing of the frequency response characteristic of the remote module box body for the high-voltage direct-current voltage measuring device, effectively eliminates problematic data in the testing process by serial data conversion and alignment of the sinusoidal voltage signal and the test signal, and improves the reliability of the testing result.
The embodiments in this specification are described in a progressive manner. Other embodiments of the invention will be apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the invention following, in general, the principles of the invention and including such departures from the present disclosure as come within known or customary practice within the art to which the invention pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the invention being indicated by the following claims.
It should be noted that, unless otherwise specified and limited, the terms "connected" and "connected" are to be interpreted broadly, and may be, for example, mechanically or electrically connected, or may be communicated between two elements, directly or indirectly through an intermediate medium, and specific meanings of the terms may be understood by those skilled in the relevant art according to specific situations. The terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a circuit structure, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such article or apparatus. Without further limitation, the presence of an element identified by the phrase "comprising an … …" does not exclude the presence of additional like elements in the article or device comprising the element. Relational terms such as "first" and "second," and the like, may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions.
It will be understood that the invention is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the invention is limited only by the appended claims.
Claims (10)
1. The utility model provides a frequency response characteristic test system of distal end module box which characterized in that includes: a standard harmonic voltage test source and waveform data recording and analyzing device;
the standard harmonic voltage test source is used for providing a sinusoidal voltage signal required by the far-end module box frequency response characteristic test and outputting the sinusoidal voltage signal to the waveform data recording and analyzing equipment;
the input end of the far-end module box body is connected with the standard harmonic voltage test source, receives the sinusoidal voltage signal, converts the sinusoidal voltage signal and outputs a test signal;
waveform data admission analytical equipment, with standard harmonic voltage test source with far end module box body connects, includes:
the data acquisition module is used for acquiring and storing the sinusoidal voltage signal and the test sample signal;
the data processing module is connected with the data acquisition module and is used for converting the sinusoidal voltage signal and the test sample signal into serial data and aligning the serial data corresponding to the sinusoidal voltage signal and the test sample signal;
and the data analysis module is connected with the data processing module and used for analyzing and calculating the serial data to obtain the frequency response characteristic data of the remote module box body.
2. The system for testing the frequency response of a remote module housing of claim 1, wherein the test signal output by the remote module housing is an analog electrical signal or an analog optical signal.
3. The system for testing the frequency response of a remote module housing of claim 2, wherein said waveform data recording and analyzing device further comprises a photoelectric conversion module for converting said analog optical signal into said analog electrical signal.
4. The system of claim 1, wherein the sample signal and the sinusoidal voltage signal are synchronously acquired by the data acquisition module.
5. The system as claimed in claim 1, wherein the waveform data recording and analyzing device is an intelligent terminal with data analysis and processing functions.
6. The system of claim 1, wherein the standard harmonic voltage test source is capable of outputting a sinusoidal voltage signal with adjustable frequency and amplitude.
7. A method for testing the frequency response of a remote module housing, using the system for testing the frequency response of a remote module housing according to any one of claims 1 to 6, the method comprising:
the standard harmonic voltage test source sends out a sinusoidal voltage signal which comprises a characteristic signal and acts on the far-end module box body;
the far-end module box body receives the sinusoidal voltage signal and outputs a test signal;
the waveform data recording and analyzing equipment synchronously acquires the sinusoidal voltage signal and the test sample signal and processes the sinusoidal voltage signal and the test sample signal to obtain serial data Sn and Vn;
the waveform data recording and analyzing equipment aligns the Sn and Vn digital bits;
judging whether the alignment is carried out;
if not, the Sn and the Vn are discarded, and the standard harmonic voltage test source is controlled to emit a sinusoidal voltage signal again;
and if the data is aligned, analyzing and calculating the Sn and the Vn by the waveform data recording and analyzing equipment to obtain the amplitude-frequency response data and the phase-frequency response data of the far-end module box body.
8. The method of claim 7, wherein the signature signal is a high frequency sinusoidal voltage signal comprising a first signature signal and a second signature signal.
9. The method of claim 8, wherein before the standard harmonic voltage test source emits a sinusoidal voltage signal, the method further comprises:
setting the initial voltage S0 output by the standard harmonic voltage test source to be zero;
and the waveform data recording and analyzing equipment records the initial output data of the far-end module box body and calculates the average value V0 of the initial output data.
10. The method of claim 9, wherein the analyzing of Sn and Vn by the waveform data recording and analyzing device comprises:
removing the S0 from the Sn and the V0 from the Vn to obtain Si-Sn-S0 and Vi-Vn-V0;
removing the first characteristic signal and the second characteristic signal from the Si and the Vi;
and carrying out spectrum analysis on the Si and the Vi.
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Application publication date: 20200605 |